JPS60235794A - Gas introduction device for gaseous phase growth - Google Patents

Gas introduction device for gaseous phase growth

Info

Publication number
JPS60235794A
JPS60235794A JP8913784A JP8913784A JPS60235794A JP S60235794 A JPS60235794 A JP S60235794A JP 8913784 A JP8913784 A JP 8913784A JP 8913784 A JP8913784 A JP 8913784A JP S60235794 A JPS60235794 A JP S60235794A
Authority
JP
Japan
Prior art keywords
gas
pipe
doping
reaction
introduction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8913784A
Other languages
Japanese (ja)
Other versions
JPH0456000B2 (en
Inventor
Bunji Hisamori
久森 文詞
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
New Japan Radio Co Ltd
Japan Radio Co Ltd
Original Assignee
New Japan Radio Co Ltd
Japan Radio Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New Japan Radio Co Ltd, Japan Radio Co Ltd filed Critical New Japan Radio Co Ltd
Priority to JP8913784A priority Critical patent/JPS60235794A/en
Publication of JPS60235794A publication Critical patent/JPS60235794A/en
Publication of JPH0456000B2 publication Critical patent/JPH0456000B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B31/00Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
    • C30B31/06Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
    • C30B31/16Feed and outlet means for the gases; Modifying the flow of the gases

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Recrystallisation Techniques (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:A device capable of carrying out rapidly stopping and beginning of introduction of a reaction gas, wherein two gas feed pipes are joined, its outlet is made to face a reaction pipe for gaseous phase growth, and a carrier gas of one pipe is made to flow partially into a reaction gas introduction pipe of the other. CONSTITUTION:In doping the substrate 9 with an impurity, the three-way cock 13 is handled as shown in the figure 1. As the raw material gas (C) having a flow rate controlled by the flowmeter 10, the doping gas (a) having a flow rate controlled by the flowmeter 1 and the carrier gas (b) having a flow rate controlled by the flowmeter 2 are introduced from the gas inlet pipes 16 and 19. The doping gas a is mixed and diluted with the carrier gas (b) at the tip 16a of the inlet pipe 16, provided with a flow velocity and flows towards the outlet 19a. In stopping the doping, the three-way cock 13 is then handled as shown in the figure 2, the carrier gas (b) in the gas inlet pipe 19 is made to flow dividedly at the tip 16a of the gas inlet pipe 16, flows partially backward in the gas inlet pipe 16, and the remaining doping gas a is exhausted to the exhaust pipe 20. consequently, the doping gas a flowing into the reaction pipe 8 is only the doping gas (a) at the part of the outlet 19a.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、気相化学反応を利用して物質を1ノl出さセ
る気相成長により基扱十に気相成長)腎を形成するガス
導入装置に関する。
[Detailed Description of the Invention] (Industrial Application Field) The present invention utilizes gas phase chemical reactions to form a kidney by vapor phase growth, which releases a substance by 1 nm. Regarding a gas introduction device.

(従来技術) この種のガス導入装置の内、例えば気相成長)−ピング
装置は、第10図或いは第11図に/I< ’Jような
構成であり、流量計1で流量制御された反応用のドーピ
ングガス(ドーパント)a或いは流量計2で流量制御さ
れたキャリアガス(反応には寄与しない。)bは、4方
バルブ3によって切り換えられて、配管4、継手5を介
してガス導入管らに供給される。4方バルブ3は、ドー
ピングガスa及びキャリアガスbの内、配管4側に切り
襖えたガスの他方を、排気管7から排気する。上記ガス
導入管6は、内部が大気圧以上の圧力の反応管8内に置
かれた基板9の上流側にその開口部6aが位置しており
、この反応管8の排気は図において右側(図示せず)で
行われている。反応用の原料ガスCは配管10から継手
11を介して、ガス導入管12から反応管8内に導入さ
れる。
(Prior art) Among this type of gas introduction apparatus, for example, a vapor phase growth)-ping apparatus has a configuration as shown in FIG. 10 or 11, and the flow rate is controlled by a flow meter 1. Doping gas (dopant) a for reaction or carrier gas b whose flow rate is controlled by flow meter 2 (does not contribute to reaction) is switched by four-way valve 3 and introduced via piping 4 and joint 5. It is supplied to the pipes. The four-way valve 3 exhausts the other of the doping gas a and the carrier gas b, which is connected to the pipe 4 side, from the exhaust pipe 7. The opening 6a of the gas introduction tube 6 is located upstream of the substrate 9 placed in a reaction tube 8 whose internal pressure is higher than atmospheric pressure, and the exhaust from the reaction tube 8 is on the right side (in the figure). (not shown). Raw material gas C for reaction is introduced into reaction tube 8 from piping 10 via joint 11 and gas introduction tube 12 .

