JPS6089040A - Matrix electron source - Google Patents

Matrix electron source

Info

Publication number
JPS6089040A
JPS6089040A JP19619383A JP19619383A JPS6089040A JP S6089040 A JPS6089040 A JP S6089040A JP 19619383 A JP19619383 A JP 19619383A JP 19619383 A JP19619383 A JP 19619383A JP S6089040 A JPS6089040 A JP S6089040A
Authority
JP
Japan
Prior art keywords
electron beam
electrode
cathode
hole
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19619383A
Other languages
Japanese (ja)
Inventor
Masanori Watanabe
正則 渡辺
Kinzo Nonomura
欽造 野々村
Ryuma Hirano
龍馬 平野
Minoru Katsuyama
実 勝山
Kiyoshi Hamada
浜田 潔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP19619383A priority Critical patent/JPS6089040A/en
Publication of JPS6089040A publication Critical patent/JPS6089040A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J31/00Cathode ray tubes; Electron beam tubes
    • H01J31/08Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
    • H01J31/10Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes
    • H01J31/12Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes with luminescent screen
    • H01J31/123Flat display tubes
    • H01J31/125Flat display tubes provided with control means permitting the electron beam to reach selected parts of the screen, e.g. digital selection
    • H01J31/126Flat display tubes provided with control means permitting the electron beam to reach selected parts of the screen, e.g. digital selection using line sources

Abstract

PURPOSE:To form a matrix electron source which can emit electrons uniformly by arranging the electron beam control electrode in vicinity of the plural rod- shaped heat cathode and further by providing the device with a grid electrode and an electrode beam takeoff electrode. CONSTITUTION:A plurality of electron beam control electrodes 2 and a plurality of rod-shaped heat cathode 3 which make a right angle to the electron beam control electrodes 2, are arranged in vicinity of each other. Furthermore, a grid electrode 6 having electron beam passing holes 7 which are coaxial with the holes 5 of an electron beam takeoff electrode 4 is arranged between the electron beam control electrode 2 and the electron beam takeoff electrode 4 having the electron beam passing hole 5. Thus formed is a matrix electron source of a plate type display unit. Since the voltage approximately equal to that applied to the cathode 3 is applied to the grid electrode 6 from the power source V4, an electron beam is only emitted from the surface of the cathode 3 which corresponds to the central part of the electron beam passing holes 5, 7. Consequently, a uniform electron beam with good convergence can be obtained without loading the cathode 3 unnecessarily.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は電子ビームを用いて文字まだは画像を表示する
表示装置のマ) IJワックス子源に関するものである
DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to an IJ wax source for a display device that displays characters or images using an electron beam.

(従来例の構成とその問題点) 複数本の電子ビームを制御して螢光体に衝突させ文字、
画像を表示する平板型の表示装置、例えば特開昭56−
7984.5号においては、マトリックス状に電子ビー
ムを正確に制御して螢光体表示板に衝突させることが必
要である。特に、高密度の画像、例えばテレビ画像を表
示しようとすると、高密度の制御された電子ビームが必
要であり、従って、制御電極を高密度に配置することが
要求される。制御電極を高密度に配置すると電極相互間
の相互影響、即ち、クロストーク現象が起り、高解像度
の画像を得難い難点があった。
(Conventional structure and its problems) Multiple electron beams are controlled to collide with a phosphor to create characters,
A flat display device for displaying images, such as Japanese Patent Application Laid-open No. 1983-
No. 7984.5 requires precise control of the electron beam to impinge on the phosphor display panel in a matrix manner. In particular, when displaying high-density images, such as television images, a high-density controlled electron beam is required, and therefore a high-density arrangement of control electrodes is required. When control electrodes are arranged in a high density, mutual influence between the electrodes, that is, a crosstalk phenomenon occurs, making it difficult to obtain high-resolution images.

