JPS6036470B2 - Ion plating device - Google Patents
Ion plating deviceInfo
- Publication number
- JPS6036470B2 JPS6036470B2 JP2413378A JP2413378A JPS6036470B2 JP S6036470 B2 JPS6036470 B2 JP S6036470B2 JP 2413378 A JP2413378 A JP 2413378A JP 2413378 A JP2413378 A JP 2413378A JP S6036470 B2 JPS6036470 B2 JP S6036470B2
- Authority
- JP
- Japan
- Prior art keywords
- evaporated
- evaporation source
- evaporated substance
- molten metal
- ion plating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】
本発明はイオンプレーティング装置に関し、さらに詳し
くは蒸発源として電子ビーム溶解蒸発源を用いた装置に
おける駆動を安定化するための機構を設けたイオンプレ
ーティング装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ion plating apparatus, and more particularly to an ion plating apparatus that uses an electron beam melting evaporation source as an evaporation source and is provided with a mechanism for stabilizing the driving of the apparatus.
以下図面を参照して説明する。第1図は本発明のイオン
プレーティング装置の構成を示す榛式断面図であり、こ
こに示されている装置はあとで説明する蒸発物質の溶湯
面高さ検出機構21,22および蒸発物質補給機構30
を除けば、多陰極型直流励起方式の装置として知られて
いる従来の装置と同じである。This will be explained below with reference to the drawings. FIG. 1 is a sectional view showing the structure of the ion plating apparatus of the present invention. Mechanism 30
Other than this, it is the same as the conventional device known as a multi-cathode DC excitation system.
この装置においては、排気系1およびガス導入口2を有
する真空室3内に、接地電位にある電子ビーム溶解蒸発
源4と被処理物である基板10とが対向配置されている
。電子ビーム溶解蒸発源4はフィラメント電源6により
加熱される電子ビームフィラメント7と、電子ビーム加
速電源5を備えている。In this apparatus, in a vacuum chamber 3 having an exhaust system 1 and a gas inlet 2, an electron beam melting and evaporation source 4 at ground potential and a substrate 10, which is an object to be processed, are disposed facing each other. The electron beam melting and evaporation source 4 includes an electron beam filament 7 heated by a filament power source 6 and an electron beam accelerating power source 5.
基板ホルダー11に保持されている基板1川こは、基板
電源12により接地電位に対して負の電圧が印加されて
いるので、基板1川ま陰極10として機能する。Since the substrate 1 held by the substrate holder 11 is applied with a negative voltage with respect to the ground potential by the substrate power supply 12, the substrate 1 functions as the cathode 10.
一方、基板10の近傍にはフィラメント電源14により
加熱される熱電子フィラメント13が配置されており、
陰極電源15により接地電位に対して負の電圧が印加さ
れているのでこれも陰極13として機能する。このよう
な装置は多陰極型直流励起方式のイオンプレーティング
装置と呼ばれている。On the other hand, a thermionic filament 13 heated by a filament power source 14 is arranged near the substrate 10.
Since a negative voltage with respect to the ground potential is applied by the cathode power supply 15, this also functions as the cathode 13. Such an apparatus is called a multi-cathode DC excitation type ion plating apparatus.
この装置において、排気系1を介して真空室3を排気し
たのち、ガス導入口2から徴量のガスを導入して真空度
を10‐3トール前後に保持し、蒸発源4と陰極10.
13との間に直流電圧を印加すると、導入ガスは放電し
てプラズマ状態となり真空室3に充満する。In this device, after a vacuum chamber 3 is evacuated via an exhaust system 1, a certain amount of gas is introduced from a gas inlet 2 to maintain the degree of vacuum at around 10-3 Torr, and an evaporation source 4 and a cathode 10.
13, the introduced gas is discharged and becomes a plasma state, which fills the vacuum chamber 3.
この状態でフィラメント電源6および電子ビーム加速電
源5を駆動して電子ビームフィラメント7からの電子ビ
ームを蒸発物質8に照射すると、蒸発物質8は溶解して
蒸気を発する。In this state, when the filament power source 6 and the electron beam accelerating power source 5 are driven to irradiate the evaporative substance 8 with an electron beam from the electron beam filament 7, the evaporative substance 8 is melted and emits vapor.
蒸発物質蒸気はプラズマの作用でイオン化し、あるいは
さらに導入ガスィオン反応して化合物を形成し、基板1
0の表面に静電的に加速されて沈着し被膜を形成する。The evaporated substance vapor is ionized by the action of plasma, or further reacts with the introduced gas to form a compound, and the substrate 1
It is electrostatically accelerated and deposited on the surface of 0 to form a film.
