JPS6097452A - Memory control system - Google Patents

Memory control system

Info

Publication number
JPS6097452A
JPS6097452A JP58204875A JP20487583A JPS6097452A JP S6097452 A JPS6097452 A JP S6097452A JP 58204875 A JP58204875 A JP 58204875A JP 20487583 A JP20487583 A JP 20487583A JP S6097452 A JPS6097452 A JP S6097452A
Authority
JP
Japan
Prior art keywords
address
ram
error
check
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58204875A
Other languages
Japanese (ja)
Inventor
Nobuo Ueda
植田 展生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP58204875A priority Critical patent/JPS6097452A/en
Publication of JPS6097452A publication Critical patent/JPS6097452A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16Error detection or correction of the data by redundancy in hardware
    • G06F11/1666Error detection or correction of the data by redundancy in hardware where the redundant component is memory or memory area
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2284Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16Error detection or correction of the data by redundancy in hardware
    • G06F11/20Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To allow a device to function normally even if a fault occurs to some RAM element by switching an RAM address part where an error is detected to an unused RAM address part and using it. CONSTITUTION:When the power source is turned on, a main control part 1 starts operating to write optional data in RAM parts 1-4, and then reads it to check whether the written contents coincide with the read contents or not. For example, if an error occurs in an address 1000H, 1000H is set in a buffer memory 12a and a check on the RAM parts is restarted at the head. In this case, the address 1000H is sent out the main storage part 7, a coincidence circuit 13a obtains a coincidence with the contents of the buffer 12a, so an address from an address generating circuit 14 is signified and an address of an unused part of the RAM parts is selected corresponding to the address 1000H. When an error is detected in another address, the same operation is performed.

Description

【発明の詳細な説明】 (技術分野) 本発明はRAMを使用した装置におけるRAMの一部に
不良等発生時に前記RAM不良の一部を未使用のRAM
の一部へ切替りるメモリ制御方式に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The present invention provides a method for replacing a part of the defective RAM with an unused RAM when a defect occurs in a part of the RAM in a device using a RAM.
This relates to a memory control method that switches to a part of the memory.

(背景技術) 装置の汎用化が進むにつれて、プログラム容量が犬きく
なシこれに追随して記憶素子も多数使用する様になって
きている。記憶素子にはリードオンリーメモリ(以下R
OMと略す)、RAM等あるがROMでは実装上あるい
はメインテナンス上大容量化には向いていないので、R
AMを使用し、このRAMにフロッピーディスク装置(
FDD )あるいはカセット磁気テープ(CMT )等
からプログラムを転送して、前記プログラムを転送され
たRAMにより装置の運用を行なっている。前記プログ
ラムの転送前にRAMの書込み読出しチェックを行ない
正常であればプログラムの転送を行なう。もし異常が検
出された場合はエラーとしてランプ表示あるいはブザー
鳴動専行ないオペレータにエラーを促し、装置としては
その時点で障害とし機能しない様になっておシ業務上支
障をきたすことがある。
(Background Art) As devices become more general-purpose, their program capacity increases, and a large number of memory elements are used accordingly. The memory element is read-only memory (hereinafter referred to as R).
There are ROM (abbreviated as OM), RAM, etc., but ROM is not suitable for increasing capacity due to implementation or maintenance reasons, so R
AM is used, and a floppy disk device (
A program is transferred from a FDD) or a cassette magnetic tape (CMT), and the device is operated by the RAM to which the program is transferred. Before transferring the program, a RAM write/read check is performed, and if normal, the program is transferred. If an abnormality is detected, a lamp will be displayed as an error or a buzzer will sound to prompt the non-specialist operator to make an error, and at that point the device will be at fault and will no longer function, which may cause a hindrance to business operations.

(発明の課題) 本発明は、RAMチェック時RAMの素子不良等によシ
損Wの一部がエラーとなった時、エラーが検出されたR
AMアドレス部を未使用のRAMアドレス部に切替え、
ある一部分のRAMの素子不良が発生しても装置として
正常に機能することを目的としたメモリ制御方式に関す
る。
(Problem to be solved by the invention) The present invention is designed to solve the problem of detecting an error when a part of the damage W becomes an error due to a defective RAM element or the like during a RAM check.
Switch the AM address section to an unused RAM address section,
The present invention relates to a memory control method that is intended to function normally as a device even if a certain portion of a RAM element fails.