第1図は従来のマ) IJワックス子源の電極構成およ
び結線図を示すもので、1はガラス等の絶縁基板であっ
て、その表面には複数個の電子ビーム制御電極2が配設
され、3は線状熱陰極、4は電子ビーム取シ出し電極で
、電子ビーム発射用の貫通孔5を備えている。AI 、
A2 + A3は線状熱陰極3の信号入力端子、Bl 
、B2 、B3は電子ビーム制御電極2に対する制御信
号入力端子、DI。
Figure 1 shows the electrode configuration and wiring diagram of a conventional MA) IJ wax source, in which 1 is an insulating substrate made of glass or the like, on the surface of which a plurality of electron beam control electrodes 2 are arranged. , 3 is a linear hot cathode, 4 is an electron beam extraction electrode, and is provided with a through hole 5 for emitting an electron beam. AI,
A2 + A3 are the signal input terminals of the linear hot cathode 3, Bl
, B2 and B3 are control signal input terminals DI for the electron beam control electrode 2.

D2 、D3はダイオード、R1、R2、R3は線状熱
陰極3の一端に設けられた抵抗、rl、r2゜r3は電
子ビーム取出し電極2の抵抗、vlはバイアス電源、■
2は陰極加熱電源、v3は電子ビーム取シ出し電極4の
電源である。
D2 and D3 are diodes, R1, R2, and R3 are resistors provided at one end of the linear hot cathode 3, rl, r2°r3 are resistors of the electron beam extraction electrode 2, vl is a bias power supply,
2 is a cathode heating power source, and v3 is a power source for the electron beam extraction electrode 4.

線状熱陰極3の信号入力端子A I + A 2 * 
A 3の何れか一つ、例えばA、に負の・セルス信号を
印加すると、これに対応する線状熱陰極3から電子ビー
ムが発射され電子ビーム取り出し電極4に設けた貫通孔
5から電子ビームが取り出せる状態にあるが、電子ビー
ム制御電極2にはバイアス電源V1から負のカットオフ
電圧が印加されておシミ子ビームは発生されない。いま
、制御信号入力端子B1〜B3の一つから、電子ビーム
制御電極201本に正の信号電圧が印加されると、これ
に対応する電子ビーム取り出し電極4に設けた貫通孔5
から電子ビームが発射される。この時、制御電極の1本
、例えば2−2に正の信号電圧を印加した時、制御電極
に対応する位置の貫通孔のみから電子ビームが発射され
る必要がある。しかし、制御電極が密に配設されている
と、隣接する貫通孔からも電子ビームが発射されたり、
隣接する制御電極の電位状態によってビーム電流値が変
化するなどの相互作用が発生し、解像度の高い画像を得
ることができないなどの欠点があった。また、線状熱陰
極3を使用した場合、電子ビーム取り出し電極40貫通
孔5以外の部分にも電子ビームが流れるため、陰極に不
必要な負担をかけるのみならず線状熱陰極30両端の電
位差が大きくなり、取り出されたビーム電流が不均一に
なり、画像の明るさの一様性がなくなるなどの欠点があ
った。
Signal input terminal A I + A 2 * of linear hot cathode 3
When a negative cellus signal is applied to any one of A 3, for example A, an electron beam is emitted from the corresponding linear hot cathode 3, and an electron beam is emitted from the through hole 5 provided in the electron beam extraction electrode 4. However, a negative cutoff voltage is applied to the electron beam control electrode 2 from the bias power supply V1, and no smear beam is generated. Now, when a positive signal voltage is applied to the electron beam control electrode 201 from one of the control signal input terminals B1 to B3, the corresponding through hole 5 provided in the electron beam extraction electrode 4 is applied.
An electron beam is emitted from the At this time, when a positive signal voltage is applied to one of the control electrodes, for example 2-2, the electron beam needs to be emitted only from the through hole at the position corresponding to the control electrode. However, if the control electrodes are densely arranged, electron beams may be emitted from adjacent through holes.
This method has disadvantages such as the inability to obtain high-resolution images due to interactions such as changes in the beam current value depending on the potential state of adjacent control electrodes. In addition, when the linear hot cathode 3 is used, the electron beam also flows to parts other than the through hole 5 of the electron beam extraction electrode 40, which not only places an unnecessary burden on the cathode but also increases the potential difference between both ends of the linear hot cathode 30. There were drawbacks such as an increase in the beam current, an uneven beam current, and an uneven image brightness.

