JPS62263412A - Measurement processing system - Google Patents

Measurement processing system

Info

Publication number
JPS62263412A
JPS62263412A JP10651786A JP10651786A JPS62263412A JP S62263412 A JPS62263412 A JP S62263412A JP 10651786 A JP10651786 A JP 10651786A JP 10651786 A JP10651786 A JP 10651786A JP S62263412 A JPS62263412 A JP S62263412A
Authority
JP
Japan
Prior art keywords
sensor
data
measurement
measuring
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10651786A
Other languages
Japanese (ja)
Inventor
Toshio Waki
脇 登志夫
Muneo Kawamura
河村 宗夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimizu Construction Co Ltd
Original Assignee
Shimizu Construction Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimizu Construction Co Ltd filed Critical Shimizu Construction Co Ltd
Priority to JP10651786A priority Critical patent/JPS62263412A/en
Publication of JPS62263412A publication Critical patent/JPS62263412A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To easily obtain necessary measuring data upon the immediate correspondence to a measuring device on the spot, by arranging a memory chip having inherent measuring information preliminarily stored therein at every sensor and reading the same so as to make a set along with the data of the sensor. CONSTITUTION:A memory chip 2 is arranged corresponding to each sensor 1 and stores the sensor-inherent pieces of information such as the kind, mount position, calibration coefficient, objective value, etc. of the corresponding sensor. A memory chip reading/writing device 3 reads/writes the informations of the chip 2 in a non-contact state. A measuring device 4 has a memory mounted therein and is selectively connected to each sensor to obtain measuring data and, at the same time, reads the information of the chip 2 at a measuring time to perform predetermined operation. By this mechanism, the correspondence of measuring data to the sensor is taken and, further, operational processing relating to necessary physical quantity can be immediately performed on the spot. The measured value at each position is stored in the memory and inputted to a data processor 6 later using an apparatus 5 to perform data processing and the print-out of necessary data.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、センサーと該センサーの固有情報を記憶した
記憶素子とをペアにしてセットし、計測データと固有情
報とを併せて読み込んで所定のデータ処理を行う計測処
理システムに関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention sets a sensor and a storage element that stores unique information of the sensor as a pair, reads the measurement data and the unique information together, and stores the sensor in a predetermined manner. The present invention relates to a measurement processing system that processes data.

〔従来の技術〕[Conventional technology]

第3図は計測処理システムの従来例を説明するための図
であり、21−1ないし21−nはセンサー、22は測
定装置を示す。
FIG. 3 is a diagram for explaining a conventional example of a measurement processing system, in which 21-1 to 21-n are sensors and 22 is a measuring device.

建築・土木の施工管理時や各種プラント、機器構造物等
においてひずみ、荷重、変位、温度等の多数項目を測定
する場合、代表的な方式として、それらのセンサーから
測定装置のある場所までケーブルで接続し、多点式ひず
み測定装置、パーソナルコンピュータ等により測定、記
録を行う方式がある。この方式を採用すると、データを
頻繁に採取しないときは、ケーブル敷設費や測定機器の
経費が割高になり、投資効率が悪くなる。そこで、この
ような場合には第3図に示すように予め設置しである各
種センサー21−1ないし21−nの場所までポータプ
ル式の静ひずみ測定装置22等を持って行き、1点ずつ
測定しながら測定位置やひずみ値、測定日時等と共に記
録用紙に記録してくる方式が採用される。
When measuring many items such as strain, load, displacement, temperature, etc. during construction management of construction and civil engineering, various plants, equipment structures, etc., a typical method is to connect the sensors to the location where the measuring device is located using cables. There is a method in which measurement and recording are performed using a multi-point strain measuring device, a personal computer, etc. If this method is adopted, the cost of laying cables and measuring equipment will be relatively high when data is not collected frequently, resulting in poor investment efficiency. Therefore, in such a case, as shown in Fig. 3, take the porta-pull type static strain measuring device 22 etc. to the locations of the various sensors 21-1 to 21-n that have been installed in advance and measure them one by one. A method is adopted in which the measurement position, strain value, measurement date and time, etc. are recorded on recording paper.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、データの採取頻度が少ないことから上記
の如きポータプル式測定装置を使った現場測定、記録方
式を採用すると、各センサー21−1ないし21−nに
は固有の情報・目的があるため、測定した値を直ちに使
用することができない。そのため、現場で必要な値を得
るには手計算や電卓等によりセンサー固有の情報・目的
に関する処理を行わなければならないという問題がある
However, since data is collected infrequently, if an on-site measurement and recording method using a portable measuring device such as the one described above is adopted, each sensor 21-1 to 21-n has its own information and purpose. value cannot be used immediately. Therefore, there is a problem in that in order to obtain the necessary values on site, it is necessary to process the information and purpose specific to the sensor using manual calculations or a calculator.

