JPS6040658B2 - Single coil inspection method for deflection yoke - Google Patents

Single coil inspection method for deflection yoke

Info

Publication number
JPS6040658B2
JPS6040658B2 JP9507277A JP9507277A JPS6040658B2 JP S6040658 B2 JPS6040658 B2 JP S6040658B2 JP 9507277 A JP9507277 A JP 9507277A JP 9507277 A JP9507277 A JP 9507277A JP S6040658 B2 JPS6040658 B2 JP S6040658B2
Authority
JP
Japan
Prior art keywords
coil
magnetic field
single coil
deflection yoke
inspection method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9507277A
Other languages
Japanese (ja)
Other versions
JPS5429917A (en
Inventor
輝 藤井
隆之 西
孝司 小林
清 矢野
一郎 新津
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9507277A priority Critical patent/JPS6040658B2/en
Publication of JPS5429917A publication Critical patent/JPS5429917A/en
Publication of JPS6040658B2 publication Critical patent/JPS6040658B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/42Measurement or testing during manufacture

Description

【発明の詳細な説明】 本発明は、TV用偏向ヨークの主要部分であるコイル単
体の磁界分布を測定するコイル単体検査法に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a single coil inspection method for measuring the magnetic field distribution of a single coil, which is a main part of a TV deflection yoke.

偏向ヨークのコイルのように、インピーダンスが低く、
形状および巻線占蹟率と線分布のばらつきが偏向ヨーク
の特性に大きく影響するものは、従来の絶縁耐圧試験お
よびィンダクタンス測定だけではコイル単体の適切な評
価をすることができず、品質管理を行うことができなか
った。
Like the coil in the deflection yoke, the impedance is low;
Variations in the shape, winding occupancy, and wire distribution greatly affect the characteristics of the deflection yoke, so conventional dielectric strength tests and inductance measurements alone cannot adequately evaluate the coil itself. could not be done.

このため、偏向ヨーク完成品の最終検査であるコンパ−
ゼンス検査にかなりの時間を要し、歩留りが悪いなどの
欠点があった。そこで、1個の磁界測定センサをコイル
単体の各測定点に移動させて磁界を測定してコイル単体
の磁界分布を求めるコイル単体検査法が実険的に開発さ
れた。
For this reason, the final inspection of the completed deflection yoke is the comparator.
There were drawbacks such as a considerable amount of time being required for inspection and poor yield. Therefore, a method of inspecting a single coil by moving one magnetic field measuring sensor to each measurement point of a single coil and measuring the magnetic field to determine the magnetic field distribution of the single coil was developed as a practical matter.

ところが、この検査法は、1個の磁界測定センサをコイ
ル単体の各測定に移動させて磁界を測定するようにした
ものであるから、1個のコイル単体の磁界分布を測定す
るのにかなりの時間が必要であり、従って製造工程で大
量にコイル単体を品質検査することが不可能であり、専
ら実験室などに使用されるのが主であった。本発明は、
上記の諸点に鑑み、コイル単体の磁界有効部における磁
界分布を短時間で測定することができる検査法を提供せ
んとするものである。
However, in this inspection method, one magnetic field measurement sensor is moved to each measurement of a single coil to measure the magnetic field, so it takes a considerable amount of time to measure the magnetic field distribution of a single coil. It is time-consuming, and therefore it is impossible to inspect the quality of individual coils in large quantities during the manufacturing process, so they have been mainly used in laboratories and the like. The present invention
In view of the above points, it is an object of the present invention to provide an inspection method that can measure the magnetic field distribution in the magnetic field effective part of a single coil in a short time.

