JPS6078309A - Fluorescent x-ray film thickness gage - Google Patents

Fluorescent x-ray film thickness gage

Info

Publication number
JPS6078309A
JPS6078309A JP18649183A JP18649183A JPS6078309A JP S6078309 A JPS6078309 A JP S6078309A JP 18649183 A JP18649183 A JP 18649183A JP 18649183 A JP18649183 A JP 18649183A JP S6078309 A JPS6078309 A JP S6078309A
Authority
JP
Japan
Prior art keywords
ray source
ray
shutter
sample surface
fluorescent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18649183A
Other languages
Japanese (ja)
Inventor
Toshio Watanabe
渡辺 登志夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP18649183A priority Critical patent/JPS6078309A/en
Publication of JPS6078309A publication Critical patent/JPS6078309A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To enable exact viewing of the condition on a sample surface on the image screen of a television set by providing an X-ray source part having an X- ray source provided to a main unit and a shutter which is provided freely movably back and forth in the lower position of said X-ray source part. CONSTITUTION:An X-ray source part 10 has an X-ray source 12 provided to a main unit 11 and the X-ray source 12 is dipped in oil 13 and is held hermetically by a cover body 14. A shutter body 19 is provided freely movably back and forth in the direction of an arrow A to a pair of sliding bodies 17, 18 held freely slidably to a pair of guide bearings 15, 16 in the lower position of the part 10. The condition on the sample surface is made visible exactly on the image screen of a television set by the above-mentioned constitution.

Description

【発明の詳細な説明】 本発明は螢光X線膜厚計に関し、特に、試料面をテレビ
画面で見つつ位置を確認して測定できるようにするため
の改良に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a fluorescent X-ray film thickness meter, and more particularly to an improvement that enables measurement by confirming the position of a sample surface while viewing it on a television screen.

従来用いられていた螢光X線膜厚計は第1図A、Bに示
されるように、X線源1から放射されたX線ビーム2は
試料面3に照射され、この試料面3から発生する螢光x
84が検出器5に導かれて検出されておシ、前記試料面
3の状態を観察するには試料面上に配設された観察手段
6によって行なっていた。
As shown in FIGS. 1A and 1B, in the conventional fluorescent X-ray film thickness meter, an X-ray beam 2 emitted from an X-ray source 1 is irradiated onto a sample surface 3. Fluorescence generated x
84 is guided to the detector 5 and detected, and the state of the sample surface 3 is observed by the observation means 6 disposed on the sample surface.

しかしながら、このような従来構成においてはX線源l
OX線軸と観察手段6の光軸とが一致していないために
、X線ビームが照射された試料面3の状態は第1図Bに
示すように種口形となり、ICパターン等の微少部分の
正確な測定が極めて困難であった。又、観察手段として
は顕微鏡が用いられていたために、目で常時レンズを見
ることは疲労が大きく、操作上極めて不便なものであっ
た。
However, in such a conventional configuration, the X-ray source l
Since the OX-ray axis and the optical axis of the observation means 6 do not coincide, the state of the sample surface 3 irradiated with the X-ray beam becomes a mouth-shaped state as shown in FIG. Accurate measurements were extremely difficult. Furthermore, since a microscope was used as the observation means, constantly looking at the lens with the eye was very tiring and extremely inconvenient in operation.

本発明は以上の欠点をすみやかに除去するための極めて
効果的な手段を提供することを目的とするもので、とぐ
に、シャッタ一体に設けられたミラーボックス全弁して
試料面の状態をテレビカメラで撮影し、ブラウン管上で
表示するようにした構成でちる。
The object of the present invention is to provide an extremely effective means for quickly eliminating the above-mentioned drawbacks. The structure is such that images are taken with a camera and displayed on a cathode ray tube.

以下、図面と共に本発明による螢光X線膜厚計について
詳細に説明する。
Hereinafter, the fluorescent X-ray film thickness meter according to the present invention will be explained in detail with reference to the drawings.

