JPS6086963A - Line image sensor - Google Patents

Abstract

PURPOSE:To attain the replacement of a defective small substrate and to improve the product yield of image sensors by dividing a substrate equally into plural small substrates and distributing plural element blocks in a row on each small substrate with element blocks overlapped each other at junction parts when those small substrates are joined together. CONSTITUTION:A substrate 1 arranged with unmagnification photodetectors equivalent to a line is divided equally into small substrates 21-24. The junction parts of these small substrates gear alternately each other through level difference parts 31-33 to obtain a long substrate 1. Element blocks B1-B17 are arrayed in a row on the substrate 21, and each element block contains 32 elements arrayed in a row. These element trains are set zigzag for each small substrate when substrates 21-24 are put together. Thus element blocks B17 and B17', B34 and B34' and B51 and B51' are put on each other at each junction part of the substrates 21-24. Thus the overlap reading is made possible for picture information.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a line image sensor that allows a facsimile machine to read an original image.

In general, a line image sensor that uses a scanner unit such as a facsimile to sequentially read a document image line by line in the main scanning direction uses a B4 image sensor having a scanning width of 256,111 m in the main scanning direction, for example. When reading a document image of the same size as the original image at a scanning density of 8 elements/field, 2048 equal-magnification photodetecting elements are arranged in a line on one elongated substrate. However, with devices configured in this way, if even one element is defective, the entire board becomes unusable, resulting in extremely poor dripping of the product. .

The present invention has been made in consideration of the above points, and provides a line image sensor that is partially replaceable.

An embodiment of the present invention will now be described in detail with reference to the accompanying drawings.

In the line image sensor according to the present invention, as shown in FIG. Stepped portion 31.3 where small substrates 21 to 24 are provided at each joint portion
'2.33, they are made to mesh with each other alternately to form one long substrate l. B on the small board 21
17 element blocks from 1-B17 are arranged in a line, 18 side element blocks from old 7' to B34 are arranged in a line on the small board 22, and 834 side element blocks are arranged on the small board 23.
18 element blocks 851' to 135] are arranged in a line, and 17 element blocks 851' to 867 are arranged in a line on the small substrate 24. Each element block has 32 elements 5 as shown in FIG.
1 to S32 are arranged in a line. In addition, the small board 21
The arrangement positions of the element arrays on each of the small substrates are set so that the element arrays on each of the small substrates become staggered when the elements 24 to 24 are bonded together. Furthermore, when each element row is arranged in a staggered manner, a second
As shown in the figure, the element blocks B17 and B17', 834 and 834', and B51, especially at their joint parts.
and B 5 ]-' are made to overlap so that the image information can be read in duplicate. Note that a1 in Figure 2.
．． a2. a3+... is a terminal drawn out to the common electrode side of each element block, and bl.

b2. b3. . . . indicates terminals drawn out from the elements of each element block to the individual electrode side. Further, FIG. 3 shows details of the joint portion between the small substrate 21 and the small substrate 22. Element blocks B17 and B17' at the joint portion of the small substrates 21 to 24.

The common electrodes B34 and B34' and B51 and 851' are connected to each other outside the substrate.

FIG. 4 shows an example of the configuration of a scanner using the line image sensor according to the present invention described above. Reading is made possible by guiding each element through cell-hock lens arrays 51, 52 which have inclinations corresponding to the respective element rows provided in a staggered manner on the small substrates 22, 24, respectively.

Moreover, in the line image sensor according to the present invention,
As mentioned above, since the element blocks at the joint portions of each of the small substrates 21 to 24 are overlapped and the image information in that area is read redundantly, the image information read in redundant manner is read out from other parts. It is necessary to perform signal processing separately from the read image information in that part. FIG. 5 shows an example of the configuration of a signal processing circuit for this purpose. Here, since a voltage is simultaneously applied to both of the element blocks provided overlappingly, the operational amplifiers O gate to 0P32 each have an element block. It is an adder with each element in the block as a human resistance. Therefore, the next stage operational amplifiers OPa, OPb
By setting the amplification degree to 1/2 only when selecting the element block in the joint part, the image information read redundantly in the joint part is averaged. Figure 6(a) shows an equivalent circuit for signal processing focusing on only one bit when an element block other than the joint part is selected, and Figure 6(b) shows the equivalent circuit for signal processing when an element block in the joint part is selected. The equivalent circuits of signal processing focusing only on the above are shown. In Fig. 6, Vd is the voltage supplied to the element, and the output voltage vO is given by the following formula in case (a), and is given by the following formula in case (b). In the line image sensor according to the invention,
A substrate on which photodetecting elements are arranged in a line is equally divided into a plurality of small substrates, and each of the small substrates is interlocked with each other at a step provided at the joining part to form one long substrate. At the same time, a plurality of element blocks are arranged in a row on each small substrate so that the element rows on each small substrate are alternately staggered when the small substrates are bonded, and each element block at the bonded part is Since they are arranged so as to overlap, it has the excellent advantage that defective small substrates can be replaced and the dripping of the product is improved.

[Brief explanation of the drawing]

FIG. 1 is a plan view showing an example of a line image sensor according to an embodiment of the present invention, FIG. 2 is an equivalent circuit diagram of the bonding portion of the small substrate in the same embodiment, and FIG. 3 is the bonding portion of the small substrate. 4 is a simplified diagram showing an example of the configuration of a scanner using a line image sensor according to the present invention, and FIG. 5 is a signal processing circuit that processes image information read redundantly at the joint of a small board. Figure 6(a) is a diagram showing an equivalent circuit for signal processing focusing only on l-pips 1~ when selecting element blocks other than the bonding part of the small board, and Figure 6(b) is 1 when selecting the element block of the joint part
FIG. 2 is a diagram showing an equivalent circuit for signal processing focusing only on bits. ■... Board 21-24... Small board 31-33 Step portion 41.42... L E D array 51, 52
...Selfoc lens array old ~B67...Element block 81-S32...Photodetection element Applicant's agent Kiyoshi Torii 1, Incident display 1984 Patent Application No. 194564 2, Name of invention Line image Sensor 3, Relationship with the person making the amendment Patent applicant No. 6-6, 1-3 Nakamagome, Oide-ku, Tokyo, Agent 1-1, June 1920 (Shipping date: Month 1, 1920]) 6. Due to the amendment Number 7 of the invention to be amended, Figures 5 and 6(b) of the present application are corrected as shown in the attached sheet.

Claims (1)

[Claims] A substrate on which photodetecting elements are arranged in a line is equally divided into a plurality of small substrates, and each of the small substrates is interlocked with each other at a step provided at the joining part to form one long substrate. At the same time, a plurality of element blocks are arranged in a row on each small substrate so that the element rows on each small substrate are alternately staggered when the small substrates are bonded, and each element block at the bonded part is Line image sensors configured by arranging them so that they overlap.