JPS61145422A - Temperature measurement and determination of emissivity by emission spectrum analysis - Google Patents
Temperature measurement and determination of emissivity by emission spectrum analysisInfo
- Publication number
- JPS61145422A JPS61145422A JP59267529A JP26752984A JPS61145422A JP S61145422 A JPS61145422 A JP S61145422A JP 59267529 A JP59267529 A JP 59267529A JP 26752984 A JP26752984 A JP 26752984A JP S61145422 A JPS61145422 A JP S61145422A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- emissivity
- lambda
- equation
- minimum value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009529 body temperature measurement Methods 0.000 title abstract description 8
- 238000000295 emission spectrum Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 claims description 10
- 230000005855 radiation Effects 0.000 claims description 6
- 238000010183 spectrum analysis Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000007711 solidification Methods 0.000 description 2
- 230000008023 solidification Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
- G01J5/602—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature using selective, monochromatic or bandpass filtering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/802—Calibration by correcting for emissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0074—Radiation pyrometry, e.g. infrared or optical thermometry having separate detection of emissivity
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は、被測定物体の表面温度を放射率に関する情報
なしにその放射エネルギを３以上の複数の波長毎に測定
することにより非接触にて決定することを特徴とする放
射スペクトル解析による温度測定法及び放射率の決定法
に関する。Detailed Description of the Invention (Field of Industrial Application) The present invention measures the surface temperature of an object to be measured in a non-contact manner by measuring its radiant energy at each of three or more wavelengths without information regarding emissivity. The present invention relates to a temperature measurement method and a method for determining emissivity by radiation spectrum analysis, which are characterized in that the temperature is determined by radiation spectrum analysis.
（従来の技？！！ｒ）
ある温度Ｔ８に加熱され所定の垂直放射率ｇｇｓ（λ）
（以下単に放射率１．（λ）という。ンの被測定物体の
面から放射される垂直放射強度１．（λ）は、ウィーン
の式によれば光学的装置により測定される放射エネルギ
に対応する電気的量Ｉｆ！、（λ）と次式のように関係
づけられる。(Conventional technique?!!r) Heated to a certain temperature T8 and given a predetermined vertical emissivity ggs(λ)
(hereinafter simply referred to as emissivity 1.(λ)). The vertical radiation intensity 1.(λ) emitted from the surface of the object to be measured corresponds to the radiant energy measured by an optical device according to Wien's equation. It is related to the electrical quantity If!, (λ) as shown in the following equation.
１μ）＝Ｃ（ｌｌ＃）、λ）ｌｃＩｉｌ（λ）＝ １
、（λ）’２０１／（λ’ ｅｘｐ（Ｏ２／λＴｓ）
・・・囚
但し、’Ｉｔ’！は普遍定数
Ｏ（ω、λ）は視野立体角ω及び放射エネルギの波長λ
に関係する光学的装置定数。1μ) = C(ll#), λ)lcIil(λ) = 1
, (λ)'201/(λ' exp(O2/λTs)
...However, 'It'! is the universal constant O(ω, λ) is the viewing solid angle ω and the wavelength of radiant energy λ
Optical equipment constants related to
この０（ω、λ月ま黒体もしくは任意の温度既知の熱放
射体を加熱し、その温度Ｔｂを測定すると共に光学的装
置により被測定物体の測定のときと同じ波長λ及び視野
立体角ωにおける放射エネ・ルギに対応する電気的量１
．（λ）を測定することにより次式から求められる。This 0(ω, λ) heats a black body or any thermal radiator of known temperature, measures its temperature Tb, and uses an optical device to use the same wavelength λ and viewing solid angle ω as when measuring the object to be measured. The electrical quantity 1 corresponding to the radiated energy in
．． (λ) can be obtained from the following equation.
