JPS6080701A - Probe for measuring thickness of suspended matter layer on surface of liquid material - Google Patents

Abstract

PURPOSE:To improve accuracy by amplifying the electric resistance values measured respectively by plural electrode groups provided at a specified interval in the vertical direction on the outside circumferential surface in the lower part of a main unit at specified sequence and outputting the same to a connector. CONSTITUTION:Plural electrode pair groups 21-33 are independently provided at a specified interval in the vertical direction on the outside circumferential surface in the lower part of the main unit 5 of a probe 1 within the range where the part above the slag layer can be covered. A switch 19 is made pushable by a push rod 35 mounted to an insulator 34 at the bottom end of the main unit. The switch 19, the lead wires 39 of the groups 21-33 are connected via a signal processor 9 to a connector 11 connected to an external signal processing means (not shown). The analog multiplexer 16 in the processor 9 connects the groups 21-33 according to the specified sequence via an isolation amplifier 12 to the connector 11 by the signal from a shift register 15. The thickness of the slag layer is thus calculated from the difference in the electric resistance values between the slag layer and the molten metal.

Description

Detailed Description of the Invention The present invention is directed to a molten slag layer M-4 floating on the surface of molten metal in a furnace, or a molten slag layer floating on an ammonia cleaning solution in a cleaning tank J3 for removing pitch from a gas containing pitch. The present invention relates to a probe for measuring the thickness of a suspended substance layer on the surface of a liquid substance such as a muddy mixture layer.

Conventionally, as a probe for measuring the level of molten metal in a smelting furnace such as a converter, a pair of open-circuit electrodes has been used, taking advantage of the fact that both molten slag and molten metal floating on the surface of the molten metal are conductive substances. A probe equipped with a detection electrode at the tip is electrically connected to an external measurement device, attached to an automatic insertion device (such as a converter sublance device, etc.), and synchronized with the lowering of the insertion device to detect the electrode. It is known that the level of molten metal in the furnace is determined from the timing when slag or molten metal is interposed between the two, and the molten metal level in the furnace becomes conductive and an electric signal is generated.

However, this method has the drawback that the true level of molten metal cannot be detected because both molten slag and molten metal are conductive substances.

However, since it is not possible to measure the true thickness of the molten slag layer floating on the surface of the molten metal, there is no data on the amount of slag needed to determine the appropriate amount of auxiliary material required for scouring. There is a problem of not being able to obtain it.

In addition, in the field of gas processing technology, when it is necessary to dispose of pitch after cleaning a gas body containing pitch, the interface between the pitch and the pitch floating on the ammonia solution is used to determine the amount of pitch to be discarded. There was no suitable measuring probe as a means of determining the part.

The present invention allows insertion (lowering) of the insertion device like a conventional probe.
There is no need to synchronize with the speed, and the probe itself is meji 1?
-The aim is to provide a probe for measuring the layer thickness of floating substances such as slag that can accurately measure the thickness of floating substances such as slag.
-ru.

Hereinafter, the probe for measuring the thickness of a suspended substance layer such as slag of the present invention (hereinafter referred to as the probe of the present invention) will be explained according to the embodiment shown in the drawings, taking as an example the measurement of the thickness of molten slag in a smelting furnace such as a converter. .

FIG. 1 shows a probe of the present invention, and the probe (3) has a main body (5) consisting of cylindrical bodies (5a), (5b), and (5c) such as paper tubes.

A plurality of independent electrode pair groups (in the example,
Listen to the interval from 30 to 1001
Electrode pair group (21) (22) -... in the range 0II1
..., (32) (showing an arrangement of (33)) are provided.

The number of electrode pairs can be increased or decreased as necessary, but 4j is sufficient as long as it covers a range at least 15 times greater than the expected thickness of the slag.

By increasing the number of electrode pairs within this range, it becomes possible to understand the resistance characteristics of the slag layer more precisely.

As an example of implementation, the electrode pair nY (21) shown in FIG.
Each of the electrode insulators (37) is supported by a ring-shaped mt40,000 insulator (3I), and the electrode insulator (37) is attached to the outer periphery of one tube (5C).

In addition to this method of constructing independent electrode pairs Y using insulators, a plurality of electrode pairs are arranged at regular intervals C and each is made of a refractory material with good heat resistance and insulation properties in the LC state.
It is also possible to adopt the molding method.

The tube [(5C) has a slit (6) from the F side (),
J3-C electric 4ii pair group (21) (
22) Insert the lead wire (3
9) is derived.

On the other hand, a swing (19) is attached to the F end of the solid body (5C), and the switch (19) is connected to the electrode pair group (21) (2
2) It is guided to the signal processing device (9) by the lead wire (39).