(発明の目的) 本発明は」1記の欠点を解決するだめのもので、線状熱
陰極からの電子放射電流を必要最小限にすることによっ
て、前記熱陰極の両端間の電位差を小さくし、均一な電
子放射を得ると共に、集束性の良い電子ビームを得るこ
とを目的とする。
(Objective of the Invention) The present invention is intended to solve the drawback described in item 1, and reduces the potential difference between both ends of the hot cathode by minimizing the electron emission current from the hot cathode. The purpose of this method is to obtain uniform electron emission and a well-focused electron beam.

(発明の構成) 本発明は、一平面内に複数本のストライブ状の電子ビー
ム制御電極を配置し、その電子ビーム制御電極とほぼ直
交するように一定間隔を保って線状熱陰極を配置し、更
に電子ビームを取り出すだめの貫通孔を有する板状の電
極を前記電子ビーム制御電極と対向して配置したマトリ
ックス電子源において、前記電子ビーム取り出し電極に
設けた貫通孔と同軸の貫通孔を有する格子状電極を前記
電子ビーム制御電極、線状熱陰極および電子ビーム取り
出し電極の各電極相互間の少なくとも一方の中−間に配
置し、前記格子状電極の電位を前記電子ビーム制御電極
および電子ビーム取り出し電極の電位よシ低くするよう
に構成したものである。
(Structure of the Invention) The present invention arranges a plurality of strip-shaped electron beam control electrodes in one plane, and arranges linear hot cathodes at regular intervals so as to be substantially perpendicular to the electron beam control electrodes. Further, in a matrix electron source in which a plate-shaped electrode having a through hole for taking out the electron beam is disposed opposite to the electron beam control electrode, a through hole coaxial with the through hole provided in the electron beam taking out electrode is provided. A grid-like electrode having a grid-like electrode is disposed between at least one of the electron beam control electrode, the linear hot cathode, and the electron beam extraction electrode, and the potential of the grid-like electrode is set between the electron beam control electrode and the electron beam extraction electrode. It is constructed so that the potential is lower than that of the beam extraction electrode.

(実施例の説明) 第2図は本発明の一実施例の電極構成および結線図を示
すもので、この特徴は第1図に示した従(5) 来の構成に対して、新たにクロストークを防止するだめ
の格子状電極を設けたことである。
(Explanation of Embodiment) Fig. 2 shows an electrode configuration and a wiring diagram of an embodiment of the present invention. The reason is that a grid-like electrode is provided to prevent talk.

ここで、6は格子電極、7は電子ビーム取シ出し電極4
に設けた貫通孔5と同軸の貫通孔、v4は格子電極6の
電源であり、その他の符号は第1図で説明したものと同
じである。
Here, 6 is a grid electrode, 7 is an electron beam extraction electrode 4
A through hole coaxial with the through hole 5 provided in , v4 is a power source for the grid electrode 6, and other symbols are the same as those explained in FIG.

以下、これを詳細に説明する。1はガラス等の絶縁基板
であって、その表面に電子ビーム制御電極2が配設され
ている。絶縁基板lは真空外囲器の一部を兼ねることも
できる。電子ビーム制御電極2は一定の間隔に複数本は
ぼ平行に設けられている。電子ビーム制御電極2の配置
間隔、および本数は表示しようとする文字または画像の
解像度および、絵素数によって決定される。
This will be explained in detail below. 1 is an insulating substrate made of glass or the like, and an electron beam control electrode 2 is disposed on the surface thereof. The insulating substrate l can also serve as a part of the vacuum envelope. A plurality of electron beam control electrodes 2 are provided substantially in parallel at regular intervals. The arrangement interval and number of electron beam control electrodes 2 are determined by the resolution of characters or images to be displayed and the number of picture elements.

