JPS6046189U - Device that sorts granular materials based on reflectance and size - Google Patents

Device that sorts granular materials based on reflectance and size

Info

Publication number
JPS6046189U
JPS6046189U JP14047983U JP14047983U JPS6046189U JP S6046189 U JPS6046189 U JP S6046189U JP 14047983 U JP14047983 U JP 14047983U JP 14047983 U JP14047983 U JP 14047983U JP S6046189 U JPS6046189 U JP S6046189U
Authority
JP
Japan
Prior art keywords
image sensor
linear image
particles
output
falling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14047983U
Other languages
Japanese (ja)
Other versions
JPS6244790Y2 (en
Inventor
高村 基範
Original Assignee
コ−ア電子工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by コ−ア電子工業株式会社 filed Critical コ−ア電子工業株式会社
Priority to JP14047983U priority Critical patent/JPS6046189U/en
Publication of JPS6046189U publication Critical patent/JPS6046189U/en
Application granted granted Critical
Publication of JPS6244790Y2 publication Critical patent/JPS6244790Y2/ja
Granted legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案による装置の全体の構成を示す斜視図で
ある。第2図は落下中のアーモンドとリニヤイメージセ
ンサの出力の関係を説明するための略図である。第3図
は演算制御部等の実施例を示すブロック図である。 2・・・粒状物(アーモンド)、3・・・光源、4a。 4b、4c・・・反射光検出部、5・・・光量検出器、
6a、 6b、 6c・・・背景板、8a、8b、8c
・・・経路変更手段を構成する空気噴射器、9・・・容
器、10・・・演算制御部、11a・・・レンズ、14
a・・・リニヤイメージセンサ、24A、24B、24
C・・・各反射光検出器の出力を処理する回路、17・
・・イメージセンサ駆動信号発生回路、18a、18b
。 18c・・・増幅サンプルホールド回路、22・・・増
幅器、23・・・基準電圧発生器、27・・・異常反射
検出器、28・・・整形器、29・・・積分器、30・
・・補正信号発生器、31・・・減算器、32・・・自
乗器、33・・・論理和回路、34・・・加算器、35
・・・判別器、36・・・スイッチ回路、3B、39.
40・・・遅延回路、41、42.43・・・駆動回路
FIG. 1 is a perspective view showing the overall structure of the device according to the present invention. FIG. 2 is a schematic diagram for explaining the relationship between a falling almond and the output of the linear image sensor. FIG. 3 is a block diagram showing an embodiment of the calculation control section, etc. 2... Granular material (almond), 3... Light source, 4a. 4b, 4c... Reflected light detection section, 5... Light amount detector,
6a, 6b, 6c...Background board, 8a, 8b, 8c
. . . Air injector constituting route changing means, 9 . . Container, 10 . . . Arithmetic control unit, 11a .
a... Linear image sensor, 24A, 24B, 24
C...Circuit for processing the output of each reflected light detector, 17.
...Image sensor drive signal generation circuit, 18a, 18b
. 18c... Amplification sample hold circuit, 22... Amplifier, 23... Reference voltage generator, 27... Abnormal reflection detector, 28... Shaper, 29... Integrator, 30...
...Correction signal generator, 31...Subtractor, 32...Squarer, 33...OR circuit, 34...Adder, 35
... Discriminator, 36... Switch circuit, 3B, 39.
40... Delay circuit, 41, 42.43... Drive circuit.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)粒状物を落下させ、落下の過程における粒状物か
らの反射光を検出し、その結果により粒状物の落下経路
を変更することにより選別する粒状物の選別装置におい
て、落下過程にある粒状物を照明する光源と、前記光源
の明るさを検出して明るさの変動に追従して変化する基
準電圧を発生する基準電圧発生器と、リニヤイメージセ
ンサおよび前記光源の照明下にある粒状物の表面の反射
の前記落下軸に直交する表面からの!反射光酸分を前記
イメージセンサに結像させる光学系を持つ反射光検出器
と、前記粒状物の一つが前記落下軸上の特定の点を通過
する期間に前記リニヤイメージセンサ出力を多数回直列
に読み出すリニヤイメージセンサ制御回路と、前記リニ
ヤイメージセンサ出力を前記基準レベルと比較して異常
レベルを検出したときに出力を発生する異常反射検出器
と、前記リニヤメイージセンサ出力の各読み出し毎の反
射光存在時間の和を求める積分器と、前記積分器の出力
を参照値と比較して粒状物の大小を判別する判別器と、
前記異常反射検出器および判別器の出力により動作させ
られる経路変更手段から構成したことを特徴とする粒状
物を反射率と大きさによ−り選別する装置。
(1) In a particle sorting device that sorts particles by dropping particles, detecting the reflected light from the particles in the process of falling, and changing the falling path of the particles based on the results, the particles in the process of falling are A light source that illuminates an object, a reference voltage generator that detects the brightness of the light source and generates a reference voltage that changes to follow changes in brightness, a linear image sensor, and a particulate object under the illumination of the light source. of the reflection from the surface perpendicular to the axis of fall! a reflected light detector having an optical system that images reflected light acid on the image sensor, and the output of the linear image sensor is serially connected many times during a period when one of the particles passes a specific point on the falling axis. a linear image sensor control circuit for reading out the linear image sensor output, an abnormal reflection detector that compares the linear image sensor output with the reference level and generates an output when an abnormal level is detected, and a linear image sensor control circuit for each reading of the linear image sensor output. an integrator that calculates the sum of reflected light existence times; a discriminator that compares the output of the integrator with a reference value to determine the size of the particulate matter;
1. A device for sorting particulate matter based on reflectance and size, comprising a path changing means operated by the outputs of the abnormal reflection detector and discriminator.
(2)前記落下は自由落下である実用新案登録請求の範
囲第1項記載の粒状物を反射率と大きさにより選別する
装置。
(2) The apparatus for sorting particulate matter according to reflectance and size according to claim 1, wherein the fall is a free fall.
JP14047983U 1983-09-09 1983-09-09 Device that sorts granular materials based on reflectance and size Granted JPS6046189U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14047983U JPS6046189U (en) 1983-09-09 1983-09-09 Device that sorts granular materials based on reflectance and size

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14047983U JPS6046189U (en) 1983-09-09 1983-09-09 Device that sorts granular materials based on reflectance and size

Publications (2)

Publication Number Publication Date
JPS6046189U true JPS6046189U (en) 1985-04-01
JPS6244790Y2 JPS6244790Y2 (en) 1987-11-27

Family

ID=30314508

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14047983U Granted JPS6046189U (en) 1983-09-09 1983-09-09 Device that sorts granular materials based on reflectance and size

Country Status (1)

Country Link
JP (1) JPS6046189U (en)

Also Published As

Publication number Publication date
JPS6244790Y2 (en) 1987-11-27

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