JPS6064490A - Semiconductor laser and manufacture thereof - Google Patents

Semiconductor laser and manufacture thereof

Info

Publication number
JPS6064490A
JPS6064490A JP17380883A JP17380883A JPS6064490A JP S6064490 A JPS6064490 A JP S6064490A JP 17380883 A JP17380883 A JP 17380883A JP 17380883 A JP17380883 A JP 17380883A JP S6064490 A JPS6064490 A JP S6064490A
Authority
JP
Japan
Prior art keywords
layer
referred
cladding
aly
active
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17380883A
Other languages
Japanese (ja)
Other versions
JP2584606B2 (en
Inventor
Haruo Tanaka
田中 治夫
Masahito Mushigami
雅人 虫上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP58173808A priority Critical patent/JP2584606B2/en
Publication of JPS6064490A publication Critical patent/JPS6064490A/en
Application granted granted Critical
Publication of JP2584606B2 publication Critical patent/JP2584606B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/2004Confining in the direction perpendicular to the layer structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure

Landscapes

  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To contrive to stabilize the longitudinal modes of laser beams by a method wherein the longitudinal modes of an active layer are respectively locked in the longitudinal modes of two photo waveguide layers, which have been respectively formed on the active layer and under the active layer. CONSTITUTION:A second clad layer 4 and a first clad layer 2 are respectively formed on an active layer 3 and under the active layer 3. The clad layer 4 consists of an n type AlZ'Ga1-Z'As layer 41, an n type AlZ''Ga1-Z''As layer 42 and an n type AlY''Ga1-Y''As photo waveguide layer 43 (Y''<Z', Y''<Z'',Y<Y'', Y'not equal to Y''), and the layer 43 is formed between the layer 41 and the layer 42. The clad layer 2 consists of a p type AlX'Ga1-X'As layer 21, a p type AlX''Ga1-X''As layer 22 and a p type AlY'Ga1-Y'As photo waveguide layer (Y'<X', Y'<X'', Y<Y') 23, and the layer is formed between the layer 21 and the layer 22. By this constitution, the longitudinal modes of the active layer 3 can be respectively locked in the longitudinal modes of the photo waveguide layers 42 and 43. Accordingly, stabilization of the longitudinal modes of laser beams can be contrived.

Description

【発明の詳細な説明】 本発明は、p(またはn)−C;aAs基板上にp(ま
たはn) −AlxGa+−xAs層(第1クラッド層
という)と、/7ドープまたはpまたはn −A Iy
Ga+−yAs層(活性層という)と、n(またはp)
 −A 1zGa+−xAs層(第2クラッド層という
)とを形成してなるスYライプ形の半導体レーザおよび
その!!造方力法関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a p(or n)-AlxGa+-xAs layer (referred to as a first cladding layer) on a p(or n)-C; A Iy
Ga+-yAs layer (referred to as active layer) and n (or p)
-A Y-striped semiconductor laser formed by forming a 1zGa+-xAs layer (referred to as a second cladding layer), and its! ! Concerning the manufacturing method.

第1図は、従来例の半導体レーザの発光面方向から見た
構造断面図である。第1図において、符号lはp(また
はn ) −G a A s基板、2はp(またはII
)−AlxGa、−xAs層(第1クラッド層という)
、3はノンドープまたは1〕またはn −A 1yGa
1−yAs層(活性層というただしy<x、 y<z)
、4は、11(またはp)−AlzGa、−zAs層(
第2クラッド層という)、5は11÷(またはp”)−
GaAs層、6はT1層、7はAuJFi、8はA u
 G e層である。このような半導体レーザでは、連続
発振動作時にはスペクトル的にシングルモードで発振す
るが高速変調時のみならずレーザ光の戻り光が変化する
場合には111j記シングルモードではレーザ発振しな
い場合がある。これを解決するものとして従来から例え
ば分布帰還型、分布反射型、二重共振器型等の半導体レ
ーザが開発されている。しかしながら、これら従来のも
のではいずれも構造が複雑であるだめに量産には不ぼき
であり、かつ製造コストも高くつという欠点があった。
FIG. 1 is a structural sectional view of a conventional semiconductor laser as viewed from the direction of the light emitting surface. In FIG. 1, l is a p (or n)-GaAs substrate, 2 is a p (or II
)-AlxGa, -xAs layer (referred to as first cladding layer)
, 3 is non-doped or 1] or n-A 1yGa
1-yAs layer (referred to as active layer, y<x, y<z)
, 4 is an 11 (or p)-AlzGa, -zAs layer (
(referred to as the second cladding layer), 5 is 11÷(or p”)−
GaAs layer, 6 is T1 layer, 7 is AuJFi, 8 is Au
Ge layer. Such a semiconductor laser oscillates spectrally in a single mode during continuous wave operation, but may not oscillate in the 111j single mode not only during high-speed modulation but also when the return light of the laser beam changes. To solve this problem, semiconductor lasers such as distributed feedback type, distributed reflection type, and double resonator type have been developed. However, all of these conventional devices have disadvantages in that they are unsuitable for mass production due to their complex structures, and their manufacturing costs are high.

