JPS61111878A - Monitor device for form of cutting on metal cutting machining - Google Patents

Monitor device for form of cutting on metal cutting machining

Info

Publication number
JPS61111878A
JPS61111878A JP24122885A JP24122885A JPS61111878A JP S61111878 A JPS61111878 A JP S61111878A JP 24122885 A JP24122885 A JP 24122885A JP 24122885 A JP24122885 A JP 24122885A JP S61111878 A JPS61111878 A JP S61111878A
Authority
JP
Japan
Prior art keywords
tool
chips
contact
chip
signal output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24122885A
Other languages
Japanese (ja)
Inventor
マンフレート ライシツヒ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WERKZEUGMAS KOMB 7 OKTOBER BER
WERKZEUGMAS KOMB 7 OKTOBER BERLIN VEB
Original Assignee
WERKZEUGMAS KOMB 7 OKTOBER BER
WERKZEUGMAS KOMB 7 OKTOBER BERLIN VEB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by WERKZEUGMAS KOMB 7 OKTOBER BER, WERKZEUGMAS KOMB 7 OKTOBER BERLIN VEB filed Critical WERKZEUGMAS KOMB 7 OKTOBER BER
Publication of JPS61111878A publication Critical patent/JPS61111878A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/34Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
    • G01J1/36Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4242Modulated light, e.g. for synchronizing source and detector circuit

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Machine Tool Sensing Apparatuses (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (発明の適用範囲) 金属切削加工の際に切断しないで長く工具を取巻く切粉
であってそれらの導電性の活用により接点要素として工
具取付装置内に収容してある工具及び切粉室内の接触個
所を経て電流回路を閉じて評価回路となるものに関して
切粉形状を監視するための装置とくに自動旋盤用のもの
[Detailed Description of the Invention] (Scope of Application of the Invention) Chips that surround a tool for a long time without being cut during metal cutting, and are housed in a tool mounting device as a contact element by utilizing their conductivity. A device, especially for automatic lathes, for monitoring the chip shape with respect to the tool and the evaluation circuit which closes the current circuit through contact points in the tool and chip chamber.

(公知の技術的解決の特徴) 旋盤作業の際には作業員の少ない生産のための製作工房
の開発に関連して切粉の管理、制御が第1級の問題とな
る。不規則なまた帯状の切粉など望ましくない切粉形状
はしばしば工作品表面の損傷また工作品及び工具の自動
交換の妨害の原因となった。そのほか工具破損の危険が
高まった。不規則な及び帯状の切粉はそのうえ切粉の移
送を妨げ、そのために大きな場所を要することになる。
(Characteristics of the Known Technical Solution) In lathe operations and in conjunction with the development of manufacturing workshops for production with few workers, the management and control of chips becomes a first-class problem. Undesirable chip shapes, such as irregular or banded chips, often caused damage to the workpiece surface and interference with automatic workpiece and tool exchange. Additionally, the risk of tool damage increased. Irregular and band-shaped chips also impede the transport of the chips and therefore require a large amount of space.

望ましくない切粉形状のこれら不利な随伴現象すべてか
ら結果として磯椋停止時間及び切粉排出の際の事故源が
生じる。
All these disadvantageous concomitants of undesirable chip shapes result in isogura downtime and sources of accidents during chip evacuation.

この種の不規則な及び帯状の切粉の発生防止のためさま
ざまな措置が採られている。それで対応した工具切刃の
形成により又は送りの駆動に型費させた付加的な揺動運
動により切粉1波断を惹起こす。別の方法は短かい切粉
を目指した製造技術上の切削パラメータを予め定めるこ
とにある。
Various measures have been taken to prevent the occurrence of irregular and band-shaped chips of this type. Therefore, by a corresponding formation of the cutting edge of the tool or by an additional oscillating movement of the mold in order to drive the feed, one-wave breakage of the chips is caused. Another method consists in predetermining manufacturing-technical cutting parameters aimed at short chips.

