JPS61114308U - - Google Patents

Info

Publication number
JPS61114308U
JPS61114308U JP19946684U JP19946684U JPS61114308U JP S61114308 U JPS61114308 U JP S61114308U JP 19946684 U JP19946684 U JP 19946684U JP 19946684 U JP19946684 U JP 19946684U JP S61114308 U JPS61114308 U JP S61114308U
Authority
JP
Japan
Prior art keywords
projection distribution
values
binary
image
burrs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19946684U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19946684U priority Critical patent/JPS61114308U/ja
Publication of JPS61114308U publication Critical patent/JPS61114308U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の物体の欠損検出装
置の概略図、第2図は二値化した映像状態図、第
3図は投影分布情報図、第4図は二次微分による
判定PAD図である。 1……テレビカメラ、2……二値化回路、3…
…投影分布回路、4……判定回路、5……検査物
体、6……ステージ、7……照明機器。
Fig. 1 is a schematic diagram of an object defect detection device according to an embodiment of the present invention, Fig. 2 is a binarized image state diagram, Fig. 3 is a projection distribution information diagram, and Fig. 4 is determination based on second-order differentiation. It is a PAD diagram. 1...TV camera, 2...Binarization circuit, 3...
...projection distribution circuit, 4...judgment circuit, 5...test object, 6...stage, 7...lighting equipment.

Claims (1)

【実用新案登録請求の範囲】 白・黒の二値より成る画像を認識する画像処理
装置において、 二値映像を投影分布処理する手段と投影分布値
の和差からなる二次微分を判定する手段と、物体
の欠損、バリを検出する手段からなることを特徴
とする物体の欠損検出装置。
[Claims for Utility Model Registration] In an image processing device that recognizes images consisting of binary values of white and black, means for processing a binary image with a projection distribution and means for determining a second-order differential consisting of the sum difference of projection distribution values. and a means for detecting defects and burrs on the object.
JP19946684U 1984-12-28 1984-12-28 Pending JPS61114308U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19946684U JPS61114308U (en) 1984-12-28 1984-12-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19946684U JPS61114308U (en) 1984-12-28 1984-12-28

Publications (1)

Publication Number Publication Date
JPS61114308U true JPS61114308U (en) 1986-07-19

Family

ID=30759416

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19946684U Pending JPS61114308U (en) 1984-12-28 1984-12-28

Country Status (1)

Country Link
JP (1) JPS61114308U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015010936A (en) * 2013-06-28 2015-01-19 株式会社神戸製鋼所 Surface flaw detection device and surface flaw detection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015010936A (en) * 2013-06-28 2015-01-19 株式会社神戸製鋼所 Surface flaw detection device and surface flaw detection method

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