JPS6037518A - Beam combiner for atomic absorption analysis - Google Patents
Beam combiner for atomic absorption analysisInfo
- Publication number
- JPS6037518A JPS6037518A JP14615883A JP14615883A JPS6037518A JP S6037518 A JPS6037518 A JP S6037518A JP 14615883 A JP14615883 A JP 14615883A JP 14615883 A JP14615883 A JP 14615883A JP S6037518 A JPS6037518 A JP S6037518A
- Authority
- JP
- Japan
- Prior art keywords
- mirror
- semi
- beam combiner
- mirrors
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010521 absorption reaction Methods 0.000 title description 5
- 238000004458 analytical method Methods 0.000 title description 2
- 238000001479 atomic absorption spectroscopy Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 abstract description 9
- 238000007740 vapor deposition Methods 0.000 abstract description 7
- 230000007423 decrease Effects 0.000 abstract description 6
- 230000003247 decreasing effect Effects 0.000 abstract description 3
- 238000002834 transmittance Methods 0.000 description 14
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 7
- 229910052805 deuterium Inorganic materials 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000008020 evaporation Effects 0.000 description 4
- 238000001704 evaporation Methods 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 238000002835 absorbance Methods 0.000 description 1
- 238000003705 background correction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
- G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
Abstract
Description
【発明の詳細な説明】
（イ）産業上の利用分野
本発明は、原子吸光分析用ビームコンバイナーに関し、
特に、反射率に対する透過率の比率を、連続的に調節で
きる、原子吸光分析装置用のビームコンバイナーに関す
る。Detailed Description of the Invention (a) Industrial Application Field The present invention relates to a beam combiner for atomic absorption spectrometry;
In particular, the present invention relates to a beam combiner for an atomic absorption spectrometer that can continuously adjust the ratio of transmittance to reflectance.
（ロ）従来技術
原子吸光分析装置において、中空陰極ランプと重水素ラ
ンプを併設して、バックグランド補正を行う場合、中空
陰極ランプからの光Ｍと重水素ランプからの光量が大き
く相違していると、光量の多い方に光電検知器の感匪が
合わされるのＣ１光（１）
量の少い１ノの信号のＳＮ比は悪化することになる。(b) When performing background correction by installing a hollow cathode lamp and a deuterium lamp together in a conventional atomic absorption spectrometer, the amount of light M from the hollow cathode lamp and the light amount from the deuterium lamp are greatly different. Then, the sensitivity of the photoelectric detector is adjusted to the one with a large amount of light, and the signal to noise ratio of the signal of C1 light (1) with a small amount of light deteriorates.
また、対数変換回路は動作範囲が限られており、信号が
小さすぎても変換精度が低下する。そこで、光量損失を
少くして、容易に中空陰極ランプと重水素ランプの光量
をバランスさけることができるように、ビームコンバイ
ナーどしで、反射充足と透過光穴の比率が異る部分をｉ
Ｑ ）プた透過比変換ミラーが使用されるが、反射率に
対する透過率の比率１なわち（透過率／反射率）比が連
続的に切り換らないために、例えば、測定波長が異って
、両児源ランプの光品比が広範囲に変化する場合などで
は、光電バランスの精度を上げるために、（透過率／殴
Ｄ４率）比の相違する半透過ミラーを多数＊＋Ｕする必
要があり、費用が高くついた。Furthermore, the logarithmic conversion circuit has a limited operating range, and if the signal is too small, the conversion accuracy will decrease. Therefore, in order to reduce the light amount loss and easily balance the light amount of the hollow cathode lamp and the deuterium lamp, the beam combiner is designed to have different ratios of reflective and transmitted light holes.
Q) A transmission ratio conversion mirror is used, but since the ratio of transmittance to reflectance (transmittance/reflectance) ratio does not change continuously, for example, the measurement wavelength is different. In cases where the light component ratio of both source lamps changes over a wide range, it is necessary to use a large number of semi-transparent mirrors with different (transmittance/D4 ratio) ratios in order to improve the accuracy of the photoelectric balance. Yes, it was expensive.
