JPS6111686Y2 - - Google Patents

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Publication number
JPS6111686Y2
JPS6111686Y2 JP11019582U JP11019582U JPS6111686Y2 JP S6111686 Y2 JPS6111686 Y2 JP S6111686Y2 JP 11019582 U JP11019582 U JP 11019582U JP 11019582 U JP11019582 U JP 11019582U JP S6111686 Y2 JPS6111686 Y2 JP S6111686Y2
Authority
JP
Japan
Prior art keywords
distance
specimen
phase contrast
objective lens
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11019582U
Other languages
Japanese (ja)
Other versions
JPS58149708U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11019582U priority Critical patent/JPS58149708U/en
Publication of JPS58149708U publication Critical patent/JPS58149708U/en
Application granted granted Critical
Publication of JPS6111686Y2 publication Critical patent/JPS6111686Y2/ja
Granted legal-status Critical Current

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  • Microscoopes, Condenser (AREA)

Description

【考案の詳細な説明】 本考案は位相差顕微鏡の自動合焦装置に関す
る。
[Detailed Description of the Invention] The present invention relates to an automatic focusing device for a phase contrast microscope.

従来の顕微鏡の自動合焦装置はステージと対物
レンズとの相対距離を変化させつつ光電手段が対
物レンズによる標本像を光電変換しその像のコン
トラストを検出しこのコントラストが最大となる
様に上記相対距離を制御するものであつた。
Conventional automatic focusing devices for microscopes change the relative distance between the stage and the objective lens while the photoelectric means photoelectrically converts the sample image formed by the objective lens, detects the contrast of the image, and adjusts the relative distance so that the contrast is maximized. It was meant to control distance.

ところが、本考案者はこの種の自動合焦装置を
位相差顕微鏡と共に使用してみたところ、この自
動合焦装置が合焦状態として制御した上記相対距
離と、接眼レンズを通して標本像を肉眼観察しな
がら手動焦点調節を行つたときの上記相対距離と
は一致しないこと、即ち自動合焦装置が自動合焦
制御した状態での標本像を肉眼観察するとその標
本像は不鮮明であることを発見した。このように
従来のこの種の自動合焦装置は位相差顕微鏡には
使用できないものであつた。
However, when the present inventor tried using this type of automatic focusing device together with a phase contrast microscope, he found that the relative distance controlled by this automatic focusing device as the in-focus state and the specimen image observed with the naked eye through the eyepiece. However, it was discovered that the above-mentioned relative distance does not match when manual focus adjustment is performed, that is, when the specimen image is observed with the naked eye under the automatic focusing control of the automatic focusing device, the specimen image is unclear. As described above, conventional automatic focusing devices of this type cannot be used in phase contrast microscopes.

そこで、本考案の目的は、位相差顕微鏡の自動
合焦を可能とする自動合焦装置を提供することで
ある。
Therefore, an object of the present invention is to provide an automatic focusing device that enables automatic focusing of a phase contrast microscope.

本考案者は数多くの実験に基づく鋭意研究の結
果、標本像コントラストが最大であると光電検出
した時の対物レンズとステージとの相対距離は、
肉眼で手動焦点調節した時の上記相対距離と或る
値だけ相違しておりこの値は位相差顕微鏡と標本
との関係によつて定まる定数であることを見出し
た。これに基づき本考案の要旨は位相差顕微鏡の
自動合焦装置が、位相差顕微鏡の対物レンズとス
テージ上の標本との相対距離を変化させつつ対物
レンズによる標本の標本像を光電変換する光電変
換手段と、この光電変換手段の出力から標本像の
最大コントラストを検出する検出手段と、位相差
顕微鏡と標本との関係で定まる一定の補正距離を
外部からの操作により導入する外部導入部と、検
出手段が最大コントラストを検出した時の標本と
対物レンズとの相対距離に前記補正係数を加えて
合焦距離を定める制御手段と、ステージと対物レ
ンズとの少なくとも一方を駆動して両者間の距離
を合焦距離に自動的に一致させる駆動手段とを含
んでなるようにしたのである。
As a result of intensive research based on numerous experiments, the inventor of this invention found that the relative distance between the objective lens and the stage when photoelectrically detected is the maximum specimen image contrast.
It has been found that the relative distance differs by a certain value from the above-mentioned relative distance when manually adjusting the focus with the naked eye, and this value is a constant determined by the relationship between the phase contrast microscope and the specimen. Based on this, the gist of the present invention is that the automatic focusing device of the phase contrast microscope performs photoelectric conversion of the specimen image of the specimen by the objective lens while changing the relative distance between the objective lens of the phase contrast microscope and the specimen on the stage. a detection means for detecting the maximum contrast of a specimen image from the output of the photoelectric conversion means; an external introduction section for introducing a fixed correction distance determined by the relationship between the phase contrast microscope and the specimen by an external operation; a control means that determines a focusing distance by adding the correction coefficient to the relative distance between the specimen and the objective lens when the means detects the maximum contrast; and a control means that drives at least one of the stage and the objective lens to determine the distance between them. The present invention includes a driving means for automatically matching the focusing distance.