(発明の構成および作用) 第2図は本発明の一実施例で1〜4はプログラムを格納
するRAM部、6はFDD (又はCMT )部、7は
電源投入時前記RAM部1〜4が正常か否かのチェック
やFDD 6からプログラムをRAM部に1〜4への転
送あるいは、RAM部1〜4に転送されたプログラムに
よシ各部への動作指令等用る主制御部、8は前記主制御
部7からのアドレスにより前記RAM部1〜4のどのR
AM部を選択するか決定するだめのデコーダ、12a〜
12nはエラーアドレスを蓄積するバッファメモリ、1
38〜13nは、前記12a〜12nに蓄積されるエラ
ーアドレスと主制御部7からのアドレスの内容とを比較
し同じであれば出力が変化する一致回路、14は前記一
致回路の13a〜13nの出力状態に応じて未使用のア
ドレスを生成するアドレス生成回路、5は主制御部7か
らアドレスか、あるいは前記アドレス生成回路14から
のアドレスかを切替えるアドレス切替回路である。
(Structure and operation of the invention) FIG. 2 shows an embodiment of the present invention, in which 1 to 4 are RAM sections for storing programs, 6 is an FDD (or CMT) section, and 7 is a RAM section in which the RAM sections 1 to 4 are stored when the power is turned on. The main control unit 8 is used to check whether the FDD is normal or not, to transfer the program from the FDD 6 to the RAM units 1 to 4, or to issue operation commands to each unit based on the program transferred to the RAM units 1 to 4. Which R of the RAM sections 1 to 4 is selected according to the address from the main control section 7?
Decoder for determining whether to select the AM section, 12a~
12n is a buffer memory for storing error addresses, 1
Reference numerals 38 to 13n refer to matching circuits that compare the error addresses accumulated in the above-mentioned 12a to 12n with the content of the address from the main control unit 7 and change the output if they are the same, and 14 refers to the matching circuits 13a to 13n of the above-mentioned matching circuits. An address generation circuit 5 generates an unused address according to the output state, and an address switching circuit 5 switches between an address from the main control section 7 and an address from the address generation circuit 14.

次に上記構成によるRAM部制御方式を第3図に示すフ
ローチャートを参照しながら説明する。
Next, the RAM unit control method with the above configuration will be explained with reference to the flowchart shown in FIG.

第3図は電源投入してから運用開始が可能になるまでの
動作フローチャートであるが、まず電源が投入されると
回路の初期リセットが行なわれ、主制御部7が動作を開
始しRAM部1〜4に対して任意のデータを書込み、こ
れを読出して書込んだ内容と読出しだ内容が一致してい
るか否かのチェックを行ない、このチェックの結果異常
がなければFDD部6から装置を運用するためのプログ
ラムをRAM部1〜4に対して転送し、転送が゛終了す
ると運用開始可能となる。もし、前記チェックの結果、
例えば100OH番地がエラーとなったらバッファメモ
リ12aに100OHをセットし再度最初からRAMチ
ェックを開始し、100OH番地が主制御部7から送出
されると一致回路13aでバッファ12aの内容と一致
がとれRAM部1〜4を選択するデコーダ8をディスイ
ネーブルすると同時に未使用部のあるRAM部(本回路
の実施例ではRAM部4)をイネーブルとし未使用部の
RAM部のアドレスを生成するアドレス生成回路14か
らのアドレスをアドレス切替回路5で有効とし、RAM
部の未使用の部分に対するアドレスが100OH番地に
対応して選択されることになる。次に150OH番地が
エラーとなったらバッファメモリ12bに1500Hを
セットし、再び最初からRAMチェックを開始し100
OH番地及び150OH番地が主制御部7から送出され
ると前記同様それぞれ未使用部のあるRAM部が選択さ
れアドレス生成回路14からのアドレスの部分が100
OH番地及び1500 H番地に対応して選択されるこ
とになり、順次エラーが検出される毎にそのエラーアド
レスをバッファメモリ12c、12d・・とセットしR
AMチェックが正常になるまであるいはパンツアメモリ
12a〜12nがフルになるまで繰返す。なおアドレス
生成回路14は、一致回路13a〜13nの出力の状態
に応じて、例えばRAM部の未使用部のアドレスが20
0OH番地以降にあるとすれば一致回路13aが出力さ
れると200OH番地を、又一致回路13bが出力され
ると2001H番地が生成されるようKあらかじめプロ
グラムができるFROM (プログラマブルリードオン
リーメモリ)でもよいし、論理回路にて構成してもよい
ことはいうまでもない。
FIG. 3 is an operation flowchart from when the power is turned on until it is possible to start operation. First, when the power is turned on, an initial reset of the circuit is performed, the main control section 7 starts operation, and the RAM section 1 Write arbitrary data to ~4, read it, and check whether the written content matches the read content.If there is no abnormality as a result of this check, operate the device from the FDD unit 6. A program for doing this is transferred to the RAM units 1 to 4, and when the transfer is completed, operation can be started. If the result of the above check,
For example, if an error occurs at address 100OH, 100OH is set in the buffer memory 12a and the RAM check is started again from the beginning. When address 100OH is sent from the main control unit 7, the match circuit 13a matches the contents of the buffer 12a and the RAM is checked. An address generation circuit 14 that disables the decoder 8 that selects sections 1 to 4 and at the same time enables a RAM section that has an unused section (RAM section 4 in this embodiment) to generate an address for the unused RAM section. The address from is made valid by the address switching circuit 5, and the address from the RAM
An address for an unused portion of the section will be selected corresponding to address 100OH. Next, when an error occurs at address 150OH, set 1500H in the buffer memory 12b and start the RAM check from the beginning again.
When the OH address and the 150OH address are sent from the main control unit 7, a RAM section with an unused portion is selected as described above, and the address portion from the address generation circuit 14 is set to 100.
It will be selected corresponding to the OH address and the 1500H address, and each time an error is detected, the error address is set in the buffer memory 12c, 12d, etc.
Repeat until the AM check becomes normal or until the panzer memories 12a to 12n become full. Note that the address generation circuit 14 determines, for example, that the address of the unused portion of the RAM section is 20, depending on the state of the output of the matching circuits 13a to 13n.
If it is located after address 0OH, it may be a FROM (programmable read only memory) that can be programmed in advance so that when the matching circuit 13a outputs, the address 200OH is generated, and when the matching circuit 13b outputs, the address 2001H is generated. However, it goes without saying that it may be constructed using a logic circuit.