図面において符号1oで示されるものは本体11に設け
られX′Ifs源[2を有するX線源部でらシ、このX
線源12は油13中に浸漬されていると共に蓋体14に
より密閉状態に保持されている。
1o in the drawings is an X-ray source section provided in the main body 11 and having an X'Ifs source [2;
The radiation source 12 is immersed in oil 13 and is kept in a sealed state by a lid 14.

このX線源部10の下部位置には一対の案内軸受15 
、16に摺動自在に保持された一対の摺動体17゜18
にシャッタ一体19が矢印Aの方向に往復移動自在に設
けられている。
A pair of guide bearings 15 are provided at a lower position of the X-ray source section 10.
, a pair of sliding bodies 17°18 slidably held by 16.
A shutter unit 19 is provided so as to be able to move back and forth in the direction of arrow A.

このシャッタ一体19は本体11に設けられた回転移動
手段であるロータリーソレノイド肋の作動レバー21の
一端に連結されておシ、ロー1’)−ソvノイド20の
作動によシ前記シャッタ一体19は矢印Aの方向に往復
移動できるものである。本体11の下部には一対のスト
ッパー22、田が設けられ、シャッタ一体19の左右方
向の移動範囲を制限している。
This shutter unit 19 is connected to one end of an operating lever 21 of a rotary solenoid rib, which is a rotary moving means provided in the main body 11, and is activated by the operation of a rotary solenoid 20. can move back and forth in the direction of arrow A. A pair of stoppers 22 are provided at the bottom of the main body 11 to limit the movement range of the shutter unit 19 in the left and right direction.

さらに、前記シャッタ一体19の一面には較正用試料板
囚が設けられていると共に、この較正用試料板囚に隣接
してミラー板25が設けられていると共に、このミラー
板石に対向して前記シャッタ一体19内にランプ2Gが
内蔵されておシ、試料面27奢照射することができる。
Furthermore, a calibration sample plate is provided on one side of the shutter unit 19, and a mirror plate 25 is provided adjacent to this calibration sample plate, and a mirror plate 25 is provided opposite to this mirror plate. A lamp 2G is built into the shutter assembly 19 and can illuminate the sample surface 27.

このシャッタ一体19における前記ミラー板5の下部位
置にはハーフミラ−坂路および反射ミラー29ヲ有する
ミラーボックス(9)が一体に設けられており、このミ
ラーボックス30に図示しない観察手段であるTVカメ
ラが装着され、”aI軸と観察用の光軸とが一致するよ
うに調整されている。
A mirror box (9) having a half mirror slope and a reflecting mirror 29 is integrally provided at a lower position of the mirror plate 5 in the shutter unit 19, and a TV camera (not shown) as an observation means is installed in this mirror box 30. It is attached and adjusted so that the aI axis and the optical axis for observation coincide.

pIJ記シャッタ一体19の下端部には各々直径の異な
る複数のコリメータ孔31 、32 、33 、34 
、35を有するコリメータ体36が回転自在に軸支部3
7によシ軸支されておシ、コリメータ体36と一体に形
成されたツマミ部38ヲ介して矢印Bの方向に回転させ
ることによシアマークの位置に合わせたコリメータ孔3
3がその時のX線ビームが通過するコリメータ孔となる
ものである。
A plurality of collimator holes 31, 32, 33, 34 each having a different diameter are provided at the lower end of the pIJ shutter unit 19.
, 35, the collimator body 36 is rotatably attached to the shaft support 3.
The collimator hole 3 is rotated in the direction of arrow B via a knob 38 formed integrally with the collimator body 36 to align with the position of the shear mark.
3 is a collimator hole through which the X-ray beam passes through.