熱電子放射フィラメント13からなる陰極13は必須の
部材ではないが、これを配置することにより基板10に
印加する負電圧を低減することが可能となり、正イオン
による基板表面のスパッタ効果が緩和されて成膜速度が
向上する。また、熱電子放射フィラメント13から放射
される電子はプラズマ密度とイオン化効率を著しく向上
させる。Although the cathode 13 made of the thermionic emission filament 13 is not an essential member, by arranging it, it is possible to reduce the negative voltage applied to the substrate 10, and the sputtering effect on the substrate surface due to positive ions is alleviated. Film deposition speed is improved. Further, the electrons emitted from the thermionic emission filament 13 significantly improve plasma density and ionization efficiency.
このようなイオンプレーティング装置において、形成さ
れる被膜の特性を左右する因子としては蒸発物質の蒸発
速度、導入ガス圧、基板電源電圧、陰極電源電圧、熱電
子放射フィラメント電流などがあるが、蒸発物質の蒸発
速度を除く残りの因子を所定の値に設定し安定に保持す
ることは比較的容易である。In such an ion plating apparatus, the factors that influence the characteristics of the film formed include the evaporation rate of the evaporated substance, the introduced gas pressure, the substrate power supply voltage, the cathode power supply voltage, and thermionic emission filament current. It is relatively easy to set the remaining factors other than the evaporation rate of the substance to predetermined values and maintain them stably.
一方、最も重要な因子である蒸発物質の蒸発速度は、特
に蒸発源として電子ビーム溶解蒸発源を用いる場合には
極めてコントロールし難い因子である。On the other hand, the most important factor, the evaporation rate of the evaporated substance, is a factor that is extremely difficult to control, especially when an electron beam melting evaporation source is used as the evaporation source.
そこで本発明の目的は、蒸発物質の蒸発速度を安定化さ
せることにより成膜条件の再現性を向上させて被膜の性
質を均質化することである。Therefore, an object of the present invention is to improve the reproducibility of film-forming conditions and homogenize the properties of a film by stabilizing the evaporation rate of evaporated substances.
上記目的のため本発明においては蒸発物質の落陽面の高
さ検出機構と、蒸発物質補給機構とを設け、落陽面の高
さを所定の位置に調整し得るようにした。蒸発物質の蒸
気圧は溶湯の温度により決定するので、蒸発速度を一定
に保っためには溶湯の温度を一定に保持するとが必要で
ある。For the above-mentioned purpose, the present invention is provided with a mechanism for detecting the height of the sun-falling surface of the evaporated material and an evaporated-material replenishment mechanism, so that the height of the sun-falling surface can be adjusted to a predetermined position. Since the vapor pressure of the evaporated substance is determined by the temperature of the molten metal, it is necessary to keep the temperature of the molten metal constant in order to keep the evaporation rate constant.
ところで、電子ビーム溶解蒸発源における出力は電子ビ
ームフィラメント電流と電子ビーム加速電圧とにより制
御されるが、これらの値を一定に設定した場合にも、熔
傷の温度は蒸発物質の量、したがって溶湯面の高さによ
り大中に変動する。Incidentally, the output of an electron beam melting and evaporation source is controlled by the electron beam filament current and electron beam acceleration voltage, but even when these values are set constant, the temperature of the flaw depends on the amount of evaporated material, and therefore the molten metal. Varies between large and medium depending on the height of the surface.
その理由は、溶傷面の高さにより電子ビームの照射位置
と照射面積とが変化し、また蒸発物質の量により水冷ル
ッボとの接触面積が変化して冷却効率が変動するためで
ある。蒸発物質の量は稼動時間とともに減少し、溶潟面
の高さは低下するので、これを所定の位置に保持するた
めには落陽面の高さを検出し、必要に応じて蒸発物質を
補給することが必要である。The reason for this is that the irradiation position and irradiation area of the electron beam change depending on the height of the flawed surface, and the contact area with the water-cooled rubbo changes depending on the amount of evaporated material, resulting in fluctuations in cooling efficiency. The amount of evaporated material decreases with operating time and the height of the lagoon surface decreases, so in order to keep it in place, the height of the falling sun surface is detected and the evaporated material is replenished as necessary. It is necessary to.
本発明は上記のような知見に基づいてなされたものであ
り、図示のように蒸発物質溶傷面9に光線を照射する発
光部21と熔濠面9からの反射光を受光する受光部22
とからなる高さ検出機構を設けるとともに、真空室外か
らの操作により蒸発源4に蒸発物質を適宜補給する蒸発
物質補給機構30を設けた。発光部21の光源としては
溶湯の白熱光スペクトルと分離して検出可能な波長の光
を用いるか、あるいはパルス変調したレーザ光を用いて
パルス成分だけを検出すれば良い。The present invention has been made based on the above knowledge, and as shown in the figure, a light emitting section 21 that irradiates a light beam to the evaporated substance flawed surface 9 and a light receiving section 22 that receives reflected light from the moat surface 9.
