JPS6057948A - Conveyor for wafer - Google Patents

Conveyor for wafer

Info

Publication number
JPS6057948A
JPS6057948A JP16731083A JP16731083A JPS6057948A JP S6057948 A JPS6057948 A JP S6057948A JP 16731083 A JP16731083 A JP 16731083A JP 16731083 A JP16731083 A JP 16731083A JP S6057948 A JPS6057948 A JP S6057948A
Authority
JP
Japan
Prior art keywords
wafer
path
movable table
projecting
movable base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16731083A
Other languages
Japanese (ja)
Inventor
Yoshinari Sato
佐藤 義成
Aiji Suetake
愛士 末武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP16731083A priority Critical patent/JPS6057948A/en
Publication of JPS6057948A publication Critical patent/JPS6057948A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67715Changing the direction of the conveying path
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67718Changing orientation of the substrate, e.g. from a horizontal position to a vertical position

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chutes (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)

Abstract

PURPOSE:To prevent the damage of a wafer and the damage of a valve for a device by mounting a rail member onto an inclined carrying path-surface while a projecting and withdrawing piece projecting or with-drawing in response to the inclination of a movable base is istalled to a wafer loading surface for the movable base. CONSTITUTION:Rigid metallic rails 21 are laid on the surface 20 of an inclined carrying path, and a wafer is brought to the state in which the wafer is floated approximately from the path surface 20 and a friction coefficient between both the wafer and the path surface is reduced extremely. Consequently, the wafer is not sucked or attached to the path surface 20 and is not stopped and positively slides on the path surface. The end section of the wafer 1 received by a movable base 7 is pushed up by a projecting and withdrawing piece 22 slightly projecting from a wafer loading surface 16 through a movement in the right direction of a weight 25, and a friction coefficient between the wafer and the loading surface 16 is reduced extremely. Accordingly, the wafer 1 on the movable base 7 responds to the inclination of the base and the pushing action of a damper 19 very smoothly and starts sliding, and no impact is applied to the wafer 1.

Description

【発明の詳細な説明】 く技術分野〉 本発明は傾斜搬送路と可動台を利用してウエノ・−を順
次各処理室へ送り込むようにしたウニ・・−の搬送装置
、たとえばイオン注入装置とか電子ビームアニール装置
に供して好適なウエノ・−の搬送装置に関するものであ
る。
[Detailed Description of the Invention] Technical Field> The present invention relates to a transporting device for sea urchin that uses an inclined transport path and a movable table to sequentially transport the sea urchin to each processing chamber, such as an ion implantation device. The present invention relates to a wafer conveying device suitable for use in an electron beam annealing device.

〈従来技術〉 一般に半導体装置に使用されるウエノ・−はイオン打込
みやアニール処理のためにイオン注入装置とか電子ビー
ムアニール装置に送り込まれる。従来、これらの装置に
送り込まれたウエノ・−は各処理室をたとえば第1図に
示すようにして順次搬送されている。
<Prior Art> Generally, wafer metal used in semiconductor devices is fed into an ion implantation device or an electron beam annealing device for ion implantation and annealing treatment. Conventionally, urethane fed into these devices is sequentially conveyed through each processing chamber as shown in FIG. 1, for example.

すなわち、ウェハー1が上部キャリア2から傾斜搬送路
(スライダー)3(第2図参照)上を滑りながら中間真
空室4に入ると該室のパルプ(入口)が閉成されて室内
の真空引きが行なわれる。
That is, when the wafer 1 enters the intermediate vacuum chamber 4 from the upper carrier 2 while sliding on the inclined transport path (slider) 3 (see Figure 2), the pulp (inlet) of the chamber is closed and the chamber is evacuated. It is done.

室内が中真空程度に到達すると火室6とのバルブが開成
し、ウェハー1はスライダー5上を滑動して高真空状態
のウェハー処理室6に入り可動台(処理台)7(第3図
参照)に受け止められる。
When the chamber reaches a medium vacuum level, the valve connected to the firebox 6 is opened, and the wafer 1 slides on the slider 5 and enters the wafer processing chamber 6 in a high vacuum state, and the movable table (processing table) 7 (see Fig. 3). ) is accepted.

ウェハー1が可動台7に移ると処理室4と6はバルプの
閉成によって分離され、次に可動台7が図中時計向に傾
斜し9の位置でウェハー1のイオン打込み又はアニール
等の処理が行われる。同時に下部の中間真空室12では
処理後のウェハー1を受け取るだめに中真空程度まで真
空引きされる。
When the wafer 1 is moved to the movable table 7, the processing chambers 4 and 6 are separated by closing the valve, and then the movable table 7 is tilted clockwise in the figure and the wafer 1 is subjected to processing such as ion implantation or annealing at the position 9. will be held. At the same time, the lower intermediate vacuum chamber 12 is evacuated to a medium vacuum level in order to receive the processed wafer 1.

