JPS60257135A - Ion implanting device - Google Patents

Ion implanting device

Info

Publication number
JPS60257135A
JPS60257135A JP11080984A JP11080984A JPS60257135A JP S60257135 A JPS60257135 A JP S60257135A JP 11080984 A JP11080984 A JP 11080984A JP 11080984 A JP11080984 A JP 11080984A JP S60257135 A JPS60257135 A JP S60257135A
Authority
JP
Japan
Prior art keywords
wafer
cassette
wafers
dummy
processed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11080984A
Other languages
Japanese (ja)
Inventor
Yoichi Fujikura
藤倉 洋一
Yasuhide Nemoto
根本 安秀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11080984A priority Critical patent/JPS60257135A/en
Publication of JPS60257135A publication Critical patent/JPS60257135A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To perform a wafer processing work automatically by a method wherein a dummy wafer is installed at the places where the installation of wafer is unnecessary, the background of the wafer is controlled, and after the wafer is processed, it is housed in the same cassette. CONSTITUTION:When no wafer is located in the cassette 2a to be placed at all address positions of a rotary disc 1, or when all the number of sheets of a lot is finished, the dummy wafer is conveyed to a table 3 from the cassette 2c wherein the dummy wafer is housed passing through branching points 6a and 6b, and it is installed on the rotary disc 1. When wafers are installed on all positions of the disc 1, the disc 1 is rotated, a scanning is performed, an ion beam is made to irradiate from the direction at a right angle with the rotating direction of the disc, and a wafer processing work is performed. After the above process is finished, data is given to a wafer 5b, it is conveyed to a conveying table 4, carried to a branching point 6c, and distinguished to a processed wafer or a dummy wafer. Then, the processed wafer is placed in a cassette 2b, and the dummy wafer is placed in the cassette 2c from the branching point 6b.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はイオン打込装置へのウェハの自動搬送方式に係
り、特にウェハのカセット管理および枚数管理によるウ
ェハ処理に好適なイオン打込装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a system for automatically transporting wafers to an ion implantation apparatus, and more particularly to an ion implantation apparatus suitable for wafer processing using wafer cassette management and number management.

〔発明の背景〕[Background of the invention]

従来のウェハ搬送方式としては、手動にエリ回転円板に
1枚1枚装着する方式と、自動搬送においても回転円板
にウェハ装着時処理枚数に不足が生じた場合、搬送する
カセットをグミーeウェハ収納カセットと交換する方式
とがある。しかしながら、前者は操作者が回転円板へ装
着したウェハの来歴を記憶しておき、搬出時に処理済ウ
ェハとダミー・ウェハとの区別を行なわなければならず
、ウェハを手動にて扱うことはウェハの損傷、ゴミ等の
問題があり、また省力化に反するという欠点がある。一
方、後者はウェハ処理後搬出用カセットに収納されたウ
ェハを処理済ウェハ、・ダミm−ウェハの区別をしなけ
ればならない等の欠点がめる。
Conventional wafer transport methods include a method in which wafers are manually loaded one by one on an Eri rotating disk, and even in automatic transport, if there is a shortage in the number of wafers to be processed when loading the wafers on the rotating disk, the cassettes to be transferred are placed in a gummy e. There is a method of replacing the wafer storage cassette. However, in the former case, the operator must memorize the history of the wafers loaded onto the rotating disk and distinguish between processed wafers and dummy wafers when unloading, and handling the wafers manually is difficult. There are problems such as damage and dust, and it also has the drawback of being contrary to labor saving. On the other hand, the latter method has drawbacks such as the need to distinguish between processed wafers and dummy m-wafers among wafers stored in a cassette for carrying out after wafer processing.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、グミーeウェハを収納してい ゛るカ
セットよりウェハを搬送およヒ処理した後、同一カセッ
トに収納する作用を効果的に発揮させることにより、回
転円板の任意の位置にダミー・ウェハを装着したり、あ
るいはカセットに収納されているウェハ枚数と回転円板
との装着枚数に不足が生じたときに自動的にダミー・ウ
ェハを装着しウェハ処理を行ない得るイオン打込装置を
提供するにある。
An object of the present invention is to effectively transport and process wafers from a cassette that stores gummy e-wafers, and then store them in the same cassette. An ion implanter that can automatically load dummy wafers and process wafers when there is a shortage between the number of wafers stored in the cassette and the number of wafers installed on the rotating disk. is to provide.