ところで、この装置においてドーピングガスaの供給停
止を行う場合には、4カハルブ3を第10図から第11
図に示す状態に切り換えて、ガス導入管6にキャリアガ
スbを導入してマ1われでいるが、4方バルブ3からガ
ス導入管〔;の1旧−l 6 a Ffでの配管内のド
ーピングガスaのキャリ)′ガスl)による拡散、或い
は継手5内のガス溜りに残留し。
By the way, when stopping the supply of doping gas a in this device, the four carburetes 3 are moved from FIG. 10 to FIG. 11.
Switching to the state shown in the figure, carrier gas b is introduced into the gas introduction pipe 6, and the inside of the pipe at the gas introduction pipe [; The doping gas (a) is carried by the doping gas (a) and diffused by the gas (l), or remains in the gas pool in the joint 5.

たi・−、ピングガスaの影響等により、ドーピングガ
ス供給の(♀止は急速には行われず、このため基板8へ
のトーピンク量が緩慢に減少する結果とス一る。
Due to the influence of the doping gas a, etc., the supply of the doping gas is not rapidly stopped, and therefore the amount of topping to the substrate 8 is gradually reduced.

従って、この装置で例えば高周波帯域で使用されるGa
Asエピクキシャル股を極く薄く成長さIイ。
Therefore, in this device, for example, Ga used in a high frequency band
As the epicaxial crotch grows extremely thin.

場合には、その成長方向のトーピングプ[1フアイルの
急峻性が阻害され、特性の改良が困蛭であ−2た。
In some cases, the steepness of the toping group in the growth direction was inhibited, making it difficult to improve the properties.

(発明の目的) 本発明は斯かる点にルみて成されたもので、その1」的
は、反応管内で反応に寄与するガスの導入の停止或いは
停止と開始を急速に行うことができるようにした気相成
長用ガス導入装置を提供すイ。
(Objective of the Invention) The present invention has been made in view of the above points, and the first object is to rapidly stop or stop and start the introduction of gas that contributes to the reaction in the reaction tube. A. Provides a gas introduction device for vapor phase growth.

ことである。That's true.

(発明の構成) このために本発明では、2本のガス導入管を結合してそ
の出口を気相成長用の反応管内に臨ま・ピ、該2本のガ
ス導入管の一方にキャリアガスを、他方に反応用ガスを
導入し、上記キャリアガスを上記他力のガス導入管に分
流さ一已ることにより上記反応用ガスの導入の停止が行
われるようにし乏或いは、2本のガス導入管を結合して
その出「1を気相成長用の反応管内に臨ま・U、該2本
のガス導入管の一方にキャリアガスを、他力に反応用カ
スを導入し、且つ上記他方のガス導入管に排出用管を結
合し、−上記キャリアガスを上記排出用fI]に分流さ
せることにより上記反応用ガスの導入(♀止が行われ、
に記キャリアガスの−1−記排出用管への分繊をやめる
ことにより七記反応用ガスの導入が開始されるようにし
ている。
(Structure of the Invention) For this purpose, in the present invention, two gas introduction tubes are connected, and the outlet thereof faces into a reaction tube for vapor phase growth. , the introduction of the reaction gas is stopped by introducing the reaction gas into the other gas introduction pipe and diverting the carrier gas to the other gas introduction pipe. Connect the tubes so that the output 1 faces into the reaction tube for vapor phase growth.A carrier gas is introduced into one of the two gas introduction tubes, and a reaction waste is introduced into the other, and the The reaction gas is introduced (♀stopped) by connecting a discharge pipe to the gas introduction pipe and branching the carrier gas to the discharge fI].
By ceasing the separation of the carrier gas described in (1) to the discharge pipe (1), the introduction of the reaction gas described in (7) is started.