In addition to providing a height detection mechanism consisting of the following, an evaporative substance replenishment mechanism 30 is provided that appropriately replenishes evaporative substance to the evaporation source 4 by operation from outside the vacuum chamber. As the light source of the light emitting section 21, it is sufficient to use light with a wavelength that can be detected separately from the incandescent light spectrum of the molten metal, or to detect only the pulse component using pulse-modulated laser light.
溶傷面の高さはアナグロ的に追従して検出する必要はな
く、所定の高さにあるか否かを検出すれば充分である。There is no need to follow and detect the height of the melted surface in an analogical manner; it is sufficient to detect whether it is at a predetermined height.
蒸発物質補給機構30としては、電磁振動型あるいはモ
ーター駆動型として慣用されている機構を利用すること
ができる。本発明の装置は上述のような機構を備えてい
るので、従来電子ビームフィラメント電流および電子ビ
ーム加速電圧によって試行錯誤的に制御されていた蒸発
速度を長時間にわたって一定に保持することを可能とす
るものであり、成膜条件の再現性向上に極めて有効であ
り、常に均質な被膜を形成することを可能とするもので
ある。As the evaporated substance replenishment mechanism 30, a commonly used electromagnetic vibration type or motor driven type mechanism can be used. Since the device of the present invention is equipped with the above-described mechanism, it is possible to maintain the evaporation rate constant over a long period of time, which was conventionally controlled by trial and error using the electron beam filament current and electron beam acceleration voltage. This method is extremely effective in improving the reproducibility of film-forming conditions, and makes it possible to always form a uniform film.
第1図は本発明のイオンプレーティング装置の構成を示
す漠式断面図である。
1・・・・・・排気系、2・・・・・・ガス導入口、3
・・・・・・真空室、4・・・・・・電子ビーム溶解蒸
発源、8…・・・蒸発物質、9・・・・・・蒸発物質溶
湯面、10・・・・・・基板、11・・・・・・基板ホ
ルダー、21・・…・発光部、22・…・・受光部、3
0・・・・・・蒸発物質補給機構。FIG. 1 is a vague sectional view showing the configuration of the ion plating apparatus of the present invention. 1...Exhaust system, 2...Gas inlet, 3
... Vacuum chamber, 4 ... Electron beam melting and evaporation source, 8 ... Evaporated substance, 9 ... Evaporated substance molten metal surface, 10 ... Substrate , 11... Substrate holder, 21... Light emitting section, 22... Light receiving section, 3
0... Evaporated substance replenishment mechanism.
Claims (1)
電位にある電子ビーム溶解蒸発源と、接地電位に対して
負の電圧が印加される基板とを対向配置し、蒸発源から
の蒸発物質蒸気とガス導入口からの導入ガスをイオン化
し、蒸発物質あるいは蒸発物質と導入ガスとの反応生成
物を基板ホルダーに保持された基板の表面に被覆するイ
オンプレーテイング装置において、前記蒸発源の蒸発物
質溶湯面に光線を照射する発光部と溶湯面からの反射光
を受光する受光部とからなる蒸発物質溶湯面の高さ検出
機構と、前記蒸発源に蒸発物質を補給する蒸発物質補給
機構とを設け、蒸発物質溶湯面の高さを所定の位置に調
整し得るようにしたことを特徴とするイオンプレーテイ
ング装置。1. In a vacuum chamber having an exhaust system and a gas inlet, an electron beam melting evaporation source at ground potential and a substrate to which a negative voltage is applied with respect to the ground potential are placed facing each other, and the evaporated material vapor from the evaporation source is In an ion plating apparatus that ionizes the introduced gas from the gas inlet and coats the surface of the substrate held in the substrate holder with the evaporated substance or a reaction product between the evaporated substance and the introduced gas, the evaporated substance of the evaporation source An evaporated substance molten metal surface height detection mechanism comprising a light emitting part that irradiates a light beam onto the molten metal surface and a light receiving part that receives reflected light from the molten metal surface, and an evaporated substance replenishment mechanism that replenishes the evaporation material to the evaporation source. An ion plating apparatus characterized in that the height of the molten metal surface of the evaporated substance can be adjusted to a predetermined position.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2413378A JPS6036470B2 (en) | 1978-03-03 | 1978-03-03 | Ion plating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2413378A JPS6036470B2 (en) | 1978-03-03 | 1978-03-03 | Ion plating device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54117336A JPS54117336A (en) | 1979-09-12 |
JPS6036470B2 true JPS6036470B2 (en) | 1985-08-20 |
Family
ID=12129803
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2413378A Expired JPS6036470B2 (en) | 1978-03-03 | 1978-03-03 | Ion plating device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6036470B2 (en) |
-
1978
- 1978-03-03 JP JP2413378A patent/JPS6036470B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS54117336A (en) | 1979-09-12 |
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