3は線状熱陰極であって、複数本はぼ平行に配置し、電
子ビーム制御電極2とほぼ直交するように配置する。線
状熱陰極3と電子ビーム制御電極2の間隔は一定に保持
され、できるだけ接近して配置することが望ましい。電
子ビーム制御電極2と線状熱陰極30間隔は解像度およ
び電子ビーム(6) 制御特性に重大な関係がある。前記間隔が電子ビーム制
御電極2の間隔の1/2以下に保持することが望ましく
、1/2以上の場合はクロストークを起す場合がある。
Numeral 3 is a linear hot cathode, and a plurality of them are arranged substantially parallel to each other and arranged to be substantially orthogonal to the electron beam control electrode 2. It is desirable that the distance between the linear hot cathode 3 and the electron beam control electrode 2 be kept constant, and that they be arranged as close as possible. The distance between the electron beam control electrode 2 and the linear hot cathode 30 has a significant relationship with resolution and electron beam (6) control characteristics. It is desirable that the spacing be kept at 1/2 or less of the spacing between the electron beam control electrodes 2; if it is more than 1/2, crosstalk may occur.

また、前記間隔が小さいほど、電子ビーム制御電極に印
加する信号電圧が小さく彦る利点がある。4は電子ビー
ムを取り出すだめの電極であって、電子ビーム制御電極
2と線状熱陰極3との各交叉点に対応する位置に貫通孔
5が設けられている。ここまでの説明は第1図の場合と
同じである。
Further, there is an advantage that the smaller the interval, the smaller the signal voltage applied to the electron beam control electrode. Reference numeral 4 denotes an electrode for taking out the electron beam, and through holes 5 are provided at positions corresponding to the intersection points of the electron beam control electrode 2 and the linear hot cathode 3. The explanation up to this point is the same as in the case of FIG.

次に、6は本発明の主要部分をなすクロス) −りを防
止するだめの格子電極である。格子電極6には前記電子
ビーム取り出し電極4と同軸の貫通孔7が設けられてい
る。貫通孔7は電子ビーム取り出し電極4に設けた貫通
孔5と同等か、まだは大きな孔径の孔が設けられている
。貫通孔は必ずしも円である必要は々く、角孔でも良い
。この場合の孔径は貫通孔5と同じか、またけそれより
大きい面積の孔であることを意味している。格子電極6
は電子ビーム制御電極2と、線状熱陰極3の中間に配置
しても同様な機能を有することが確認されている。
Next, reference numeral 6 denotes a grid electrode for preventing cross-curing, which is a main part of the present invention. The grid electrode 6 is provided with a through hole 7 coaxial with the electron beam extraction electrode 4 . The through hole 7 has a diameter equal to or larger than the through hole 5 provided in the electron beam extraction electrode 4. The through hole does not necessarily have to be circular, and may be a square hole. In this case, the hole diameter means that the hole has the same area as the through hole 5 or even larger than it. Grid electrode 6
It has been confirmed that it has the same function even when placed between the electron beam control electrode 2 and the linear hot cathode 3.

第2図にはまたこの電子源を駆動するだめの基本的結線
図を示している。
FIG. 2 also shows a basic wiring diagram for driving this electron source.

電子ビーム制御電極2の各電極は抵抗r1.r2゜r3
・・・・・・を介してバイアス電源v1の負極に接続さ
れている。線状熱陰極3の各陰極の一端は抵抗R1、R
2r R3・・・・・・を介して陰極加熱電源v2の正
極に、他端はダイオードDI 、D2 * D3・・・
・・・を介して電源V2の負極に接続されている。また
、電子ビームを取り出すだめの電極4には電源v3によ
って正の電圧が印加されている。
Each electrode of the electron beam control electrode 2 has a resistor r1. r2゜r3
It is connected to the negative electrode of the bias power supply v1 via... One end of each cathode of the linear hot cathode 3 is connected to a resistor R1, R
2r R3... to the positive electrode of the cathode heating power supply v2 via R3..., the other end is connected to the diode DI, D2 * D3...
... is connected to the negative electrode of the power supply V2. Further, a positive voltage is applied to the electrode 4 from which the electron beam is extracted by a power source v3.

格子電極6には電源V4によって線状熱陰極3とほぼ等
しい電圧が印加されている。
A voltage approximately equal to that of the linear hot cathode 3 is applied to the grid electrode 6 by a power source V4.

