JPS61166552A - Electrostatic latent image carrying body - Google Patents
Electrostatic latent image carrying bodyInfo
- Publication number
- JPS61166552A JPS61166552A JP774385A JP774385A JPS61166552A JP S61166552 A JPS61166552 A JP S61166552A JP 774385 A JP774385 A JP 774385A JP 774385 A JP774385 A JP 774385A JP S61166552 A JPS61166552 A JP S61166552A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- amorphous silicon
- latent image
- photoconductive layer
- support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/08—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
- G03G5/082—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
- G03G5/08214—Silicon-based
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G5/00—Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
- G03G5/02—Charge-receiving layers
- G03G5/04—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
- G03G5/08—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
- G03G5/082—Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
- G03G5/08214—Silicon-based
- G03G5/08221—Silicon-based comprising one or two silicon based layers
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photoreceptors In Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
(イ 産業上の利用分野
本発明は、アモルファスシリコンを主成分とする光導電
層が形成された静電潜像担持体に関する。DETAILED DESCRIPTION OF THE INVENTION (A) Field of Industrial Application The present invention relates to an electrostatic latent image carrier on which a photoconductive layer containing amorphous silicon as a main component is formed.
(ロ)従来の技術
米国特許第4,471,042Ji!rに開示されたア
モルファスシリコンを主成分とする静電潜像担持体は、
セレンや硫化カドミウムを主成分とするものに比較して
、耐熱性や耐摩擦性に富み、無害であるとともに高光感
度であること等の種々の長所を有している。また、長波
長光に対しても充分な感度を有するので、複写機やレー
ザプリンタを用いたインテリジエントコビイにも使用で
きる特長を有している。(b) Prior art U.S. Patent No. 4,471,042Ji! The electrostatic latent image carrier mainly composed of amorphous silicon disclosed in R.
Compared to those whose main components are selenium or cadmium sulfide, they have various advantages such as being highly heat resistant and abrasion resistant, harmless, and highly sensitive to light. Furthermore, since it has sufficient sensitivity to long wavelength light, it has the feature that it can also be used for intelligent copiers using copying machines and laser printers.
このアモルファスシリコンを静電潜像担持体トして用い
る場合、光導電層の暗抵抗の高抵抗化を図るとともに、
現像プロセスに必要なだけの帯電量を得るために十分な
厚さを有させる必要がある。When this amorphous silicon is used as an electrostatic latent image carrier, the dark resistance of the photoconductive layer is increased, and
It is necessary to have sufficient thickness to obtain the amount of charge necessary for the development process.
(ハ)発明が解決しようとする問題点
然し乍ら、十分な厚さの光導電層を得ようとすれば光導
電層の形成条件や支持体表面の状態によっては該支持体
表面から光導電層が浮き上がったり、剥離したりする問
題点がある。断る問題点は光導電層の膜厚が厚くなる程
顕著である。(c) Problems to be solved by the invention However, in order to obtain a photoconductive layer of sufficient thickness, depending on the formation conditions of the photoconductive layer and the condition of the surface of the support, the photoconductive layer may be removed from the surface of the support. There are problems with lifting and peeling. The problems mentioned above become more pronounced as the thickness of the photoconductive layer increases.
に)問題点を解決するための手段
本発明は斯る問題点を解決すべく、支持体の導電表面に
、少なくともアモルファスシリコンと合金化してシリサ
イドを形成するシリサイド層と、アモルファスシリコン
を主成分とする光導電層をこの順序で積層した構成にあ
る。In order to solve these problems, the present invention provides a silicide layer that is alloyed with at least amorphous silicon to form a silicide, and a silicide layer that is mainly composed of amorphous silicon, on the conductive surface of the support. It has a structure in which photoconductive layers are laminated in this order.
(句作 用
上述の如く、支持体の導電表面と光導電層との間にアモ
ルファスシリコンと合金化したシリサイド層を設けるこ
とによって、斯るシリサイド層は光導電層の支持体に対
する付着力を高めるべく作用する。As mentioned above, by providing a silicide layer alloyed with amorphous silicon between the conductive surface of the support and the photoconductive layer, the silicide layer is used to increase the adhesion of the photoconductive layer to the support. act.