１、（λ）＝Ｃ（ω、λ］・Ｅｂ（λ）＝２０Ｓ ／
（λ’ −ｅｘｐ （ａｍ／λＴｂ））０（ω、λ）＝
２０１／（λ’ ＠ｘｐ （ｏｗ／λ−υ −［Ｊ３］
（２）式を固成に代入して整理すると
ｇ 、（Ｊ）＝ ８ＸＩ（−０、／λＴｂ） −１！！
、（λ）／Ｉ、（λ）・＠Ｘｐ （０２／λＴ）
＝Ｄ （λ）・ｅｘｐ （θ８／わ ・・
・（９）但し、Ｄｓ（λ）＝ｅｘｐ （−ａｔ ／λＴ
ｂ）ψｍ、（乃／Ｅｂ（λ）
は分光測定により得られる放射エネル
ギに対応する無次元量。1, (λ)=C(ω,λ]・Eb(λ)=20S/
(λ' −exp (am/λTb))0(ω,λ)=
201/(λ' @xp (ow/λ−υ −[J3]
Substituting equation (2) into solidification and rearranging it, g, (J) = 8XI (-0, /λTb) -1! !
, (λ)/I, (λ)・@Xp (02/λT) =D (λ)・exp (θ8/wa ・・
・(9) However, Ds(λ)=exp (-at /λT
b) ψm, (no/Eb(λ)) is a dimensionless quantity corresponding to the radiant energy obtained by spectroscopic measurement.
が得られる。is obtained.
この０式を見れば明らかなように、Ｄｓは光学的装置に
よって測定されるが、放射率ε８（λ）と温度相当項θ
８が未知数として入っており、放射率が判らないとその
ときの被測定物体の真の温度Ｔ。As is clear from this equation 0, Ds is measured by an optical device, but the emissivity ε8(λ) and the temperature equivalent term θ
8 is included as an unknown quantity, and if the emissivity is not known, the true temperature T of the object to be measured at that time.
が測定できない。cannot be measured.
そこで、従来、温度？、の被測定物体からの放射エネル
ギのうち、放射率ｇ、（λ）が余り変化しない２つの波
長における放射強度１．（乃をそれぞれ■式に代入して
比をとることにより温度′ｒ８を求める２色温度計によ
る温度測定法が知られている。So, conventionally, temperature? Of the radiant energy from the measured object of , the radiant intensities at two wavelengths where the emissivity g and (λ) do not change much. (A temperature measurement method using a two-color thermometer is known in which the temperature 'r8 is determined by substituting each of the values into the equation (2) and taking the ratio.
他方、多重反射による測定面の黒体化を行なう方法も知
られている。On the other hand, a method is also known in which the measurement surface is made into a black body by multiple reflections.
（発明が解決しようとする問題点）
２色温度計は、実際には放射率が放射エネルギの波長に
よって一定ではないので、測温精度の点で好ましくない
。また、多重反対による方法は高精度の測温を可能とす
るが、測定環境に関する制約を受ける不都合がある。(Problems to be Solved by the Invention) A two-color thermometer is not preferable in terms of temperature measurement accuracy because the emissivity is not actually constant depending on the wavelength of the radiant energy. Further, although the method using multiplexing enables highly accurate temperature measurement, it has the disadvantage of being subject to restrictions regarding the measurement environment.
本発明は、従来のかかる不都合を解消した温度測定法及
び放射率の決定法を提供することをその目的としたもの
である。An object of the present invention is to provide a temperature measurement method and an emissivity determination method that eliminate these conventional disadvantages.
（問題点を解決するための手段）
本発明は、（１）光学的装置を用いて黒体もしくけ任意
の温度既知の熱放射体のある温度Ｔｂにおける所定波長
λの放射エネルギｉｂ（λ）に対応する電気的量］ｌ１
ｂ（λ）と被測定物体のある温度Ｔｓにおける前記所定
波長λの放射エネルギー。（λ）に対応する電気的量ｍ
、（λ）を測定すること。(Means for Solving the Problems) The present invention provides (1) using an optical device to create a black body and generate radiant energy ib(λ) of a predetermined wavelength λ at a certain temperature Tb of a thermal radiator of known temperature. electrical quantity corresponding to]l1
b(λ) and the radiant energy of the predetermined wavelength λ at a certain temperature Ts of the object to be measured. Electrical quantity m corresponding to (λ)
, (λ).