(実hb例) 以1・、本発明の実施例について説明する。第1図はそ
の−・実施例を示すものであり、気相成長ドーピング装
置についてのものである。本実施例゛(は、ドーピング
ガスdを流量旧1.3カハルブ13、配管14、継手1
5及びガス導入管16を介して、反応管8内に導入(1
1能に構成し2、またキャリアガスbは流量ril 2
 、配η17、継ず18及びガス導入管19を介して反
応管8内に導入可能に構成し、前者のガス導入管16の
先端1 fi aを後4iのガス導入管19の先端部分
の側面に結合し、そのl&省のガス導入管19の出1.
+ 19 aが基板9の上流側となるようにしている。
(Actual hb example) Below, 1. Examples of the present invention will be described. FIG. 1 shows an embodiment of the present invention, which relates to a vapor phase growth doping apparatus. In this example, the flow rate of the doping gas d was 1.3.
5 and the gas introduction pipe 16 into the reaction tube 8 (1
2, and the carrier gas b has a flow rate ril 2
, so that it can be introduced into the reaction tube 8 via the pipe 17, the joint 18 and the gas introduction tube 19, and the tip 1 fi a of the former gas introduction tube 16 is connected to the side surface of the tip portion of the rear gas introduction tube 19 4i. and the output 1 of the gas inlet pipe 19 of the l&.
+19a is on the upstream side of the substrate 9.

20は」記3カハルソ13に接続された排気管(ある。20 is an exhaust pipe (exhaust pipe) connected to the 3rd grade 13.

さ“(、基板9に対して不純物のドーピングを行う場合
には、3カハルブ13を第1し1に小ず状態に切り東え
ておき、流量計lOで流量制御された原料ガスCを導入
しなから、流量i′111で流ill制御された1Th
fflのドーピングガスa及び流量1it2で流量制御
されたキャリアガスbを各々ガス導入管1619から導
入する。このとき、l−ピングガスaはガス導入管16
の先端1らaにおいてキャリアカスbと混合・希釈化さ
れ、流速をり、えられて、出LJ I 9 aに向う(
第3図(a))。
(When doping the substrate 9 with impurities, first cut the three carburetes 13 into small pieces, and introduce the raw material gas C whose flow rate is controlled by a flow meter IO. Therefore, 1Th controlled by flow rate i'111
A doping gas a of ffl and a carrier gas b whose flow rate is controlled at a flow rate of 1it2 are each introduced from a gas introduction pipe 1619. At this time, the l-ping gas a is supplied to the gas introduction pipe 16.
It is mixed and diluted with the carrier scum b at the tip 1a of the carrier sludge, and the flow rate is increased and the carrier sludge is collected and directed to the exit LJ I 9a (
Figure 3(a)).

次にこの状態でドーピングを停止上すべくドーピングガ
スaの供給を停止するために、3カハルフ■3を第2図
にボず状態に切り換えると、ガス導入管19内を導入さ
れているキャリアカスbが、ガス導入管16の先端15
a部分で分流し“(、その一部はガス導入管16内を逆
流しく第3図(b))、その内部の残留ドーピングガス
aを3方バルブ13から排気管20に排気する。
Next, in order to stop the supply of doping gas a to stop doping in this state, switch 3 to the open state as shown in FIG. b is the tip 15 of the gas introduction pipe 16
The remaining doping gas a inside the doping gas is discharged from the three-way valve 13 to the exhaust pipe 20.

