JPS6031817Y2 - Film rotation coating equipment - Google Patents

Film rotation coating equipment

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Publication number
JPS6031817Y2
JPS6031817Y2 JP12219280U JP12219280U JPS6031817Y2 JP S6031817 Y2 JPS6031817 Y2 JP S6031817Y2 JP 12219280 U JP12219280 U JP 12219280U JP 12219280 U JP12219280 U JP 12219280U JP S6031817 Y2 JPS6031817 Y2 JP S6031817Y2
Authority
JP
Japan
Prior art keywords
coating
substrate
chuck
film
chuck table
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12219280U
Other languages
Japanese (ja)
Other versions
JPS5747272U (en
Inventor
暁 岡崎
Original Assignee
大日本印刷株式会社
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Filing date
Publication date
Application filed by 大日本印刷株式会社 filed Critical 大日本印刷株式会社
Priority to JP12219280U priority Critical patent/JPS6031817Y2/en
Publication of JPS5747272U publication Critical patent/JPS5747272U/ja
Application granted granted Critical
Publication of JPS6031817Y2 publication Critical patent/JPS6031817Y2/en
Expired legal-status Critical Current

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Description

【考案の詳細な説明】 本考案は被膜回転塗布装置に係り、特に、樹脂等の薄膜
を形威するための回転塗布装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a spin coating device, and more particularly to a spin coating device for forming a thin film of resin or the like.

液状樹脂等を塗布基板上に塗布する方法としてはスピン
ナーコート法が広く用いられている。
A spinner coating method is widely used as a method for applying liquid resin or the like onto a coating substrate.

この方法によれば、塗布膜の厚さを0.1〜5μ程度の
薄さで形成することができる。
According to this method, the coating film can be formed with a thickness of about 0.1 to 5 μm.

一般に用いられているスピンナーコート法による回転塗
布装置は、第1図に示すように、縦軸線A−Aのまわり
で高速回転するチャック台1を有しており、このチャッ
ク台1上に被膜塗布用基板2が載置されるようになって
いる。
As shown in Fig. 1, a commonly used rotary coating device using a spinner coating method has a chuck table 1 that rotates at high speed around a vertical axis line A-A. A board 2 for use is placed thereon.

チャック台1は適当な回転軸部3を有し、この軸部は図
示しないモータ等の回転駆動手段によって回転させられ
る。
The chuck table 1 has a suitable rotating shaft portion 3, and this shaft portion is rotated by a rotation driving means such as a motor (not shown).

チャック台1の上面にはゴム等からなる密封用○リング
4が取りつけられており、この○リング4上に基板2が
載置される。
A sealing ring 4 made of rubber or the like is attached to the upper surface of the chuck table 1, and the substrate 2 is placed on this ring 4.

軸部3とチャック台1には真空ポンプに連なる真空吸引
孔5が形威されており、真空ポンプが運転されると、吸
引孔5を介して基板2の下部空間6に真空が作用腰基板
2はチャック台1に吸引によって保持される。
A vacuum suction hole 5 connected to a vacuum pump is formed in the shaft portion 3 and the chuck base 1, and when the vacuum pump is operated, a vacuum is applied to the lower space 6 of the substrate 2 through the suction hole 5. 2 is held on the chuck stand 1 by suction.

そしてチャック台1の回転によって基板2も回転せしめ
られる。
As the chuck table 1 rotates, the substrate 2 is also rotated.

静止しているチャック台1上に基板2を設置後被膜形成
用材料としての液状樹脂7を基板2上に滴下腰真空吸引
孔5により減圧して基板2をチャック台1に真空吸着し
て固定味チャック台1を100〜7000rpmの回転
速度で回転させると、液状樹脂は遠心力等で基板面上に
拡散し、基板面上に薄い被膜7aが第2図に示すように
形威される。
After setting the substrate 2 on the stationary chuck table 1, drop the liquid resin 7 as a film forming material onto the substrate 2, reduce the pressure through the vacuum suction hole 5, and fix the substrate 2 to the chuck table 1 by vacuum suction. When the taste chuck table 1 is rotated at a rotational speed of 100 to 7000 rpm, the liquid resin is diffused onto the substrate surface by centrifugal force or the like, and a thin film 7a is formed on the substrate surface as shown in FIG.