従って、このコリメータ体19の移動する距離はハーフ
ミラ−板28の中心点とPマークのコリメータ孔33の
中心点との間に設けられた距離りが移動範囲となり、X
線源12に対してノ・−フミラー板あが位置している時
、すなわち較正用試料板24にX線ビームが照射してい
る状態はシャッタ一体19が閉状態であシ、X線源I2
からのX線ビームがコリメータ体3GのPマークのコリ
メータ孔33ヲ通過して試料板nに照射している時はシ
ャッタ一体19に隣接して比例計数管等から検出器39
が設けられ、この検出器39には較正用試料板賞からの
螢光X線を入射させるための第1入射開口部40および
試料面27からの螢光X線を入射させるための第2入射
開口部41が各÷形成され、この第2入射開口部41の
前面側には、例えば、コバルトからなるフィルター42
が矢印Cの方向に可動式に設けられている。
Therefore, the moving distance of this collimator body 19 is the distance provided between the center point of the half mirror plate 28 and the center point of the collimator hole 33 of the P mark, and
When the mirror plate is positioned relative to the radiation source 12, that is, when the calibration sample plate 24 is irradiated with the X-ray beam, the shutter unit 19 is in the closed state, and the X-ray source I2
When the X-ray beam from the collimator body 3G passes through the collimator hole 33 marked P in the collimator body 3G and is irradiating the sample plate n, the detector 39
The detector 39 is provided with a first entrance opening 40 for entering the fluorescent X-rays from the calibration sample plate and a second entrance opening for entering the fluorescent X-rays from the sample surface 27. Apertures 41 are formed on each side, and a filter 42 made of cobalt, for example, is provided on the front side of the second entrance aperture 41.
is provided movably in the direction of arrow C.

前記ミラーボックス30の長手方向と直交する方向には
テレビカメラレンズ体43が本体11に設けられた取付
体44に対して摺動部45を介して装着されておシ、ね
じ部46をゆるめることによりテレビカメラレンズ体4
3は矢印Cの方向に回動することができる。
In a direction perpendicular to the longitudinal direction of the mirror box 30, a television camera lens body 43 is attached to a mounting body 44 provided on the main body 11 via a sliding part 45, and a screw part 46 is loosened. TV camera lens body 4
3 can rotate in the direction of arrow C.

又、このテレビカメラレンズ体43にはテレビカメラ4
7がテレビカメラレンズ体43の長手方向と直交する方
向に取付けられている。
Moreover, the television camera 4 is attached to this television camera lens body 43.
7 is attached in a direction perpendicular to the longitudinal direction of the television camera lens body 43.

以上のような構成において、本発明による螢光X線膜厚
計を作動させる場合について述べると、まず、シャッタ
一体19ヲ第2図で示す閉状態に保ち、X線源12ヲオ
ンとすると、X線ビーム12αは較正用試料板囚に照射
され、この較正用試料根回からの螢光X線は第1入射開
口部40全経て検出器39に入射して測定され、本膜厚
計の測定コンディションが一定値に整えられる。
In the above configuration, when operating the fluorescent X-ray film thickness meter according to the present invention, first, if the shutter unit 19 is kept in the closed state shown in FIG. 2 and the X-ray source 12 is turned on, The ray beam 12α is irradiated onto the calibration sample plate, and the fluorescent X-rays from the calibration sample plate are incident on the detector 39 through the entire first entrance aperture 40 and measured. Conditions are adjusted to a constant value.

次に、シャッタ一体19全回II移動手段であるロータ
リ−ソレノイド20ヲ作動させると、第2図において右
側に移動し、ストッパー詔に接合した状態に保持される
Next, when the rotary solenoid 20, which is the means for moving the shutter unit 19 all the way, is operated, it moves to the right in FIG. 2 and is held in a state connected to the stopper sleeve.