多数のさまざまな工具を装備しく工具収納部及び工具自
動交換)、経済上の観点から最適切削値にプログラムし
てある自動的に作動する工作m6Aにおいては望ましく
ない切粉形状が始めから確実には排除できない。その原
因は工作機械−工具−工作品の系の切粉形状に影響を及
ぼす緒特性の多数及び分散である。外部から予め切粉形
状を定めることは現在では十分な信頼性をもってするこ
とは不可能である。
The machine M6A is equipped with a large number of different tools (tool storage and automatic tool change) and is programmed to the optimum cutting value from an economical point of view. Cannot be excluded. The cause is the large number and dispersion of core characteristics that affect the chip shape of the machine tool-tool-workpiece system. It is currently not possible to determine the chip shape from the outside with sufficient reliability.

それゆえ今日不利な切粉形状の結果としての損傷の回避
のため採られている道は自動的切粉形状認識のための装
置開発にある。
The path being taken today to avoid damage as a result of unfavorable chip shapes is therefore the development of devices for automatic chip shape recognition.

公知の切粉形状認識のための装置は排出される切粉の熱
輻射又は超音波反射の測定に基づいている。別の公知の
切粉形状監視は近接起動器乃至光線遮断警報装置を用い
て作動する。切粉形状認識のためにはすでに動的な送り
力分力も活用されている。
Known devices for chip shape recognition are based on measuring the thermal radiation or ultrasonic reflections of the ejected chips. Another known chip shape monitor operates using a proximity trigger or beam interruption alarm device. Dynamic feed force components are already being utilized for chip shape recognition.

旋盤作業の場合に、切粉形状な切粉の進行方向の測定を
介して把握しようと試みられた。そのために旋削用刃物
のす(い面及び逃げ面の相−ぢ − 異なる3個所にそれぞれ1個の接点片を絶縁して取付け
、それを介して、排出される切粉により評価回路への電
流回路が閉じられるようにしてある。
In the case of lathe work, an attempt was made to understand the traveling direction of chips in the form of chips by measuring them. For this purpose, one contact piece is insulated and installed at each of three different locations on the cutting face and flank face of the turning tool, and through these contact pieces, the current flowing to the evaluation circuit is caused by the discharged chips. The circuit is closed.

これら公知の解決法は何れも従来実地において有効とは
なっていない。すべての場合において実験室モデル及び
それに対応して複雑なセンサであり、実生産伯件下の使
用には適していない。これらが機械の作動空間を狭くし
工作品乃至工具の自動交換を妨げるからである。これら
のセンナのうち多くは生産補助材料の使用の下ではそれ
らの機能に悪影響を受ける。そのほか信号取得及び信号
伝達のための負担も極めて大きい。工具及び工具に設け
てある接触センサの自動交換を行なう工作機械において
は耐え得る技術上の負担をもって機能を保証するため信
号伝達の付加的な問題が生じる。そのうえセンサは大な
り小なり外部からの力の作用に敏感であり、切粉の動き
による損傷にさらされていることが加わる。
None of these known solutions has hitherto been effective in practice. In all cases laboratory models and correspondingly complex sensors are not suitable for use under commercial production conditions. This is because these narrow the operating space of the machine and prevent automatic exchange of workpieces or tools. Many of these senna have their function adversely affected under the use of production auxiliary materials. In addition, the burden of signal acquisition and signal transmission is extremely large. In machine tools with automatic exchange of tools and contact sensors installed on the tools, additional problems of signal transmission arise in order to guarantee functionality with a tolerable technical burden. Moreover, the sensor is sensitive to the action of external forces to a greater or lesser degree and is additionally exposed to damage due to the movement of chips.

(発明の目標) 本発明は信頼性が高く故障が少なくて実生産に使用する
ための要件を満たす切粉形状監視装置を目標とする。
(Objective of the Invention) The aim of the present invention is to provide a chip shape monitoring device that is highly reliable, has few failures, and satisfies the requirements for use in actual production.

