JPS6056209U - 非接触形変位検出装置 - Google Patents

非接触形変位検出装置

Info

Publication number
JPS6056209U
JPS6056209U JP14859183U JP14859183U JPS6056209U JP S6056209 U JPS6056209 U JP S6056209U JP 14859183 U JP14859183 U JP 14859183U JP 14859183 U JP14859183 U JP 14859183U JP S6056209 U JPS6056209 U JP S6056209U
Authority
JP
Japan
Prior art keywords
detection device
gap sensor
measured
sensor
contact displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14859183U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0342328Y2 (enExample
Inventor
達道 花田
竹下　興二
中沢　邦泰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP14859183U priority Critical patent/JPS6056209U/ja
Publication of JPS6056209U publication Critical patent/JPS6056209U/ja
Application granted granted Critical
Publication of JPH0342328Y2 publication Critical patent/JPH0342328Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP14859183U 1983-09-26 1983-09-26 非接触形変位検出装置 Granted JPS6056209U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14859183U JPS6056209U (ja) 1983-09-26 1983-09-26 非接触形変位検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14859183U JPS6056209U (ja) 1983-09-26 1983-09-26 非接触形変位検出装置

Publications (2)

Publication Number Publication Date
JPS6056209U true JPS6056209U (ja) 1985-04-19
JPH0342328Y2 JPH0342328Y2 (enExample) 1991-09-05

Family

ID=30330091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14859183U Granted JPS6056209U (ja) 1983-09-26 1983-09-26 非接触形変位検出装置

Country Status (1)

Country Link
JP (1) JPS6056209U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010113450A1 (ja) * 2009-04-03 2010-10-07 オムロン株式会社 三次元形状計測装置、三次元形状計測方法、および三次元形状計測プログラム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499259U (enExample) * 1972-04-24 1974-01-26
JPS51149050A (en) * 1975-05-13 1976-12-21 Rolls Royce Measuring device
JPS5786710A (en) * 1980-11-19 1982-05-29 Yokogawa Hokushin Electric Corp Measuring device for three-dimensional configuration
JPS5793202A (en) * 1980-12-01 1982-06-10 Toyota Motor Corp Measurer for three-dimensional displacement

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499259U (enExample) * 1972-04-24 1974-01-26
JPS51149050A (en) * 1975-05-13 1976-12-21 Rolls Royce Measuring device
JPS5786710A (en) * 1980-11-19 1982-05-29 Yokogawa Hokushin Electric Corp Measuring device for three-dimensional configuration
JPS5793202A (en) * 1980-12-01 1982-06-10 Toyota Motor Corp Measurer for three-dimensional displacement

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010113450A1 (ja) * 2009-04-03 2010-10-07 オムロン株式会社 三次元形状計測装置、三次元形状計測方法、および三次元形状計測プログラム
JP2010243296A (ja) * 2009-04-03 2010-10-28 Omron Corp 三次元形状計測装置、三次元形状計測方法、および三次元形状計測プログラム
CN102365522A (zh) * 2009-04-03 2012-02-29 欧姆龙株式会社 三维形状计测装置、方法及程序
KR101257188B1 (ko) 2009-04-03 2013-04-22 오므론 가부시키가이샤 3차원 형상 계측 장치, 3차원 형상 계측 방법 및 3차원 형상 계측 프로그램을 기록한 기록 매체
TWI414750B (zh) * 2009-04-03 2013-11-11 Omron Tateisi Electronics Co Dimensional shape measuring device, three-dimensional shape measurement method and three-dimensional shape measurement program

Also Published As

Publication number Publication date
JPH0342328Y2 (enExample) 1991-09-05

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