(へ)実施例
第1図は本発明静電潜像担持体の部分拡大断面図で、(
1)は表面を精度良く加工したステンレス製の円筒状支
持体、(2)はこの支持体(1)の導電表面に設けられ
た膜厚1o〜1000λ程度のシリサイド層で、このシ
リサイド層(2)はTi、Ta、 MO,W。(f) Example FIG. 1 is a partially enlarged sectional view of the electrostatic latent image carrier of the present invention.
1) is a cylindrical support made of stainless steel with a precisely processed surface, and (2) is a silicide layer with a thickness of about 10 to 1000λ provided on the conductive surface of this support (1). ) are Ti, Ta, MO, W.
Co、Pd、 Ptをアモルファスシリコ7(a−sx
)と合金化することにより形成され、上記支持体(1)
との密着性に優れると共にオ料的にも緻密で安定性に富
んでいる。(31は上記シリサイド層(2)上にアモル
ファスシリコンを主成分とする膜厚2oμm程度の光導
電層で、例えば一定量の酸素及び硼素が添加されている
。Co, Pd, Pt in amorphous silicon 7 (a-sx
) formed by alloying with the support (1)
It has excellent adhesion with other materials, and is also dense and stable. (Reference numeral 31 denotes a photoconductive layer on the silicide layer (2) with a film thickness of about 2 μm mainly composed of amorphous silicon, to which, for example, a certain amount of oxygen and boron are added.
次に、静電潜像担持体の製造方法について説明する。ス
テンレス製中空円筒管の表面に、モリブデンが厚さ数1
0〜数100人電子ビーム蒸着された支持体(1)にお
いて、s1イオンを基板温度400℃で注入し、イオン
ビームミキシングを行なうことによりアモルファスシリ
コンと合金化し、支持体(1)表面にモリブデンシリサ
イド(Mo512)層(2)が形成される。Next, a method for manufacturing the electrostatic latent image carrier will be described. Molybdenum is coated several times thick on the surface of the stainless steel hollow cylindrical tube.
s1 ions are implanted at a substrate temperature of 400°C and alloyed with amorphous silicon by performing ion beam mixing, and molybdenum silicide is formed on the surface of the support (1). (Mo512) layer (2) is formed.
この様に表面にシリサイド層(2)が形成された支持体
(1)を、第2図に示すプラズマCVD装置の密閉容器
14)内に、放電電極(5)と対向せしめた状態で回転
自在に収納する。次いで、この密閉容器(4)内をロー
タリポンプ(6)及びメカニカルブースダポンプ(7)
で1×10 気圧程度まで排気した後、この支持体(1
)を回転しっつヒータ(8)にて20[]〜3゜0℃に
昇温する。密閉容器(41にSin、ガス及びH2ガス
をベースとするB2H,ガス、及びo2ガスを導大して
ガス圧を1×10 気圧程度に保持する。The support (1) with the silicide layer (2) formed on its surface in this manner can be freely rotated in a sealed container 14) of the plasma CVD apparatus shown in FIG. 2 while facing the discharge electrode (5). Store it in. Next, a rotary pump (6) and a mechanical booster pump (7) are installed inside this closed container (4).
After evacuating to about 1×10 atmosphere, this support (1
) is heated to 20° to 3°C using a rotary heater (8). Sin, gas, B2H gas based on H2 gas, and O2 gas are introduced into the closed container (41), and the gas pressure is maintained at approximately 1×10 atm.
この際のE2H,ガスのS iH4ガスに対する混合比
を数十PPm、O,ガスのS14ガスに対する混合比を
数茶、全ガス流量を300Cc/分とする。At this time, the mixing ratio of the E2H gas to the SiH4 gas is several tens of ppm, the mixing ratio of the O gas to the S14 gas is several teas, and the total gas flow rate is 300 Cc/min.
この状態にて周波数が13.56MHzの高周波電力を
高周波電源(9)にて50QW印加し、プラズマ放電を
生起させることにより、アモルファスシリコンを主成分
とする光導電層(3)が形成される。In this state, 50 QW of high frequency power with a frequency of 13.56 MHz is applied from the high frequency power source (9) to generate plasma discharge, thereby forming a photoconductive layer (3) containing amorphous silicon as a main component.
上記第1の実施例では、アモルファスシリコンを主成分
とする層として光導電層(31のみの構造であったが、
第3図に示す様に、光導電層(31とM。In the first embodiment described above, the photoconductive layer (31) was the only layer mainly composed of amorphous silicon, but
As shown in FIG. 3, the photoconductive layer (31 and M).