本発明者は、コイルの磁界分布をコイル単体で測定すれ
ば、他部品の影響を受けずに形状、巻線占積率および巻
線分布のばらつき量を検出することができ、また偏向ヨ
ークに要求される磁性特性はコイルの中心軸に対する対
称性であることに着目し、コイルの中心軸に対して直角
な断面数層に数個の磁界測定センサを配置したコイル取
付治具にコイルを取付け、そのコイルに電流を流して磁
界を発生させそれを測定することによりコイル単体の磁
界分布を短時間で測定できることを発明した。以下、本
発明の係る偏向ヨークのコイル単体検査法の一具体例を
添付図面について説明する。偏向ヨークの水平コイルは
、第1図乃至第3図に示すように、くる型のコィルー,
1′を2個組合わせてなる。そして、前記コイル1,1
′の磁界分布測定の条件としては、コイル1,1′の中
心軸に対して直角な断面数層(A断面、B断面、C断面
およびD断面)のコイル1,1′の形状に沿った点、例
えばA,,A2,ん,A4をA断面における磁界測定点
とし、以下同様にD,,○2,D3,D4まで上下左右
対称になるように機械的に決め、上記各磁界測定点A,
,ん・・…・・・・D3,D4において磁界を測定する
。第4図は、本発明の検査法に使用する検査装置の斜視
図である。
The present inventor has discovered that by measuring the magnetic field distribution of a coil as a single coil, it is possible to detect the shape, winding space factor, and variation in winding distribution without being influenced by other parts. Focusing on the fact that the required magnetic property is symmetry with respect to the central axis of the coil, we installed the coil in a coil mounting jig with several magnetic field measurement sensors arranged in several layers in a cross section perpendicular to the central axis of the coil. invented the ability to measure the magnetic field distribution of a single coil in a short time by passing a current through the coil to generate a magnetic field and measuring it. Hereinafter, a specific example of the method for inspecting a single coil of a deflection yoke according to the present invention will be described with reference to the accompanying drawings. The horizontal coil of the deflection yoke is a coil-shaped coil, as shown in FIGS. 1 to 3.
It is made by combining two 1'. And the coils 1, 1
The conditions for measuring the magnetic field distribution of coils 1 and 1' are as follows: Points, for example, A,, A2, N, A4 are taken as the magnetic field measurement points on the A cross section, and the following mechanically determined points up to and including D,, ○2, D3, and D4 are determined vertically and horizontally symmetrically, and each of the above magnetic field measurement points is A,
, Hmm......Measure the magnetic field at D3 and D4. FIG. 4 is a perspective view of an inspection device used in the inspection method of the present invention.

この検査装置は、ベース2上に1対のブラケツト7,7
′を固定し、該1対のブラケット7,7′の間にアクリ
ル製のコイル取付台具3を設け、前記ベース2の両端部
に1対のスライド8,8′をスライド自在に敦橿し、該
スライド8,8′にコイル押え4,4′をハンドル5,
5′を介して設ける。
This inspection device has a pair of brackets 7, 7 on a base 2.
' is fixed, an acrylic coil mounting fixture 3 is provided between the pair of brackets 7, 7', and a pair of slides 8, 8' are slidably mounted on both ends of the base 2. , attach the coil pressers 4, 4' to the slides 8, 8' and the handle 5,
5'.

前記コイル取付治具3の前記コィルー,1′の磁界測定
点A,,A2・・・・・・・・・D3,D4を対応する
箇所に磁界測定センサ(図示せず)を配置し、該磁界測
定センサのリード線10を端子台9に接続する。図中、
6,6′は前記スライド8,8′に突設したストップピ
ンである。
A magnetic field measuring sensor (not shown) is placed at a position corresponding to the magnetic field measuring points A, A2, D3, D4 of the coil 1' of the coil mounting jig 3. Connect the lead wire 10 of the magnetic field measurement sensor to the terminal block 9. In the figure,
Reference numerals 6 and 6' indicate stop pins protruding from the slides 8 and 8'.

次に、上述の装置による本発明のコイル単体検査法につ
いて説明する。
Next, a coil unit inspection method of the present invention using the above-mentioned apparatus will be explained.

すなわち、コイル1,1′をコイル取付拾具3の両側に
位置させてコイル押え4,4′により押え付けてセット
する。
That is, the coils 1 and 1' are placed on both sides of the coil mounting pick 3 and held down by the coil pressers 4 and 4'.

次に前記コイル1,1′に所定の電流を流して交流磁界
を発生させる。すると、コイル取付治具3に配置された
磁界測定センサによりコイル1,1′の各磁界測定点A
,,A2・・・……D3,D4における磁界が測定され
、その測定値を基にして第5図に示すような磁界測定分
布図が得られる。第5図に示す磁界分布図において、実
線で示す測定分布は理想的なコイルを表わし、破線で示
す測定分布は実測値のものを表わし、図からも明らかな
ように、実測値の上下左右の額きがアンバランスとして
現われる。
Next, a predetermined current is passed through the coils 1, 1' to generate an alternating magnetic field. Then, each magnetic field measurement point A of the coils 1 and 1' is detected by the magnetic field measurement sensor placed on the coil mounting jig 3.
, , A2......D3, D4 are measured, and based on the measured values, a magnetic field measurement distribution diagram as shown in FIG. 5 is obtained. In the magnetic field distribution diagram shown in Figure 5, the measured distribution shown by the solid line represents an ideal coil, and the measured distribution shown by the broken line represents the actual measured value. The forehead appears unbalanced.

