JPS6049246A - 二段フレ−ム式炎光分析装置 - Google Patents

二段フレ−ム式炎光分析装置

Info

Publication number
JPS6049246A
JPS6049246A JP15725383A JP15725383A JPS6049246A JP S6049246 A JPS6049246 A JP S6049246A JP 15725383 A JP15725383 A JP 15725383A JP 15725383 A JP15725383 A JP 15725383A JP S6049246 A JPS6049246 A JP S6049246A
Authority
JP
Japan
Prior art keywords
flame
stage
capillary
sample
frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15725383A
Other languages
English (en)
Japanese (ja)
Other versions
JPH031618B2 (ref
Inventor
Yoshihito Suzuki
義仁 鈴木
Shigemitsu Okazaki
岡崎 重光
Yutaka Yoshida
裕 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jasco Corp
Original Assignee
Japan Spectroscopic Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Spectroscopic Co Ltd filed Critical Japan Spectroscopic Co Ltd
Priority to JP15725383A priority Critical patent/JPS6049246A/ja
Publication of JPS6049246A publication Critical patent/JPS6049246A/ja
Publication of JPH031618B2 publication Critical patent/JPH031618B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/72Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using flame burners

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP15725383A 1983-08-30 1983-08-30 二段フレ−ム式炎光分析装置 Granted JPS6049246A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15725383A JPS6049246A (ja) 1983-08-30 1983-08-30 二段フレ−ム式炎光分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15725383A JPS6049246A (ja) 1983-08-30 1983-08-30 二段フレ−ム式炎光分析装置

Publications (2)

Publication Number Publication Date
JPS6049246A true JPS6049246A (ja) 1985-03-18
JPH031618B2 JPH031618B2 (ref) 1991-01-11

Family

ID=15645603

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15725383A Granted JPS6049246A (ja) 1983-08-30 1983-08-30 二段フレ−ム式炎光分析装置

Country Status (1)

Country Link
JP (1) JPS6049246A (ref)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62226023A (ja) * 1986-03-28 1987-10-05 Nippon Denki Sanei Kk 放射率測定装置
JPS63314426A (ja) * 1987-06-17 1988-12-22 Chino Corp 放射温度測定装置
JPH0363534A (ja) * 1989-04-24 1991-03-19 Tektronix Inc 温度測定方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62226023A (ja) * 1986-03-28 1987-10-05 Nippon Denki Sanei Kk 放射率測定装置
JPS63314426A (ja) * 1987-06-17 1988-12-22 Chino Corp 放射温度測定装置
JPH0363534A (ja) * 1989-04-24 1991-03-19 Tektronix Inc 温度測定方法

Also Published As

Publication number Publication date
JPH031618B2 (ref) 1991-01-11

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