線状熱陰極3には常時電源v2によって給電され、加熱
されていて電子を放出し得る状態にあり、電子ビーム取
り出し電極4には電源v3によって正の電圧が印加され
ているにもかかわらず、電子ビーム制御電極2に抵抗r
l、r2+r3・・・・・・を介してバイアス電圧v1
によって負の電圧が印加されているため、線状熱陰極3
の近傍は負電界となり電子ビームが放出され々い。然る
に、今、線状熱陰極3の一本に負のパルス信号を印加し
、任意の電子ビーム制御電極2に正の・にルス信号を印
加すると、信号電圧の印加された両電極の各交点に対応
する部分の陰極面のみから電子ビームが放出される。
Although the linear hot cathode 3 is constantly supplied with power by the power supply v2 and is heated and ready to emit electrons, and the positive voltage is applied to the electron beam extraction electrode 4 by the power supply v3, A resistor r is connected to the electron beam control electrode 2.
bias voltage v1 via l, r2+r3...
Since a negative voltage is applied by the linear hot cathode 3
There is a negative electric field in the vicinity of , and an electron beam is easily emitted. However, if we now apply a negative pulse signal to one of the linear hot cathodes 3 and apply a positive pulse signal to any electron beam control electrode 2, each intersection of both electrodes to which the signal voltage is applied The electron beam is emitted only from the portion of the cathode surface corresponding to .

第3図は本発明のマトリックス電子源の電極構成を示す
一実施例の断面図である。
FIG. 3 is a sectional view of one embodiment showing the electrode structure of the matrix electron source of the present invention.

電子ビーム制御電極2は1mmピッチで、05謹巾の電
極がガラスの絶縁基板lの表面に設けられており、カッ
トオフ時−20Vの負のカットオフ電圧が印加されてい
る。線状熱陰極3は電子ビーム制御電極2および格子電
極6と0.3 mの間隔を保持して前記ガラス基板面と
ほぼ平行に架張され、常時Ovの電圧が印加され、駆動
時に一5v〜−10Vのノにルス電圧が印加される。格
子電極6には陰極駆動時の電圧とほぼ等しい電圧が印加
され、電子ビーム取り出し電極4には+50〜100V
の電圧が印加されている。電子ビーム取り出しく9) 電極4に正の電圧を印加すると、格子電極60貫通孔7
内に正の電界(一部図示)がしみ込み陰極近傍に壕で達
する。然るに複数本の陰極の任意の1本に負の・ぐルス
電圧を印加し、任意の制御電極に正の信号電圧を印加す
ると、それぞれの交叉点部分の陰極表面から電子ビーム
が発射され、貫通孔5および7を通過して電子ビームが
得られる。
The electron beam control electrodes 2 have a pitch of 1 mm and a width of 0.5 mm, and are provided on the surface of an insulating glass substrate 1, and a negative cutoff voltage of -20V is applied at cutoff. The linear hot cathode 3 is stretched approximately parallel to the glass substrate surface with a distance of 0.3 m from the electron beam control electrode 2 and the grid electrode 6, and a voltage of Ov is constantly applied to it, and a voltage of -5V is applied when driving. A Luss voltage of ~-10V is applied. A voltage approximately equal to the voltage during cathode drive is applied to the grid electrode 6, and +50 to 100 V is applied to the electron beam extraction electrode 4.
voltage is applied. Take out the electron beam 9) When a positive voltage is applied to the electrode 4, the grid electrode 60 through hole 7
A positive electric field (partially shown) penetrates into the cathode and reaches the vicinity of the cathode. However, when a negative signal voltage is applied to any one of the plurality of cathodes and a positive signal voltage is applied to any control electrode, an electron beam is emitted from the cathode surface at each intersection point and penetrates. An electron beam is obtained passing through holes 5 and 7.