本発明は、上記の問題点を解決するものであって、現場
で直ちに測定装置とセンサーとの対応がつき、容易に必
要な測定データを得るこ2ができる計測処理システムの
提供を目的とするものである。
The present invention solves the above-mentioned problems, and aims to provide a measurement processing system that can immediately connect measuring devices and sensors at the site and easily obtain necessary measurement data. It is something.

〔問題点を解決するための手段〕[Means for solving problems]

そのために本発明の計測処理システムは、測定場所に設
置されるセンサー、該センサーに併設した記憶素子、測
定データを採取するデータ読み取り装置、及び該読み取
り装置で読み取ったデータを処理するデータ処理袋ヱを
備え、センサーに関する情報を前記記憶素子に記憶し、
データ読み取り装置によりセンサーから測定データを読
み取ると共に記憶素子の情報を併せて読み取ることを特
徴とするものである。
To this end, the measurement processing system of the present invention includes a sensor installed at a measurement location, a storage element attached to the sensor, a data reader that collects measurement data, and a data processing bag that processes the data read by the reader. and storing information regarding the sensor in the storage element;
This method is characterized in that a data reading device reads measurement data from a sensor and also reads information from a storage element.

〔作用〕[Effect]

本発明の計測処理システムでは、上記手段を備えること
により、予め記憶素子にセンサー固有の情報を設定でき
、この情報を測定データと併せて読み取ることにより、
測定データとセンサーとを間違いなく確実に対応させ処
理させることができる。また、測定データとセンサー固
有の情報とを同じ場所で読み取るようにするため、デー
タの読み取りミスをなくすことができる。
In the measurement processing system of the present invention, by including the above means, sensor-specific information can be set in the storage element in advance, and by reading this information together with measurement data,
Measurement data and sensors can be correlated and processed without fail. Additionally, since the measurement data and sensor-specific information are read at the same location, data reading errors can be eliminated.

〔実施例〕〔Example〕

以下、実施例を図面を参照しつつ説明する。 Examples will be described below with reference to the drawings.

第1図は本発明に係る計測処理システムの1実施例を説
明するための図である。図中、1−1ないしl−nはセ
ンサー、2−1ないし2−nは記憶チップ、3は記憶チ
ップ読み/書き装置、4は測定装置、5はデータ読み取
り装置、6はデータ処理装置を示す。
FIG. 1 is a diagram for explaining one embodiment of a measurement processing system according to the present invention. In the figure, 1-1 to l-n are sensors, 2-1 to 2-n are memory chips, 3 is a memory chip reading/writing device, 4 is a measuring device, 5 is a data reading device, and 6 is a data processing device. show.

実施例を説明するに先立って、まず、主なセンサー固有
の測定情報を説明する。一般に、直接得られるデータは
、一般的に必要な物理量とは異なっているが、通常セン
サーの特性は直線的であるので、ある係数を掛けること
によって必要な物理量になる。これが校正係数である。
Before describing the embodiments, first, measurement information specific to the main sensors will be explained. Generally, the directly obtained data is different from the generally required physical quantity, but since the characteristics of sensors are usually linear, the required physical quantity can be obtained by multiplying by a certain coefficient. This is the calibration coefficient.

また、測定と同時にその状態が判り早期に必要な処置を
することを可能にするためには目標値が盛り込まれる。
In addition, target values are included in order to make it possible to understand the condition at the same time as measurement and take necessary measures at an early stage.

