JPS604114Y2 - 多成分赤外線ガス分析計のスパンチエツク機構 - Google Patents
多成分赤外線ガス分析計のスパンチエツク機構Info
- Publication number
- JPS604114Y2 JPS604114Y2 JP1977067950U JP6795077U JPS604114Y2 JP S604114 Y2 JPS604114 Y2 JP S604114Y2 JP 1977067950 U JP1977067950 U JP 1977067950U JP 6795077 U JP6795077 U JP 6795077U JP S604114 Y2 JPS604114 Y2 JP S604114Y2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- light
- span
- component
- electric signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 41
- 230000003287 optical effect Effects 0.000 claims description 7
- 230000000903 blocking effect Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 2
- 230000003321 amplification Effects 0.000 claims 5
- 238000003199 nucleic acid amplification method Methods 0.000 claims 5
- 239000007789 gas Substances 0.000 description 30
- 238000010586 diagram Methods 0.000 description 7
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1977067950U JPS604114Y2 (ja) | 1977-05-26 | 1977-05-26 | 多成分赤外線ガス分析計のスパンチエツク機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1977067950U JPS604114Y2 (ja) | 1977-05-26 | 1977-05-26 | 多成分赤外線ガス分析計のスパンチエツク機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS53162786U JPS53162786U (enExample) | 1978-12-20 |
| JPS604114Y2 true JPS604114Y2 (ja) | 1985-02-05 |
Family
ID=28975381
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1977067950U Expired JPS604114Y2 (ja) | 1977-05-26 | 1977-05-26 | 多成分赤外線ガス分析計のスパンチエツク機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS604114Y2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5946540A (ja) * | 1982-09-09 | 1984-03-15 | Toshiba Corp | 濁度計 |
-
1977
- 1977-05-26 JP JP1977067950U patent/JPS604114Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS53162786U (enExample) | 1978-12-20 |
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