JPS61125776U - - Google Patents
Info
- Publication number
- JPS61125776U JPS61125776U JP917985U JP917985U JPS61125776U JP S61125776 U JPS61125776 U JP S61125776U JP 917985 U JP917985 U JP 917985U JP 917985 U JP917985 U JP 917985U JP S61125776 U JPS61125776 U JP S61125776U
- Authority
- JP
- Japan
- Prior art keywords
- chip
- probe card
- probe
- pad
- contact portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 11
- 230000002950 deficient Effects 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000005452 bending Methods 0.000 claims 1
- 239000003550 marker Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP917985U JPS61125776U (enExample) | 1985-01-28 | 1985-01-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP917985U JPS61125776U (enExample) | 1985-01-28 | 1985-01-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61125776U true JPS61125776U (enExample) | 1986-08-07 |
Family
ID=30489152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP917985U Pending JPS61125776U (enExample) | 1985-01-28 | 1985-01-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61125776U (enExample) |
-
1985
- 1985-01-28 JP JP917985U patent/JPS61125776U/ja active Pending