JPS6114469B2 - - Google Patents

Info

Publication number
JPS6114469B2
JPS6114469B2 JP7191278A JP7191278A JPS6114469B2 JP S6114469 B2 JPS6114469 B2 JP S6114469B2 JP 7191278 A JP7191278 A JP 7191278A JP 7191278 A JP7191278 A JP 7191278A JP S6114469 B2 JPS6114469 B2 JP S6114469B2
Authority
JP
Japan
Prior art keywords
frequency
transistor
signal
terminal
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7191278A
Other languages
English (en)
Japanese (ja)
Other versions
JPS54162474A (en
Inventor
Kazuhiko Honjo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP7191278A priority Critical patent/JPS54162474A/ja
Publication of JPS54162474A publication Critical patent/JPS54162474A/ja
Publication of JPS6114469B2 publication Critical patent/JPS6114469B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP7191278A 1978-06-13 1978-06-13 Measuring unit for ultra-high frequency transistor characteristics Granted JPS54162474A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7191278A JPS54162474A (en) 1978-06-13 1978-06-13 Measuring unit for ultra-high frequency transistor characteristics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7191278A JPS54162474A (en) 1978-06-13 1978-06-13 Measuring unit for ultra-high frequency transistor characteristics

Publications (2)

Publication Number Publication Date
JPS54162474A JPS54162474A (en) 1979-12-24
JPS6114469B2 true JPS6114469B2 (en, 2012) 1986-04-18

Family

ID=13474213

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7191278A Granted JPS54162474A (en) 1978-06-13 1978-06-13 Measuring unit for ultra-high frequency transistor characteristics

Country Status (1)

Country Link
JP (1) JPS54162474A (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01168960U (en, 2012) * 1988-05-19 1989-11-29

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01168960U (en, 2012) * 1988-05-19 1989-11-29

Also Published As

Publication number Publication date
JPS54162474A (en) 1979-12-24

Similar Documents

Publication Publication Date Title
US6639393B2 (en) Methods and apparatus for time-domain measurement with a high frequency circuit analyzer
US20120007605A1 (en) High frequency measurement system
CN107271938B (zh) 一种混频器矢量特性测量方法
CN104375011B (zh) 一种用于矢量网络分析仪材料测试的任意阻抗测试电路及方法
CN103684490A (zh) 基于矢量网络分析仪的无源互调异常点快速定位方法
US7002335B2 (en) Method for measuring a three-port device using a two-port vector network analyzer
Teppati et al. Recent advances in real-time load-pull systems
EP0265073B1 (en) Test arrangement
Hughes et al. Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices
CN109150332B (zh) 一种利用矢量谐波预测量无源互调的装置和方法
CN106788784A (zh) 动态无源互调参考信号发生器
EP3857240B1 (en) Millimeter wave active load pull using low frequency phase and amplitude tuning
US11193966B1 (en) Low frequency active load pull tuner
EP0234111B1 (en) Six-port reflectometer test arrangement
JPS6114469B2 (en, 2012)
Dudkiewicz Vector-receiver load pull measurements
CN116455483B (zh) 用于旋磁器件三阶互调电平测试系统及测试方法
Dvorak et al. Removal of time-varying errors in network-analyser measurements: signal normalisation and test results
CN111579874B (zh) 一种高反射度器件的热态阻抗测试系统
Bunea et al. Characterization of 3-port SAW diplexers using 2-port VNA measurements
Saurer et al. Technique for load-independent millimeter-wave output power monitoring for mass-volume testing
Roth et al. Vector corrected on-wafer power measurements of frequency converting two-ports
Kishikawa Measurement Uncertainty Estimation Method for Passive Source/Load Pull
Liu et al. Load pull characterization system for differential devices
JP2698111B2 (ja) マイクロ波半導体素子の特性測定装置及び方法