このようにして形成される被膜7aの用途の例を示すと
、被膜7aとして感光性樹脂膜を形威し、それに露光、
現像処理を施した後製版し着色することにより、撮像管
および固体撮像素子用色分離フィルターが得られる。
An example of the use of the film 7a formed in this way is to form a photosensitive resin film as the film 7a, expose it to light,
Color separation filters for image pickup tubes and solid-state image pickup devices can be obtained by performing development, followed by plate making and coloring.

また、フォトマスクは、ガラス板上にCr層等を形成し
てなる基板上に、ネガまたはポジタイプのフォトレジス
トを回転塗布した後、露光、現像してレジスト層を得、
レジスト層をマスキング層としてCr層をエツチングす
ることにより製造される。
In addition, a photomask is made by spin-coating a negative or positive type photoresist on a substrate formed by forming a Cr layer or the like on a glass plate, and then exposing and developing it to obtain a resist layer.
It is manufactured by etching the Cr layer using a resist layer as a masking layer.

さらに、IC。LSIのリソグラフィ一工程においても
、基板としてのウェハー上にフォトレジストを回転塗布
し、製版後、SiO□、ポリシリコン、アルミニウム等
をエツチングして製造する。
Furthermore, I.C. In one step of lithography for LSI, a photoresist is spin-coated onto a wafer as a substrate, and after plate making, SiO□, polysilicon, aluminum, etc. are etched.

感光性樹脂を基板上に回転塗布し、製版する工程の一例
を第3図および第4図について説明すると、まず、第3
図に示すように、基板2上の被膜7a上に、遮光層8を
有するマスク9を密着させ、矢印Bのように紫外線を照
射すると、ネガタイプの感光性樹脂の場合は、第4図に
示すように、紫外線が照射された部分7bが硬化して残
される。
An example of the process of spin-coating a photosensitive resin onto a substrate and making a plate is explained with reference to FIGS. 3 and 4.
As shown in the figure, a mask 9 having a light-shielding layer 8 is brought into close contact with the coating 7a on the substrate 2, and ultraviolet rays are irradiated as shown by arrow B. As shown, the portion 7b irradiated with ultraviolet rays is hardened and left behind.

以上に述べたように種々の用途のために基板2上に形成
される被膜7aは一定の厚さで均一に塗布されねばなら
ない。
As described above, the coating 7a formed on the substrate 2 for various uses must be uniformly applied to a certain thickness.

例えば、色分離フィルターの製造の場合には樹脂被膜の
厚さが0.1μ異なると、フィルターの分光特性の半値
波長が約1nm(ナノメーター)異なってしまうため、
被膜厚さは常に一定でなければならない。
For example, in the case of manufacturing color separation filters, if the thickness of the resin coating differs by 0.1μ, the half-value wavelength of the filter's spectral characteristics will differ by about 1 nm (nanometer).
The coating thickness must always remain constant.

また、LSI用フォトマスクについては、レジストの塗
布膜厚が0.05マイクロメーター異なると、レジスト
の寸法精度が0.02〜0.04マイクロメーター(μ
rrL)異なる。
In addition, for LSI photomasks, if the resist coating thickness differs by 0.05 micrometers, the dimensional accuracy of the resist will decrease by 0.02 to 0.04 micrometers (μ
rrL) Different.

このように基板上の被膜には高度の品質が要求されるが
、第1図に原理を示した従来の被膜回転塗布装置では、
塗布むらの発生を避けることができない。
In this way, a high level of quality is required for the coating on the substrate, but with the conventional coating spin coating device whose principle is shown in Figure 1,
Occurrence of uneven coating cannot be avoided.

