JPS61158884U - - Google Patents

Info

Publication number
JPS61158884U
JPS61158884U JP4278385U JP4278385U JPS61158884U JP S61158884 U JPS61158884 U JP S61158884U JP 4278385 U JP4278385 U JP 4278385U JP 4278385 U JP4278385 U JP 4278385U JP S61158884 U JPS61158884 U JP S61158884U
Authority
JP
Japan
Prior art keywords
leakage current
under test
semiconductor device
output
device under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4278385U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4278385U priority Critical patent/JPS61158884U/ja
Publication of JPS61158884U publication Critical patent/JPS61158884U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP4278385U 1985-03-25 1985-03-25 Pending JPS61158884U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4278385U JPS61158884U (enExample) 1985-03-25 1985-03-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4278385U JPS61158884U (enExample) 1985-03-25 1985-03-25

Publications (1)

Publication Number Publication Date
JPS61158884U true JPS61158884U (enExample) 1986-10-02

Family

ID=30553850

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4278385U Pending JPS61158884U (enExample) 1985-03-25 1985-03-25

Country Status (1)

Country Link
JP (1) JPS61158884U (enExample)

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