ウェハー1の処理が終了し中間真空室12が所定の真空
状態になると処理室6と真空室12との間のバルブが開
成し同時に可動台7が図中時計方向に10の位置まで傾
斜する。ウェハー1は後述する可動台7のダンパーに押
し出され、スライダー11を滑って次の中間真空室12
に入り、バルブが閉成して処理室6と分離される。その
後、この中間真空室12は大気圧に戻されバルブの開成
によって外部の下部キャリア14に連通ずると、ウェハ
ー1はスライダー13を滑って同キャリア14に入る。
When the processing of the wafer 1 is completed and the intermediate vacuum chamber 12 reaches a predetermined vacuum state, the valve between the processing chamber 6 and the vacuum chamber 12 is opened, and at the same time, the movable table 7 is tilted clockwise to the position 10 in the figure. The wafer 1 is pushed out by the damper of the movable table 7, which will be described later, and slides on the slider 11 to the next intermediate vacuum chamber 12.
The valve closes and the chamber is separated from the processing chamber 6. Thereafter, the intermediate vacuum chamber 12 is returned to atmospheric pressure and communicated with the external lower carrier 14 by opening a valve, and the wafer 1 slides on the slider 13 and enters the carrier 14.

この様にウェハー1は傾斜搬送路(スライダー)3.5
.11.13上を滑って順次処理室に送られ、又可動台
7によって処理のため処理室6内に一時的に留められ且
その搬送方向が変更されるように成っている。
In this way, the wafer 1 is placed on the inclined conveyance path (slider) 3.5
.. 11 and 13, and are sent to the processing chamber one by one, and are temporarily held in the processing chamber 6 for processing by a movable table 7, and the direction of conveyance thereof is changed.

然し乍ら、ウェハー1は処理室6でイオン注入力どの処
理を受けると帯電するため、傾斜搬送路すなわちスライ
ダー(3,5,11,13)の路面15(第2図参照)
や可動台7のウェハー搭載面16(第3図参照)に静電
吸着しそこに停止する虞れがある。もしウェハー1がス
ライダーの路面15に吸着して静止した場合には画処理
室間を分離するバルブにウェハー1が挾まれ、ウェハー
1及びバルブが破損する。特にバルブが破損すると真空
引き直しのだめに数時間から10数時間かかることがあ
り、その間数億円もする装置が使えなくなるという大き
な問題があった。
However, since the wafer 1 becomes electrically charged when subjected to ion implantation or other processing in the processing chamber 6, the inclined transport path, that is, the road surface 15 of the slider (3, 5, 11, 13) (see FIG. 2)
There is a risk that the wafer may be electrostatically attracted to the wafer mounting surface 16 (see FIG. 3) of the movable table 7 and stopped there. If the wafer 1 is attracted to the road surface 15 of the slider and comes to rest, the wafer 1 will be caught in the valve that separates the image processing chambers, and the wafer 1 and the valve will be damaged. In particular, if a valve breaks, it can take anywhere from a few hours to over 10 hours to re-evacuate, creating a major problem in which the equipment, which costs hundreds of millions of yen, becomes unusable.

又ウェハー1が可動台7のウェハー搭載面16に吸着し
た場合は、可動台17の傾斜に応じて錘17がバー18
を図中右方向に移動し同時にダンパ19の同方向への移
動によってウェハー1が押し出される時に該ウェハー1
が移動しないので、そのときの衝撃によってウェハー1
が破損するという問題があった。
Further, when the wafer 1 is attracted to the wafer mounting surface 16 of the movable table 7, the weight 17 is moved to the bar 18 according to the inclination of the movable table 17.
When the wafer 1 is moved to the right in the figure and the wafer 1 is pushed out by simultaneously moving the damper 19 in the same direction, the wafer 1
Since the wafer 1 does not move, the impact causes the wafer 1 to
There was a problem with it being damaged.

〈目的〉 本発明はかかる従来の問題点に鑑みて成されたもので、
その目的とするところは、傾斜搬送路面上にレール部材
を設けるとともに可動台のウェハー搭載面に談合の傾斜
に応じて出没する出没片を設けることにより、ウェハー
の破損及び装置のバルブ破損を防止することが出来るウ
ェハーの搬送装置を提供することにある。
<Purpose> The present invention has been made in view of such conventional problems, and
The purpose of this is to prevent damage to the wafers and valves of the equipment by providing a rail member on the sloping conveyance path and providing a retractable piece on the wafer mounting surface of the movable table that retracts and retracts according to the slope of the rigging. The object of the present invention is to provide a wafer transport device that can perform the following tasks.