（２） Ｋｂ（λ）及びＫ１１（λ）を用いて被測定
物体の前記温度Ｔ８とその温度Ｔ８における放射率ｇ、
（λ）との関係式
％式％
：
を導出すること。(2) Using Kb(λ) and K11(λ), calculate the temperature T8 of the object to be measured and the emissivity g at that temperature T8,
To derive the relational expression % expression %: with (λ).
（３）＠式から求めた Ｄ Ｃ，２）＝ｚａＣλ）・ｅ
ｘｐ（−θ８／λ）と、温度！及びその温度Ｔにおける
放射率ｇ（λ）の関係式
％式％）
ε（λ）＝ε８（λ）・ｅｘｐ（（θ−θｇ）／λ）
・・・回を導出するこ゛と。但し θ＝ａ、／Ｔ（
４）前記０式から前記温度Ｔｓにおける放射率と仮定す
ること。但しｂｋ： ｍ 、（λ）、 Ｉｂ四Ｔｓ等で
定まる係数。(3) D C,2)=zaCλ)・e obtained from @formula
xp(-θ8/λ) and temperature! and the relational expression of emissivity g(λ) at temperature T: ε(λ)=ε8(λ)・exp((θ−θg)/λ)
...We will derive the times. However, θ=a, /T(
4) Assuming the emissivity at the temperature Ts from the above equation 0. However, bk: A coefficient determined by m, (λ), Ib4Ts, etc.
（５）温度Ｔを走査して前記■式から各温度Ｔにおける
放射率ｅ（λ）を求め、この各放射率８（λ）と開式か
ら求めた温度で８における放射率ｇ、（λ）との差の２
乗値を残差として求めること。(5) Scan the temperature T and find the emissivity e(λ) at each temperature T from the formula (■) above, and use the emissivity g, (λ ) the difference between
Find the multiplicative value as the residual.
（６）該残差が極小値を示すように前記■式の次数ｎを
選定し、該残差の極小値に対応するθを求めること。(6) Select the order n of the equation (2) above so that the residual shows a minimum value, and find θ corresponding to the minimum value of the residual.
（７）該残差の極小値に対応する０から真の温度Ｔ８を
求めること。(7) Find the true temperature T8 from 0 corresponding to the minimum value of the residual.
が行なわれることを特徴とする。It is characterized by being carried out.
（実施例）
固成から明らかなように、一般に、被測定物体の放射率
ε（λ）とその温度でとの間には、ｇｓ（λ）＝Ｄ（λ
）・ ｅｘｐ （θ／λ）、但し、θ＝Ｏｔ ／ Ｔ
の関係がある。(Example) As is clear from the solidification, in general, the relationship between the emissivity ε(λ) of the object to be measured and the emissivity at that temperature is gs(λ)=D(λ
)・exp (θ/λ), where θ=Ot/T
There is a relationship between
先ずこの式に助成から求めたＤｓ（λ）＝ｇ、（λ）・
ｓｚｐ （−θａ／λ）を代入して
ｇｓ（λ）＝ε（λ）＠ｅｘｐ （（θ−ａ１１） ／
λ） ・（１）１を導出する。First, Ds (λ) = g, (λ)・calculated from the subsidy using this formula.
Substituting szp (-θa/λ), gs(λ)=ε(λ)@exp ((θ-a11)/
λ) ・(1) Derive 1.
この式において温度Ｔを走査してθを真の温度Ｔｓに対
応するθ８とすればそのときの放射率ｅ（λ）はεｓ（
λ）となる。そこで真の温度Ｔｓにおける放射率εｓ（
λ）についてのω式を波長λについてのｎ次式
％式％［）：）
但し、ｂｏ、 ｂ、 ・−はＩ、（λ）、 Ｅ＋ｂ（λ
）、Ｔ８等で定まる係数。In this equation, if the temperature T is scanned and θ is set to θ8 corresponding to the true temperature Ts, then the emissivity e(λ) is εs(
λ). Therefore, the emissivity εs(
The ω formula for wavelength λ is converted into the n-dimensional formula % formula %[):) However, bo, b, ・- is I, (λ), E+b(λ
), a coefficient determined by T8, etc.