以上説明したようにRAMのある一部分において不良等
が発生しても未使用のRAMの一部へ切替える方式であ
るので予備のRAMを用意することもなくまた、オペレ
ータ等信に何ら影響を及ぼすことなく簡単に実現できる
利点がある。
As explained above, even if a defect occurs in a certain part of the RAM, it is switched to an unused part of the RAM, so there is no need to prepare a spare RAM, and there is no impact on operator communication. It has the advantage of being easily realized.

(発明の効果) 本発明は通常運用で使用するRAMのある一部分に不良
等ある時、これを未使用のRAMの一部に切替えて運用
できるためRAMを使用している装置であればどの用な
分野にも利用できる。特にRAMの一部に不良があシ該
装置がダウンすることによシ、システムとしての機能を
失うものに有効である。
(Effects of the Invention) The present invention enables operation by switching to a part of unused RAM when a part of the RAM used in normal operation is defective. It can also be used in various fields. This is particularly effective for systems that lose their system functionality due to a defect in a part of the RAM and the device goes down.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の一実施例の動作フローチャート図、第2
図は本発明の一実施例の回路図、第3図は第1図の回路
の動作フローチャート図である。 1〜4・・・RAM部、5・・・アドレス切替回路、6
・・・FDD部、7・・・主制御部、8・・・デコーダ
、1.2 a〜12n・・・バッファメモリ、13a〜
13n・・・一致回路、J4・・アドレス生成回路、1
5・・NORケゝ−ト、16・ANDケ8−ト。 特¥[出願人 沖電気工業株式会社 特許出願代理人 弁理士 山 本 恵 −
Figure 1 is an operational flowchart of a conventional embodiment;
The figure is a circuit diagram of one embodiment of the present invention, and FIG. 3 is an operation flowchart of the circuit of FIG. 1. 1-4...RAM section, 5...Address switching circuit, 6
...FDD section, 7... Main control section, 8... Decoder, 1.2 a to 12n... Buffer memory, 13a to
13n... Matching circuit, J4... Address generation circuit, 1
5...NOR gate, 16.AND gate. Special ¥ [Applicant Oki Electric Industry Co., Ltd. Patent application agent Megumi Yamamoto −

Claims (1)

【特許請求の範囲】[Claims] 運用に先立ってランダムアクセスメモIJ (RAM)
の書込み読出しチェックを行なうメモリ制御方式におい
て、チェックでエラーを生じたメモリアドレスを指定す
るバッファメモリと、前記バッファメモリによシ指定さ
れたメモリアドレスを無効とし未使用メモリアドレスを
有効とするためのメモリアドレス切替回路とを備え、R
AMの書込み読出しチェックでエラーが検出された時、
前記バッファメモリに該メモリアドレスを指定するデー
タを書込み再びRAMの書込み読出しチェックを行なう
ことを特徴とするメモリ制御方式。
Random access memo IJ (RAM) before operation
In a memory control method that performs read/write checks, there is a buffer memory for specifying a memory address where an error occurred in the check, and a memory address for invalidating the memory address specified by the buffer memory and validating an unused memory address. and a memory address switching circuit.
When an error is detected in AM write/read check,
A memory control method characterized in that data specifying the memory address is written in the buffer memory and a read/write check of the RAM is performed again.
JP58204875A 1983-11-02 1983-11-02 Memory control system Pending JPS6097452A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58204875A JPS6097452A (en) 1983-11-02 1983-11-02 Memory control system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58204875A JPS6097452A (en) 1983-11-02 1983-11-02 Memory control system

Publications (1)

Publication Number Publication Date
JPS6097452A true JPS6097452A (en) 1985-05-31

Family

ID=16497839

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58204875A Pending JPS6097452A (en) 1983-11-02 1983-11-02 Memory control system

Country Status (1)

Country Link
JP (1) JPS6097452A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63205899A (en) * 1987-02-20 1988-08-25 Rohm Co Ltd Semiconductor memory driving device
JPH04134544A (en) * 1990-09-26 1992-05-08 Nec Corp Information processor
KR101030146B1 (en) 2008-08-29 2011-04-18 서울대학교산학협력단 Flash based storage device using page buffer as write cache and method of using the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63205899A (en) * 1987-02-20 1988-08-25 Rohm Co Ltd Semiconductor memory driving device
JPH04134544A (en) * 1990-09-26 1992-05-08 Nec Corp Information processor
KR101030146B1 (en) 2008-08-29 2011-04-18 서울대학교산학협력단 Flash based storage device using page buffer as write cache and method of using the same

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