〈実施例〉 以下図にもとづいて本発明の詳細な説明する。<Example> The present invention will be explained in detail below based on the drawings.

第4図(イ)及び(ロ)は本発明に係るウェハーの搬送
装置に使用される傾斜搬送路(スライダー)の外観斜視
図と側面図、第5図は同可動台の側面図である。
FIGS. 4A and 4B are an external perspective view and a side view of an inclined conveyance path (slider) used in the wafer conveyance apparatus according to the present invention, and FIG. 5 is a side view of the same movable table.

本発明に係るウェハーの搬送装置の基本的な構造は第1
図の搬送装置と同じであるが、特に傾斜搬送路20の路
面にはウエノ・−1の搬送方向に二本のレール21が設
けられている。このレール21はウェハー1で削られな
いように硬質の金属レールから成り、ウェハー1と搬送
面との摩擦係数を小さくするために設けられている。な
お、レール部材21の形態は、要はウェハー1と搬送面
との摩擦係数を小さくできればよいので、丸頭状のもの
を搬送方向に所定の間隔を置いて配設するようにしても
よい。
The basic structure of the wafer transport device according to the present invention is as follows.
Although it is the same as the conveyance device shown in the figure, two rails 21 are provided particularly on the road surface of the inclined conveyance path 20 in the conveyance direction of Ueno-1. This rail 21 is made of a hard metal rail so as not to be scraped by the wafer 1, and is provided to reduce the coefficient of friction between the wafer 1 and the conveying surface. Note that the shape of the rail members 21 should be such that the coefficient of friction between the wafer 1 and the conveying surface can be reduced, so that round-headed members may be arranged at predetermined intervals in the conveying direction.

また、可動台7のウェハー搭載面16の中央部にはウェ
ハー1の搬送方向と平行に二本の溝が設けられ、この溝
は可動台7の底部まで達している。
Furthermore, two grooves are provided in the center of the wafer mounting surface 16 of the movable table 7 in parallel to the direction of conveyance of the wafer 1, and these grooves reach the bottom of the movable table 7.

そして、これらの溝には図示のような形状の出没片22
が挿入されていて、その基部は可動台7の軸23に回動
自在に軸支され且バネ24により常時は反時計方向に附
勢されて図中点線で示す如くその先端部が可動台7のウ
ェハー搭載面16より下に没している。そして、バー1
8に設けた今一つの錘25が図中右方向に移動し、出没
片22がその押圧力を受けると実線で示す如く時計方向
に回動し、その先端部がウェハー搭載面16から若干突
出するように形成されている。
In these grooves, there are retractable pieces 22 shaped as shown in the figure.
is inserted, its base is rotatably supported on the shaft 23 of the movable table 7, and is normally biased counterclockwise by a spring 24, so that its tip end is attached to the movable table 7 as shown by the dotted line in the figure. It is sunk below the wafer mounting surface 16 of. And bar 1
Another weight 25 provided at 8 moves to the right in the figure, and when the protruding/retracting piece 22 receives the pressing force, it rotates clockwise as shown by the solid line, and its tip slightly protrudes from the wafer mounting surface 16. It is formed like this.

路面15の上には硬質の金属レールが敷かれ、ウェハー
はその路面15からほとんど浮き上がった状態にあって
該両者間の摩擦係数は非常に小さくなっている。したが
って、ウェハーは路面15に吸着もしくは付着して停止
することなく確実にその上を滑動する。
A hard metal rail is laid on the road surface 15, and the wafer is almost lifted off the road surface 15, so that the coefficient of friction between the two is extremely small. Therefore, the wafer reliably slides on the road surface 15 without adhering to or adhering to it and stopping.

また可動台7に受け止められたウェハー1は、談合7が
図中右に傾斜してダンパー19の抑圧により送り出され
る際に、錘25の右方向への移動によってウェハー搭載
面16から少し突出する出没片22によりその端部が押
し上げられて該搭載面16との摩擦係数が非常に小さく
なっている。
Furthermore, when the wafer 1 received by the movable table 7 is sent out by the damper 19 while tilting to the right in the figure, the wafer 1 slightly protrudes from the wafer mounting surface 16 due to the rightward movement of the weight 25. The end portion is pushed up by the piece 22, so that the coefficient of friction with the mounting surface 16 is extremely small.