一般に、センサーを用いて計測を行う場合、漠然とデー
タのみを蓄積することもあるが、通常はそえば荷重や圧
力、温度等が許容値内にあるか、限界値に近づいている
か、上昇(下降)の度合が早すぎる(遅すぎる)か等の
管理)や、プラント・機器構造物等の状態管理(例えば
荷重や圧力、温度等が許容値内にあるか、限界値に近づ
いているか等の管理)を行い、部品や部材、構造物のメ
ンテナンスをする等の目的がある。このような目的にあ
った物理量を設定するのが目標値である。通常センサー
は無負荷時にも何等かの値を出力するため、初期値は、
設置した時点からの絶対変化量を知る時に必要となる。
In general, when measuring with sensors, only vague data may be accumulated, but it usually indicates whether the load, pressure, temperature, etc. are within allowable values, approaching the limit value, rising (declining), etc. ) is too fast (too slow), etc., and the condition of plants, equipment structures, etc. (for example, whether the load, pressure, temperature, etc. are within allowable values or approaching limit values, etc.) The purpose is to carry out maintenance of parts, members, and structures. The target value is to set a physical quantity suitable for such a purpose. Normally, sensors output some value even when there is no load, so the initial value is
This is necessary when knowing the absolute amount of change from the time of installation.

また、負荷が成る程度かかった状態を初期状態として初
期値を設定することもある。
In addition, the initial value may be set using a state where the load is applied as the initial state.

本発明は、上記の如き校正係数や目標値、初期値の外、
センサーの種類、設定値その他センサー固有の測定情報
を各センサー毎に予め記憶した記憶チップを設置し、こ
の情報をセンサーのデータとセットにして読み込むもの
であり、その実施例を第1図により説明する。
In addition to the above-mentioned calibration coefficients, target values, and initial values,
A memory chip is installed in which sensor type, setting values, and other sensor-specific measurement information is stored in advance for each sensor, and this information is read in as a set with sensor data. An example of this is explained with reference to Figure 1. do.

nは、各センサー1−1ないしl−nに対応して設置さ
れ、対応するセンサーの種類や取り付け位置、校正係数
、目標値、初期値、測定値、測定日時、設置時期等のセ
ンサー固有の情報を記憶するものであり、記憶チップ読
み/書き装置3は、これらの記憶チップ2−1ないし2
−nに記憶された情報を無接触により読み/書きするも
のである。
n is installed corresponding to each sensor 1-1 to l-n, and has sensor-specific information such as the corresponding sensor type, installation position, calibration coefficient, target value, initial value, measured value, measurement date and time, and installation time. The memory chip reading/writing device 3 stores information.
-n reads/writes information stored in the device without contact.

測定装置4は、メモリを内蔵し、各センサー1−1ない
し1−nと選択的に接続して測定データを得ると同時に
、その測定時の記憶チップ2−1ないし2−nの情報を
読み込み、所定の演算を行うものである。これにより測
定データとセンサーとの対応がつき、さらにその場で直
ちに必要な物理量に関する演算処理を行うことができる
。なお、これら各位置の測定値は、内蔵のメモリに記憶
され、後にデータ読み取り装置5を使ってデータ処理装
置6にインプットされ、データ処理及び必要なデータの
プリントアウトが行われる。
The measuring device 4 has a built-in memory and selectively connects with each sensor 1-1 to 1-n to obtain measurement data, and at the same time reads information from the memory chips 2-1 to 2-n at the time of the measurement. , which performs predetermined calculations. This allows for correspondence between measurement data and sensors, and furthermore, it is possible to immediately perform arithmetic processing on the necessary physical quantities on the spot. Note that the measured values at each of these positions are stored in a built-in memory, and later inputted to a data processing device 6 using a data reading device 5, where data processing and printing out of necessary data are performed.

第2図はトンネル掘削工事に本発明の計測処理システム
を適用した例を示す図であり、11はトンネル、12は
センサ一端末集中盤、13は測定装置、14はセンサ一
端末、15は記憶チップ、16はデータ処理装置を示す
FIG. 2 is a diagram showing an example in which the measurement processing system of the present invention is applied to tunnel excavation work, where 11 is a tunnel, 12 is a sensor/terminal concentration board, 13 is a measuring device, 14 is a sensor/terminal, and 15 is a memory. Chip 16 indicates a data processing device.