Further, a tip insulator (34) is fixed to the lower end of the cylinder (5C), and a bushing rod (3) that protrudes from the lower end surface and can push the switch (19) by vertical movement is attached to the tip insulator (34).
5) is installed.

Next, a connector (11) protrudes upward from the signal processing device (9), and the connector (11) connects external signals via the connector of the holder (2) of the probe insertion device (1) such as a sublance as shown in FIG. It is for electrical connection to a processing means (not shown) (note that the signal processing device (9) portion can be used repeatedly).

FIG. 2 shows a block diagram of the electric circuit of the signal processing device (9), and the signal processing bag N (9) has an electrode pair group (21) (2
2) has an analog multiplexer (16) connected to it.

A 1-tube signal generation circuit (11) and a bottom signal generation circuit (18) are further connected to the analog multiplexer (16).

The top signal generation circuit (11) and the bottom signal generation circuit (18) clearly define the periodic measurement intervals of the electrode pair groups (21), (22), etc. while avoiding generation of predetermined reference horns. However, if such delimiters are unnecessary, they may be omitted.

The analog multiplexer (16) uses the signal from the shift register (15) to connect the top signal generation circuit (1
7), the electrode pair groups (21), (22), etc. and the bottom signal generation circuit (18) are connected to the input terminal of the isolation amplifier (12) according to a fixed sequence.

The shift register (15) receives the pulse signal Jζ from the clock pulse IJ- (14), which is a periodic pulse generation circuit.
It is driven by

A clock pulser (14) is connected to the swing (19) and starts generating pulses in response to a signal from the switch (19).

Next is the isolation amplifier (12), which electrically insulates the crowd 13 to block noise, but also has a circuit for optically connecting input and output, for example), and its output terminal is Connected to the connector (11).

As a signal processing method of the input signal from the analog multiplexer (16) in the isolation amplifier (12), for example, the following method can be considered: A. Electrode pair group (21)
(22) Each signal is output as is to the connector (11).

B. Calculate the number of electrode pairs (21), (22), etc. whose output values are within a certain range (these are those immersed in a layer of suspended matter such as slag). Output that value.

The above isolation amplifier (12), pulser (14), shift register (15) and analog multiplexer (16) are powered by a battery (13).

The method of use and operation of the probe of the present invention shown in the above embodiments will now be described.

Also shown in Figure 3? 1', the probe (3) is placed in the holder (2) of the probe insertion device N (1) S! ii.

Thereby, the connector (11> of the probe (3) is electrically connected to the holder (2).

In this state, the probe (3) is inserted into the furnace, but since there are eight layers of slag on the surface of the molten metal 8 in the furnace, the probe (3)
3) The lower end first contacts the surface of the eight slag layers.

This allows the bushing rod (35) at the upper end of the probe (3) to
) is pushed up and the switch (19) is closed.

This causes the clock valve (14) to start operating and supply a pulse signal to the shift register (15).

As a result, the shift register (15) drives the analog multiplexer (16), the top signal generating circuit (17), and the top signal generating circuit (17) in the analog multiplexer (16). 21) (22)・・・・・・
- and the bottom signal generation circuit (18) are sequentially connected to the isolation amplifier (12).

Input signals such as electrical resistance values of the electrode pair groups (21), (22), etc. are amplified and appropriately signal-processed by an isolation amplifier (12), and then sent to an external measuring device (Fig. (not shown).

Here, the measured resistance value of each electrode pair group (21) (22)... is the electrode pair group (21) (22>...
It is determined by the value of the current flowing through the slag A1, molten metal 8, etc. at the position of...

Therefore, since slag A normally has a higher electrical resistance value than molten metal B, in the inserted state shown in Fig. 3, electrodes λ・1 group (21
) (22) It is thought that the electrical resistance value of... will be in the state shown in FIG.

That is, the electrode pair (32) (33) located in the molten metal B
) etc. have a low electrical resistance value, and electrode pairs located in the air (2
1) The electrical resistance value of (22) etc. is high.

On the other hand, the electrode pair located in the slag A layer has a higher electrical resistance value than the molten metal B, but the value is not constant, because the lower part of the 6th layer of the slab is considered to be in a mixed state with the molten metal B. This is because it is thought that the electrical resistance value decreases as the temperature increases.

The pulses from the electrode pair are, for example, J(21), (22).
As a result of being sequentially scanned, the electrical resistance value of each electrode material gradually changes from the high value in the air to the low bean paste in the 6 layers of slag or molten metal B. .

Figure 4 shows a hypothetical diagram of the resistance change curve corresponding to the pulse signals sent in the above sequence (the vertical axis shows the resistance value increasing downward), and is set for the part depicted in the air. The resistance level is maximum, and as it enters the 8th layer of slag, the resistance gradually decreases and eventually reaches the same resistance value of molten metal B through the interface between the 8th slag layer and molten metal B. “There is.

