JPS61114308U - - Google Patents
Info
- Publication number
- JPS61114308U JPS61114308U JP19946684U JP19946684U JPS61114308U JP S61114308 U JPS61114308 U JP S61114308U JP 19946684 U JP19946684 U JP 19946684U JP 19946684 U JP19946684 U JP 19946684U JP S61114308 U JPS61114308 U JP S61114308U
- Authority
- JP
- Japan
- Prior art keywords
- projection distribution
- values
- binary
- image
- burrs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
Landscapes
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
Description
第1図は本発明の一実施例の物体の欠損検出装
置の概略図、第2図は二値化した映像状態図、第
3図は投影分布情報図、第4図は二次微分による
判定PAD図である。
1……テレビカメラ、2……二値化回路、3…
…投影分布回路、4……判定回路、5……検査物
体、6……ステージ、7……照明機器。
Fig. 1 is a schematic diagram of an object defect detection device according to an embodiment of the present invention, Fig. 2 is a binarized image state diagram, Fig. 3 is a projection distribution information diagram, and Fig. 4 is determination based on second-order differentiation. It is a PAD diagram. 1...TV camera, 2...Binarization circuit, 3...
...projection distribution circuit, 4...judgment circuit, 5...test object, 6...stage, 7...lighting equipment.
Claims (1)
装置において、 二値映像を投影分布処理する手段と投影分布値
の和差からなる二次微分を判定する手段と、物体
の欠損、バリを検出する手段からなることを特徴
とする物体の欠損検出装置。[Claims for Utility Model Registration] In an image processing device that recognizes images consisting of binary values of white and black, means for processing a binary image with a projection distribution and means for determining a second-order differential consisting of the sum difference of projection distribution values. and a means for detecting defects and burrs on the object.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19946684U JPS61114308U (en) | 1984-12-28 | 1984-12-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19946684U JPS61114308U (en) | 1984-12-28 | 1984-12-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61114308U true JPS61114308U (en) | 1986-07-19 |
Family
ID=30759416
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19946684U Pending JPS61114308U (en) | 1984-12-28 | 1984-12-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61114308U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015010936A (en) * | 2013-06-28 | 2015-01-19 | 株式会社神戸製鋼所 | Surface flaw detection device and surface flaw detection method |
-
1984
- 1984-12-28 JP JP19946684U patent/JPS61114308U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015010936A (en) * | 2013-06-28 | 2015-01-19 | 株式会社神戸製鋼所 | Surface flaw detection device and surface flaw detection method |
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