次に本考案を第1図に示した実施例に基づき詳
述する。1は固体撮像素子を組込んだカメラ、2
はサンプルアンドホールド回路、3は走査クロツ
ク発生回路である。例えばリンパ球標本の如き被
検物をステージ11に置きカメラ1との距離をそ
のステージに連結した駆動装置10と、その制御
装置9によつて変化させる。このカメラの対物レ
ンズによる被検物の画像のコントラストを測定す
るには画像を走査、光電変換して得られた電気信
号の高周波成分を抽出して積分したものを調べれ
ばよいが本例では固体撮像素子を用い、一定のク
ロツクでサンプルアンドホールドを行つている
為、単に高周波成分を抽出しても効果がない。詳
述するとサンプリングした場合サンプリング周波
数の1/2までの周波数成分に原信号の情報を復元
できるだけの情報が存在しており1/2より高い周
波数に含まれる情報はその繰り返しとなつてい
る。従つて原信号の高周波成分を抽出するにはサ
ンプリング周波数の1/2以下の周波数の内の高い
周波数成分のみ抽出する必要がある。この目的の
為にバンドパスフイルタ4が接続されている。5
は整流回路、6は積分回路、7は積分回路6の出
力を一定時間保持するサンプルアンドホールド回
路、8はコントローラである。
Next, the present invention will be explained in detail based on the embodiment shown in FIG. 1 is a camera incorporating a solid-state image sensor, 2
3 is a sample and hold circuit, and 3 is a scanning clock generation circuit. For example, a specimen such as a lymphocyte specimen is placed on a stage 11 and the distance from the camera 1 is varied by a drive device 10 connected to the stage and a control device 9 thereof. To measure the contrast of the image of the object to be inspected by the objective lens of this camera, it is sufficient to scan the image, extract the high-frequency components of the electrical signal obtained by photoelectric conversion, and examine the integrated result. Since an image sensor is used and sample-and-hold is performed at a constant clock, simply extracting high-frequency components has no effect. To explain in detail, when sampling, there is enough information to restore the information of the original signal in frequency components up to 1/2 of the sampling frequency, and information included in frequencies higher than 1/2 is a repetition of that information. Therefore, in order to extract the high frequency components of the original signal, it is necessary to extract only the high frequency components within frequencies that are 1/2 or less of the sampling frequency. A bandpass filter 4 is connected for this purpose. 5
6 is a rectifier circuit, 6 is an integrating circuit, 7 is a sample-and-hold circuit that holds the output of the integrating circuit 6 for a certain period of time, and 8 is a controller.

次に、この動作を説明する。 Next, this operation will be explained.

コントローラ8の指令により制御装置9と駆動
装置10がステージ11をその移動範囲の一端か
ら、カメラの光軸方向に一定のステツプずつ移動
させる。そのステツプ毎のサンプルアンドホール
ド回路7の出力Pをコントローラ8は調べる。こ
うしてステージ11がその全移動範囲を移動する
と回路7は第2図の如き出力を発生する。第2図
は横軸にステージの位置xを縦軸に回路7の出力
P即ち画像のコントラストをとつてある。コント
ローラ8は最大コントラストを与えるステージ位
置xcを記憶する。コントローラ8には、予め被
検物と位相差顕微鏡との組合せから決まる一定補
正距離xdが外部導入部12から導入されてい
る。コントローラ8は前述のxcとこのxdを加算
しこの加算値(xc+xd)出力を発生する。従つ
てこの加算値(xc+xd)はステージの合焦位置
を表わすことになる。制御装置9と駆動装置10
はこの加算値(xc+xd)出力に基づきステージ
11をこの(xc+xd)位置まで駆動し合焦させ
る。この様なコントローラ8はA/D変換回路と
マイクロコンピユータの組合せやアナログコンパ
レータとアツプダウンカウンタ等により容易に構
成できる。即ち本実施例では、固体撮像素子を組
み込んだカメラ1が光電変換手段を構成し、サン
プルアンドホールド回路2、走査クロツク発生回
路3、バンドパスフイルタ4、整流回路5及び積
分回路7が検出手段を構成し、コントローラ8が
制御手段を構成し、制御装置9及び駆動装置10
が駆動手段を構成する。尚、本実施例ではステー
ジ11を駆動したがカメラ1をその光軸方向に移
動させてもよい。
In response to commands from the controller 8, the control device 9 and the drive device 10 move the stage 11 from one end of its movement range in constant steps in the direction of the optical axis of the camera. The controller 8 examines the output P of the sample-and-hold circuit 7 for each step. When the stage 11 moves through its entire range of movement, the circuit 7 generates an output as shown in FIG. In FIG. 2, the horizontal axis represents the position x of the stage, and the vertical axis represents the output P of the circuit 7, that is, the contrast of the image. Controller 8 stores the stage position x c that provides maximum contrast. A fixed correction distance x d determined in advance from the combination of the object to be examined and the phase contrast microscope is introduced into the controller 8 from the external introduction section 12 . The controller 8 adds the aforementioned x c and this x d and generates an output of the added value (x c +x d ). Therefore, this added value (x c +x d ) represents the in-focus position of the stage. Control device 9 and drive device 10
Based on the output of this added value (x c +x d ), the stage 11 is driven to this (x c +x d ) position and focused. Such a controller 8 can be easily constructed by a combination of an A/D conversion circuit and a microcomputer, an analog comparator, an up/down counter, etc. That is, in this embodiment, a camera 1 incorporating a solid-state image sensor constitutes a photoelectric conversion means, and a sample-and-hold circuit 2, a scanning clock generation circuit 3, a bandpass filter 4, a rectification circuit 5, and an integration circuit 7 constitute a detection means. The controller 8 constitutes a control means, the control device 9 and the drive device 10
constitutes the driving means. Although the stage 11 is driven in this embodiment, the camera 1 may be moved in the direction of its optical axis.