（ハ）目 的
本発明は、このような従来法の原子吸光分析装置にお１
ノるご−ムコンバイナーの欠点を解消するものであっＣ
１反射面となる蒸着面ど透過面の非蒸着面を適宜の割合
で有する二枚の半透過ミラーを適宜重ね合わせることに
より、（透過率／反射（２）
率）化が連続的に調節できるビームコンバイブ−を提供
するにある。(c) Purpose The present invention provides an improvement to such a conventional atomic absorption spectrometer.
It solves the drawbacks of the Norgomu combiner.
By appropriately overlapping two semi-transmissive mirrors each having an appropriate ratio of a vapor-deposited surface, a transmissive surface, and a non-vapor-deposited surface to serve as a reflective surface, the ratio (transmittance/reflection (2) ratio) can be continuously adjusted. To provide beam combiner vibes.
（ニ）構 成
本発明は、二枚の半透過ミラーを重ね合せて有し、少く
とも一方の半透過ミラーが他方の半透過ミラーに対し移
ｎノ自在に設けられていることを特徴する原子吸光分析
用ど一ムコンバイノーにある。(d) Structure The present invention provides an atom atomic mirror having two semi-transparent mirrors stacked one on top of the other, and at least one of the semi-transparent mirrors being provided so as to be freely movable with respect to the other semi-transparent mirror. For absorbance analysis, there is one in the binoculars.
本発明のビームコンバイナーにおいて、車ね合せて設け
られる二枚の半透過ミラーの夫々は、適宜の面積比率で
、光透過板或は透明な板の片側に、蒸着その他の金属メ
ッキ手段により、適宜、金属反射面を形成して！ｌｌＪ
造される。反射面の経年変化を防止するために、形成
された反射面周囲に適宜コーティングを施しＩ″製造て
もよい。In the beam combiner of the present invention, each of the two semi-transmissive mirrors provided in combination is coated on one side of a light transmitting plate or a transparent plate with an appropriate area ratio by vapor deposition or other metal plating means. , forming a metallic reflective surface! llJ
will be built. In order to prevent the reflective surface from deteriorating over time, an appropriate coating may be applied to the periphery of the formed reflective surface.
本発明のビームコンバイナーは、光透過板どして、例え
ば、光透過性の寸ぐれた月利のものを使用したり、或い
は適宜の厚さのものを使用することによって、光間損失
を少くすることがｒぎる。The beam combiner of the present invention can reduce inter-optical loss by using, for example, a light transmitting plate with uneven light transmittance or having an appropriate thickness. There's too much to do.
蒸着反射面は、適宜の透過性を有する半透明状に形成し
たものも包含η−る。半透過ミラーの（透過率７・′反
１１−１ ＄ １ Ｉｆ； ｌよ、蒸析面の蒸ｊ’ｒ
Ｐｌ彎のｆｌ）カッ＋、Ｌ蒸者面積を喰えることにより
、適宜調節できる。The vapor-deposited reflective surface also includes one formed in a semi-transparent shape with appropriate transparency. Transmittance of semi-transmissive mirror (transmittance 7・'11−1 $ 1 If; l, evaporation of evaporation surface
It can be adjusted as appropriate by adjusting the fl) and L vapor areas of the Pl curve.
組合Ｉ′）さイする二枚の半透過ミラーの夫々の（透過
率／′反側胴率比は、同じであってもよく、」、た。Combination I') The (transmittance/'opposite side ratio) of each of the two semi-transmissive mirrors may be the same.
侑１ｆｆｉ Ｌでいでｂよい。この組合わδＪ’ｌる一
枚の３１を透過ミラーは、（透過率、／反射率）比の適
当なものを選択７れば、広汎な範）ＤＩの（透過率／反
則ヰ・）比、例λば、４０ ／６０ないしＯ、／ １０
０の（透過率、・′灰ＱＪ率）比の範囲内Ｃ辿続的ＩＪ
変λることがでさる。Yu1ffi L is good. This combination δJ'l of one sheet 31 can be used as a transmitting mirror if a suitable one with (transmittance, /reflectance) ratio is selected 7, the (transmittance / reflection ratio) of DI , for example λ, 40 /60 to O, /10
Continuous IJ within the range of (transmittance, ・′ash QJ rate) ratio of 0
It is possible to change λ.