この様にして任意の線状熱陰極3と任意の電子ビーム制
御電極2に信号電圧を印加することによって、線状熱陰
極3と電子ビーム制御電極2で構成する各交叉点から2
次元的に電子ビームを制御しながら取り出すことができ
る。格子電極6および電子ビーム取り出し電極4に設け
た貫通孔7および5は電界のしみ込みを容易にするだめ
に、貫通孔7を貫通孔5より若干大きくすることが望ま
しい。実施例では貫通孔5および7は05祁φおよび0
.8 tanφを用いた。
In this way, by applying a signal voltage to any linear hot cathode 3 and any electron beam control electrode 2, two
It is possible to take out the electron beam while controlling it dimensionally. The through holes 7 and 5 provided in the grid electrode 6 and the electron beam extraction electrode 4 are desirably made slightly larger than the through hole 5 in order to facilitate penetration of the electric field. In the example, the through holes 5 and 7 have diameters of 05φ and 0.
.. 8 tanφ was used.

この様な組合せの場合、貫通孔5を通過する電子ビーム
は貫通孔5の中心部分に対応する線状熱陰極3の表面か
ら電子ビームが発射され、極めて(10) 集束性の良いビームが得られる特長を有する。史に、格
子電極6を挿入することによる効果は、線状熱陰極から
発射される電子ビームが貫通孔の中心部に対応する線状
熱陰極表面のみから発射されるため、余分な電子電流が
ないことから線状熱陰極を流れる電流も小さく、従って
、駆動時に発生する線状熱陰極3の両端間の電位差も小
さく、陰極全長にわたって均一な電子ビームを増り出す
ことができる。特に長い陰極を使用する場合には不可欠
である。
In the case of such a combination, the electron beam passing through the through hole 5 is emitted from the surface of the linear hot cathode 3 corresponding to the central part of the through hole 5, and a beam with extremely good focusing property is obtained. It has the following characteristics. Historically, the effect of inserting the grid electrode 6 is that the electron beam emitted from the linear hot cathode is emitted only from the surface of the linear hot cathode corresponding to the center of the through hole, so that excess electron current is generated. Because of this, the current flowing through the linear hot cathode is small, and therefore the potential difference between both ends of the linear hot cathode 3 that occurs during driving is also small, making it possible to increase the uniform electron beam over the entire length of the cathode. This is especially necessary when using a long cathode.

また、格子電極6を電子ビーム制御電極2と線状熱陰極
3の中間に配直し、格子電極6に線状熱陰極3と同電圧
か、若干質の電圧、例えば線状熱陰極3に対して一5V
の電圧を印加し、電子ビーム制御電極2に正の電圧、例
えば+IOVを印加すると、格子電極6の貫通孔7から
しみ出す正の電界によって、前記貫通孔7の中央部分の
線状熱陰極30表面が正となり、この部分からのみ電子
ビームが放射される。従って、前記実施例の場合と同様
、余分な電子流が発生することなく、同様な効果が得ら
れる。
In addition, the grid electrode 6 is rearranged between the electron beam control electrode 2 and the linear hot cathode 3, and the grid electrode 6 is placed at the same voltage as the linear hot cathode 3, or at a slightly higher voltage, for example, with respect to the linear hot cathode 3. Teichi 5V
When a positive voltage, for example +IOV, is applied to the electron beam control electrode 2, the linear hot cathode 30 in the center of the through hole 7 is The surface is positive, and electron beams are emitted only from this part. Therefore, as in the case of the previous embodiment, the same effect can be obtained without generating an extra electron flow.

(発明の効果) 以上説明したように、本発明は線状熱陰極と電子ビーム
取り出し電極の間、または線状熱陰極と電子ビーム制御
電極の間、またはその両方の電極間に格子電極6を設け
た電極構成とすることによって、陰極に不必要な負荷を
かけることなく、線状熱陰極の全長にわたって、均一で
かつ集束性のよい電子ビームを取り出すことができると
いう利点がある。
(Effects of the Invention) As explained above, the present invention provides the grid electrode 6 between the linear hot cathode and the electron beam extraction electrode, between the linear hot cathode and the electron beam control electrode, or between both electrodes. This electrode configuration has the advantage that a uniform and well-focused electron beam can be extracted over the entire length of the linear hot cathode without imposing unnecessary load on the cathode.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のマトリックス電子源の電極構成および結
線図を示す図、第2図は本発明の一実施例の電極構成お
よび結線図を示す図、第3図は本発明のマトリックス電
子源の電極構成を示す一実施例の断面図である。 1・・・絶縁基板、2・・・電子ビーム制御電極、3・
・・線状熱陰極、4・・・電子ビーム取り出し電極、5
゜7・・・貫通孔、6・・・格子電極。
FIG. 1 is a diagram showing the electrode configuration and wiring diagram of a conventional matrix electron source, FIG. 2 is a diagram showing the electrode configuration and wiring diagram of an embodiment of the present invention, and FIG. 3 is a diagram showing the electrode configuration and wiring diagram of a matrix electron source of the present invention. FIG. 2 is a cross-sectional view of one embodiment showing an electrode configuration. DESCRIPTION OF SYMBOLS 1... Insulating substrate, 2... Electron beam control electrode, 3...
... Linear hot cathode, 4 ... Electron beam extraction electrode, 5
゜7...Through hole, 6...Grid electrode.

