JPS61165456U - - Google Patents
Info
- Publication number
- JPS61165456U JPS61165456U JP5016385U JP5016385U JPS61165456U JP S61165456 U JPS61165456 U JP S61165456U JP 5016385 U JP5016385 U JP 5016385U JP 5016385 U JP5016385 U JP 5016385U JP S61165456 U JPS61165456 U JP S61165456U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- holder
- engages
- hole
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 4
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Transducers For Ultrasonic Waves (AREA)
Description
第1図はこの考案の一実施例を示す平面図、第
2図は第1図の側面図、第3図は従来の超音波探
触子装置を示す平面図、第4図は第3図の側面図
である。
図において、1は探触子を内蔵するホルダ、2
は探触子、3はホルダを保持するフレーム、4は
フレームにホルダを保持するピン、5はフレーム
にピンを固定する止めねじ、6は被検材の表面、
7はピン、8はスプリング、9はピンとスプリン
グを保持するブロツク、10はブロツクをフレー
ムに固定する止めねじである。なお、各図中同一
符号は同一または相当部分を示す。
Fig. 1 is a plan view showing an embodiment of this invention, Fig. 2 is a side view of Fig. 1, Fig. 3 is a plan view showing a conventional ultrasonic probe device, and Fig. 4 is Fig. 3. FIG. In the figure, 1 is a holder containing a probe, 2
is a probe, 3 is a frame that holds the holder, 4 is a pin that holds the holder to the frame, 5 is a set screw that fixes the pin to the frame, 6 is the surface of the material to be tested,
7 is a pin, 8 is a spring, 9 is a block that holds the pin and spring, and 10 is a set screw that fixes the block to the frame. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
傷する超音波探触子装置において、上記被検材と
当接する択探触子を内蔵し両側に穴を有するホル
ダと、このホルダが被検材の搬送方向とは直角な
軸まわりに回転可能なように上記ホルダの片方の
穴に係合する第1のピンと、他方の穴に係合する
第2のピンと、この第2のピンがホルダより着脱
自在となるように上記ホルダの方向に押し付ける
スプリングと、このスプリングを保持するブロツ
クと、上記第1のピン、上記第2のピン、および
上記ブロツクが取付けられているフレームとで構
成したことを特徴とする超音波探触子装置。 In an ultrasonic probe device that automatically detects flaws in test materials such as pipes and round bars using ultrasonic waves, there is a holder with a built-in selective probe that comes into contact with the test material and has holes on both sides, and this holder. A first pin that engages with one hole of the holder so as to be rotatable around an axis perpendicular to the conveying direction of the test material, a second pin that engages with the other hole, and a second pin that engages with the other hole. A spring that presses the pin toward the holder so that the pin can be detached from the holder, a block that holds the spring, and a frame to which the first pin, the second pin, and the block are attached. An ultrasonic probe device characterized by comprising:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5016385U JPS61165456U (en) | 1985-04-04 | 1985-04-04 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5016385U JPS61165456U (en) | 1985-04-04 | 1985-04-04 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61165456U true JPS61165456U (en) | 1986-10-14 |
Family
ID=30568040
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5016385U Pending JPS61165456U (en) | 1985-04-04 | 1985-04-04 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61165456U (en) |
-
1985
- 1985-04-04 JP JP5016385U patent/JPS61165456U/ja active Pending
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