JPS60243510A - Measured information processor - Google Patents

Measured information processor

Info

Publication number
JPS60243510A
JPS60243510A JP59098534A JP9853484A JPS60243510A JP S60243510 A JPS60243510 A JP S60243510A JP 59098534 A JP59098534 A JP 59098534A JP 9853484 A JP9853484 A JP 9853484A JP S60243510 A JPS60243510 A JP S60243510A
Authority
JP
Japan
Prior art keywords
temperature
information
measurement
characteristic
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59098534A
Other languages
Japanese (ja)
Other versions
JPH0432968B2 (en
Inventor
Shigekazu Sekii
関位 重和
Taketoshi Ikegami
池上 武敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Terumo Corp
Original Assignee
Terumo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Terumo Corp filed Critical Terumo Corp
Priority to JP59098534A priority Critical patent/JPS60243510A/en
Publication of JPS60243510A publication Critical patent/JPS60243510A/en
Publication of JPH0432968B2 publication Critical patent/JPH0432968B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory

Abstract

PURPOSE:To correct the measured data in mechanical correspondence with the characteristic information of a detecting element, which detects the measured information, by providing a characteristic information input means, which indicates the inherent characteristics of a measuring part, at the input part of the measured information. CONSTITUTION:A processor is composed of the following parts; a connector 13, which functions as an input part of measured information from a temperature measuring catheter 2 and the like; a magnetism detecting element 12, which is a characteristic information input means of a measuring part; and a processing means 30, which executes the processing in accordance with the inputted characteristic information. The characteristic values of a temperature detecting element 3, which are detected by the element 12, are imparted to a decoder 36. The decoded output is imparted to a ROM38. Correcting values in correspondence with the kinds, characteristic values and the like of a temperature detecting probe are stored in the ROM38 beforehand. The data in the specified addresses are read and inputted to a microprocessor 40. The microprocessor 40 reads the digitalized temperature information from an A/D converter 34, performs the correcting operation by the correcting data from the ROM38 and outputs the obtained temperature data to a display and recording part 42.

Description

【発明の詳細な説明】 ■8発明の背景 A、技術分野 本発明は温度測定などに使用できる測定情報処理装置に
関するものであり、特に検出手段より入力される測定情
報を検出素子の特性に従って補正処理する測定情報処理
装置に関するものである。
Detailed Description of the Invention ■8 Background of the Invention A, Technical Field The present invention relates to a measurement information processing device that can be used for temperature measurement, etc., and in particular corrects measurement information input from a detection means according to the characteristics of a detection element. The present invention relates to a measurement information processing device for processing.

B、先行技術とその問題点 測定情報を処理する処理装置は被測定部の測定情報を検
出する必要がある。例えば生体の温度を検出する場合、
温度検出用素子としてサーミスタを使用することが多い
。しかしながら、この種の検出素子は測定値/出力特性
の値(例えば温度抵抗値特性等)にばらつきがあり、そ
のままで使用すれば計測誤差を生じ、正確な計測は不可
能である。
B. Prior art and its problems A processing device for processing measurement information needs to detect measurement information of a part to be measured. For example, when detecting the temperature of a living body,
A thermistor is often used as a temperature detection element. However, this type of detection element has variations in measured values/output characteristics (for example, temperature resistance characteristics, etc.), and if used as is, measurement errors will occur, making accurate measurement impossible.

検出素子の特性値にばらつきがある場合には、特性値に
よって選別を行い特性値のバラツキによる計測誤差が許
容範囲内にあるもののみを用い他のものは捨て去るか、
特性値のばらつきを補正する目的で検出素子に他の部品
を付加して調整を行う等によって計測用プローブの出力
特性を均一化して互換性を持たせ、温度計測を行なって
いる。
If there are variations in the characteristic values of the detection elements, select them based on their characteristic values and use only those whose measurement errors due to variations in characteristic values are within the allowable range, or discard the others.
Temperature measurements are performed by making the output characteristics of the measurement probe uniform and compatible by adding other parts to the detection element and making adjustments for the purpose of correcting variations in characteristic values.