S12シリサイド層(2)との間に、支持体(1)から
のキャリアの注入を防ぐ目的で阻止層(301)を、光
導電層(3)表面に、担持体表面からのキャリアの流入
を防ぐ目的で表面層(302)を設ける三層構造であっ
ても良い。このMo53−、のシリサイド層(2)ヲ、
支持体(1)とアモルファスシリコンの三層構造(30
1)(3)(302) との間に設けたものを第2の
実施例とする。A blocking layer (301) is provided between the S12 silicide layer (2) for the purpose of preventing the injection of carriers from the support (1), and a blocking layer (301) is provided on the surface of the photoconductive layer (3) to prevent the inflow of carriers from the surface of the support. A three-layer structure may also be used in which a surface layer (302) is provided for the purpose of preventing this. This Mo53-, silicide layer (2),
Support (1) and a three-layer structure of amorphous silicon (30
1), (3), and (302) as the second embodiment.
次に、ステンレス中空円筒管の表面に、タングステンが
電子ビーム蒸着された支持体において、第2図の装置に
てアモルファスシリコン膜を数百人形成し、一度取り出
した後、YAGレーザを用いアモルファスシリコン表面
を数百度に加熱することにより、合金化し、タングステ
ンシリサイド(Wsx2)層(2)を形成した後、第1
実施例と同じく光導電層(3)のみを形成した第3の実
施例と、阻止層(301)、光導電層(3)及び表面層
(302)を積層した第4の実施例の静電潜像担持体を
作製した。Next, several hundred amorphous silicon films were formed on the surface of the stainless steel hollow cylindrical tube using the apparatus shown in Figure 2 on the support body on which tungsten was deposited by electron beam. After alloying the surface by heating it to several hundred degrees and forming a tungsten silicide (Wsx2) layer (2), the first
A third example in which only the photoconductive layer (3) was formed as in the example, and a fourth example in which a blocking layer (301), a photoconductive layer (3), and a surface layer (302) were laminated. A latent image carrier was produced.
この様にして得られた本発明による第1〜WE4の実施
例の静電潜像担持体の優れた特性を確認するため、通紙
試験及び温度湿度サイクル試験を行なった。比較例とし
て、シリサイド層(2)を有しないもので、支持体(1
)上に第1実施例の条件で作製した光導電層(3)のみ
を有する構造のもの(第1比較例)、及び支持体(1)
上にP型アモルファスシリコン膜からなる阻止層(30
1)、第1実施例の条件で作製した光導電層(31、窒
素を含有するアモルファスシリコン膜からなる表面層(
302)を有する構造のもの(第2比較例)が選ばれた
。In order to confirm the excellent characteristics of the electrostatic latent image bearing members of Examples 1 to WE4 according to the present invention thus obtained, a paper passing test and a temperature/humidity cycle test were conducted. As a comparative example, one without a silicide layer (2) and a support (1
) having only the photoconductive layer (3) produced under the conditions of the first example (first comparative example), and the support (1)
A blocking layer (30
1), a photoconductive layer (31) produced under the conditions of the first example, a surface layer made of an amorphous silicon film containing nitrogen (
302) (second comparative example) was selected.
通紙試験は、静電潜像担持体を複写機に実装し複写紙を
通してコピー画像を写し、画像流れが何枚目で起こるか
を見るものである。温度湿度サイクル試験は、上限が温
度60℃で湿度90%、下限が温度−10℃で湿度は維
持し得るできる限り高い湿度の条件の下で行なった。温
度湿度サイクル試験の1サイクルの所要時間は、上限に
1時間、上限から下限への移行に2時間、下限に1時間
、及び下限から上限への移行に2時間の合計6時間であ
る。静電潜像担持体は適当なサイクル数の温度湿度サイ
クル試験を受けた後、80℃の恒温槽で30分間加熱さ
れて測定条件を均一にされた後、その特性が測定される
。In the paper passing test, an electrostatic latent image carrier is installed in a copying machine, a copy image is transferred through copy paper, and the number of sheets in which image deletion occurs is observed. The temperature/humidity cycle test was conducted under the following conditions: the upper limit was 60°C and the humidity was 90%, and the lower limit was -10°C, and the humidity was as high as possible. The time required for one cycle of the temperature/humidity cycle test is 1 hour for the upper limit, 2 hours for the transition from the upper limit to the lower limit, 1 hour for the lower limit, and 2 hours for the transition from the lower limit to the upper limit, for a total of 6 hours. After the electrostatic latent image carrier is subjected to a temperature/humidity cycle test for an appropriate number of cycles, it is heated in a constant temperature bath at 80° C. for 30 minutes to equalize measurement conditions, and then its characteristics are measured.