(発明の詳細な説明) 本発明には金属切粉加工の際に、切断しないで長く工具
を取巻く切粉に関して、粗加工か仕上加工かに関係なく
、製作補助材料の使用の下においても機能を果すべきで
あり、接点要素は工具から離しておくべ(、また機械の
機能ならびに工作品及び工具の交換に悪影響があっては
ならない、接点要素により切粉形状を監視するための装
置を作り出すという課題が根拠となっている。
(Detailed Description of the Invention) The present invention has a function for metal chip machining, with regard to chips that surround the tool for a long time without cutting, regardless of rough machining or finishing machining, and also with the use of manufacturing auxiliary materials. The contact elements should be kept separate from the tool (and should not have an adverse effect on the functioning of the machine and on the exchange of workpieces and tools, creating a device for monitoring chip shape with contact elements). The issue is the basis.

本発明によりこの課題は、工具取付装置には工具取付個
所の直接の環境において、工作品に向けられた端面なら
びに直接に接続している側面に、工具取付装置の基体に
対して絶縁してある導電層が設けてあることによって解
決される。
The present invention solves this problem by providing a tool mounting device which, in the immediate environment of the tool mounting point, has an end face facing the workpiece as well as a directly connected side surface which is insulated with respect to the base body of the tool mounting device. This problem is solved by providing a conductive layer.

この層は工具取付装置内部を貫いて布置してある伝達導
線と連結してあり後者は外方へ接続個所を経て評価回路
へ導いてあり□、その回路によって持続性接触生起の際
は信号出力”巻きつき切粉”が、また断続的接触生起の
際は信号出力1長い切粉”が活性化されていることによ
って解決される。
This layer is connected to a transmission conductor placed inside the tool attachment device, the latter leading outward via a connection point to an evaluation circuit □, which outputs a signal in the event of a persistent contact. ``Tangled chips'' are also solved by activating the signal output 1 ``Long chips'' in the event of intermittent contact.

導電性層としては望ましくは工具取付装置の面上に耐摩
耗性の板が絶縁して取付けである。
The conductive layer is preferably a wear-resistant plate insulated and mounted on the surface of the tool mounting device.

これらの板は有利に非磁性材料からなるべきである。These plates should preferably consist of non-magnetic material.

タレットの一部としての工具取付装置にありては接続個
所は誘道性近接動器として形成してある。
In the case of a tool attachment device as part of a turret, the connection point is designed as an inductive proximity device.

タレット内において交換可能の測定走査具からの測定信
号を受けるために設けてありかつタレットからの測定信
号を定置の工具担体部分へ伝達する無線式測定信号伝達
器がすでに存在してい木場台は定置の工具担体部分に設
けてある    1゛測定信号伝達器の受信個所はゲー
ト回路を介して評価回路と連結してある。
A wireless measuring signal transmitter is already present which is provided in the turret to receive the measuring signal from the exchangeable measuring scanning device and which transmits the measuring signal from the turret to the stationary tool carrier part. The receiving point of the measuring signal transmitter 1, which is provided in the tool carrier part of the tool carrier, is connected to the evaluation circuit via a gate circuit.

望ましくは信号出力0巻きつき切粉1は0.5乃至4秒
の範囲にある予め定めである持続的接触時間の際に活性
化されており、信号出力“長い切粉”は2乃至50 H
zの範囲圧ある予め定められた接触頻度の際に活性化さ
れている。評価回路の信号出力端は送り駆動を段階的に
高める目標値源に接続してある。
Preferably, the signal output 0 wrapped chips 1 is activated during a predetermined sustained contact time in the range 0.5 to 4 seconds, and the signal output ``long chips'' is activated between 2 and 50 H.
The range pressure of z is activated upon a certain predetermined contact frequency. The signal output of the evaluation circuit is connected to a setpoint value source which increases the feed drive in stages.

実施例 図面には本発明の一実施例が示してある。Example An embodiment of the invention is shown in the drawing.

