JPS6078304A - Signal processing system for detecting two-dimensional position - Google Patents
Signal processing system for detecting two-dimensional positionInfo
- Publication number
- JPS6078304A JPS6078304A JP58187216A JP18721683A JPS6078304A JP S6078304 A JPS6078304 A JP S6078304A JP 58187216 A JP58187216 A JP 58187216A JP 18721683 A JP18721683 A JP 18721683A JP S6078304 A JPS6078304 A JP S6078304A
- Authority
- JP
- Japan
- Prior art keywords
- light
- dimensional position
- irradiated
- signal processing
- algorithm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Manipulator (AREA)
- Control Of Position Or Direction (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、ロボットが対象物体や作業環境に関する距離
情報を得るときによく使われる。対象物体や作業環境に
スポット光、スリット光およびランダムパターン光など
を照射する方法において。DETAILED DESCRIPTION OF THE INVENTION The present invention is often used by robots to obtain distance information about a target object or work environment. In a method of irradiating a target object or work environment with spot light, slit light, random pattern light, etc.
その反射光の２次元位置を高感度かつ背景のランダムノ
イズを除去して検出可能な信号処理方式に関するもので
ある。The present invention relates to a signal processing method that can detect the two-dimensional position of the reflected light with high sensitivity while removing background random noise.
ロホンティクスにおいて重要な作業対象物や作業環境な
どの３次元情報をめる方式として、スポット光、スリッ
ト光およびランタムパターン光などを作業対象物や作業
環境などにアクティブに照射し、テレビカメラなどでそ
の反射光を検出し三角測量法に基づいて３次元位置や距
離などを計算する方法がある。しかし、この方法は、照
明条件に敏感であり、明るい場所では反射光の検出が困
難であったり１作業対象物や作業環境などの表面状態や
姿勢によっては反射が弱くなり受光できないことや、−
画面内や−スキャンライン上の最明点を検出する従来の
方式を用いると、照射しているスポット光、スリット光
およびランダムパターン光などよりもっと明るい個所が
他に存在すれば、照射光以外の位置を検出して誤動作す
るなどの欠点がある。As a method for capturing 3D information about work objects and the work environment, which is important for Lohontics, the work objects and work environment are actively irradiated with spot light, slit light, and random pattern light. There is a method of detecting the reflected light and calculating the three-dimensional position and distance based on the triangulation method. However, this method is sensitive to lighting conditions, and it is difficult to detect reflected light in bright places, and depending on the surface condition and posture of the work object and work environment, the reflection becomes weak and light cannot be received.
Using the conventional method of detecting the brightest point within the screen or on the scan line, if there is another spot that is brighter than the irradiating spot light, slit light, random pattern light, etc. It has drawbacks such as malfunction due to position detection.
本発明は、上記の欠点を解決することを目的としてなさ
れたもので、スポット光、スリ・シト光およびランダム
パターン光などを一定の法則に従って照射したシーンと
照射しないシーンの反射入力画像の差をとり、スポット
光、スリット光およびランタムパターン光など以外の背
景画像を消去する手法を用いる。さらに９反射光が微弱
な場合や、背景がランダムノイズで汚されている場合に
は、−上記の処理を複数回繰り返して、加算平均を行な
い、 Ｓ／Ｎ比を向旧させて信頼性よくスポット光、ス
リ・シト光およびランダムパターン光などの２次元位置
の検出を行なうことができるようにした信号処理方式で
ある。以下９本発明について説明する。The present invention was made with the aim of solving the above-mentioned drawbacks, and it is possible to solve the difference between reflected input images of a scene illuminated with spot light, spot light, random pattern light, etc. according to a certain rule and a scene not illuminated. A method is used to remove background images other than spot light, slit light, random pattern light, etc. Furthermore, if the reflected light is weak or the background is contaminated with random noise, repeat the above process multiple times and average it to improve the S/N ratio and improve reliability. This is a signal processing method that can detect two-dimensional positions of spot light, spot light, random pattern light, etc. Below, nine aspects of the present invention will be explained.
第１図に９本発明の信号処理方式による２次元位置検出
装置を構成要素とする距離計測システムの構成例を示す
。これは、計算機１における距離計測のアルゴリズム２
からの命令により、入出力装＠３を通して、スポット光
、スリ・シト光およびランダムパターン光などを照射装
置４から対象物体や作業環境へ照射し、その反射光を本
発明の信号処理方式による２次元位置検出装置５で検出
し、入出力装置３を通して得られたデータを用いて、三
角測量法に基づくアルゴリズム２により対象物体や作業
環境の３次元情報をめるシステムである。FIG. 1 shows an example of the configuration of a distance measuring system including a two-dimensional position detecting device using the signal processing method of the present invention as a component. This is algorithm 2 for distance measurement in calculator 1.
According to a command from , the irradiation device 4 irradiates a target object or work environment with spot light, spot light, random pattern light, etc. through the input/output device @ 3, and the reflected light is irradiated with 2 by the signal processing method of the present invention. This is a system that uses data detected by the dimensional position detection device 5 and obtained through the input/output device 3 to obtain three-dimensional information about the target object and the work environment using algorithm 2 based on triangulation.