Claims (2)

【特許請求の範囲】[Claims] (1) 絶縁基板表面に配設した複数本の電子ビーム制
御電極と、その電子ビーム制御電極とほぼ直交する様に
配置した複数本の線状熱陰極と、前記電子ビーム制御電
極および前記線状熱陰極が交叉する各交点に対応する位
置に貫通孔を有する電子ビーム取9出し電極とを相互に
ほぼ平行に配置したマ) IJワックス子源において、
前記電子ビーム制御電極、線状熱陰極および電子ビーム
取り出し電極相互間の少なくとも一方の中間に電子ビー
ム取9出し電極の貫通孔と同軸の貫通孔を有する格子電
極を挿入して構成したことを特徴とするマトリックス電
子源。
(1) A plurality of electron beam control electrodes arranged on the surface of an insulating substrate, a plurality of linear hot cathodes arranged almost orthogonally to the electron beam control electrodes, and a plurality of linear hot cathodes disposed on the surface of the insulating substrate; In an IJ wax source, an electron beam extraction electrode and an electron beam extraction electrode each having a through hole at a position corresponding to each intersection point where the hot cathodes intersect are arranged substantially parallel to each other.
A grid electrode having a through hole coaxial with the through hole of the electron beam extraction electrode is inserted between at least one of the electron beam control electrode, the linear hot cathode, and the electron beam extraction electrode. matrix electron source.
(2)格子電極の貫通孔の孔径が電子ビーム取り出し電
極の貫通孔の孔径り上であることを特徴とする特許請求
の範囲第(1)項記載のマ) IJワックス子源。
(2) The IJ wax source according to claim (1), wherein the diameter of the through-hole in the grid electrode is larger than the diameter of the through-hole in the electron beam extraction electrode.
JP19619383A 1983-10-21 1983-10-21 Matrix electron source Pending JPS6089040A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19619383A JPS6089040A (en) 1983-10-21 1983-10-21 Matrix electron source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19619383A JPS6089040A (en) 1983-10-21 1983-10-21 Matrix electron source

Publications (1)

Publication Number Publication Date
JPS6089040A true JPS6089040A (en) 1985-05-18

Family

ID=16353737

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19619383A Pending JPS6089040A (en) 1983-10-21 1983-10-21 Matrix electron source

Country Status (1)

Country Link
JP (1) JPS6089040A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01221844A (en) * 1988-02-29 1989-09-05 Sony Corp Flat display device
JPH02309226A (en) * 1989-05-24 1990-12-25 Ulvac Corp Checking apparatus of leakage of gas

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5679845A (en) * 1979-12-04 1981-06-30 Matsushita Electric Ind Co Ltd Picture display device
JPS5861551A (en) * 1981-10-08 1983-04-12 Matsushita Electric Ind Co Ltd Display device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5679845A (en) * 1979-12-04 1981-06-30 Matsushita Electric Ind Co Ltd Picture display device
JPS5861551A (en) * 1981-10-08 1983-04-12 Matsushita Electric Ind Co Ltd Display device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01221844A (en) * 1988-02-29 1989-09-05 Sony Corp Flat display device
JPH02309226A (en) * 1989-05-24 1990-12-25 Ulvac Corp Checking apparatus of leakage of gas

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