切粉形状監視装置を規格化された旋削工具取付装置1(
矛1図、第2図)に基づいて記述する。旋削工具取付装
置1内にはチップ2aを施こしてある旋削工具2が収容
してある。旋削工具取付装置lには円筒形の受具1aが
ありこれで円板タレット3に固定しCある(第3図)。
Turning tool mounting device 1 (standardized chip shape monitoring device)
The description is based on Figures 1 and 2). A turning tool 2 provided with a tip 2a is accommodated in the turning tool mounting device 1. As shown in FIG. The turning tool mounting device 1 has a cylindrical holder 1a, which is fixed to the disc turret 3 (FIG. 3).

旋削工具取付装置IKは接点要素4が固定してあり、こ
れが旋削工具取付装置lの旋削工具2の突出に近い面を
包みとんでいるすなわちその装置の表面形状に適合させ
である。接点要素4は非磁性鋼板からなる。接点要素4
の旋削工具取付装置lに対する絶縁材として適合させた
絶縁性下敷5が設けてある。接点要素4は絶縁性下敷5
とともに旋削工具取付装置1にねじどめしてある。その
ため旋削工具取付装置1には固定用ねじ9.10のため
の絶縁ブシュ6.7.8、が挿入してある。接点要素4
は一方の固定個所において固定用ねじ10を介して、旋
削工具取付装置1内に絶縁して挿入してある円筒形ブシ
ュ11と連結してあり後者には電線12が接続してあり
これが旋削工具取付装置1を貫いて導かれ小誘導コイル
13(1’3図)に連結してある。臼導=イル13の別
の入力端は電線14を経て接地すなわち旋削工具取付装
置lに、よってまたチップ2a に接続してある。
The turning tool mounting device IK has a fixed contact element 4 which wraps around the surface of the turning tool mounting device I close to the protrusion of the turning tool 2, i.e. is adapted to the surface shape of the device. Contact element 4 is made of a non-magnetic steel plate. Contact element 4
An insulating underlay 5 is provided which is adapted as insulation for the turning tool mounting device l. The contact element 4 is covered with an insulating underlay 5
It is also screwed to the turning tool mounting device 1. For this purpose, an insulating bushing 6.7.8 for the fixing screw 9.10 is inserted into the turning tool mounting device 1. Contact element 4
is connected at one fixing point via a fixing screw 10 to a cylindrical bushing 11 inserted insulated into the turning tool mounting device 1, to which an electric wire 12 is connected, which connects the turning tool. It is guided through the mounting device 1 and connected to a small induction coil 13 (Fig. 1'3). The other input end of the milling lead 13 is connected via a wire 14 to ground or to the turning tool attachment device 1 and thus also to the tip 2a.

誘導コイル13はハウジング15内に収容してあり、後
者は工具取付装置10円筒形受具1aの端面にある円筒
形切りこみ内に挿入してありねじ19で固定してある。
The induction coil 13 is housed in a housing 15, the latter being inserted into a cylindrical recess in the end face of the cylindrical receiver 1a of the tool mounting device 10 and fixed with screws 19.

誘導コイル13に直接向い合って近接起動器16がある
。近接起動器16を収容しているハウジング17は定置
の工具担体部分l8に固定してある。誘導コイル13と
近接起動器16との間の空気間隙は円板スペーサ加によ
って調整可能である。
Directly opposite the induction coil 13 is a proximity activator 16 . A housing 17 containing the proximity actuator 16 is fastened to a stationary tool carrier part l8. The air gap between the induction coil 13 and the proximity starter 16 can be adjusted by adding a disc spacer.

結線図(矛4図)は接点要素4とチップ2aとの間の切
換接点21として表わしてある切粉によって短時間開じ
られ得る誘導コイル13を示す。
The wiring diagram (figure 4) shows an induction coil 13 that can be opened for a short time by a chip, which is represented as a switching contact 21 between contact element 4 and tip 2a.