本発明は、簡単な構造で量産に適し、製造コストを低減
しその上、縦モードの安定性を良くすることを目的とす
る。
An object of the present invention is to have a simple structure suitable for mass production, to reduce manufacturing costs, and to improve longitudinal mode stability.

以下、本発明を図面に示1実施例に基づいて11′「細
に説明する。この実施例は屈折率導波型半導体レーザに
適用して説明する。第2図はこの実施例の構造断面図で
あり、第1図とメ゛・1応する部分には同一の符号を付
す。第2図において符号1はu(またはn)−GaAs
基級、2は1)(またはn ) −A l x G a
 。
Hereinafter, the present invention will be explained in detail based on one embodiment shown in the drawings.This embodiment will be explained by applying it to a refractive index guided semiconductor laser.FIG. 1, parts corresponding to those in FIG. 1 are given the same reference numerals. In FIG.
Base level, 2 is 1) (or n) -A l x Ga
.

−xAs層(tIS1クラッド層という)であるーこの
第1クラツド[2は、該第1クラッド層2と同伝導型で
p(またはn) Alx’Ga、−x’As層2.1と
、p(またはn)−Alx”Ga、−x”As層22と
の間にp(またはu) −A ly’ Ga1−y’ 
As層23(ただし l < Xl、yl < Xl 
l、y<y’)を形成して構成される。3はノンドープ
またはρまたはn−AlyGa、−yAs層(活性層と
いうただしy<x、y<z)、4は第2クラッド層であ
る。この第2クラッド層4は該第2クラッド層4と同伝
導型でn(または1+) −A lz’ Ga+−z’
 As層41とn(またはp ) −A I Z ” 
CM a 1− Z ” A 3層42との間に11(
またはp)−Aly”Ga、−y”As層43(ただし
yl l < Zl、 l I < Zl !、y<y
”、y゛≠y゛)を形成してなる。この1)(またはn
)−Aly’Ga+−y’As層、11(または1+)
−Aly”Ga、−y”As層23 、43は、先導波
層であり、この光導波層23.43は前記活性層3との
間隔を互いに光学的に作用しあうとともに前記先導波層
23.43が動作電流によりレーザ発振を起こさない間
隔に設定される。
-xAs layer (referred to as tIS1 cladding layer) - this first cladding layer 2 is of the same conductivity type as the first cladding layer 2 and has p (or n) Alx'Ga, -x'As layer 2.1; p (or n) -Alx"Ga, -x"As layer 22 and p (or u) -A ly'Ga1-y'
As layer 23 (where l < Xl, yl < Xl
l, y<y'). 3 is a non-doped or ρ or n-AlyGa, -yAs layer (referred to as an active layer, where y<x, y<z), and 4 is a second cladding layer. This second cladding layer 4 has the same conductivity type as the second cladding layer 4 and has n (or 1+) -A lz'Ga+-z'
As layer 41 and n (or p)-A I Z ”
11(
or p) -Aly"Ga, -y"As layer 43 (however, yl l < Zl, l I < Zl !, y < y
”, y゛≠y゛).This 1) (or n
)-Aly'Ga+-y'As layer, 11 (or 1+)
The -Aly"Ga, -y"As layers 23 and 43 are waveguide layers, and the optical waveguide layers 23 and 43 optically act on each other to maintain the distance between the active layer 3 and the waveguide layer 23. .43 is set to an interval that does not cause laser oscillation due to the operating current.

