JPS61122581U - - Google Patents
Info
- Publication number
- JPS61122581U JPS61122581U JP487785U JP487785U JPS61122581U JP S61122581 U JPS61122581 U JP S61122581U JP 487785 U JP487785 U JP 487785U JP 487785 U JP487785 U JP 487785U JP S61122581 U JPS61122581 U JP S61122581U
- Authority
- JP
- Japan
- Prior art keywords
- reset
- circuit
- signal
- reset signal
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000004044 response Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985004877U JPH0733179Y2 (ja) | 1985-01-18 | 1985-01-18 | デイジタル回路の試験用リセツト回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985004877U JPH0733179Y2 (ja) | 1985-01-18 | 1985-01-18 | デイジタル回路の試験用リセツト回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61122581U true JPS61122581U (OSRAM) | 1986-08-01 |
| JPH0733179Y2 JPH0733179Y2 (ja) | 1995-07-31 |
Family
ID=30480872
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985004877U Expired - Lifetime JPH0733179Y2 (ja) | 1985-01-18 | 1985-01-18 | デイジタル回路の試験用リセツト回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0733179Y2 (OSRAM) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57197480A (en) * | 1981-05-29 | 1982-12-03 | Seiko Instr & Electronics Ltd | Test circuit for integrated circuit |
-
1985
- 1985-01-18 JP JP1985004877U patent/JPH0733179Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57197480A (en) * | 1981-05-29 | 1982-12-03 | Seiko Instr & Electronics Ltd | Test circuit for integrated circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0733179Y2 (ja) | 1995-07-31 |