JPS61107229U - - Google Patents
Info
- Publication number
- JPS61107229U JPS61107229U JP19254984U JP19254984U JPS61107229U JP S61107229 U JPS61107229 U JP S61107229U JP 19254984 U JP19254984 U JP 19254984U JP 19254984 U JP19254984 U JP 19254984U JP S61107229 U JPS61107229 U JP S61107229U
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- subtracting
- adding twice
- amplifier circuit
- output level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000010355 oscillation Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
Landscapes
- Channel Selection Circuits, Automatic Tuning Circuits (AREA)
- Superheterodyne Receivers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19254984U JPS61107229U (zh) | 1984-12-18 | 1984-12-18 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19254984U JPS61107229U (zh) | 1984-12-18 | 1984-12-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61107229U true JPS61107229U (zh) | 1986-07-08 |
Family
ID=30749959
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19254984U Pending JPS61107229U (zh) | 1984-12-18 | 1984-12-18 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61107229U (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7509106B2 (en) | 2004-04-06 | 2009-03-24 | Sony Corporation | Test signal generation circuit, and reception circuit |
-
1984
- 1984-12-18 JP JP19254984U patent/JPS61107229U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7509106B2 (en) | 2004-04-06 | 2009-03-24 | Sony Corporation | Test signal generation circuit, and reception circuit |
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