しかし、曲名の場合には歩留りが悪くなり、計測用プロ
ーブの価格が高くなる。また、後者の場合には他の部品
を付加し、調整を施すのに困難を伴う場合が多い。
However, in the case of song titles, the yield will be poor and the price of the measurement probe will be high. Furthermore, in the latter case, it is often difficult to add other parts and make adjustments.

■1発明の目的 本発明の目的は測定情報を検出する検出素子の特性情報
に機械的に対応して測定情報を補正処理する測定情報処
理装置を提案することにある。
(1) Purpose of the Invention The purpose of the present invention is to propose a measurement information processing device that corrects measurement information in mechanical correspondence with characteristic information of a detection element that detects measurement information.

本願発明の目的は、測定情報を処理する処理装置であっ
て、該装置は検出手段からの測定情報を入力する端子を
有する入力部に、該測定部の固有の特性を示す特性情報
入力手段を設けてなり、該手段で入力された特性情報に
従って前記測定情報を処理する処理手段を備えることを
特徴とする測定情報処理装置によって達成される。そし
て好適な態様に従えば入力部は特性情報入力手段を備え
るコネクタであり、処理手段は特性情報を解読する解読
手段と、解読結果に従って測定情報を補正する補正手段
とを含むものである。
An object of the present invention is to provide a processing device for processing measurement information, which device has an input section having a terminal for inputting measurement information from a detection means, and a characteristic information input means indicating the unique characteristics of the measurement section. This is achieved by a measurement information processing apparatus characterized by comprising a processing means for processing the measurement information according to the characteristic information inputted by the processing means. According to a preferred embodiment, the input section is a connector equipped with characteristic information input means, and the processing means includes decoding means for decoding the characteristic information and correction means for correcting the measurement information according to the decoding result.

■1発明の詳細な説明 以下、図面を参照して本発明の詳細な説明する。■1 Detailed explanation of the invention Hereinafter, the present invention will be described in detail with reference to the drawings.

第1図は本発明の一実施例の全体構成を示すブロック図
、第2図は同じ〈回路図である。
FIG. 1 is a block diagram showing the overall configuration of an embodiment of the present invention, and FIG. 2 is the same circuit diagram.

本発明は前述したように、測定情報を処理する処理装置
であって、温度計測カテーテル2などの検出手段からの
測定情報の入力部として機能するコネクタ13、測定部
の特性情報入力手段である磁気検出素子12と、入力さ
れた特性情報に従って処理を実行する処理手段30から
成るものであるが、説明の便宜上、検出手段から順次説
明をする。
As described above, the present invention is a processing device that processes measurement information, and includes a connector 13 that functions as an input section for measurement information from a detection means such as a temperature measurement catheter 2, and a magnetic It consists of a detection element 12 and a processing means 30 that executes processing according to input characteristic information, but for convenience of explanation, the explanation will be given sequentially starting with the detection means.

第3図は本発明の一実施例に適用する温度計測カテーテ
ルとその接続部の構造を示す図である。
FIG. 3 is a diagram showing the structure of a temperature measuring catheter and its connecting portion applied to one embodiment of the present invention.

図中、1はカテーテル接続部であり、磁化されず絶縁性
を持つ物質、例えばプラスチック等よりなる。、2は温
度計測カテーテル、3はサーミスタよりなる温度検出用
素子、4は温度検出用素子3に接続ピン5とを接続する
リード線、5は接続ピン、6は磁石、7は磁石6を収納
するための四部である。
In the figure, reference numeral 1 denotes a catheter connection portion, which is made of a non-magnetized and insulating material, such as plastic. , 2 is a temperature measuring catheter, 3 is a temperature detecting element consisting of a thermistor, 4 is a lead wire connecting the temperature detecting element 3 to the connecting pin 5, 5 is the connecting pin, 6 is a magnet, and 7 is a housing for the magnet 6. There are four parts to do this.