近接起動器16に属する結合誘導コイル22はオシレー
タ回路内にあり、後者は結合誘導コイル乙に結線してあ
るコンデンサ乙によって表わしてある。電線24(矛3
図)にかかつている信号は図示してない評価回路へ導か
れている。
A coupled induction coil 22 belonging to the proximity starter 16 is in the oscillator circuit, the latter being represented by a capacitor O connected to the coupled induction coil O. Electric wire 24 (spear 3
The signals associated with FIG. 1 are routed to an evaluation circuit (not shown).

送り出される切粉は接点片と接触すると信号を発し、こ
れらは時間tを横軸として第5図にグラフ化して表して
ある。?5a図においては不規則な信号経過が表わして
あり長さの異なる接触生起により短かいパルス状の信号
もより長い信号も発せられる。才5b図には三つの特徴
的な信号経過が表わしてある。才lの時期TL、8には
予め定められた接触持続時間戸以内に再び消滅する信号
のみが現われる。矛2の時期T3にはパルス状の信号の
集合が現われ、その際パルス9個の限界パルス数に達す
る。これは予め定められた接触頻度と時期−とから定ま
るものである。次の時期′rIJ8には送り出される切
粉により予め定められた持続性接触時間Tつを超える持
続性接触が現われる。
When the ejected chips come into contact with the contact piece, they emit a signal, which is graphically represented in FIG. 5 with time t on the horizontal axis. ? FIG. 5a shows an irregular signal course, in which contact events of different lengths produce both short pulse-like signals and longer signals. Figure 5b shows three characteristic signal profiles. At time TL, 8 only signals appear which disappear again within a predetermined contact duration. At period T3 of spear 2, a collection of pulse-like signals appears, in which case a limit pulse number of 9 pulses is reached. This is determined from predetermined contact frequency and timing. At the next period 'rIJ8, a sustained contact occurs with the ejected chips that exceeds a predetermined sustained contact time T.

限界パルス数でigrenz又は予め定められた持続性
接触時間−の超過から評価回路により信号“長い切粉”
又は信号巻きつき切粉”が活性化される。
If the limit pulse number is exceeded or the predetermined continuous contact time is exceeded, the evaluation circuit signals "long chips".
Or the "signal wrapped chips" is activated.

切粉形状監視装置の作動法は下記のとおりである: 加工の際に工具チップ2a上を送り出され、切換要素2
1として作用する切粉は接点要素4との接触生起の際に
信号YベルHな生じさせる。
The operating method of the chip shape monitoring device is as follows: During machining, a chip is sent out over the tool tip 2a and the switching element 2
The chips acting as 1 generate a signal Y when contact occurs with the contact element 4.

切粉から接点要素4への回路が閉じていないときは信号
レベルはその原始レベルLに留まっている。
When the circuit from the chips to the contact element 4 is not closed, the signal level remains at its original level L.

これによってすべての短かく切れた切粉では全くHレベ
ルは生じない。接点要素4につきあたるより長い切粉が
初めて信号レベルHへ導く。
As a result, no H level occurs in all short chips. Only longer chips that hit contact element 4 lead to signal level H.

その直後にすなわち設定してある持続性接触時間−の到
達前にこれらの切粉がなお自ら破断すると加工の進行に
介入する必要はない。この時間限界超過の際に始めて、
送り出される切粉の接触生起が持続性接触時間−として
評価回路によって認識され信号”巻きつき切粉’ ws
が発せられる。この場合送り出された切粉が通常旋削工
具に巻きつき固定されている。送り出される切粉が単に
短時間だけただし反復して回路を閉じ、よってパルス状
の信号が発せられるとき、時期Tお以内に限界パルス数
igrenzに達しないすなわちこの実施例の場合時期
Tユあたりパルス9個を超えない限り危険な長い切粉の
惧れは排除できる。限界パルス数igrenz  を超
える計数値の場合に始めて評価回路から信号1長い切粉
” LSが発せられる。
If these chips still break off on their own immediately after that, ie before the predetermined continuous contact time has been reached, there is no need to intervene in the progress of the machining process. Starting when this time limit is exceeded,
The contact occurrence of the ejected chips is recognized by the evaluation circuit as a sustained contact time and a signal "Wrapped Chips" ws
is emitted. In this case, the chips sent out are usually wrapped around the turning tool and fixed. When the ejected chips simply but repeatedly close the circuit for a short period of time, thus emitting a pulse-like signal, the limit number of pulses igrenz is not reached within the period T, that is, in this embodiment, the number of pulses per period T is As long as the number of chips does not exceed nine, the risk of dangerous long chips can be eliminated. Only in the case of a count value that exceeds the limit pulse number igrenz is the signal 1 long chip "LS" emitted from the evaluation circuit.