〔発明の概要〕[Summary of the invention]

本発明は、回転円板にウェハを装着し、該円板を回転さ
せてイオンビームを照射しウェハ処[ヲ行なう工程にお
いて、ウェハが装着されていない箇所にイオンビームを
照射した場合、回転円板に直接イオンビームが照射され
て熱損傷の原因となるため、ウェハの装着不用箇所にダ
ミー・ウェハを装着し、このウェハの来歴を管理し、ダ
ミー・ウェハの収納されているカセットによりウェハを
搬送し、ウェハ処理後同一カセットに収納することによ
り、処理の必要なウェハが収納されているカセットを交
換するのみでウェハ処理が自動的に行なえるよう構成し
たものである。
The present invention provides a method for processing the wafer by mounting a wafer on a rotating disk, rotating the disk, and irradiating the ion beam with the ion beam. Since the ion beam is directly irradiated on the board and causes thermal damage, dummy wafers are mounted in areas where wafers are not needed, the history of these wafers is managed, and the wafers are stored in the cassette containing the dummy wafers. By transporting the wafers and storing them in the same cassette after processing, the wafers can be processed automatically by simply replacing the cassette containing the wafers that need to be processed.

〔発明の実施例〕[Embodiments of the invention]

本発明の一実施例を第1図および第2図に示す。 An embodiment of the invention is shown in FIGS. 1 and 2.

回転円板1に自動および手動により装着されたウェハ5
 (5a、5b)は矢印の方向に回転しながら、回転方
向と直角の方向からイオンビームを照射することにより
ウェハ処理を行ない、処理済みのウェハ5を自動および
手動にて取り出すよう構成されている。
Wafer 5 automatically and manually mounted on rotating disk 1
(5a, 5b) are configured to perform wafer processing by irradiating the ion beam from a direction perpendicular to the direction of rotation while rotating in the direction of the arrow, and to take out the processed wafer 5 automatically or manually. .

第1図において、未処理ウェハの収納されているカセッ
ト2aよりベルト7aK工り分岐点6aにウェハが搬送
される。このとき、搬送される各ウェハ(Al〜AN 
)には第2図に示すようにAの部分に搬送元カセットデ
ータおよびBの部分にカセット内収納位置データを作成
し付加する。
In FIG. 1, wafers are conveyed from a cassette 2a containing unprocessed wafers to a belt 7aK processing branch point 6a. At this time, each wafer (Al to AN
), as shown in FIG. 2, transport source cassette data is created and added to part A and storage position data in the cassette to part B.

OF(オリエンテーション・フラット)検出用テーブル
3上にウェハのないことを確認した後、ベル)7dによ
りテーブル3上に搬送され、OF検出を実行する。OF
検出後未処理ウェハ5aとして回転円板lに装着され、
回転円板1.上の全アドレス(& 1− &N )位置
に装着されるまでアドレス位置を更新しながら順次装着
を行なう。
After confirming that there is no wafer on the OF (orientation flat) detection table 3, the wafer is transported onto the table 3 by a bell 7d, and OF detection is performed. OF
After detection, it is mounted on a rotating disk l as an unprocessed wafer 5a,
Rotating disk 1. Attachment is performed sequentially while updating the address positions until all address positions (&1-&N) above are attached.

ここで、回転円板lの全アドレス位置に装着終了前にカ
セット2a内のウェハが空になったとき、またはロット
枚数が終了したときには、ダミ−ウェハの収納されてい
るカセット2Cよりダミー9ウエハがベル)7e、7b
、7dにより、分岐点6b、6aを経由してテーブル3
に搬送され、回転円板1に装着される。このときもカセ
ット2aから搬送されたウェハと同様、第2図のデータ
が付加され、回転円板l上の各アドレス位置に装着され
ている各ウェハの来歴が計算機により管理される。
Here, when the wafers in the cassette 2a become empty before all the address positions of the rotating disk l are loaded, or when the number of wafers in the lot ends, the dummy 9 wafers are transferred from the cassette 2C in which the dummy wafers are stored. is bell) 7e, 7b
, 7d, table 3 via branch points 6b and 6a.
and mounted on the rotating disk 1. At this time, as with the wafers transferred from the cassette 2a, the data shown in FIG. 2 is added, and the history of each wafer mounted at each address position on the rotating disk l is managed by the computer.