この状態では、X線ビーム12αは較正用試料板冴に照
射されず、シャッタ一体19ヲ経てコリメータ体36の
Pマーク位置のコリメータ孔33ヲ介して一定径のビー
ムどなって試料面27に照射され、試料面27からの螢
光X線は第2入射開口部41を介して検出器39内に入
射される。
In this state, the X-ray beam 12α does not irradiate the calibration sample plate, but passes through the shutter unit 19, passes through the collimator hole 33 at the P mark position of the collimator body 36, becomes a beam of a constant diameter, and irradiates the sample surface 27. The fluorescent X-rays from the sample surface 27 enter the detector 39 through the second entrance aperture 41.

この場合、前記コリメータ体36は、ツマミ部38を矢
印Bの方向に回転させることkよ)、コリメータ孔31
は0.1ミリ、コリメータ孔32は0.2ミリ、コリメ
ータ孔33は0.3ミリ、コリメータ孔34は0゜5ミ
リ、コリメータ孔35は1.Qミリの直径であるため、
任意のコリメータ孔をPマークに合わせれば、任意の直
径のコリメータ孔に合わせることができ、被測定試料の
測定部の大きさによシ任意に選択できるものである。
In this case, the collimator body 36 is rotated by rotating the knob 38 in the direction of arrow B), the collimator hole 31
is 0.1 mm, collimator hole 32 is 0.2 mm, collimator hole 33 is 0.3 mm, collimator hole 34 is 0°5 mm, collimator hole 35 is 1. Since it has a diameter of Q mm,
By aligning an arbitrary collimator hole with the P mark, the collimator hole can be aligned with an arbitrary diameter, and can be arbitrarily selected depending on the size of the measurement part of the sample to be measured.

さらに、試料面nの状況はミラーボックス11テレビカ
メラレンズ体43’&介してテレビカメラ47によシ撮
像され、図示しないブラウン管により表示することがで
きるものでアシ、テレビカメ247はX、Y、Z三次元
方向に微量移動調整できる構成で予め、X線軸と観察系
の光軸とが一致するように調整されている。
Further, the situation of the sample surface n is imaged by the television camera 47 through the mirror box 11 and the television camera lens body 43', and can be displayed on a cathode ray tube (not shown). It has a configuration that allows minute movement adjustment in the Z three-dimensional direction, and is adjusted in advance so that the X-ray axis and the optical axis of the observation system coincide.

本発明は以上のような構成と作用とを備えているため、
試料面上の状況をテレビ画面によシ正確に見ることがで
きるため、目でのぞく必要がなくなり、極めて疲労の少
ない操作全達成することができる。
Since the present invention has the above configuration and operation,
Since the situation on the sample surface can be accurately viewed on a television screen, there is no need to look into the specimen surface with the naked eye, making it possible to perform all operations with extremely little fatigue.

又、X線軸とテレビカメラの光軸とが一致するように調
整されているため、ミラーボックスに十文字等の目盛が
付してちることにより、X線の正確な照射位置ヲ決める
ことができるものでちる。
In addition, since the X-ray axis and the optical axis of the television camera are adjusted to match, the mirror box is marked with cross-shaped scales, making it possible to determine the exact irradiation position of the X-ray. Dechiru.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図Aは従来の膜厚計を示す構底図、第1図Bは第1
図Aの膜厚計によるX線照射状態を示す試料の平面図、
第2図は本発明による螢光X線膜厚計を示す正面断面図
、第3図は第2図のA−A線による断面図、第4図は第
3図のコリメータ体の轟面図、第5図は要部の拡大図で
ある。 10はX綜源部、11は本体、12はX線源、13は油
、14は蓋体、191″l:シャッタ一体、加はロータ
リーソレノイド、24は較正用試料板、25はミラー板
、27は試料面、路はハーフミラ−板、四は反射ミラー
、30はミラーボックス、31〜35はコリメータ孔、
36はコリメータ体、38はツマミ部、39は検出器、
40は第1入射開口部、41は第2入射開口部、42は
フィルター、43はテレビカメ2レンズ体、44は取付
体、45Fi、摺動部、47はテレビカメラである。 以上 出願人 セイコー電子工業株式会社 代理人 弁理士 最 上 務
Figure 1A is a bottom view of a conventional film thickness meter, and Figure 1B is a bottom view of a conventional film thickness meter.
A plan view of the sample showing the X-ray irradiation state by the film thickness meter in Figure A,
Fig. 2 is a front sectional view showing the fluorescent X-ray film thickness meter according to the present invention, Fig. 3 is a sectional view taken along line A-A in Fig. 2, and Fig. 4 is a top view of the collimator body in Fig. 3. , FIG. 5 is an enlarged view of the main part. 10 is an X-source part, 11 is a main body, 12 is an X-ray source, 13 is oil, 14 is a lid body, 191"l: shutter integrated, addition is a rotary solenoid, 24 is a calibration sample plate, 25 is a mirror plate, 27 is a sample surface, path is a half mirror plate, 4 is a reflection mirror, 30 is a mirror box, 31 to 35 are collimator holes,
36 is a collimator body, 38 is a knob part, 39 is a detector,
40 is a first entrance opening, 41 is a second entrance opening, 42 is a filter, 43 is a TV camera 2 lens body, 44 is a mounting body, 45Fi is a sliding part, and 47 is a TV camera. Applicant: Seiko Electronic Industries Co., Ltd. Agent Patent Attorney Mogami