これらのパルス頻度の出現は切粉生成に関しては何度も
接触生起を伴なう長い切粉は極めて僅かな切削条件変化
の際にしばしば巻きつき切粉発生へ導くので危険な長い
切粉と評価すべきである。従って多(の場合については
危険な長い切粉の認識及びその結果としてなされる加工
パラメータの変更によって絶対に回避すべき巻きつき切
粉の発生を防止することができる。切粉と接点要素4と
の接触生起ごとに近接起動器16のオシレータ回路の減
衰となり、それから上記の■信号が導出され、評価回路
へ送られる。
When it comes to chip generation, the appearance of these pulse frequencies indicates that long chips that come into contact with each other many times are considered to be dangerous long chips because they often wrap around and generate chips when there is an extremely slight change in cutting conditions. Should. Therefore, in the case of multiple chips, by recognizing dangerous long chips and changing the machining parameters as a result, it is possible to prevent the occurrence of wrapped chips, which should be absolutely avoided. Each occurrence of a contact causes an attenuation of the oscillator circuit of the proximity starter 16, from which the above-mentioned signal (2) is derived and sent to the evaluation circuit.

減辰が切換接点21の開放によって排除されると信号は
Lへ戻される。可能な戦略はたとえばこのとき、信号長
い切粉”LS及び/又は信号“巻きつき切粉″WSの発
出の際に刀日工過程の送りを特定の段階超越により予め
定められた限界値まで高めて切粉形状の改善乃至切粉破
断を達成するように考えている。このため警報信号の際
に段階的に高まる目標値源を用いることができる。この
措置に拘わらず信号”巻きつき切粉″WSが存在してい
るときは工具に巻きついている切粉な排除するため介入
が必要である旨の信号を発すべきである。加工過程への
手作業介入の信号発出信号“長い切粉”L8が存在し続
ける場合にも行なうことができる。
When the depletion is eliminated by opening the switching contact 21, the signal is returned to L. A possible strategy is, for example, to increase the feed rate of the Tonikko process to a predetermined limit value by a certain step-over when the signal ``long chip'' LS and/or the signal ``wound chip'' WS is issued. The idea is to improve the chip shape or break the chip by using a step-by-step increase in the target value source for the alarm signal. ``When WS is present, a signal should be issued that intervention is required to remove chips wrapped around the tool.Signal for manual intervention in the machining process "Long chips" This can also be done if L8 continues to exist.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は旋削工具用の工具取付装置の工作品に向けられ
た側の外形図。 矛2図は第1図の工具取付装置の上面図。 第3図はIt図の線A−Bにそった断面図。 才4図は信号取得のための結線図。 第5’a図は破断した切粉の場合の信号経過。 第5.b図は破断していな〜1切粉及びそれから評価回
路により導出された信号出力“長い切粉1乃至1巻きつ
き切粉”の場合の信号経過を示す。 1− 旋削工具取付装置 1a−円筒形受具 2− 旋削工具 2a−チップ 3− 円板タレット 4− 接点要素 5−下敷 6.7.8、−絶縁ブシュ 9.1〇−固定用ねじ 11 − 円筒状ブシュ 12.14、冴−電線 13 − 誘導コイル 15.17− ハウジング 16 − 近接起動器 18 − 工具担体部分 19−ねじ 加 −円板スペーサ 21 − 切換接点 四 −結合誘導コイル n −コンデンサ L8− 長い切粉 We  −巻きつき切粉 5一時期 m−持続性接触時間 igrenz−限界接触頻度            
[を一時間 H−信号レベル高 L −信号レベル低 16一
FIG. 1 is an outline view of the side of the tool mounting device for turning tools that faces the workpiece. Figure 2 is a top view of the tool mounting device shown in Figure 1. FIG. 3 is a sectional view taken along line A-B of the It diagram. Figure 4 is a wiring diagram for signal acquisition. FIG. 5'a shows the signal curve in the case of a broken chip. Fifth. FIG. b shows the signal curve in the case of unbroken to 1 chip and the signal output derived therefrom by the evaluation circuit ``1 long chip to 1 wrapped chip.'' 1-Turning tool mounting device 1a-Cylindrical receiver 2-Turning tool 2a-Chip 3-Disc turret 4-Contact element 5-Underlay 6.7.8, -Insulating bush 9.1〇-Fixing screw 11- Cylindrical bushing 12.14, electric wire 13 - induction coil 15.17 - housing 16 - proximity starter 18 - tool carrier part 19 - screwing - disc spacer 21 - four switching contacts - coupled induction coil n - capacitor L8 - Long chips We - Coiled chips 5 one time period m - Persistent contact time igrenz - Limit contact frequency
[1 hour H - Signal level high L - Signal level low 16-1