したがって可動台7上のウェハー1は談合の傾斜とダン
パー19の抑圧作用に極めてスムースに応答して滑り出
し、ウェハー1には何ら衝撃が加えられない。
Therefore, the wafer 1 on the movable table 7 begins to slide extremely smoothly in response to the inclination of the rigging and the suppressing action of the damper 19, and no impact is applied to the wafer 1.

尚、望ましくはウェハー1がダンパー19に押される前
にその先端部を出没片22によって持ち上げられるのが
よい。よってこのタイミングを正確にするために実施例
の錘25のかわりに電子的なメカ機構等を採用すればよ
り効果的である。
It is preferable that the leading end of the wafer 1 be lifted up by the retractable piece 22 before being pushed by the damper 19. Therefore, in order to make this timing accurate, it would be more effective to use an electronic mechanical mechanism or the like instead of the weight 25 in the embodiment.

〈効果〉 以上の様に本発明のウェハーの搬送装置にあっては、各
処理室間を連結する傾斜搬送路面上にレール部材を設け
るとともに、可動台に談合の傾斜方向に応じてそのウェ
ハーの搭載面から出没する出没片を設けだから、ウェハ
ーの破損や装置の破損を防止することが出来る。
<Effects> As described above, in the wafer conveyance apparatus of the present invention, a rail member is provided on the inclined conveyance path surface that connects each processing chamber, and the movable table is configured to move the wafers according to the inclination direction of the rigging. Since a retractable piece that retracts from the mounting surface is provided, damage to the wafer and equipment can be prevented.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来装置の構造を示す図、第2図(イ)、(ロ
)は同装置のスライダーの構造を示す図、第3図は同可
動台の構造を示す図、第4図(イ)、(ロ)は本発明装
置の傾斜搬送路(スライダー)の構造を示す図、第5図
は同可動台の構造を示す図である。 7は可動台、16はウェハー搭載面、20は傾斜搬送路
、21はレール部材、22は出没片、25は錘、 代理人 弁理士 福 士 愛 彦(他2名)θ 0 叉 リ
Figure 1 is a diagram showing the structure of the conventional device, Figures 2 (a) and (b) are diagrams showing the structure of the slider of the same device, Figure 3 is a diagram showing the structure of the movable base, and Figure 4 ( A) and (B) are diagrams showing the structure of the inclined conveyance path (slider) of the apparatus of the present invention, and FIG. 5 is a diagram showing the structure of the movable table. 7 is a movable table, 16 is a wafer mounting surface, 20 is an inclined transport path, 21 is a rail member, 22 is a retractable piece, 25 is a weight, agent: patent attorney Yoshihiko Fukushi (and 2 others) θ 0

Claims (1)

【特許請求の範囲】 1、複数の処理室間を傾斜搬送路で接続し、ウェハーを
この搬送路上を滑動させて各処理室に送シ込むようにす
るとともに、少なくとも一つの処理室内には上方の処理
室から送り込まれて来たウェハーを受け止める可動台を
設け、この可動台を傾斜させて受け止めたウエノ・−を
次の処理室へ送り込むようにしたウェハーの搬送装置に
於て、 各処理室間を連結する傾斜搬送路面上にレール部材を設
けるとともに、前記可動台に該台の傾斜方向に応じてそ
のウェハーの搭載面から出没する出没片を設けたことを
特徴とするウエノ・−の搬送装置。
[Claims] 1. A plurality of processing chambers are connected by an inclined conveyance path, and the wafer is slid on this conveyance path to be fed into each processing chamber, and at least one of the processing chambers has an upper In a wafer transfer device, a movable table is provided to receive wafers sent from one processing chamber, and the movable table is tilted to send the received wafers to the next processing chamber. A rail member is provided on an inclined conveyance road surface that connects the wafer, and the movable table is provided with a retractable piece that retracts and retracts from the wafer mounting surface depending on the inclination direction of the table. Device.
JP16731083A 1983-09-09 1983-09-09 Conveyor for wafer Pending JPS6057948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16731083A JPS6057948A (en) 1983-09-09 1983-09-09 Conveyor for wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16731083A JPS6057948A (en) 1983-09-09 1983-09-09 Conveyor for wafer

Publications (1)

Publication Number Publication Date
JPS6057948A true JPS6057948A (en) 1985-04-03

Family

ID=15847371

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16731083A Pending JPS6057948A (en) 1983-09-09 1983-09-09 Conveyor for wafer

Country Status (1)

Country Link
JP (1) JPS6057948A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001041193A1 (en) * 1999-12-01 2001-06-07 Steag Rtp Systems Gmbh Device and method for aligning disc-shaped substrates

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001041193A1 (en) * 1999-12-01 2001-06-07 Steag Rtp Systems Gmbh Device and method for aligning disc-shaped substrates

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