例えば、基板2として0.5mm厚で直径3インチのガ
ラス円板を用い、チャック台1に60cm H9の真空
を作用させ、感光性樹脂を1.0μの膜厚、iooor
pm、 5咀の条件で回転塗布した場合、第5図に示す
ように、膜厚の差により塗布むらがチャック台の形状に
発生する。
For example, use a glass disk with a thickness of 0.5 mm and a diameter of 3 inches as the substrate 2, apply a vacuum of 60 cm H9 to the chuck table 1, and apply a photosensitive resin to a film thickness of 1.0 μ, iooor
When spin coating is performed under the conditions of 5 pm and 5 oz., coating unevenness occurs in the shape of the chuck table due to the difference in film thickness, as shown in FIG.

同図において、11はチャック台上のOリング4に対応
する位置を境に発生した塗布むらで、膜厚の差は0.0
4μに達している。
In the figure, reference numeral 11 indicates coating unevenness that occurs at the position corresponding to the O-ring 4 on the chuck table, and the difference in film thickness is 0.0.
It has reached 4μ.

また、第6A図および第6B図に示すように、チャック
台1上面に同心円状溝12および半径方向溝13からな
る真空吸引溝を真空吸引孔5を中心として形成したもの
を用い、その上に基板2を上述と同じ条件で載置して回
転塗布を行った場合、第6C図に示す形状で塗布むらが
発生する。
Further, as shown in FIGS. 6A and 6B, a vacuum suction groove consisting of a concentric groove 12 and a radial groove 13 is formed on the top surface of the chuck base 1, centered around the vacuum suction hole 5, and a When the substrate 2 is mounted under the same conditions as described above and spin coating is performed, coating unevenness occurs in the shape shown in FIG. 6C.

同図中、14は真空吸引溝12.13の形状に沿って発
生した塗布むらであり、15はチャック台1の寸法に沿
って発生する。
In the figure, reference numeral 14 indicates coating unevenness that occurs along the shape of the vacuum suction grooves 12 and 13, and reference numeral 15 indicates coating unevenness that occurs along the dimensions of the chuck table 1.

このようなチャック台むらは、回転塗布時の真空吸引チ
ャッキングによる基板温度変化および基板の曲げ変形に
よるものと考えられる。
Such chuck stand unevenness is thought to be caused by changes in substrate temperature due to vacuum suction chucking during spin coating and bending deformation of the substrate.

ただし、基板板厚2〜3wRと厚くしても発生するむら
は基板の曲げ変形だけでなく、チャッキングによる基板
温度変化により多く影響されているものと考えられる。
However, it is considered that the unevenness that occurs even when the substrate thickness is as large as 2 to 3 wR is influenced not only by bending deformation of the substrate but also by changes in substrate temperature due to chucking.

第7図には、チャック台1の真空吸着圧(バキュウム圧
)と塗布むらの発生の関係を示す。
FIG. 7 shows the relationship between the vacuum suction pressure (vacuum pressure) of the chuck table 1 and the occurrence of coating unevenness.

この図から明らかなように、真空吸着圧が大きくなると
塗布むらも大きくなる。
As is clear from this figure, as the vacuum suction pressure increases, the coating unevenness also increases.

なお、真空吸着圧を30crrLHgより弱くすると、
基板の固定が不完全となり、回転中基板が脱落してしま
う。
In addition, if the vacuum suction pressure is made weaker than 30crrLHg,
The fixation of the board becomes incomplete and the board falls off during rotation.

したがって、従来の形式の装置では、塗布むらをなくす
ために真空吸着圧を小さくしようとしてもそれが不可能
であり、結局、塗布むらの除去ができない。
Therefore, in the conventional type of apparatus, even if an attempt is made to reduce the vacuum suction pressure in order to eliminate uneven coating, it is impossible to do so, and as a result, uneven coating cannot be removed.