次に１本発明の信号処理方式について説１！１１する。Next, the signal processing method of the present invention will be explained.
スポット光、スリット光およびラングｌ、パターン光な
どを照射したとき、その５番目の反射入力画像信号は２
次式で表わされる。When spot light, slit light, rung l, pattern light, etc. are irradiated, the fifth reflected input image signal is 2.
It is expressed by the following formula.
［（ｘ、ｙ、ｉ） ＝ ｌ５（ｘ、ｙ、ｉ） ＋ Ｉｂ
（ｘ、ｙ） ＋ Ｎ（ｉ）ここで、Ｉｓ：照射光の反射
入力画像信号。[(x, y, i) = l5(x, y, i) + Ib
(x, y) + N(i) where Is: reflected input image signal of the irradiation light.
Ｉｂ 背景画像の内で変化しない成分６Ｎ ：背景画像
のランダムノイズを含
む雑音成分で、白色雑音と仮定。Ib Component that does not change in the background image 6N: A noise component including random noise in the background image, assumed to be white noise.
たとえば、奇数番目の画像 １（ｘ、ｙ、２’１−１）
を。For example, odd numbered image 1(x,y,2'1-1)
of.
スポット光、スリット光およびランダムパターン光など
を照射したときの画像、偶数番目の画像１（ｘ、ｙ、２
ｉ）を、照射しないときの画像とすると。Images when spot light, slit light, random pattern light, etc. are irradiated, even-numbered image 1 (x, y, 2
Let i) be an image without irradiation.
その差 １ｄ（ｘ、ｙ、ｉ） は７
Ｉｄ（ｘ、ｙ、ｉ）
＝ Ｔ（３ｙ、２ｌ−１）−１（ｘ、ｙ、２ｉ）＝ （
Ｉｓ（ｘ、ｙ、２ｉ−１） ＋ Ｉｂ （Ｘ、ｙ） 今
Ｎ（２ｉ−１））−（Ｉｂ（Ｘ、ｙ）＋ Ｎ（２ｉ）
１
＝ Ｉｓ（＋＋、ｙ、２ｉ−１） ＋ ｊＮ（２ｉ−１
） −Ｎ（２ｉ））となる。 この操作をＭ回くり返し
て、平均すると２次式が得られる。The difference 1d(x, y, i) is 7 Id(x, y, i) = T(3y, 2l-1)-1(x, y, 2i) = (
Is (x, y, 2i-1) + Ib (X, y) Now N (2i-1)) - (Ib (X, y) + N (2i)
1 = Is(++, y, 2i-1) + jN(2i-1
) −N(2i)). By repeating this operation M times and averaging, a quadratic equation is obtained.
Ｉｅ（ｘ、ｙ、Ｎ）
この式において、第一項は、スポット光、スリット光お
よびランダムパターン光などの信号分であり１Ｍの値に
もかかわらず、一定である。−力。Ie (x, y, N) In this equation, the first term is a signal component such as spot light, slit light, and random pattern light, and is constant despite the value of 1M. -Power.
第２項は、白色雑音の性質によって１Ｍが増加するにつ
れて、１／「Ｗ に比例し、従って、Ｉｅの全体として
のＳ／Ｎ比は、ＦＷに比例して向上していく。このよう
に上記の操作を行なうことにより、微弱なスポット光、
スリ・シト光およびランダムパターン光なとでも感度よ
くその２次元位置を検出できる。背景にある周期的なラ
ンダムノイズを除去するためには９Ｍ系列などの乱数で
照射光を点減し、相関を利用した信号処理を行なう。The second term is proportional to 1/W as 1M increases due to the nature of white noise, and therefore the overall S/N ratio of Ie increases in proportion to FW. In this way, By performing the above operations, a weak spot light,
The two-dimensional position can be detected with high sensitivity even with pick-pocket light and random pattern light. In order to remove periodic random noise in the background, the irradiation light is subtracted using random numbers such as a 9M sequence, and signal processing using correlation is performed.
また１来信号処理方式の信頼性向」−および高速化をは
かるために次のような方法が考えられる。Furthermore, in order to improve the reliability of signal processing systems and increase speed, the following methods can be considered.
■照射光の波長成分以外を力・シトする干渉フィルタの
併用。■Used in combination with an interference filter that filters out wavelength components other than the wavelength components of the irradiated light.
（■スポット光やスリ・シト光などの検出候補の周辺を
ウィンドでマスクし、全画像を処理せずウィンド内のみ
を処理して高度化をはかる。(■Mask the area around detection candidates such as spot light and pickpocket light with a window, and process only the area within the window without processing the entire image to improve sophistication.