２に透過ミラーの蒸着１ｈ）枯↓と十１ｊＩ 、及０；
Ｉ １ｆｉｉの光透過性の如何によっても異なるが、透
過ｆ１を右しない反ｏｊミラーに形成した場合は、５０
ないし６０％が適当であり、その面積比率で、格子状、
スリン１〜状、市松模様、イの他適当４丁模様に形成り
ることができる。二枚の半透過ミラーは、その＠着面を
７７に内側又は外側１．二向けて設（）でもよく、或は
互に左側父は７ｊに６側と同じ側に設けてもよい。2. Vapor deposition of transmitting mirror 1h) ↓ and 11jI, and 0;
It depends on the light transmittance of I1fii, but if it is formed into an anti-oj mirror that does not reflect the transmission f1, it will be 50
A ratio of 60% to 60% is appropriate, and with that area ratio, grid-like,
It can be formed into any suitable 4-cho pattern, such as a checkerboard pattern or a pattern. The two semi-transparent mirrors have their @ mounting surfaces set to 77 on the inside or outside 1. It may be provided facing two (), or the left side of each may be provided on the same side as 7j and the 6th side.
（小）実施例
第１図は、本５と明のビームコンバイノーの実ＭＦ例の
−を示す。(Small) Embodiment FIG. 1 shows an actual MF example of the beam combiner no. 5 and Akira.
第２図及び第３図に示される半透過ミラーは、第１図の
実施例における一組に重ね合わされる半透過ミラーの夫
々の一例を示す。The semi-transmissive mirrors shown in FIGS. 2 and 3 are examples of the semi-transmissive mirrors that are superimposed in a set in the embodiment of FIG. 1.
第１図の実施例における半透過ミラー１ の−例を第２
図に示し、同じく半透過ミラー２の一例を第３図に示す
。A second example of the semi-transparent mirror 1 in the embodiment of FIG.
Similarly, an example of the semi-transparent mirror 2 is shown in FIG.
第１図の実施例において、３は中空陰極ランプであり、
４は重水素ランプである。In the embodiment of FIG. 1, 3 is a hollow cathode lamp;
4 is a deuterium lamp.
半透過ミラー１及び２のいずれにも、市松模様状に蒸着
反射面５．５′が形成されている。Both of the semi-transmissive mirrors 1 and 2 have vapor-deposited reflective surfaces 5.5' formed in a checkered pattern.
半透過ミラー１と半透過ミラー２を重ね合せたとき、半
透過ミラー１の蒸着反射面５は、半透過ミラー２の非蒸
着の透過面６と重なり、同様に半透過ミラー１の非蒸着
の透過面６は半透過ミラー２の蒸着反射面５′と重なっ
て、ビームコンバイナーの使用面全体が蒸着反射面でお
おわれることになる。この場合、ビームコンバイナーの
透過光量は最小となり、反射光量は最高となる。これに
対して、一方の半透過ミラー１を他方の半透過ミラ（５
）
＝２に対し、格子の一列分だＩノ移動させると、それぞ
れの蒸椙面５．５′は重なりあい、それぞれの非蒸着透
過面６．６′も小なりあってビーム−］コンバイナの透
過光量は最高となり、一方、反射先組は最小となる。When the semi-transmissive mirror 1 and the semi-transmissive mirror 2 are superimposed, the vapor-deposited reflective surface 5 of the semi-transmissive mirror 1 overlaps the non-evaporated transparent surface 6 of the semi-transmissive mirror 2, and similarly the non-evaporated transparent surface 6 of the semi-transmissive mirror 1 overlaps The transmitting surface 6 overlaps with the vapor-deposited reflective surface 5' of the semi-transmissive mirror 2, so that the entire use surface of the beam combiner is covered with the vapor-deposited reflective surface. In this case, the amount of light transmitted through the beam combiner is the minimum and the amount of reflected light is the maximum. On the other hand, one semi-transparent mirror 1 is replaced with the other semi-transparent mirror (5
) = 2, if the grating is moved by one row, the evaporation surfaces 5.5' overlap each other, and the non-evaporation transmission surfaces 6.6' are also slightly smaller, so that the beam-] combiner's The amount of transmitted light is the highest, while the amount of reflected light is the lowest.