この事実は、基板の厚さが小さい程顕著である。This fact becomes more pronounced as the thickness of the substrate decreases.

以上の点に鑑み、本考案の目的は、簡単な構成て塗布む
らを除去することのできる被膜回転塗布装置を提供する
ことにある。
In view of the above points, it is an object of the present invention to provide a coating rotary coating device that has a simple configuration and can eliminate coating unevenness.

この目的は、チャック台表面上に通気性のある多孔質層
を設けることによって遠戚される。
This objective is furthered by providing a breathable porous layer on the chuck table surface.

次に、第8図以下について本考案の実施例を説明する。Next, an embodiment of the present invention will be described with reference to FIG. 8 and subsequent figures.

本考案によれば、第8A図に示すようにチャック台1の
上面に通気性のある多孔質層17が設けられる。
According to the present invention, an air permeable porous layer 17 is provided on the upper surface of the chuck base 1, as shown in FIG. 8A.

この多孔質層17は円板状をなし、第8B図からも明ら
かなように、軸部3を貫通して上方へ延びる真空吸引孔
5に連通ずる同心円状真空吸引溝12および半径方向溝
13を上面に有するチャック台1の外周の環状突縁部1
8の上面に接着剤等により固定されている。
This porous layer 17 has a disk shape, and as is clear from FIG. 8B, concentric vacuum suction grooves 12 and radial grooves 13 communicate with the vacuum suction holes 5 extending upward through the shaft portion 3. An annular protruding edge 1 on the outer periphery of the chuck stand 1 having on the upper surface
It is fixed to the upper surface of 8 with adhesive or the like.

この円板状多孔質層17の外周端部17aは必要に応じ
て接着剤等により通気性を遮断する。
The outer circumferential end 17a of this disc-shaped porous layer 17 is blocked from air permeability by adhesive or the like as necessary.

多孔質層17の材料としては、径10〜200μ程度の
ポリエチレン等のパウダーを焼結して0.5〜5閑程度
の厚さのシートにしたもの(例えは、株式会社化研の製
造に係るフィルタレンシート〔商品名〕)、石英繊維製
濾紙、アスベストを混合抄紙して作つ濾過板、セルロー
ス繊維と珪藻土を混合抄紙して作った濾過板、ガラス繊
維濾紙、4−弗化エチレンによるポリフロンフィルター
、メンブランフィルタ−、ガラスフィルター等を用いる
のがよい。
The material for the porous layer 17 is a sheet made by sintering powder such as polyethylene with a diameter of about 10 to 200 μm to a thickness of about 0.5 to 5 μm (for example, a sheet manufactured by Kaken Co., Ltd. Related filterane sheets [trade name]), quartz fiber filter paper, filter plates made by mixing asbestos, filter plates made by mixing paper with cellulose fibers and diatomaceous earth, glass fiber filter paper, and 4-fluorinated ethylene It is preferable to use a polyflon filter, membrane filter, glass filter, etc.

いずれにしても、多孔質層17としては、一般的に0.
5〜5鴫の厚さをもつ濾過用フィルターが用いられ、そ
の孔径は500μ以下程度とするのが望ましい。
In any case, the porous layer 17 is generally 0.
A filtration filter having a thickness of 5 to 5 mm is used, and its pore diameter is preferably about 500 μm or less.

上述のように上面に多孔質層17を設けたチャック台1
上に第8C図に示すように被膜塗布用基板2を載置し、
真空を作用させてチャック台1を高速回転させることに
より基板2上に被膜を形成すると、第8D図に示すよう
な形状の塗布むら19が発生するが、この環状をなす塗
布むら19は、チャック台1の外周縁から基板2がはみ
出す部分のみにしか発生しない。
Chuck stand 1 with porous layer 17 provided on the top surface as described above
A film coating substrate 2 is placed on top as shown in FIG. 8C,
When a film is formed on the substrate 2 by applying a vacuum and rotating the chuck table 1 at high speed, coating unevenness 19 having a shape as shown in FIG. 8D occurs. This occurs only in the portion where the substrate 2 protrudes from the outer periphery of the table 1.