と仮定し、この画成のε、（λ）を０式に代入して温度
Ｔにおける放射率１（λ）についての■式を波長λにつ
いてのｍ次式
％式％
で定まる係数。Assuming that, by substituting ε and (λ) of this definition into the equation 0, the equation (2) for the emissivity 1 (λ) at the temperature T is a coefficient determined by the m-order equation % equation % for the wavelength λ.
とし、■式と■式とから走査温度毎に残差Ｓ＝（ε（λ
）−陥（λ））ｔを算出する。この残差Ｓが極小値とな
る温度Ｔは前述のように真の温度Ｔ８である。Then, from formulas ■ and formulas, the residual S = (ε(λ
)−defect(λ))t is calculated. The temperature T at which this residual difference S becomes the minimum value is the true temperature T8, as described above.
尚、ｇｌｌ（λ）の次数ｎ及びｅ（λ）の次数ｍは、残
差Ｓが極小値となるときが最適の次数で、そのときの波
長λについて関数形が実際の放射率ε８（λ）である。Note that the order n of gll(λ) and the order m of e(λ) are the optimal orders when the residual S becomes the minimum value, and the functional form for the wavelength λ at that time is the actual emissivity ε8(λ ).
かくて、加熱された被測定物体の未知の温度Ｔ８は、光
学的装置によりこの物体から放射される放射エネルギの
波長λの放射強度１８（λ）及び温度Ｔｂにおける黒体
から放射される放射エネルギの波長λの放射強度１ｂ（
λ）をそれぞれ電気的ｆｆ１ｘ、（λ）及びに、（λ）
として測定し、このＶｓ（λ）及び１１ｉｂ（λ）を用
いて前述のような計算をすることにより求めることがで
きる。なお、］Ｉ！ｂ（λ）はセンサ及び光学系の波長
特性を求めるための量であり、あらかじめ較正しておけ
ばよい。Thus, the unknown temperature T8 of the heated object to be measured is determined by the radiation intensity 18 (λ) of the radiant energy emitted from this object by the optical device at the wavelength λ and the radiant energy emitted from the black body at the temperature Tb. The radiation intensity 1b(
λ) respectively electrical ff1x, (λ) and (λ)
It can be determined by calculating as described above using Vs(λ) and 11ib(λ). In addition,] I! b(λ) is a quantity for determining the wavelength characteristics of the sensor and optical system, and may be calibrated in advance.
第１図は、加熱された被測定物体について、ε８（λ）
＝ｂ０＋ｂ１λ、ε（λ）＝ ＩＬＱ ＋ ＆、λ十ａ
ｌＦ＋・・・・・・＋ ａ、Ｊ （ｍ＝１．２．５）
とし、温度Ｔを１２００〜１４５０°Ｘの範囲で走査し
たときの前記残差Ｓの対数特性を示す。Figure 1 shows ε8(λ) for a heated object to be measured.
=b0+b1λ, ε(λ)=ILQ+&,λ10a
IF+...+ a, J (m=1.2.5)
The logarithmic characteristic of the residual S when the temperature T is scanned in the range of 1200 to 1450°X is shown.
ｍ＝１．ｍ＝２のうち特にｍ＝１の特性曲線が１３００
’にで極小値を示した。m=1. Especially the characteristic curve of m=1 among m=2 is 1300
It showed a minimum value at '.
この特性により加熱された被測定物体の温度は１３００
０にであることが測定され、この物体の放射率ｅ（λ）
は第３図のＡで示すように波長に対して直線を示した。Due to this characteristic, the temperature of the heated object to be measured is 1300
The emissivity of this object is measured to be 0, e(λ)
shows a straight line with respect to wavelength, as shown by A in FIG.