またコントローラ8の前述の(xc+xd)出力
を表示器14に供給し、ステージ11の合焦位置
を表示するようにし、操作者がこの表示値に基づ
きステージ11を駆動することもできる。尚、外
部導入部12の出力xdの値は、各被検物毎に予
め実験により求めておく。
Furthermore, the aforementioned (x c +x d ) output of the controller 8 can be supplied to the display 14 to display the in-focus position of the stage 11, and the operator can drive the stage 11 based on this displayed value. Note that the value of the output x d of the external introduction section 12 is determined in advance by experiment for each test object.

以上本考案によると従来の焦点位置検出用光電
変換装置を利用して極めて簡単に位相差顕微鏡の
自動合焦装置を得ることができる。
As described above, according to the present invention, an automatic focusing device for a phase contrast microscope can be obtained very easily by using a conventional photoelectric conversion device for detecting a focal point position.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例のブロツク図、第2図
は被検物の対物レンズの相対距離を変えたときの
画像のコントラストを示すグラフである。 主要部分の符号の説明、1……光電変換手段、
2,3,4,5,6,7……検出手段、8……制
御手段、9,10……駆動手段、11……ステー
ジ、12……外部導入部。
FIG. 1 is a block diagram of an embodiment of the present invention, and FIG. 2 is a graph showing the contrast of images when the relative distance of the objective lens to the object to be examined is changed. Explanation of symbols of main parts, 1...Photoelectric conversion means,
2, 3, 4, 5, 6, 7... detection means, 8... control means, 9, 10... drive means, 11... stage, 12... external introduction section.

Claims (1)

【実用新案登録請求の範囲】 位相差顕微鏡の自動合焦装置であつて、 前記位相差顕微鏡の対物レンズとステージ上の
標本との相対距離を変化させつつ前記対物レンズ
による前記標本の標本像を光電変換する光電変換
手段と、 該光電変換手段の出力から前記標本像の最大コ
ントラストを検出する検出手段と、 前記位相差顕微鏡と前記標本との関係で定まる
一定の補正距離を外部からの操作により導入する
外部導入部と、 前記検出手段が最大コントラストを検出した時
の前記標本と前記対物レンズとの相対距離に前記
補正距離を加えて合焦距離を定める制御手段と、 前記ステージと前記対物レンズとの少なくとも
一方を駆動して該両者間の距離を前記合焦距離に
自動的に一致させる駆動手段と、 を含むことを特徴とする位相差顕微鏡の自動合焦
装置。
[Claims for Utility Model Registration] An automatic focusing device for a phase contrast microscope, which captures a sample image of the specimen by the objective lens while changing the relative distance between the objective lens of the phase contrast microscope and the specimen on a stage. a photoelectric conversion means for photoelectric conversion; a detection means for detecting the maximum contrast of the sample image from the output of the photoelectric conversion means; and a fixed correction distance determined by the relationship between the phase contrast microscope and the sample by an external operation. an external introduction section for introducing the object; a control means for determining a focusing distance by adding the correction distance to the relative distance between the specimen and the objective lens when the detection means detects the maximum contrast; an automatic focusing device for a phase contrast microscope, comprising: driving means for driving at least one of the two to automatically match the distance between the two to the focusing distance.
JP11019582U 1982-07-22 1982-07-22 Automatic focusing device for phase contrast microscope Granted JPS58149708U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11019582U JPS58149708U (en) 1982-07-22 1982-07-22 Automatic focusing device for phase contrast microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11019582U JPS58149708U (en) 1982-07-22 1982-07-22 Automatic focusing device for phase contrast microscope

Publications (2)

Publication Number Publication Date
JPS58149708U JPS58149708U (en) 1983-10-07
JPS6111686Y2 true JPS6111686Y2 (en) 1986-04-12

Family

ID=30101168

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11019582U Granted JPS58149708U (en) 1982-07-22 1982-07-22 Automatic focusing device for phase contrast microscope

Country Status (1)

Country Link
JP (1) JPS58149708U (en)

Also Published As

Publication number Publication date
JPS58149708U (en) 1983-10-07

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