すなわち、塗布むら19の外周縁19aは基板2の外周
に相当し、その内周縁19bは、チャック板1の外周縁
相当位置にある。
That is, the outer periphery 19a of the uneven coating 19 corresponds to the outer periphery of the substrate 2, and the inner periphery 19b thereof is located at a position corresponding to the outer periphery of the chuck plate 1.

このように、内周縁19bより内側に形成される被膜に
は塗布むらが発生せず、均一な被膜が得られるから、そ
の内側部分のみを製品のために利用すればよい。
In this way, the coating formed inside the inner circumferential edge 19b does not have uneven coating and a uniform coating can be obtained, so that only the inner portion thereof can be used for the product.

しか腰塗布むら19の内周縁19bより外側の部分が基
板の有効エリアに入る場合は、第9A図に示すように、
チャック台1の外径寸法を基板2の外径寸法と同程度に
すればよい。
However, if the portion outside the inner peripheral edge 19b of the uneven coating 19 falls within the effective area of the substrate, as shown in FIG. 9A,
The outer diameter of the chuck stand 1 may be approximately the same as the outer diameter of the substrate 2.

このようにすれば、塗布むら19の発生部分は第9B図
に示すように基板2の有効エリアの外側にあるようにな
る。
In this way, the portion where the coating unevenness 19 occurs will be located outside the effective area of the substrate 2, as shown in FIG. 9B.

以上に述べたように多孔質層17を介在させることによ
って、基板2に作用する真空は、吸引溝12.13、吸
引孔5等の寸法、形状等に影響されることなく均一なも
のとなり、基板2に微妙に異なる力を与えることがなく
なる。
As described above, by interposing the porous layer 17, the vacuum acting on the substrate 2 becomes uniform without being affected by the dimensions, shapes, etc. of the suction grooves 12, 13, suction holes 5, etc. There is no need to apply slightly different forces to the substrate 2.

すなわち、真空は多孔質層17の全面に分布した状態で
基板2に作用し、しかも基板2はその下面全体にわたっ
て多孔質層上面に支持されるから、基板の局所的変形が
避けられる。
That is, the vacuum acts on the substrate 2 while being distributed over the entire surface of the porous layer 17, and since the entire lower surface of the substrate 2 is supported by the upper surface of the porous layer, local deformation of the substrate can be avoided.

また、多孔質層は基板全体の温度変化を緩和する作用を
も呈する。
Further, the porous layer also exhibits the effect of mitigating temperature changes throughout the substrate.