また第4図に第3図に示すカテーテル接続部lと対をな
す接続部の構造を示す。図中11は第1図のカテーテル
接続部1と対をなす接続部、12は凹部7に配設された
磁石6の磁気を検出する磁気検出素子、13は第3図の
接続ピン5の接続ソケット、14はリード線である。ま
た15は計測信号を処理する信号処理装置である。
Further, FIG. 4 shows the structure of a connecting portion that is paired with the catheter connecting portion 1 shown in FIG. 3. In the figure, 11 is a connection part that is paired with the catheter connection part 1 in FIG. The socket 14 is a lead wire. Further, 15 is a signal processing device that processes measurement signals.

使用に際しては、接続部lの空洞内に接続部11を挿入
し、接続ピン5とソケット13とを接続すると共に磁石
6の有無を磁気検出素子12で検出する様両者を結合す
る。
In use, the connecting part 11 is inserted into the cavity of the connecting part 1, the connecting pin 5 and the socket 13 are connected, and the two are coupled so that the presence or absence of the magnet 6 can be detected by the magnetic detection element 12.

温度計測カテーテル2に内蔵された温度検出用素子3に
よって生体内の温度情報が電気信号に変換され、リード
線4によって接続ピン5へ電気信号が伝えられる。しか
しこの電気信号の値は温度検出用素子3の種類、製造上
のばらつき等によって同一ではない。
Temperature detection element 3 built into temperature measurement catheter 2 converts temperature information in the living body into an electrical signal, and the electrical signal is transmitted to connection pin 5 via lead wire 4 . However, the value of this electric signal is not the same depending on the type of temperature detection element 3, manufacturing variations, etc.

接続部lには磁石6が配設できるように四部7が設けら
れており、この四部7の中に磁石6があるかないかの2
種類の状態が作られることになる。そして凹部7がN個
設けられている場合には、その状態が2N通り作られる
ことになる。このため四部7に重み付けを行うことによ
り2 のコード化した値が得られる。
The connecting part l is provided with four parts 7 so that a magnet 6 can be placed therein.
A type of state will be created. When N recesses 7 are provided, 2N such states are created. Therefore, by weighting the four parts 7, a coded value of 2 is obtained.

上述の温度検出用素子3ののばらつきが既に判明してい
る場合にはそのばらつきの分布を計測の許容誤差で分割
して何通りかに分類することが可能である。その分類に
従って、検出用素子3の特性値を前述した四部7中の磁
石6の有無によって作られる状態と対応付けることがで
きる。
If the variation in the temperature detection element 3 described above is already known, it is possible to divide the distribution of the variation based on the measurement tolerance and classify it into several ways. According to the classification, the characteristic value of the detection element 3 can be associated with the state created by the presence or absence of the magnet 6 in the four parts 7 described above.

その際分類した数がA通りであったとすると、N≧lo
g 2 Aにする凹部の数を設ければ良く、磁石も最大
N個あれば良い。そして凹部の数と同数の接続部11に
配置された磁気検出素子12によってその状態を検知し
、信号処理装置へリード線14を介して伝えられ、同時
に接続ソケット13を介して伝えられる温度検出用素子
3の電気信号に対する補正が信号処理装置15によって
、適宜の方法で行なわれるので、温度検出用素子3の特
性値にばらつきがある場合にも温度計測カテーテルが互
換性を持つ。
If the number of classifications is A, then N≧lo
It is sufficient to provide the number of recesses to make g 2 A, and it is sufficient to provide a maximum of N magnets. Then, the state is detected by the magnetic detection elements 12 arranged in the same number of connection parts 11 as the number of recesses, and the temperature detection is transmitted to the signal processing device via the lead wire 14 and at the same time via the connection socket 13. Since the electrical signal of the element 3 is corrected by the signal processing device 15 in an appropriate manner, the temperature measuring catheter is compatible even when the characteristic values of the temperature detecting element 3 vary.