第２図は他の被測定物体について、す（λ）＝ｂ、＋ｂ
、λ十ｂｔ ２” ＋ｂ３λ３１ｇ（λ）＝１゜＋ＩＬ
１λ＋・・・・・・−λ （ｍ＝２．５，４．５）とし
、温度Ｔを１２００〜１４５０°Ｘの範囲で走査したと
きの残差Ｓの特性曲線を示す。Figure 2 shows other objects to be measured, S(λ)=b, +b
, λ0bt 2” +b3λ31g(λ)=1°+IL
1λ+...-λ (m=2.5, 4.5), and shows a characteristic curve of the residual S when scanning the temperature T in the range of 1200 to 1450°X.
ｍ ＝ ５の特性曲線が１３００°にで極小値を示した
。The characteristic curve for m = 5 showed a minimum value at 1300°.
この特性により被測定物体の温度は１３００’にであり
、この物体の放射率６（λ）は第３図のＢに示すように
波長に対して一極値曲線を示した。Due to this characteristic, the temperature of the object to be measured was 1300', and the emissivity 6 (λ) of this object showed a one-extreme curve with respect to wavelength, as shown in B in FIG.
次表は白金板について、本発明の方法及び２色温度計に
よる方法で測定した温度と熱電対で測定した温度との対
比を４つの温度について示す。The following table shows the comparison between the temperature measured by the method of the present invention and the method using a two-color thermometer and the temperature measured by a thermocouple for four temperatures on a platinum plate.
表
（発明の効果ン
本発明によれば、測温精度を高めることができると共に
測定環境についての制約を受けることがない効果を有す
る。さらに放射率に関するオンサイトの情報も得られる
。Effects of the Invention According to the present invention, temperature measurement accuracy can be improved and there is no restriction on the measurement environment.In addition, on-site information regarding emissivity can be obtained.
第１図及び第２図は、それぞれ本発明により温度を測定
するための温度を走査したときの残差特性図、第３図は
本発明により求めた波長に対する放射率特性図を示す。
Ｓ・・・残 差
Ｔ・・・温 度
ε・・・垂直放射率
λ・・・波 長
特許出願人 真空理工株式会社
仝 上 徳 １） 昌 則仝
上 小 林 三 部外２石 −
萬１５１ｉ
第２図
１２００ ■刀 １久υ じ
にン第３図1 and 2 are residual characteristic diagrams when scanning temperature for measuring temperature according to the present invention, respectively, and FIG. 3 is a diagram showing emissivity characteristics with respect to wavelength determined according to the present invention. S...Residual T...Temperature ε...Vertical emissivity λ...Wavelength Patent applicant: Shinku Riko Co., Ltd. 1) Noriyoshi Masa
Upper Kobayashi 3 outside 2 koku - 151i 1200 Figure 2 Sword 1 Kyuu Jinin Figure 3
Claims (7)
の熱放射体のある温度Ｔ＿ｂにおける所定波長λの放射
エネルギｉ＿ｂ（λ）に対応する電気的量Ｅ＿ｂ（λ）
と被測定物体のある温度Ｔ＿ｓにおける前記所定波長λ
の放射エネルギｉ＿ｓ（λ）に対応する電気的量Ｅ＿ｓ
（λ）を測定すること。(1) Electrical quantity E_b(λ) corresponding to radiant energy i_b(λ) of a predetermined wavelength λ at a certain temperature T_b of a black body or any thermal radiator of known temperature using an optical device.
and the predetermined wavelength λ at a certain temperature T_s of the object to be measured
The electrical quantity E_s corresponding to the radiant energy i_s(λ) of
(λ).