よって、本考案によれば、塗布むらのない均一な被膜を
基板上に形成することができる。
Therefore, according to the present invention, a uniform coating without uneven coating can be formed on the substrate.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は公知の回転塗布装置を示す縦断面図、第2図は
その基板上に形成された被膜を示す縦断面図、第3図は
第2図のように形成された被膜の露光工程を示す図、第
4図は第3図の工程の結果得られた被膜の状態を示す図
、第5図は第1図の回転塗布装置により得られる被膜の
塗布むらの発生状態を示す図、第6A図は公知の他の回
転塗布装置を示す図、第6B図は第6A図のチャック板
の平面図、第6C図は第6A図の装置によって得られる
被膜の塗布むらの発生状況を示す図、第7図は吸引圧と
塗布むらの関係を示すグラフ、第8A図は本考案による
回転塗布装置のチャック板を示す縦断面図、第8B図は
第8A図の平面図、第8C図は第8A図にチャック板に
基板を施した状態を示す図、第8D図は第8C図の装置
によって得られる被膜に発生する塗布むらを示す図、第
9A図はチャック板の寸法を大きくした場合を示す第8
C図と同様な図、第9B図は第9A図の装置によって得
られる被膜の塗布むらを示す図である。 1・・・・・・チャック台、2・・・・・・被膜塗布用
基板、3・・・・・・軸部、5・・・・・・吸引孔、1
2.13・・・・・・吸引溝、17・・・・・・多孔質
層、18・・・・・・環状突縁部、19・・・・・・塗
布むら。
Fig. 1 is a vertical cross-sectional view showing a known spin coating device, Fig. 2 is a longitudinal cross-sectional view showing a film formed on the substrate, and Fig. 3 is an exposure process for the film formed as shown in Fig. 2. FIG. 4 is a diagram showing the state of the film obtained as a result of the process shown in FIG. 3, and FIG. 5 is a diagram showing the state of uneven coating of the film obtained by the rotary coating device of FIG. 1. FIG. 6A is a diagram showing another known rotary coating device, FIG. 6B is a plan view of the chuck plate of FIG. 6A, and FIG. 6C is a diagram showing the occurrence of uneven coating of the film obtained by the device of FIG. 6A. 7 is a graph showing the relationship between suction pressure and coating unevenness, FIG. 8A is a vertical sectional view showing the chuck plate of the rotary coating device according to the present invention, FIG. 8B is a plan view of FIG. 8A, and FIG. 8C is a graph showing the relationship between suction pressure and coating unevenness. Figure 8A is a diagram showing a state in which a substrate is applied to a chuck plate, Figure 8D is a diagram showing uneven coating that occurs in the coating obtained by the apparatus of Figure 8C, and Figure 9A is a diagram showing a state in which the chuck plate is enlarged in size. 8th case showing
FIG. 9B, which is similar to FIG. C, is a diagram showing uneven coating of the film obtained by the apparatus of FIG. 9A. 1... Chuck stand, 2... Film coating substrate, 3... Shaft, 5... Suction hole, 1
2.13... Suction groove, 17... Porous layer, 18... Annular protrusion, 19... Uneven coating.

Claims (1)

【実用新案登録請求の範囲】 1 被膜塗布基板を上面に支持しつつ真空吸着作用で該
塗布基板を吸着保持するチャック台と、このチャック台
を縦軸線まわりで回転させる回転駆動手段とを有する被
膜回転塗布装置において、チャック台の上部表面を多孔
質層により形威したことを特徴とする塗布装置。 2 チャック台の横方向寸法をその上に支持される塗布
基板の横方向寸法とほぼ同じにしてなる実用新案登録請
求の範囲第1項記載の被膜回転塗布装置。
[Claims for Utility Model Registration] 1. A coating having a chuck stand that supports a coated substrate on its upper surface and holds the coated substrate by vacuum suction, and a rotation drive means for rotating the chuck stand around a vertical axis. 1. A rotary coating device, characterized in that the upper surface of a chuck table is formed by a porous layer. 2. The coating rotary coating apparatus according to claim 1, wherein the lateral dimension of the chuck table is substantially the same as the lateral dimension of the coating substrate supported thereon.
JP12219280U 1980-08-28 1980-08-28 Film rotation coating equipment Expired JPS6031817Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12219280U JPS6031817Y2 (en) 1980-08-28 1980-08-28 Film rotation coating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12219280U JPS6031817Y2 (en) 1980-08-28 1980-08-28 Film rotation coating equipment

Publications (2)

Publication Number Publication Date
JPS5747272U JPS5747272U (en) 1982-03-16
JPS6031817Y2 true JPS6031817Y2 (en) 1985-09-24

Family

ID=29482818

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12219280U Expired JPS6031817Y2 (en) 1980-08-28 1980-08-28 Film rotation coating equipment

Country Status (1)

Country Link
JP (1) JPS6031817Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2899250B2 (en) * 1996-07-29 1999-06-02 キヤノン株式会社 Semiconductor manufacturing equipment
JP2005246228A (en) * 2004-03-03 2005-09-15 Dainippon Printing Co Ltd Spin coater apparatus and spin coating method

Also Published As

Publication number Publication date
JPS5747272U (en) 1982-03-16

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