重水素ランプ４の光量が中空陰極ランプ３の光量より一
桁程大きいときは、ビームコンバイナーの反射面が増加
するｈ向に、半透過ミラー１を移動させて、蒸着反射面
５を一方の半透過ミラー２の蒸着反射面５に対してずら
りことにより、ビームコンバイナーの半透過ミラーとし
ての使用部分の反射面枯化率が増加し、透過面積比率は
減少Ｊることになるので、重水素ランプ４の光量は減少
し、中空陰極ランプ３の光用は増加することになり、両
者の光量バランスを適当に保つことができる。また、中
空陰極ランプ３の光量が重水素ランプより大きいときは
、半透過ミラー１の蒸着反射面５を、半透過ミラー２の
、Ｍ着反射面５′に重ね合わせるｈ向、つまり、反射面
積比率を減少させ、透過面積比率を増加する方面に、移
動さＵて、重（６）
水素ラン／４の先賢をＩｌ’ｌ ７！Ｉｌさせ、中空ｌ
ｉ２体シンブ３の光−を減少させて、両者の光ωバラン
スを適当に保つことができる。When the light intensity of the deuterium lamp 4 is about an order of magnitude larger than the light intensity of the hollow cathode lamp 3, move the semi-transmissive mirror 1 in the direction h, in which the reflective surface of the beam combiner increases, and shift the vapor deposition reflective surface 5 to one half. Due to the misalignment of the transmitting mirror 2 with respect to the vapor-deposited reflective surface 5, the rate of deterioration of the reflective surface of the portion used as a semi-transmissive mirror of the beam combiner increases, and the transmission area ratio decreases. The amount of light from the hollow cathode lamp 3 decreases, and the amount of light from the hollow cathode lamp 3 increases, so that the balance between the amounts of light can be maintained appropriately. When the light intensity of the hollow cathode lamp 3 is larger than that of the deuterium lamp, the vapor-deposited reflective surface 5 of the semi-transmissive mirror 1 is overlapped with the M-deposited reflective surface 5' of the semi-transmissive mirror 2 in the h direction, that is, the reflective area Move in the direction of decreasing the ratio and increasing the permeation area ratio, and use the heavy (6) hydrogen run / 4 prescient Il'l 7! Il, hollow l
By reducing the light of the i2 body Simbu 3, it is possible to maintain an appropriate light ω balance between the two.
（へ）効 宋
本発明のビームコンバイノー−は、二枚の半透過ミラー
を自由に移動できるように重ね合せて設置ノるという簡
単な椛造で、その一方の半透過ミラーを、他方の半透過
ミラーに対して移動させるという簡単な操作により、ビ
ームコンバイノー−の反射面及び透過面の増減を任意に
かつ連続的に行うことができるものであり、従来のビー
ムコンバイＪ−−と比較して、構造ｈａ単であって、安
価で、使い易いものである。The beam combiner of the present invention is a simple construction in which two semi-transparent mirrors are placed one on top of the other so that they can move freely. By simply moving it relative to the semi-transmissive mirror, the reflecting and transmitting surfaces of the beam combiner can be increased or decreased arbitrarily and continuously, compared to the conventional beam combiner J. It has a simple structure, is inexpensive, and is easy to use.
しかも、このように本発明のビームコンバイナーは、反
射面積及び透過面積の増減を、任意かつ連続的に行うこ
とができるので、（透過率／反射率）比が任意かつ広範
囲にそして連続的に変化させることができるものである
。Moreover, since the beam combiner of the present invention can arbitrarily and continuously increase or decrease the reflection area and transmission area, the (transmittance/reflectance) ratio can be changed arbitrarily, over a wide range, and continuously. It is something that can be done.
したがって、本発明のビームコンバイナーを使用するこ
とにより、原子吸光分析装置における光電検知器、対数
変換回路を、開ｊｌｌ ＜ｒ操作で、りｆ適な動作状態
にもたらすことができるので、高精度の分析が容易どな
る。Therefore, by using the beam combiner of the present invention, the photoelectric detector and the logarithmic conversion circuit in the atomic absorption spectrometer can be brought into a suitable operating state by opening jll <r operation, so that high precision can be achieved. Easy to analyze.
以」二のように、本発明のビームコンバイナーは従来の
ビームコンバイノーと比較して優れたものであり、その
もたらす彫りは大きい。As described above, the beam combiner of the present invention is superior to the conventional beam combiner, and the carving it provides is large.