このように、本発明においては、コイルの中心軸に対し
て直角な断面数層に数個の磁界測定センサを配置したコ
イル取付治具にコイルをセットし、そのコイルに電流を
流して磁界を発生させ、その磁界を測定するようにした
ものであるから、コイルの磁界有効部における磁界分布
を短時間で測定することができる。
In this way, in the present invention, a coil is set in a coil mounting jig in which several magnetic field measurement sensors are arranged in several layers in a cross section perpendicular to the central axis of the coil, and a current is passed through the coil to generate a magnetic field. Since the magnetic field is generated and the resulting magnetic field is measured, the magnetic field distribution in the magnetic field effective part of the coil can be measured in a short time.

しかもコイル単体で品質検査を行うことができるので、
製造工程におけるコイルの品質管理ができ、コイルの品
質向上を計ることができるなどの効果がある。
Moreover, since quality inspection can be performed on the coil itself,
This has the advantage of being able to control the quality of the coil during the manufacturing process and improve the quality of the coil.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はコイルの斜視図、第2図および第3図はコイル
の磁界分布測定点の一例を示す平面図および側面図、第
4図は本発明のコイル単体検査法に使用する装置の斜視
図、第5図は理想値と美郷値との磁界分布図である。 1,1′…・・・コイル、3・…・・コイル取付治具、
4,4′・・・…コイル押え、A,,Aな・・・・・・
・・D3,D4・・・・・・磁界測定点。 第1図 第2図 第3図 第4図 第5図
Fig. 1 is a perspective view of the coil, Figs. 2 and 3 are a plan view and side view showing an example of the magnetic field distribution measurement points of the coil, and Fig. 4 is a perspective view of the device used in the single coil inspection method of the present invention. FIG. 5 is a magnetic field distribution diagram between the ideal value and the Misato value. 1, 1'... Coil, 3... Coil installation jig,
4, 4'... Coil holder, A,, A...
...D3, D4...Magnetic field measurement points. Figure 1 Figure 2 Figure 3 Figure 4 Figure 5

Claims (1)

【特許請求の範囲】[Claims] 1 コイル単体の中心軸に対して直角な断面数層に、断
面の中心で交差する水平線と垂直線にそれぞれ線対称で
、かつコイルに接近した位置に複数個の磁界測定センサ
を配置したコイル取付治具に、コイル単体をセツトし、
前記コイル単体に所定の電流を流して交流磁界を発生さ
せ、前記磁界測定センサによりコイル単体の各磁界測定
点における磁界を測定し、コイル単体の磁気分布が得ら
れるようにしたことを特徴とする偏向ヨークのコイル単
体検査法。
1 Coil installation in which multiple magnetic field measurement sensors are arranged in several layers in a cross section perpendicular to the central axis of a single coil, symmetrical to a horizontal line and a vertical line that intersect at the center of the cross section, and in positions close to the coil. Set the coil alone on the jig,
A predetermined current is passed through the single coil to generate an alternating magnetic field, and the magnetic field measurement sensor measures the magnetic field at each magnetic field measurement point of the single coil to obtain the magnetic distribution of the single coil. Single coil inspection method for deflection yoke.
JP9507277A 1977-08-10 1977-08-10 Single coil inspection method for deflection yoke Expired JPS6040658B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9507277A JPS6040658B2 (en) 1977-08-10 1977-08-10 Single coil inspection method for deflection yoke

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9507277A JPS6040658B2 (en) 1977-08-10 1977-08-10 Single coil inspection method for deflection yoke

Publications (2)

Publication Number Publication Date
JPS5429917A JPS5429917A (en) 1979-03-06
JPS6040658B2 true JPS6040658B2 (en) 1985-09-12

Family

ID=14127774

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9507277A Expired JPS6040658B2 (en) 1977-08-10 1977-08-10 Single coil inspection method for deflection yoke

Country Status (1)

Country Link
JP (1) JPS6040658B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0249443U (en) * 1988-09-29 1990-04-05

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59195555U (en) * 1983-06-11 1984-12-26 株式会社 堀場製作所 glass electrode

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0249443U (en) * 1988-09-29 1990-04-05

Also Published As

Publication number Publication date
JPS5429917A (en) 1979-03-06

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