第2図において、センサ一端末集中盤12には、複数の
測定点に設置されたセンサーの端末14及びそれぞれの
センサーに対応する記憶チップ15が集中配置されてい
る。従って、このセンサ一端末集中盤12で測定装置1
3を順次センサ一端末14に接続して各センサーのデー
タを読み取り、同時に記憶チップ15のセンサー固有の
情報を読み取ることによって、測定装置13で各センサ
ーのデータとその種類、初期値、校正係数、目標値、設
定値等による所定の演算処理が行われ記録される。
In FIG. 2, sensor terminals 14 installed at a plurality of measurement points and memory chips 15 corresponding to the respective sensors are centrally arranged in a sensor one terminal concentration panel 12. Therefore, with this sensor one terminal centralized board 12, the measuring device 1
3 is sequentially connected to the sensor terminal 14 to read the data of each sensor, and at the same time read the sensor-specific information of the memory chip 15, so that the measuring device 13 can store the data of each sensor, its type, initial value, calibration coefficient, Predetermined calculation processing using target values, set values, etc. is performed and recorded.

なお、本発明は、種々の変形が可能であり、上記実施例
に限定されるものではない0例えば、上記実施例では、
読み取り手段により読み取った測定データや情報を一旦
記憶し、オフライン的にデータ処理手段にインプットし
て処理するようにしているが、読み取り手段とデータ処
理子1段との間を有線、或いは無線の通信回線により接
続してオンライン化してもよい。
Note that the present invention can be modified in various ways and is not limited to the above embodiments.For example, in the above embodiments,
Although the measurement data and information read by the reading means are temporarily stored and input to the data processing means offline for processing, wired or wireless communication is required between the reading means and the first stage of data processor. It may also be connected online via a line.

〔発明の効果〕〔Effect of the invention〕

以上の説明から明らかなように、本発明によれば、各セ
ンサー毎に予めその種類、初期値、校正係数、目標値、
設定値等センサー固有の測定情報を記憶した記憶チップ
を設置し、この情報をセンサーのデータとセットにして
読み込むので、前記センサー固有の測定情報を全く意識
しなくても自動的に各センサー固有のデータがセットで
き、測定時の入力負担の軽減を図ることができる。また
、データの読み取りミスがなくなるので、測定場所とデ
ータとの対応ミスもなくなり、測定精度、信頼性の向上
を図ることができる。さらにはその場で直ちに必要なデ
ータ処理を行うことができ、迅速な測定処理を行うこと
ができる。
As is clear from the above description, according to the present invention, for each sensor, its type, initial value, calibration coefficient, target value,
A memory chip is installed that stores sensor-specific measurement information such as set values, and this information is read together with the sensor data, so the sensor-specific measurement information is automatically stored without any awareness of the sensor-specific measurement information. Data can be set and the input burden during measurement can be reduced. Furthermore, since there are no errors in reading data, there are no errors in the correspondence between measurement locations and data, and measurement accuracy and reliability can be improved. Furthermore, necessary data processing can be performed immediately on the spot, and rapid measurement processing can be performed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る計測処理システムの1実施例を説
明するための図、第2図はトンネル掘削〒盲lν +2
翼n日n)量↓111力11舊 、も、・フ −−1,
メー:糸1)1  す、ふ1メ一示す図、第3図は計測
処理システムの従来例を説明するための図である。 1−1ないしl−n・・・センサー、2−1ないし2−
nと15・・・記憶チップ、3・・・記憶チップ読み/
書き装置、4と13・・・測定装置、5・・・データ読
み取り装置、6と16・・・データ処理装置、11・・
・トンネル、12・・・センサ一端末集中盤、14・・
・センサ一端末。 出 願 人  清水建設株式会社 代理人弁理士 阿 部 記 吉(外2名)第2図 第3図
Fig. 1 is a diagram for explaining one embodiment of the measurement processing system according to the present invention, and Fig. 2 is a diagram for explaining one embodiment of the measurement processing system according to the present invention.
Wing n day n) quantity ↓ 111 force 11 舊 , also, ・fu --1,
Figure 3 is a diagram for explaining a conventional example of a measurement processing system. 1-1 to l-n...sensor, 2-1 to 2-
n and 15...memory chip, 3...memory chip reading/
Writing device, 4 and 13... Measuring device, 5... Data reading device, 6 and 16... Data processing device, 11...
・Tunnel, 12...Sensor one terminal centralized panel, 14...
・Sensor terminal. Applicant Shimizu Corporation Patent Attorney Kiyoshi Abe (2 others) Figure 2 Figure 3

Claims (3)