本信号処理方式のアルゴリズムをＣＣＤなどの光電変換
素子、複数個のイメージバッファ、簡単な演算回路およ
び照射光との同期回路などで構成される２次元位置検出
機能付きの半導体センサとしてハードウェア化すればｌ
チップのデバイスか実現できる。The algorithm of this signal processing method is implemented in hardware as a semiconductor sensor with a two-dimensional position detection function, which consists of a photoelectric conversion element such as a CCD, multiple image buffers, a simple arithmetic circuit, and a synchronization circuit with irradiation light. Bal
A chip device can be realized.
以」二、説明したように本信号処理方式による２次元位
置検出装置を用いれば９作業環境や照明条件を整備しな
くても信頼性よくスポント光、スリット光およびランダ
ムパターン光などの照射光を検出できるので、屋外など
の外乱の多い「１然環境においても、たとえば什設−土
米作業用ロボ。2. As explained above, by using a two-dimensional position detection device using this signal processing method, it is possible to reliably generate illumination lights such as spot lights, slit lights, and random pattern lights without having to improve the work environment or lighting conditions. Since it can be detected, it can be used even in natural environments with many disturbances, such as outdoors, for example, when robots are used for construction and soil work.
１・の距離センサの構成要素として適用される。また、
ｊ’ｊ＋７．射光に対して反射状態のよくない金属、
鋳物なとの対象物表面における微弱な反射光でも検出用
イ指である。アーク溶接作業などにおいて、照射光の他
に強い光源か存在する場合でも有効性を発揮する。この
他、ロホッティクスの様々な分野への応用か考えられる
。It is applied as a component of the distance sensor of 1. Also,
j'j+7. Metals that do not reflect well when exposed to light,
Even weak reflected light from the surface of an object such as a cast metal can be detected. It is effective even when there is a strong light source in addition to the irradiation light, such as in arc welding work. In addition, the application of Rohhottics to various fields can be considered.
）Ｉｌ、第１図は１本発明の信号処理方式による２次元
：）・
１４位置検出装置を含む距離計測システムの構成例を一
、示す。
、ニー
図中、１はみ１算機、２は距離測定のアルゴリズム、３
はアナログ・ディジタル変換の入出力装置、４はスボ・
５ト光、スリット光およびランダムパターン光などの照
射装置、５は本発明の信号処理方式による２次元位置検
出装置である。)Il, FIG. 1 shows an example of the configuration of a distance measurement system including a two-dimensional position detection device using the signal processing method of the present invention. , in the knee diagram, 1 is the calculator, 2 is the distance measurement algorithm, and 3 is the distance measurement algorithm.
4 is the analog/digital conversion input/output device, and 4 is the subo/output device.
5 is an irradiation device for emitting light, slit light, random pattern light, etc., and 5 is a two-dimensional position detection device using the signal processing method of the present invention.
Claims (1)
ムパターン光などの２次元位置を検出する方式において
。 スポット光、スリット光およびランダムパターン光なと
を一定の法則に従って点滅し、照射したシーンと照射し
ないシーンの反射入力画像の差を取り、これを複数回繰
り返して加算平均し、 Ｓ／Ｎ比の向−１−をはかるこ
とにより微弱信号を検出し。 さらに背景にあるランタムノイズを消去することを特徴
とする２次元位置検出のための信号処理方式。[Claims] In a method for detecting the two-dimensional position of spot light, spot light, random pattern light, etc. on image plane-L. Spot light, slit light, and random pattern light are flashed according to a certain rule, and the difference between the reflected input images of the irradiated scene and the non-irradiated scene is taken, and this is repeated multiple times and averaged to determine the S/N ratio. A weak signal is detected by measuring direction -1-. Furthermore, a signal processing method for two-dimensional position detection is characterized by eliminating random noise in the background.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58187216A JPS6078304A (en) | 1983-10-05 | 1983-10-05 | Signal processing system for detecting two-dimensional position |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58187216A JPS6078304A (en) | 1983-10-05 | 1983-10-05 | Signal processing system for detecting two-dimensional position |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6078304A true JPS6078304A (en) | 1985-05-04 |
Family
ID=16202101
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58187216A Pending JPS6078304A (en) | 1983-10-05 | 1983-10-05 | Signal processing system for detecting two-dimensional position |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6078304A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105318837A (en) * | 2015-11-20 | 2016-02-10 | 常州铭赛机器人科技股份有限公司 | A visual calibration device for end portions of quick-wear parts and a calibration method thereof |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54143166A (en) * | 1978-03-15 | 1979-11-08 | Hitachi Ltd | Illumination light detector |
-
1983
- 1983-10-05 JP JP58187216A patent/JPS6078304A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54143166A (en) * | 1978-03-15 | 1979-11-08 | Hitachi Ltd | Illumination light detector |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105318837A (en) * | 2015-11-20 | 2016-02-10 | 常州铭赛机器人科技股份有限公司 | A visual calibration device for end portions of quick-wear parts and a calibration method thereof |
| CN105318837B (en) * | 2015-11-20 | 2018-04-17 | 常州铭赛机器人科技股份有限公司 | Vulnerable part end position vision alignment device and its calibration method |
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