したがって、この実施例によれば3つの光共振器3.2
3.43を有することになる。これら3.23.43は
へきかい面が同一のため同し共振器長りを有するが屈折
率が異なることになる。ここで77ブリ・ペロー反射型
半導体レーザの縦モードについて説明する。縦モードと
は波長上りら41常に長い共振器長を有するレーザ発振
器では異なる多数の波長の波が共振可能になるが、この
モードのことを縦モードといい、軸モードともいう。し
たがづて、縦モードにおいては多数の波長の波が存在す
るがスペクトル的にシングルモードとはこれらの波から
1つだけの波が選択されているモードである。各波長の
差(縦モード間隔)をΔ入とすると、この縦モード間隔
は次式であられされる、二とが知られている。
According to this embodiment, therefore, three optical resonators 3.2
3.43. Since these 3, 23, and 43 have the same cleavage plane, they have the same resonator length, but have different refractive indexes. Here, the longitudinal mode of the 77 Burri-Perot reflective semiconductor laser will be explained. A laser oscillator with a long resonator length can resonate waves of many different wavelengths, and this mode is called a longitudinal mode, also called an axial mode. Therefore, in the longitudinal mode, there are waves of many wavelengths, but a spectrally single mode is a mode in which only one wave is selected from these waves. If the difference between the wavelengths (longitudinal mode spacing) is Δin, then this longitudinal mode spacing is expressed by the following equation.

Δλ=λ2Δ+n / 2 u 1. [] (^/ 
11<(Il+/ (lλ)1ここで、mは次数、■は
屈折率、λは波長である。
Δλ=λ2Δ+n/2 u 1. [] (^/
11<(Il+/(lλ)1) where m is the order, ■ is the refractive index, and λ is the wavelength.

このように縦モード間隔があられされるので活性JtJ
 3と光導波層23.43とは屈折率が異なることから
両者の縦モード間隔は異なるが、これらが互いに光学的
に結合されているので活fi層3と光導波層23との両
者が一致した波長および活性層3と先導波層43との両
者が一致した波長でのみ共振する。このため、活性層3
が戻り光などにより他の近接した縦モードへ飛ぼうとし
ても該縦モードでは光導波Wi23.43とは共振でき
ないため該活性層3の縦モードはこの光導波層23,4
3のそれぞれにロックされることになる。こうしてこの
実施例の半導体レーザでは縦モードの安定化が計れる。
Since the longitudinal mode spacing is reduced in this way, the active JtJ
3 and the optical waveguide layer 23, 43 have different refractive indexes, so their longitudinal mode spacing is different, but since they are optically coupled to each other, both the active fi layer 3 and the optical waveguide layer 23 match. The active layer 3 and the leading wave layer 43 resonate only at the same wavelength. Therefore, the active layer 3
Even if the light tries to fly to another adjacent longitudinal mode due to returned light, etc., the longitudinal mode cannot resonate with the optical waveguide Wi23, 43, so the longitudinal mode of the active layer 3 is transferred to the optical waveguide layer 23, 4.
It will be locked to each of 3. In this way, the semiconductor laser of this embodiment can stabilize the longitudinal mode.