【特許請求の範囲】[Claims] (1)測定場所に設置されるセンサー、該センサーに併
設した記憶素子、測定データを採取するデータ読み取り
装置、及び該読み取り装置で読み取ったデータを処理す
るデータ処理装置を備え、センサーに関する情報を前記
記憶素子に記憶し、データ読み取り装置によりセンサー
から測定データを読み取ると共に記憶素子の情報を併せ
て読み取ることを特徴とする計測処理システム。
(1) A sensor installed at a measurement location, a storage element attached to the sensor, a data reading device for collecting measurement data, and a data processing device for processing the data read by the reading device. A measurement processing system that stores measurement data in a storage element, and reads measurement data from a sensor using a data reading device, and also reads information in the storage element.
(2)記憶素子は、センサーに関する情報としてセンサ
ーの種類、取り付け位置、校正係数、初期値、設定時期
等のセンサーに関する固有情報を記憶したことを特徴と
する特許請求の範囲第1項記載の計測処理システム。
(2) The measurement according to claim 1, wherein the memory element stores unique information regarding the sensor, such as the type of sensor, mounting position, calibration coefficient, initial value, and setting time, as information regarding the sensor. processing system.
(3)データ読み取り装置とデータ処理装置との間は、
無線によりデータ転送することを特徴とする特許請求の
範囲第1項又は第2項記載の計測処理システム。
(3) Between the data reading device and the data processing device,
The measurement processing system according to claim 1 or 2, characterized in that data is transferred wirelessly.
JP10651786A 1986-05-09 1986-05-09 Measurement processing system Pending JPS62263412A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10651786A JPS62263412A (en) 1986-05-09 1986-05-09 Measurement processing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10651786A JPS62263412A (en) 1986-05-09 1986-05-09 Measurement processing system

Publications (1)

Publication Number Publication Date
JPS62263412A true JPS62263412A (en) 1987-11-16

Family

ID=14435600

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10651786A Pending JPS62263412A (en) 1986-05-09 1986-05-09 Measurement processing system

Country Status (1)

Country Link
JP (1) JPS62263412A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0214002U (en) * 1988-07-11 1990-01-29
JP2003121213A (en) * 2001-10-12 2003-04-23 Hitachi Cable Ltd Electronic tag for recording device calibration
JP2005064562A (en) * 2003-08-11 2005-03-10 Hitachi Ltd Sensor network system
JP2010175539A (en) * 2009-01-27 2010-08-12 General Electric Co <Ge> Automatic calibration of sensor by sensor parameter download

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JPS56153214A (en) * 1980-04-28 1981-11-27 Tokyu Constr Co Ltd Measuring and processing device for portable type landslide protection wall
JPS57182299A (en) * 1981-04-16 1982-11-10 Fujitsu Ltd Monitoring false address setting system
JPS58127119A (en) * 1981-11-10 1983-07-28 セントロン ベー.オー.エフ. Sensor and memory-unit and sensor device
JPS59183332A (en) * 1983-04-01 1984-10-18 Cosmo Eitei:Kk Detecting apparatus for movement of ground
JPS60192216A (en) * 1984-03-13 1985-09-30 Kyowa Dengiyou:Kk Multiple point measuring instrument
JPS60243510A (en) * 1984-05-18 1985-12-03 Terumo Corp Measured information processor

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56153214A (en) * 1980-04-28 1981-11-27 Tokyu Constr Co Ltd Measuring and processing device for portable type landslide protection wall
JPS57182299A (en) * 1981-04-16 1982-11-10 Fujitsu Ltd Monitoring false address setting system
JPS58127119A (en) * 1981-11-10 1983-07-28 セントロン ベー.オー.エフ. Sensor and memory-unit and sensor device
JPS59183332A (en) * 1983-04-01 1984-10-18 Cosmo Eitei:Kk Detecting apparatus for movement of ground
JPS60192216A (en) * 1984-03-13 1985-09-30 Kyowa Dengiyou:Kk Multiple point measuring instrument
JPS60243510A (en) * 1984-05-18 1985-12-03 Terumo Corp Measured information processor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0214002U (en) * 1988-07-11 1990-01-29
JP2003121213A (en) * 2001-10-12 2003-04-23 Hitachi Cable Ltd Electronic tag for recording device calibration
JP2005064562A (en) * 2003-08-11 2005-03-10 Hitachi Ltd Sensor network system
JP2010175539A (en) * 2009-01-27 2010-08-12 General Electric Co <Ge> Automatic calibration of sensor by sensor parameter download

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