回転円板l上の全アドレス位置にウェハが装着されると
回転円板lが回転、走査を行ない、イオンビームが回転
方向と直角方向より照射されウェハ処理を行なう。そし
て、所定のエネルギーが照射され、ウェハ処理終了後の
ウェハ5bは第2図のデータが付加され搬出用テーブル
4に搬出される。ウェハ5bはベル)7fにエリ分岐点
6Cに達し、ここで第2図のデータにより処理済みのつ
エバ、捷たはダミー−ウェハに区別され、処理済みのウ
ェハの(場合、ベルト7 CVCL りカセット2bに
収納される。また、ダミー・ウェハの場合は、ベルト7
b、7eにエリ分岐点6bを経由し、カセット2Cに収
納される。
When wafers are mounted at all address positions on the rotating disk l, the rotating disk l rotates and scans, and the ion beam is irradiated from a direction perpendicular to the rotating direction to process the wafer. Then, the wafer 5b is irradiated with a predetermined energy, and after the wafer processing is completed, the data shown in FIG. The wafer 5b reaches the edge branching point 6C at the belt 7f, where it is distinguished as a processed wafer, a shredded wafer, or a dummy wafer according to the data shown in FIG. It is stored in the cassette 2b.In addition, in the case of a dummy wafer, the belt 7
b, 7e via the Eri branch point 6b and is stored in the cassette 2C.

本発明の一実施例によれば、ダミー・ウェハの収納され
Cいるカセット2Cのウェハには増減がないため一反セ
ットすることにエリ、未処理ウェハの収納されているカ
セット2aを交換するのみで、処理ウェハのロット管理
、枚数管理が容易に行なえ、省力化が実現できる効果が
める。
According to one embodiment of the present invention, there is no increase or decrease in the number of wafers in the cassette 2C in which the dummy wafers are stored. Therefore, lot management and number management of processed wafers can be easily performed, and labor saving can be realized.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、ウェハ処理待回転円板上のアドレス位
置の整数倍によるウェハ処理を考慮しなくてもよく、任
意のクエハ数によるロット管理および枚数管理が自動的
にできるので、工程管理および人力の省力化が可能でお
るという効果がおる。
According to the present invention, there is no need to consider wafer processing using an integer multiple of the address position on the wafer processing waiting rotating disk, and lot management and number management using an arbitrary number of wafers can be automatically performed. This has the effect of saving manpower.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を説、明する原理図、第2図
はウェハ付加データの概略図である。 l・・・回転円板、2a、2b、2c・・・カセット、
3゜4−−−f−プル、5 a 、 5 b−ウェハ、
6a、6b。 6C・・・分岐点、7a、7b、7C97d、7e。 7f・・・ベルト。 代理人 弁理士 高橋明夫 」 ] 167− く ′N −良 (ζ
FIG. 1 is a principle diagram for explaining an embodiment of the present invention, and FIG. 2 is a schematic diagram of wafer additional data. l... Rotating disk, 2a, 2b, 2c... Cassette,
3゜4---f-pull, 5a, 5b-wafer,
6a, 6b. 6C... Branching point, 7a, 7b, 7C97d, 7e. 7f...Belt. Agent Patent Attorney Akio Takahashi] 167-ku'N-Ryo(ζ

Claims (1)