Claims (1)

【特許請求の範囲】[Claims] 本体に設けられX線源を有するX線源部と、このX線源
部の下部位置においてこのX線源からのX線ビームを横
切る方向に往復移動自在に設けられたシャッターと、こ
のシャッターを往復移動させるための往復移動手段と、
このシャッターの下端に設けられたコリメータ体と、こ
のシャッターの下端に設けられたミラーボックスと、本
体に設けられ少なくともXY方向に可動なテレビカメラ
体と、テレビ画面手段とを備え、前記シャッターが試料
上にX線ビームを通過させない閉状態において、前記テ
レビカメラにょシ試料面をテレビ画面手段に映しだし、
試料面上のX線ビームの照射位置を調節することができ
るように構成した芸光X線模厚計。
An X-ray source section provided in a main body and having an X-ray source; a shutter provided at a lower position of the X-ray source section so as to be movable back and forth in a direction across the X-ray beam from the X-ray source; a reciprocating means for reciprocating;
The shutter includes a collimator body provided at the lower end of the shutter, a mirror box provided at the lower end of the shutter, a television camera body provided in the main body and movable in at least XY directions, and a television screen means, projecting the sample surface of the television camera on a television screen means in a closed state that does not allow the X-ray beam to pass therethrough;
Geiko's X-ray thickness meter is configured so that the irradiation position of the X-ray beam on the sample surface can be adjusted.
JP18649183A 1983-10-05 1983-10-05 Fluorescent x-ray film thickness gage Pending JPS6078309A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18649183A JPS6078309A (en) 1983-10-05 1983-10-05 Fluorescent x-ray film thickness gage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18649183A JPS6078309A (en) 1983-10-05 1983-10-05 Fluorescent x-ray film thickness gage

Publications (1)

Publication Number Publication Date
JPS6078309A true JPS6078309A (en) 1985-05-04

Family

ID=16189415

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18649183A Pending JPS6078309A (en) 1983-10-05 1983-10-05 Fluorescent x-ray film thickness gage

Country Status (1)

Country Link
JP (1) JPS6078309A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6258749U (en) * 1985-09-30 1987-04-11
JP2013221744A (en) * 2012-04-12 2013-10-28 Horiba Ltd X-ray detection device
JP2013221745A (en) * 2012-04-12 2013-10-28 Horiba Ltd X-ray detection device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6258749U (en) * 1985-09-30 1987-04-11
JPH0539449Y2 (en) * 1985-09-30 1993-10-06
JP2013221744A (en) * 2012-04-12 2013-10-28 Horiba Ltd X-ray detection device
JP2013221745A (en) * 2012-04-12 2013-10-28 Horiba Ltd X-ray detection device

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