この凹部の磁石の配設は上述の温度検出用素子3の分類
に対応した四部7の上部開口部より磁石6を配置し、こ
の凹部7上面より全面を覆うカバーを接着する。又は四
部7の下部開口部より磁石6を配置し、下部全面を覆う
カバーを接着する様にしてもよい。凹部7に重み付けを
行ない磁石6の有無により記号化して得られた値を上述
の分類した温度検出用素子3の特性値のばらつきと対応
付けた例を第5図に示す。
To arrange the magnets in this recess, the magnet 6 is placed from the upper opening of the four parts 7 corresponding to the classification of the temperature detection element 3 described above, and a cover covering the entire surface from the upper surface of the recess 7 is adhered. Alternatively, the magnet 6 may be placed through the lower opening of the four parts 7, and a cover covering the entire lower part may be adhered. FIG. 5 shows an example in which the values obtained by weighting the recesses 7 and symbolizing them according to the presence or absence of the magnet 6 are associated with the above-mentioned variations in the characteristic values of the classified temperature detection elements 3.

図中20は温度検出用素子の特性分布であり、21は計
測の許容誤差で分割した分割例を示す。
In the figure, 20 indicates the characteristic distribution of the temperature detection element, and 21 indicates an example of division based on measurement tolerance.

例えば特性値44〜46にある温度検出用素子の場合に
は、磁石6はコード化された値で7となる様に配設され
る。以上の説明では検出素子として温度計測に用いるサ
ーミスタを使用した例について述べたが、温度や歪の測
定等、用途の全く異なる検出素子に対しても同様に扱う
ことが可能であり、多くの種類の検出素子に対して互換
性を持つ。
For example, in the case of a temperature detection element having characteristic values 44 to 46, the magnet 6 is arranged so that the coded value is 7. In the above explanation, we have described an example in which a thermistor used for temperature measurement is used as a detection element, but it is possible to treat detection elements for completely different purposes such as temperature and strain measurement in the same way, and many types can be used. Compatible with all detection elements.

尚、m%検出素子12としてホール素子、リードスイッ
チ、磁気抵抗素子等が挙げられ、信号処理装置15によ
る補正法として四則演算による演糞処理、表化した対応
処理等が挙げられる。
Incidentally, examples of the m% detection element 12 include a Hall element, a reed switch, a magnetoresistive element, etc., and examples of the correction method by the signal processing device 15 include feces processing using four arithmetic operations, tabulated correspondence processing, and the like.

また磁石6の代わりにフェライト等の磁性体を配設し、
プローブの外観が完成してから着磁させてもよい、この
様にすることにより製造工程上非常に簡単となる。
In addition, a magnetic material such as ferrite is arranged in place of the magnet 6,
It is also possible to magnetize the probe after its external appearance is completed, which greatly simplifies the manufacturing process.

次に以上の構成より成る計測用プローブを用いて温度計
測を行なう信号処理装置15を第5図及び第6図を参照
して説明する。
Next, the signal processing device 15 that performs temperature measurement using the measurement probe having the above configuration will be explained with reference to FIGS. 5 and 6.

第5図は信号処理装置のブロック図であり、カテーテル
接続部l、及び接続部1’lはコネクタとして機能し、
また接続部11は信号処理装置15の筺体の外部に臨む
ように設けられている。信号処理装置15には特定の温
度に従属したサーミスタの抵抗値をめる抵抗値測定回路
321回路32がめた抵抗値をディジタル値に変換する
A/D変換器34を含む。
FIG. 5 is a block diagram of the signal processing device, in which the catheter connection part l and the connection part 1'l function as connectors,
Further, the connecting portion 11 is provided so as to face the outside of the housing of the signal processing device 15 . The signal processing device 15 includes an A/D converter 34 that converts the resistance value determined by the resistance measurement circuit 321 circuit 32 into a digital value, which calculates the resistance value of the thermistor depending on a specific temperature.