【特許請求の範囲】 1、 ウェハの収納されたカセットと、カセットエリウ
ェハを自動搬送する機構と、回転円板の円周上に複数枚
のウェハを装着してフェノ・処理を行なう装置と、処理
済みのフェノ)を搬出してカセットに収納する機構エリ
成る装置において、回転円板に装着されるシェフ1枚数
に不足が生じたときに新たに設けたカセットよりダミー
・フェノ−を搬送、装着しウェハ処理を行なう工うにし
たことを特徴としたイオン打込装置。 2゜ カセットより搬送されるフェノ\に、搬送された
カセット番号およびカセット内における収納位置番号の
情報を持たせ、回転円板に装着されているウェハの来歴
を管理することを特徴とする特許請求の範囲第1項記載
のイオン打込装置。 3、 回転円板に装着されているフェノ)の情報により
、ウェハ処理後ダミー・フェノ1および処理済ウニへの
区別を行ない、該当するカセット内にウェハを収納する
ようにしたことを特徴とする特許請求の範囲第1項記載
のイオン打込装置。 4、 ダミー・ウェハにイオンビームにより影響の受け
ない部材を用いることにより、特定のカセットより搬送
、装着後ウェハ処理を行ない、処理済みのダミー・ウェ
ハを特定のカセットに収納することにエリカセットを交
換することなくダミー・ウェハとして使用できるように
したことを特徴とする特許請求の範囲第1項記載のイオ
ン打込装置。 5、 ダミー拳ウェハを収納しているカセットをウェハ
のサイズ毎に複数個設置し、処理しようとするウェハ・
サイズに応じて必要なときに同一サイズのウェハが収納
されているカセットよりウェハを搬送、装着し、ウェハ
処理後同一カセットに収納するようにしたことを特徴と
する特許請求の範囲第1項記載のイオン打込装置。
[Claims] 1. A cassette containing wafers, a mechanism for automatically transporting wafers in the cassette area, and a device for performing phenol processing by mounting a plurality of wafers on the circumference of a rotating disk; In this device, which carries out processed phenos and stores them in a cassette, when there is a shortage in the number of chefs to be installed on the rotating disk, dummy phenos are transported and installed from a newly installed cassette. An ion implantation device characterized by being designed to process wafers. 2゜ A patent claim characterized in that the phenol transported from the cassette is given information on the transported cassette number and storage position number in the cassette, and the history of the wafers mounted on the rotating disk is managed. The ion implantation device according to item 1. 3. After wafer processing, the wafer is distinguished into dummy pheno 1 and processed urchin based on the information of the phenol attached to the rotating disk, and the wafer is stored in the corresponding cassette. An ion implantation device according to claim 1. 4. By using a material that is not affected by the ion beam for the dummy wafer, the wafer is transported from a specific cassette, processed after being mounted, and the processed dummy wafer is stored in the specific cassette. The ion implantation apparatus according to claim 1, wherein the ion implantation apparatus can be used as a dummy wafer without being replaced. 5. Install multiple cassettes containing dummy fist wafers for each wafer size, and place the wafers to be processed.
According to claim 1, the wafers are transported and loaded from a cassette containing wafers of the same size when necessary according to the size, and are stored in the same cassette after processing the wafers. ion implantation device.
JP11080984A 1984-06-01 1984-06-01 Ion implanting device Pending JPS60257135A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11080984A JPS60257135A (en) 1984-06-01 1984-06-01 Ion implanting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11080984A JPS60257135A (en) 1984-06-01 1984-06-01 Ion implanting device

Publications (1)

Publication Number Publication Date
JPS60257135A true JPS60257135A (en) 1985-12-18

Family

ID=14545204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11080984A Pending JPS60257135A (en) 1984-06-01 1984-06-01 Ion implanting device

Country Status (1)

Country Link
JP (1) JPS60257135A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02126649A (en) * 1988-11-07 1990-05-15 Teru Yamanashi Kk Transfer apparatus
JPH05304197A (en) * 1992-04-27 1993-11-16 Hitachi Ltd Multi-chamber system
JPH08340040A (en) * 1996-03-08 1996-12-24 Kokusai Electric Co Ltd Wafer transfer method
KR100673006B1 (en) 2005-07-15 2007-01-24 삼성전자주식회사 Apparatus for implanting wafers with ions

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02126649A (en) * 1988-11-07 1990-05-15 Teru Yamanashi Kk Transfer apparatus
JPH05304197A (en) * 1992-04-27 1993-11-16 Hitachi Ltd Multi-chamber system
JPH08340040A (en) * 1996-03-08 1996-12-24 Kokusai Electric Co Ltd Wafer transfer method
KR100673006B1 (en) 2005-07-15 2007-01-24 삼성전자주식회사 Apparatus for implanting wafers with ions

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