Claims (1)

【特許請求の範囲】 1 金属切削加工の際に、切断しないで長く工具を取巻
く切粉であってそれらの導電性の活用により接点要素と
して、工具取付装置に収容してある工具及び切粉室内の
接触個所を介して電流回路を閉じて評価回路となるもの
に関して切粉形状を監視するための装置とくに自動旋盤
用のものにおいて、工具取付装置は工具(2)の取付個
所の直接環境に、工作品に向けてある端面上にならびに
直接続いている側面上に工具取付装置の基体に対して絶
縁してある導電層が施こしてあり、その層は工具取付装
置内部を貫いて布設してある伝達電線(12)と連結し
てあり後者は外方へ接続個所を介して評価回路へ導いて
あり、これによって持続性接触生起の際は信号出力“巻
きつき切粉”(WS)及び断続的接触生起の際は信号出
力“長い切粉”(LS)が活性化されていることを特徴
とする装置。 2 工具取付装置の面上の導電層としては耐摩耗性鋼板
(4)が絶縁して施こしてあることを特徴とする特許請
求の範囲第1項記載の装置。 3 耐摩耗性鋼板(4)は非磁性材料からなることを特
徴とする特許請求の範囲第1及び2項記載の装置。 4 タレット(3)の部分としての工具取付装置におい
て接続個所は誘導性近接起動器(16)として形成して
あることを特徴とする特許請求の範囲第1乃至3項記載
の装置。 5 タレット(3)と定置の工具担体部分(18)との
間の、タレット(3)内に収容してある電気的測定走査
具の測定信号を受けるために設けてある測定信号伝達器
において測定信号伝達器の受信個所はゲート回路を経て
評価回路と連結してあることを特徴とする特許請求の範
囲第1乃至4項記載の装置。 6 信号出力“巻きつき切粉”(WS)は0.5乃至4
秒の範囲にある予め定められた持続的接触時間(T_W
_S)の場合に活性化されていることを特徴とする特許
請求の範囲第1乃至5項記載の装置。 7 信号出力“長い切粉”(LS)は2乃至50Hzの
範囲にある予め定められた接触頻度の場合に活性化され
ていることを特徴とする特許請求の範囲第1乃至6項記
載の装置。 8 評価回路の信号出力端は送り駆動部を段階的に高め
る目標値源に接続してあることを特徴とする特許請求の
範囲第1乃至7項記載の装置。
[Claims] 1. Chips that surround the tool for a long time without cutting during metal cutting, and by utilizing their conductivity, they can be used as contact elements in the tool and chip chamber housed in the tool mounting device. In a device for monitoring the shape of chips with respect to an evaluation circuit by closing a current circuit through the contact point of the tool (2), especially in the device for automatic lathes, the tool mounting device is placed in the direct environment of the mounting point of the tool (2). On the end face facing the workpiece as well as on the side directly adjoining, a conductive layer is applied, which is insulated from the base of the tool attachment device, and which layer is laid through the interior of the tool attachment device. It is connected to a transmission line (12), which is led to the outside via a connection point to the evaluation circuit, so that in the event of a persistent contact, the signal output "wound chip" (WS) and the intermittent A device characterized in that a signal output "long chip" (LS) is activated when a physical contact occurs. 2. The device according to claim 1, characterized in that the conductive layer on the surface of the tool mounting device is an insulating wear-resistant steel plate (4). 3. The device according to claims 1 and 2, characterized in that the wear-resistant steel plate (4) is made of a non-magnetic material. 4. Device according to claims 1 to 3, characterized in that in the tool attachment device as part of the turret (3), the connection point is designed as an inductive proximity starter (16). 5 Measurement at a measuring signal transmitter between the turret (3) and the stationary tool carrier part (18), which is provided for receiving the measuring signals of the electrical measuring scanning device housed in the turret (3). 5. Device according to claim 1, characterized in that the receiving point of the signal transmitter is connected to the evaluation circuit via a gate circuit. 6 Signal output “wrapped chips” (WS) is 0.5 to 4
A predetermined sustained contact time (T_W) in the range of seconds
6. The device according to claim 1, wherein the device is activated in the case of _S). 7. Device according to claims 1 to 6, characterized in that the signal output "long chips" (LS) is activated for a predetermined contact frequency in the range from 2 to 50 Hz. . 8. Device according to claims 1 to 7, characterized in that the signal output of the evaluation circuit is connected to a setpoint value source for increasing the feed drive stepwise.
JP24122885A 1984-11-01 1985-10-28 Monitor device for form of cutting on metal cutting machining Pending JPS61111878A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DD23Q/268975-4 1984-11-01
DD26895384A DD228058A1 (en) 1984-11-01 1984-11-01 PHASE SYNCHRONIZATION DEVICE FOR STEPPER MOTORIZED MODULATION DEVICES