第１図は、本発明のビームコンバイナーの実施例の一例
を示ケ。第２図及び第ご３図に示ｌＩ生透過ミラーは、
第１図の実施例におい′Ｃ車ね合わされる半透過ミラー
１．２の夫々の一例である。
１は半透過ミラー、２は前記半透過ミラー１と重ね白け
る一方の半透過ミラーを承り。３は中空陰極ランプ、４
は重水素ランプである。５及び５′は反射面、６及び６
は透過面である。
第１図
第２図 第３図
手続補正書
５９、月、−７
昭和 年 月 口
特 許 庁 艮 官 殿
１、事件の表示
昭和５８年特許顧第１４６１５８ 号
２、発明の名称
原子吸光分析用ビームコンバイナー
３、補正をする者
事件との関係 特許出願人
住 所 京都府京都市中京区河原町通二条［″ルー・）
船大町３７８″４ｈ地
名 称 （１９９） 株式会社 島津製作所４、代 理
人
氏 名 （７５０Ｂ） 弁理士 武 １）正 彦５、補
正命令の口付 自 発
６、補正の対象
明細書の発明の詳細な説明の欄
７、補正の内容
（１） 明細書第４頁第１８行目に［互に左側又は互に
イｉ １ｕ１１．Ｊとあるを「−互に左側すなわち前方
に又は互に右側すなわち後方」と補正する。
以上FIG. 1 shows an example of an embodiment of the beam combiner of the present invention. The II raw transmission mirror shown in Figures 2 and 3 is
This is an example of each of the semi-transparent mirrors 1.2 which are combined in the embodiment of FIG. 1. 1 is a semi-transparent mirror, and 2 is a semi-transparent mirror that overlaps the semi-transparent mirror 1 and is white. 3 is a hollow cathode lamp, 4
is a deuterium lamp. 5 and 5' are reflective surfaces, 6 and 6
is a transparent surface. Figure 1 Figure 2 Figure 3 Procedural amendment 59, Month, -7 Showa year, month, month, month, month, month, month, Showa year, Patent Office, Public Prosecutor's Office, Department 1, Indication of the case, 1982 Patent Registration No. 146158, 2, Name of the invention, For atomic absorption spectrometry Beam combiner 3, relationship with the case of the person making the amendment Patent applicant address 2-jo Kawaramachi-dori, Nakagyo-ku, Kyoto-shi, Kyoto Prefecture
Funaomachi 378″4h Place name (199) Shimadzu Corporation 4, Agent name (750B) Patent attorney Take 1) Masahiko 5, Order for amendment Motto 6, Invention of the specification subject to amendment Detailed Explanation Column 7, Contents of Amendment (1) In page 4, line 18 of the specification, [mutually left side or mutually i 1u11. In other words, it is corrected as "backward."that's all
Claims (1)
半透過ミラーが、他方の半透過ミラーに対し、移動自在
に設けられていることを特徴とする原子吸光分析用ビー
ムコンバイナー。1. A beam combiner for atomic absorption spectrometry, characterized in that it has two semi-transparent mirrors stacked one on top of the other, and at least ten thousand semi-transparent mirrors are provided movably relative to the other semi-transparent mirror.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14615883A JPS6037518A (en) | 1983-08-10 | 1983-08-10 | Beam combiner for atomic absorption analysis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14615883A JPS6037518A (en) | 1983-08-10 | 1983-08-10 | Beam combiner for atomic absorption analysis |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6037518A true JPS6037518A (en) | 1985-02-26 |
Family
ID=15401439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14615883A Pending JPS6037518A (en) | 1983-08-10 | 1983-08-10 | Beam combiner for atomic absorption analysis |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6037518A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8184286B2 (en) | 2006-12-18 | 2012-05-22 | Shimadzu Corporation | Atomic absorption spectrophotometer |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49974U (en) * | 1972-04-07 | 1974-01-07 |
-
1983
- 1983-08-10 JP JP14615883A patent/JPS6037518A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49974U (en) * | 1972-04-07 | 1974-01-07 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8184286B2 (en) | 2006-12-18 | 2012-05-22 | Shimadzu Corporation | Atomic absorption spectrophotometer |
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