 以上のように本発明によれば第1層クラッド層を該第
1クラッド層と同伝導型でp(またはn) −Alx’
Ga、−x’As層とp(またはn)−Alx”Ga、
−x”As層との間にp(またはn)−Aly’Ga、
y’As層(ただし、 l < ×T、 I < xI
 1、y<y’)を形成して構成し前記第2クラッド層
を該第2クラッド層と同伝導型でn(またはp) −A
 lz’ Ga、−z”As層とn(またはp)−Al
z”Ga+−z”As層との間にn(またはp)−Al
y”Ga1−y”As層(ただしyl l < zl、
+ 1 < ZI I、y<yII、y゛≠y゛)を形
成して構成し、前記各Aly’Gat−y’As層、A
ly”Ga、−y”As層(先導液層という)と前記活
性層との間隔を互いに光学的1こ作用しあうとともに前
記光導波層が動作電流によりレーザ発振を起こさない間
隔に設定したので、活性層が戻り光の変化などにより池
の縦モードへ飛ぼうとしても該縦モードでは光導波層と
は共振できないため該活性層の縦モードはこの先導波層
のそれぞれにロックされることになり、該縦モードの安
定化が計れる。
As described above, according to the present invention, the first cladding layer is of the same conductivity type as the first cladding layer and p (or n) -Alx'
Ga, -x'As layer and p (or n)-Alx''Ga,
p (or n)-Aly'Ga between the -x''As layer,
y'As layer (where l < xT, I < xI
1, y<y'), and the second cladding layer is of the same conductivity type as the second cladding layer and is n (or p) -A.
lz' Ga, -z''As layer and n (or p)-Al
n (or p)-Al between the z"Ga+-z"As layer
y"Ga1-y"As layer (where yl l < zl,
+ 1 < ZI I, y < yII, y゛≠y゛), and each of the Aly'Gat-y'As layers, A
The distance between the ly"Ga, -y"As layer (referred to as the leading liquid layer) and the active layer is set to such a distance that they interact optically with each other and that the optical waveguide layer does not cause laser oscillation due to the operating current. Even if the active layer tries to jump to the longitudinal mode of the pond due to a change in the returned light, the longitudinal mode cannot resonate with the optical waveguide layer, so the longitudinal mode of the active layer is locked to each of the leading wave layers. Therefore, the longitudinal mode can be stabilized.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来例の構造断面図、第2図は本発明の実施例
の構造断面図である。 1、、、p(またはn)−GaAs基板、2. 、6.
 p(またはn)−AlxGa、−xAs層(第1クラ
ッド層)、3゜0.ノンドープまたはpまたはn −A
 1y(ial−yAs層(活性層)、4.、、n(ま
たはII)/\1zGa、−zAS層(第2クラツド)
@)、5.、、n+(またはII+)−GaAs層、6
10.Ti層、7,0.lXu層、Fi。 、、AuGe層、21.、.1+(またはn) −Al
x’(ial−x’As層、220.、p(またはn 
) −A l x ” (i a 1−)+”Asl、
23.、、’rl−(またはp) A ly’(ial
−y’As層(光導波層)、4]、、、n(または++
 ) A I /、’GIIIl−z’As層、42.
、、++(またはp)−1\lz”(:a+−z”As
層、43.、、n(またはp)−A ly” QaI−
y”As層、 出願人 ローム株式会社 代理人 弁理士 両口1和秀 第1図 5′
FIG. 1 is a structural sectional view of a conventional example, and FIG. 2 is a structural sectional view of an embodiment of the present invention. 1. p (or n)-GaAs substrate, 2. ,6.
p (or n)-AlxGa, -xAs layer (first cladding layer), 3°0. Non-doped or p or n-A
1y (ial-yAs layer (active layer), 4.,, n (or II)/\1zGa, -zAS layer (second cladding)
@), 5. , , n+ (or II+)-GaAs layer, 6
10. Ti layer, 7,0. lXu layer, Fi. , , AuGe layer, 21. ,.. 1+ (or n) -Al
x'(ial-x'As layer, 220., p(or n
) −A l x ” (ia 1-) + “Asl,
23. ,,'rl-(or p)Aly'(ial
-y'As layer (optical waveguide layer), 4], , n (or ++
) A I /,'GIIIl-z'As layer, 42.
,,++(or p)-1\lz"(:a+-z"As
layer, 43. ,, n (or p)-A ly” QaI-
y”As layer, Applicant ROHM Co., Ltd. Agent Patent Attorney Kazuhide Ryoguchi 1 Figure 1 5'

Claims (2)