Publications (1)

Publication Number Publication Date
JPS61111878A true JPS61111878A (en) 1986-05-29

Family

ID=5561815

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24122885A Pending JPS61111878A (en) 1984-11-01 1985-10-28 Monitor device for form of cutting on metal cutting machining

Country Status (4)

Country Link
JP (1) JPS61111878A (en)
DD (1) DD228058A1 (en)
DE (1) DE3528345A1 (en)
GB (1) GB2166544B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02232148A (en) * 1989-03-06 1990-09-14 Mitsubishi Electric Corp Chip supervisory device for cutting machine
JP2017094420A (en) * 2015-11-20 2017-06-01 ファナック株式会社 Machine tool

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62118221A (en) * 1985-11-19 1987-05-29 Shimadzu Corp Frequency modulation photometric method
DD256569B5 (en) * 1986-12-31 1994-04-28 Zeiss Carl Jena Gmbh Method for phase synchronization of stepper drive controlled devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3659942A (en) * 1970-11-13 1972-05-02 Perkin Elmer Corp Detector circuits for phase compensation
US4386852A (en) * 1981-01-29 1983-06-07 The Perkin-Elmer Corporation Phase synchronization apparatus
ZA884689B (en) * 1987-07-03 1989-03-29 Rutherford William A golf practice driving aid

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02232148A (en) * 1989-03-06 1990-09-14 Mitsubishi Electric Corp Chip supervisory device for cutting machine
JP2017094420A (en) * 2015-11-20 2017-06-01 ファナック株式会社 Machine tool
US10307876B2 (en) 2015-11-20 2019-06-04 Fanuc Corporation Machine tool

Also Published As

Publication number Publication date
GB2166544A (en) 1986-05-08
DD228058A1 (en) 1985-10-02
DE3528345A1 (en) 1986-04-30
GB8526865D0 (en) 1985-12-04
GB2166544B (en) 1988-08-10

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