斯る通紙試験及び温度湿度サイクル試験の結果を下表に
記す。The results of the paper passing test and temperature/humidity cycle test are shown in the table below.
(ト1 発明の効果
本発明は以上の説明から明らかな・如く、支持体の導電
表面と光導電層との間にアモルファスシリコンと合金化
したシリサイド層を設けることによって、斯るシリサイ
ド層は光導電層の支持体に対する付着力を高めるべく作
用するので、長時間の使用や環境の変化による光導電層
の浮き上がりや剥離事故を抑圧することができる。また
、シリサイド層は従来のアモルファスシリコン系の阻止
層に較べ仕事関数が大きいので、支持体からのキャリア
の流入を阻止する効率も向上し、静電潜像担持体の光導
電特性及び信頼性を著しく改善し得る。(1) Effects of the Invention As is clear from the above description, the present invention provides a silicide layer alloyed with amorphous silicon between the conductive surface of the support and the photoconductive layer, so that the silicide layer Since it acts to increase the adhesion of the conductive layer to the support, it can suppress lifting and peeling accidents of the photoconductive layer due to long-term use or environmental changes.Also, the silicide layer is different from conventional amorphous silicon-based Since the work function is larger than that of the blocking layer, the efficiency of blocking carrier inflow from the support is improved, and the photoconductive properties and reliability of the electrostatic latent image carrier can be significantly improved.
図面はいずれも本発明の実施例を示すもので、第1図、
第5図は静電潜像担持体の部分拡大断面図、第2図はプ
ラズマCVD装置を示す模式図である。
(1)・・・支持体、(2)・・・シリサイド層、(3
)・・・光導電層。The drawings all show embodiments of the present invention; FIG.
FIG. 5 is a partially enlarged sectional view of the electrostatic latent image carrier, and FIG. 2 is a schematic diagram showing a plasma CVD apparatus. (1) Support, (2) Silicide layer, (3
)...Photoconductive layer.
Claims (1)
リコンと合金化してシリサイドを形成するシリサイド層
と、アモルファスシリコンを主成分とする光導電層をこ
の順序で積層したことを特徴とする静電潜像担持体。(1) An electrostatic latent image characterized in that a silicide layer that is alloyed with at least amorphous silicon to form a silicide and a photoconductive layer whose main component is amorphous silicon are laminated in this order on the conductive surface of a support. carrier.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP774385A JPS61166552A (en) | 1985-01-19 | 1985-01-19 | Electrostatic latent image carrying body |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP774385A JPS61166552A (en) | 1985-01-19 | 1985-01-19 | Electrostatic latent image carrying body |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61166552A true JPS61166552A (en) | 1986-07-28 |
Family
ID=11674179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP774385A Pending JPS61166552A (en) | 1985-01-19 | 1985-01-19 | Electrostatic latent image carrying body |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61166552A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61272757A (en) * | 1985-05-28 | 1986-12-03 | Ricoh Co Ltd | Electrophotographic sensitive body |
JPS63218967A (en) * | 1986-09-03 | 1988-09-12 | Hitachi Ltd | Electrophotographic sensitive body and electrophotographic method |
CN113126190A (en) * | 2021-03-25 | 2021-07-16 | 江苏鲁汶仪器有限公司 | Distributed Bragg reflector with stable interlayer adhesion and preparation method thereof |
-
1985
- 1985-01-19 JP JP774385A patent/JPS61166552A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61272757A (en) * | 1985-05-28 | 1986-12-03 | Ricoh Co Ltd | Electrophotographic sensitive body |
JPS63218967A (en) * | 1986-09-03 | 1988-09-12 | Hitachi Ltd | Electrophotographic sensitive body and electrophotographic method |
CN113126190A (en) * | 2021-03-25 | 2021-07-16 | 江苏鲁汶仪器有限公司 | Distributed Bragg reflector with stable interlayer adhesion and preparation method thereof |
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