体の前記温度Ｔ＿ｓとの温度Ｔ＿ｓにおける放射率ｇ＿
ｓ（λ）との関係式 ε＿ｓ（λ）＝Ｄ＿ｓ（λ）・ｅｘｐ（θ＿ｓ／λ）・
・・〔Ｃ〕但し、Ｄ＿ｓ（λ）＝ｅｘｐ（−Ｃ＿２／λ
Ｔ＿ｂ）・Ｅ＿ｓ（λ）Ｅ＿ｂ（λ）θ＿ｓ＝Ｃ＿２／
Ｔ＿ｓ（Ｃ＿２：定数） を導出すること。(2) Emissivity g_ at temperature T_s of the measured object using E_b(λ) and E_s(λ)
Relational expression with s(λ) ε_s(λ)=D_s(λ)・exp(θ_s/λ)・
... [C] However, D_s(λ)=exp(-C_2/λ
T_b)・E_s(λ)E_b(λ)θ_s=C_2/
Derive T_s(C_2: constant).
・ｅｘｐ（−θ＿ｓ／λ）と、温度Ｔ及びその温度Ｔに
おける放射率ε（λ）の関係式 ε（λ）＝Ｄ（λ）・ｅｘｐ（θ／λ）とからε（λ）
＝ε＿ｓ（λ）・ｅｘｐ（（θ−θ＿ｓ）／λ）・・・
〔Ｄ〕を導出すること。但しθ＝Ｃ＿２／Ｔ(3) D_s(λ)=g_s(λ) obtained from [C] formula
・ε(λ) from the relational expression ε(λ)=D(λ)・exp(θ/λ) between exp(−θ_s/λ) and temperature T and emissivity ε(λ) at that temperature T
=ε_s(λ)・exp((θ−θ_s)/λ)...
Derive [D]. However, θ=C_2/T
ｇ＿ｓ（λ）を波長λのｎ次式ｇ＿ｓ（λ）＝Σ＾ｎ＿
ｋ＿＝＿０ｂ＿ｋλ＾ｋ・・・〔Ｅ〕と仮定すること。 但しｂ＿ｋ：Ｅ＿ｓ（λ）、Ｅ＿ｂ（λ）、Ｔ＿ｓ等で
定まる係数。(4) From the above formula [C], the emissivity g_s(λ) at the temperature T_s can be calculated using the n-dimensional formula g_s(λ)=Σ^n_
Assume that k_=_0b_kλ^k...[E]. However, b_k: a coefficient determined by E_s(λ), E_b(λ), T_s, etc.
ける放射率ｇ（λ）を求め、この各放射率ｅ（λ）と〔
Ｅ〕式から求めた温度Ｔ＿ｓにおける放射率ε＿ｓ（λ
）との差の２乗値を残差として求めること。(5) Scan the temperature T, find the emissivity g(λ) at each temperature T from the above [D] formula, and calculate each emissivity e(λ) and [
E] The emissivity ε_s(λ
) to obtain the square value of the difference between the two as the residual.
ｎを選定し、該残差の極小値に対応するθを求めること
。(6) Select the order n of the equation [E] so that the residual shows a minimum value, and find θ corresponding to the minimum value of the residual.
を求めること。 が行なわれることを特徴とする放射スペクトル解析によ
る温度測定法及び放射率の決定法。(7) True temperature T_s from θ corresponding to the minimum value of the residual
to seek. A method for measuring temperature and determining emissivity by radiation spectrum analysis, characterized in that:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59267529A JPS61145422A (en) | 1984-12-20 | 1984-12-20 | Temperature measurement and determination of emissivity by emission spectrum analysis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59267529A JPS61145422A (en) | 1984-12-20 | 1984-12-20 | Temperature measurement and determination of emissivity by emission spectrum analysis |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61145422A true JPS61145422A (en) | 1986-07-03 |
Family
ID=17446094
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59267529A Pending JPS61145422A (en) | 1984-12-20 | 1984-12-20 | Temperature measurement and determination of emissivity by emission spectrum analysis |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61145422A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19757447A1 (en) * | 1997-12-23 | 1999-07-01 | Braun Gmbh | Temperature calculation method for radiation thermometers |
-
1984
- 1984-12-20 JP JP59267529A patent/JPS61145422A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19757447A1 (en) * | 1997-12-23 | 1999-07-01 | Braun Gmbh | Temperature calculation method for radiation thermometers |
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