磁気検出素子12が検出した温度検出素子の特性値はデ
コーダ36に与えられる。デコーダ36のデコード出力
はROM38の読み出しアドレスとしてROM38に与
えられる。ROM38には予め温度検出用プローブの種
別、特性値等に応じた補正イーが記憶されており、指定
されたアドレスのROMのデータがマイクロプロセッサ
へ読み出される。マイクロプロセッサ40は実施例に従
った処理手順を格納するROM、処理経過結果を記憶す
るRAMを内部に備え、A/D変換器34がらディジタ
ル化された温度情報を読み込み、補正用ROM38から
読み込んだ補正データに基づきマイクロプロセッサ40
が補正演算を行い請求めた温度情報を表示記録部42に
出力する。
The characteristic value of the temperature detection element detected by the magnetic detection element 12 is given to the decoder 36. The decoded output of the decoder 36 is given to the ROM 38 as a read address of the ROM 38. Correction data corresponding to the type, characteristic value, etc. of the temperature detection probe is stored in advance in the ROM 38, and data in the ROM at a designated address is read out to the microprocessor. The microprocessor 40 is internally equipped with a ROM for storing processing procedures according to the embodiment and a RAM for storing processing progress results, and reads temperature information digitized from the A/D converter 34 and from the correction ROM 38. Based on the correction data, the microprocessor 40
performs correction calculations and outputs the requested temperature information to the display/recording section 42.

また、この信号処理装置15はアナログ回路によっても
実現可能であり、この具体例を85図に示す。第5図は
磁気検出素子12が検出した温度検出素子3の特性をデ
コーダ36でデコードし、リニアライズ調整信号44.
0点調整値号46、ゲイン調整信号48をめる。リニア
ライズ調整信号44は、リニアライズ調整スイッチ44
Sに与えられ、信号44のHIGH2はLOWレベルに
よって、非反転増巾回路52の(+)個入力とソケツ)
13を結ぶ信号線50に調整抵抗R,又はR2を択一的
に接続し、温度計測カテーテルの直線性のばらつきを補
正する。0点調整値号46は0点調整スイッチ46Sに
ケえられ、信号46のHIGH又はLOWレベルに従っ
て基準電源51の電圧を抵抗R3・R4又はR3・R5
に分圧して非反転増巾回路54に0点調整電圧を与える
。これにより、基準温度における温度検出素子抵抗値の
バラツキが補償される。ゲイン調整信号48は、ゲイン
調整スイッチ483に与えられ、信号48のHIGH又
はLOWレベルに従ってゲイン調整抵抗R7・R8のい
ずれかを両増巾回路52.54間に接続し、温度検出素
子の感温特性のバラツキを補償する。こうして両増巾回
路52.54の各出力は、更に差動増幅回路53に与え
られ、その出力端子55から温度計測カテーテルの正規
化された出力電圧が得られる。
Further, this signal processing device 15 can also be realized by an analog circuit, and a specific example of this is shown in FIG. In FIG. 5, the characteristics of the temperature detection element 3 detected by the magnetic detection element 12 are decoded by the decoder 36, and the linearization adjustment signal 44.
Enter the zero point adjustment value number 46 and the gain adjustment signal 48. The linearize adjustment signal 44 is transmitted to the linearize adjustment switch 44.
HIGH2 of the signal 44 is applied to the (+) inputs and sockets of the non-inverting amplification circuit 52 due to the LOW level.
An adjustment resistor R or R2 is selectively connected to the signal line 50 connecting the temperature measurement catheters 13 to correct variations in linearity of the temperature measurement catheter. The zero point adjustment value number 46 is connected to the zero point adjustment switch 46S, and according to the HIGH or LOW level of the signal 46, the voltage of the reference power source 51 is changed to the resistor R3/R4 or R3/R5.
The zero point adjustment voltage is applied to the non-inverting amplification circuit 54 by dividing the voltage into the voltage. This compensates for variations in the temperature detection element resistance value at the reference temperature. The gain adjustment signal 48 is given to a gain adjustment switch 483, and according to the HIGH or LOW level of the signal 48, either gain adjustment resistor R7 or R8 is connected between both amplifier circuits 52 and 54, and the temperature sensing element of the temperature detection element is connected. Compensate for variations in characteristics. In this way, each output of both amplifying circuits 52, 54 is further applied to a differential amplifier circuit 53, and a normalized output voltage of the temperature measuring catheter is obtained from its output terminal 55.