In this way, a series of signals divided by the top signal and the bottom signal are continuously recorded. When the probe reaches and passes through the eight layers of slag, it melts into the slab AH. It can be clearly seen that it moves to the point where the interface with metal B can be identified.

Therefore, the thickness of the eight slag layers can be calculated by counting the number of electrode pairs whose electrical resistance values are within the range of the predetermined maximum and minimum values, and multiplying this by the distance between the electrode pairs, which is then calculated by 81.

Further, a constant bias may be applied to the pulse output to enable checking of the state of wire breakage, etc. before the start of the measurement period.

Further, in order to prevent the pulse output of the electrode pairs exposed to the air from varying depending on the atmosphere, a resistance slightly lower than the resistance of the air (for example, 1 MΩ) may be connected to all the electrode pairs in advance.

In addition to the embodiments shown above, the probe of the present invention may have the following configuration.

That is, the isolation amplifier (12) is for noise isolation and may be a normal amplifier.

Further, the i~tube signal generation circuit (11) and the bottom signal generation circuit (18) are incidental.

Further, the switch (19) is an IC that starts the measurement from the time when the probe (3) reaches the surface of the slag A layer, so it is possible to omit the switch (19) and start the measurement from an earlier stage.

Further, the electrode pair groups (21), (22), etc. may be arranged so that they do not protrude from the electrode insulators (37) as shown in FIG.

If there is a possibility that slag may adhere to the electrode pairs when the probe is lowered or immersed, the outer periphery of the electrode pair group may be covered with a paper tube or other combustible exterior material.

In this case, unlike the pulse signal waveform described in section 2, a waveform indicating the thickness of the slag layer is obtained immediately after the exterior material is burned out.

Above, we have explained how to measure the thickness of a suspended solids layer on the surface of a liquid material using molten slag and molten metal in a smelting furnace as an example. It is extremely easy to measure the density of a suspended solid layer on the surface of a liquid substance for the purpose of identifying the interface of an ammonia solution, and of other similar substances.

The pro 1 of the present invention is shown in the above embodiments and has the following effects in its IC configuration, method of use, and operation.

(1) The probe of the present invention has the structure described in the claims, and in particular, the probe has the structure shown in the lower part of the main body in the vertical direction. 1
(ii) Since a plurality of independent electrode pair groups are installed, the thickness of the layer of floating substances such as slag can be determined from the electrical resistance measured by each of these, and as a result, it is possible to synchronize with the insertion speed of the probe. It is possible to accurately measure the thickness of the layer of suspended matter such as slag without any problems.

(2) The probe of the present invention has the same configuration as above and can accurately measure the thickness of a layer of suspended matter such as slag, making it possible to measure the true level of the liquid substance beneath such a layer of suspended matter.

(3) The probe of the present invention has the same configuration as above, and since the state of change in resistance value in the thickness direction of the layer of floating substances such as slag can be directly read from the pulse signal, various types of characteristic research are possible.

(4) The probe of the present invention has the same configuration as above, and even if the probe moves slightly up and down during measurement, the entire curve drawn by the pulse signal moves. There is no effect on this and it can be measured reliably.

(5) The probe of the present invention has the same configuration C as above, and in particular has a signal processing device that partially outputs the electrical resistance value measured by the electrode pair group according to a sequence, so the number of wires in the connector and holder can be extremely small.

[Brief explanation of the drawing]

Fig. 1 is a vertical cross-sectional view of the probe of the present invention Fig. 2 is a block diagram of the electric circuit of the signal processing device of the same probe as above Fig. 3 is a diagram of the use state of the same one nib probe Fig. 4 is the electrical resistance measured by the same electrode pair group FIG. 5 is a partial vertical cross-sectional view of a probe 11-j that receives other electrode pair groups. 1: Probe insertion device 2: Boulder 3: Probe 5: Main body 5a, . 5b, 5C: Cylindrical body 6: Slit 9: Signal processing device 11: Connector 12, Isolation 31, Pump 7, 13: Battery 14: Clock valve, 15: Shift register 16: Analog multiplex cleaner, 1F: 1 to block signal generation circuit 18: Box 1 to signal generation circuit 19: Switches 21, 22...32.33: Electrode pair group 34
: Tip insulator 35 : Bush rod 37 : Electrode insulator 39 : Lead wire A ゛ Slag B : Molten metal Applicant Kawaso Electric Industry Co., Ltd. Agent Hideya Hashizume Figure 4

Claims (1)

[Claims] 1. A plurality of groups of electrode pairs provided at regular intervals in the vertical direction on the outer peripheral surface of the lower part of the main body, and a signal processing device that amplifies the electrical resistance value measured by each of the groups of electrode pairs according to a certain sequence and outputs it to a connector. A probe for measuring the thickness of suspended solids on the surface of a liquid substance.