【特許請求の範囲】[Claims] (1)I)(またはn)−GaAs基板上にp(または
n) −AlxGa、−xAs層(第1クラッド層とい
う)と、ノンドープまたはpまたはn −A 1yGa
I−yAs層(活性層という)と、11(またはp) 
−A IzGal−zAs層(第2クラッド層という)
とが形成されるストライプ形の半導体レーザにおいて、
前記第1クラッド層を該第12ラツド層と同伝導型でp
(またはn)−Alx’Ga、−x’As層と1)(ま
たはn)−Alx”Ga、−x”As層との間に++(
またはn)−Aly’Ga、−y’AswI(ただし 
l < ×11.l<yII、y<y”)を形成して構
成するとともに前記第2クラッド層を該第2クラッド層
と同伝導型で11(またはp)−A lz” Ga1−
z’ As層とn(またはp)−Alz”Ga、−z”
As層との間にn(またはp)−Aly”Ga、−y”
As層(ただし、 l l < zI、yII<z゛、
Z< 、 l l、y゛≠y゛)を形成して構成し、前
記側A ly’ Ga+−y’ As層およびAly”
Ga、−y”As層(先導波層という)と前記活性層と
の間隔を互いに光学的に作用しあうとともに前記先導波
層が動作電流によりレーザ発振を起こさない間隔に設定
してなる半導体レーザ。
(1) A p (or n) -AlxGa, -xAs layer (referred to as a first cladding layer) on an I) (or n) -GaAs substrate, and a non-doped or p or n -A 1yGa layer.
I-yAs layer (referred to as active layer) and 11 (or p)
-A IzGal-zAs layer (referred to as second cladding layer)
In a striped semiconductor laser in which
The first cladding layer is of the same conductivity type as the twelfth cladding layer.
Between the (or n)-Alx'Ga, -x'As layer and the 1) (or n)-Alx"Ga, -x"As layer ++(
or n) -Aly'Ga, -y'AswI (but
l < ×11. 1<yII, y<y''), and the second cladding layer is of the same conductivity type as the second cladding layer and has the same conductivity type as the second cladding layer.
z' As layer and n (or p)-Alz"Ga, -z"
n (or p)-Aly"Ga, -y" between the As layer
As layer (however, l l < zI, yII < z゛,
Z < , l l, y゛≠y゛), and the side A ly'Ga+-y'As layer and Aly''
A semiconductor laser in which the distance between a Ga, -y''As layer (referred to as a leading wave layer) and the active layer is set to such a distance that they optically interact with each other and the leading wave layer does not cause laser oscillation due to an operating current. .
(2)p(またはn)−GaAs基板上に1)(または
II)/\1xGa+−xAs層(第1クラツドノ14
という)と、7ンドープまたは1)またはn−AlyG
a、−yAs層(活性層という)と、n(またはp) 
−A 1zGa1−zAs層(第2クラッド層という)
とを形成してストライプ形の半導体レーザを製造する方
法において、前記第1層クラッド層を1)(または口)
−ノ\1\’Gu1−X’Aて7層とp(またはn)−
Alx”(ia、−x”As層との開に1賢またはu)
−Aly’Ga+−y’As層(たたし I / xl
、 I/xII、y<y’)を形成するとともに111
j記第2クランド層を11(またはp) Alz’(i
a、−z’As層と11(またはp)−Alz”Ga+
−z”As層との間に++(または++)−Aly”G
a+−y”As層(ただし l l < zl、 11
 < z 1゛、z< yl 7、y゛≠y゛)を形成
し、1iij記両A l y ’ Ci a 1−y’
As層、A ly” Ga1−y” /’sJM (先
導波層という)と前記活性層との間隔を互いに光学的に
作用しあうとともに′rIij記光導波層が動作電流−
二よ;)レーザ発振を起こさない間隔に設定することに
より半導体レーザを製造する方法。
(2) 1) (or II)/\1xGa+-xAs layer (first clad layer 14) on the p (or n)-GaAs substrate.
), 7-doped or 1) or n-AlyG
a, -yAs layer (referred to as active layer) and n (or p)
-A 1zGa1-zAs layer (referred to as second cladding layer)
In the method of manufacturing a stripe-shaped semiconductor laser by forming the first cladding layer 1) (or
-ノ\1\'Gu1-X'A 7 layers and p (or n)-
Alx" (ia, -x" 1 wise or u in the gap with the As layer)
-Aly'Ga+-y'As layer (Tatashi I/xl
, I/xII, y<y') and 111
11 (or p) Alz'(i
a, -z'As layer and 11 (or p)-Alz"Ga+
++ (or ++)-Aly”G between −z”As layer
a+-y”As layer (where l l < zl, 11
< z 1゛, z< yl 7, y゛≠y゛), and both A ly ' Ci a 1-y'
The As layer, A ly"Ga1-y"/'sJM (referred to as a leading wave layer), and the active layer interact optically with each other, and the optical waveguide layer 'rIij' controls the operating current -
2) A method of manufacturing semiconductor lasers by setting intervals that do not cause laser oscillation.
JP58173808A 1983-09-19 1983-09-19 Semiconductor laser Expired - Lifetime JP2584606B2 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0385388A2 (en) * 1989-02-28 1990-09-05 Omron Corporation Ridge-waveguide semiconductor laser

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5245296A (en) * 1975-10-07 1977-04-09 Nippon Telegr & Teleph Corp <Ntt> Semiconductive phototransmission pass and semiconductor emission devic e used it
JPS55157281A (en) * 1979-05-25 1980-12-06 Fujitsu Ltd Semiconductor light emitting device
JPS5743487A (en) * 1980-08-28 1982-03-11 Nec Corp Semiconductor laser

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5245296A (en) * 1975-10-07 1977-04-09 Nippon Telegr & Teleph Corp <Ntt> Semiconductive phototransmission pass and semiconductor emission devic e used it
JPS55157281A (en) * 1979-05-25 1980-12-06 Fujitsu Ltd Semiconductor light emitting device
JPS5743487A (en) * 1980-08-28 1982-03-11 Nec Corp Semiconductor laser

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0385388A2 (en) * 1989-02-28 1990-09-05 Omron Corporation Ridge-waveguide semiconductor laser

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JP2584606B2 (en) 1997-02-26

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