■1発明の効果 以上述べたように本発明によれば、測定部から特定部の
特性を示す信号が処理装置に与えられるため処理装置は
特性に応じた処理が機械的に可能であり、人手を介さな
いため処理にエラーが混入することがない。
■1 Effects of the Invention As described above, according to the present invention, since a signal indicating the characteristics of a specific part is given from the measuring part to the processing device, the processing device can perform processing according to the characteristics mechanically, instead of manually. Because there is no intervention, no errors will occur in the process.

また、種々の特性を有する検出素子を使用することが可
能なので、本発明によれば、測定部の歩留まりの向上と
、互換性の向上を図ることができる。
Further, since it is possible to use detection elements having various characteristics, the present invention can improve the yield and compatibility of the measuring section.

また更に、測定情報と測定部の特性値が一体に処理装置
にケえられるため、測定部の変更と変換が自在に行なえ
る他、変更、変換に伴なうエラーの発生を防止できる。
Furthermore, since the measurement information and the characteristic values of the measurement section are stored together in the processing device, it is possible to freely change and convert the measurement section, and it is also possible to prevent errors from occurring due to changes and conversions.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例のブロック図、第2図は本発
明の一実施例の回路図、 第3図は本発明の一実施例に用いる温度計測用カテーテ
ルの測温部の構造を説明するための斜視図、 第4図は第1図に示した温度計測用カテーテルと信号処
理装置とを接続する接続部の構造を説明するための斜視
図、 第5図は温度検出用素子の特性分布と、計測の許容誤差
との関係を示すグラフ図である。 図中、l・・・カテーテル接続部、2・・・温度計測カ
テーテル、3・・・温度検出用素子、4,14・・・リ
ード線、5・・・接続ビン、6・・・磁石、7・・・凹
部、11・・・カテーテル接続部lと対をなす接続部、
12・・・磁気検出素子、13・・・接続ソケット、3
6・・・デコーダ、44・・・リニアライズ調整信号、
46・・・θ点調整信号、48・・・ゲイン調整信号で
ある。 第1図 第2図
Fig. 1 is a block diagram of an embodiment of the present invention, Fig. 2 is a circuit diagram of an embodiment of the present invention, and Fig. 3 is a structure of a temperature measuring section of a temperature measuring catheter used in an embodiment of the present invention. FIG. 4 is a perspective view illustrating the structure of a connection part that connects the temperature measurement catheter shown in FIG. 1 and the signal processing device; FIG. 5 is a temperature detection element FIG. 3 is a graph diagram showing the relationship between the characteristic distribution of and the measurement tolerance. In the figure, l... Catheter connection part, 2... Temperature measurement catheter, 3... Temperature detection element, 4, 14... Lead wire, 5... Connection bottle, 6... Magnet, 7... Concave portion, 11... Connection portion paired with catheter connection portion l,
12... Magnetic detection element, 13... Connection socket, 3
6... Decoder, 44... Linearization adjustment signal,
46...θ point adjustment signal, 48... Gain adjustment signal. Figure 1 Figure 2

Claims (3)

【特許請求の範囲】[Claims] (1)測定情報を処理する処理装置であって、該装置は
検出手段からの測定情報を入力する端子を有する入力部
に、該測定部の固有の特性を示す特性情報入力手段を設
けてなり、該手段で入力された特性情報に従って前記測
定情報を処理する処理手段を備えることを特徴とする測
定情報処理装置。
(1) A processing device for processing measurement information, the device having an input section having a terminal for inputting measurement information from the detection means, and provided with characteristic information input means indicating the unique characteristics of the measurement section. , a measurement information processing device comprising processing means for processing the measurement information according to characteristic information input by the means.
(2)入力部は特性情報入力手段を備えるコネクタであ
ることを特徴とする特許請求の範囲第1項記載の測定情
報処理装置。
(2) The measurement information processing device according to claim 1, wherein the input section is a connector equipped with characteristic information input means.
(3)処理手段は特性情報を解読する解読手段と、解読
結果に従って測定情報を補正する補正手段とを含むこと
を特徴とする特許請求の範囲第1項記載の測定情報処理
装置。
(3) The measurement information processing apparatus according to claim 1, wherein the processing means includes a decoding means for decoding the characteristic information and a correction means for correcting the measurement information according to the decoding result.
JP59098534A 1984-05-18 1984-05-18 Measured information processor Granted JPS60243510A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59098534A JPS60243510A (en) 1984-05-18 1984-05-18 Measured information processor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59098534A JPS60243510A (en) 1984-05-18 1984-05-18 Measured information processor

Publications (2)

Publication Number Publication Date
JPS60243510A true JPS60243510A (en) 1985-12-03
JPH0432968B2 JPH0432968B2 (en) 1992-06-01

Family

ID=14222342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59098534A Granted JPS60243510A (en) 1984-05-18 1984-05-18 Measured information processor

Country Status (1)

Country Link
JP (1) JPS60243510A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61727A (en) * 1984-06-13 1986-01-06 Omron Tateisi Electronics Co Electronic thermometer
JPS62263412A (en) * 1986-05-09 1987-11-16 Shimizu Constr Co Ltd Measurement processing system
JPS62197033U (en) * 1986-06-05 1987-12-15
JPH0351714A (en) * 1989-07-20 1991-03-06 Hitachi Ltd Sensor apparatus
JPH0545543U (en) * 1991-11-22 1993-06-18 理化工業株式会社 Sensor compensator and sensor connected thereto
JP3032513U (en) * 1996-06-14 1996-12-24 柴田科学器械工業株式会社 Hot wire anemometer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58127119A (en) * 1981-11-10 1983-07-28 セントロン ベー.オー.エフ. Sensor and memory-unit and sensor device
JPS5940113A (en) * 1982-08-30 1984-03-05 Hino Motors Ltd Error compensating method of sensor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58127119A (en) * 1981-11-10 1983-07-28 セントロン ベー.オー.エフ. Sensor and memory-unit and sensor device
JPS5940113A (en) * 1982-08-30 1984-03-05 Hino Motors Ltd Error compensating method of sensor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61727A (en) * 1984-06-13 1986-01-06 Omron Tateisi Electronics Co Electronic thermometer
JPS62263412A (en) * 1986-05-09 1987-11-16 Shimizu Constr Co Ltd Measurement processing system
JPS62197033U (en) * 1986-06-05 1987-12-15
JPH0351714A (en) * 1989-07-20 1991-03-06 Hitachi Ltd Sensor apparatus
JPH0545543U (en) * 1991-11-22 1993-06-18 理化工業株式会社 Sensor compensator and sensor connected thereto
JP3032513U (en) * 1996-06-14 1996-12-24 柴田科学器械工業株式会社 Hot wire anemometer

Also Published As

Publication number Publication date
JPH0432968B2 (en) 1992-06-01

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