従っ“(、反応管8内に入るドーピングガスaはIll
 LI I 9 a部分にあったドーピングガスaのみ
となり、即らガスの置換はガス導入管16の先端16a
とガス導入管19の出1119 aの間のガスの置換の
みで済み、従来に比較してはるかに急速にドーピングガ
ス供給停止を行うことができる。
Therefore, "(, the doping gas a entering the reaction tube 8 is Ill
LI I 9 Only the doping gas a that was in the a part is replaced, that is, the gas is replaced at the tip 16a of the gas introduction pipe 16.
It is only necessary to replace the gas between the and the outlet 1119a of the gas introduction pipe 19, and the doping gas supply can be stopped much more rapidly than in the past.

なお、第3図に示すガスの流れは、流量計に電気的に制
御できる質量流量針を使用し、3方バルブに電磁バルブ
を使用すれば、容易に制御することができ、プログラム
制御も可能である。
The gas flow shown in Figure 3 can be easily controlled by using an electrically controllable mass flow needle for the flowmeter and a solenoid valve for the 3-way valve, and program control is also possible. It is.

また、本実施例の装置の効果をより良くするためには、
ドーピングガスaのガス導入管16の内i¥を小さくす
ると同時に、第4図に示すように、ガス導入管19内に
おけるガス導入管16の先端16a部分の結合部の前後
にスペーサ21.22を配置すれば、この部分での流速
を速めることができ、逆流の防止と置換の迅速化をより
同士することができる。
In addition, in order to improve the effect of the device of this example,
At the same time as reducing the doping gas a in the gas introduction tube 16, spacers 21 and 22 are placed before and after the joint of the tip 16a of the gas introduction tube 16 in the gas introduction tube 19, as shown in FIG. If placed, the flow velocity in this part can be increased, and it is possible to prevent backflow and speed up replacement.

また、上記ガス導入管16.19は、第5図に不すよう
に、キャリアガスbを導入するカス導入管19′の内部
にドーピングガスaを導入するガス導入管16’ を設
けた二重構造の管とし、ガス導入管19′の出n19a
’ の手11:Jにガス導入管16′の出口162′が
位置するように配置し−(両ガス導入管+6’ と19
′を結合することもできる。この場合、出口16a′は
、その外径を名士広げて、ガス導入管19′内に狭窄部
を形成する。
Further, as shown in FIG. 5, the gas introduction pipes 16 and 19 are double-layered, with a gas introduction pipe 16' for introducing the doping gas a inside a waste introduction pipe 19' for introducing the carrier gas b. structure, and the outlet n19a of the gas introduction pipe 19'
' Hand 11: Arrange so that the outlet 162' of the gas inlet pipe 16' is located at J - (Both gas inlet pipes +6' and 19
′ can also be combined. In this case, the outlet 16a' widens its outer diameter to form a constriction within the gas introduction pipe 19'.

第6図は別の実施例のドーピング装置を小才ものである
。上記実施例におけるものと同様の作用を行う部分につ
いては同一の符号を使用した。本実施例ではバルブは使
用せず、ドーピングカスaのガス導入管16及びキャリ
アガスbのカス導入管19以外に、排出用管23も反応
管8内に配置している。そして、その排出用管23の出
D 23 aの手前の側面にガス導入管19の先端19
bを結合し、その結合部の更に手i;」の側面にガス導
入管]6の先端16bを結合している。24は継手、2
5は配管、26は流量針である。
FIG. 6 shows a doping apparatus according to another embodiment. The same reference numerals are used for parts that perform the same functions as those in the above embodiment. In this embodiment, no valve is used, and in addition to the gas introduction pipe 16 for the doping gas a and the waste introduction pipe 19 for the carrier gas b, a discharge pipe 23 is also arranged in the reaction tube 8. Then, the tip 19 of the gas introduction pipe 19 is attached to the side surface in front of the outlet D 23a of the discharge pipe 23.
b is connected, and the tip 16b of the gas introduction pipe 6 is connected to the side surface of the connected portion. 24 is a joint, 2
5 is a pipe, and 26 is a flow needle.

本実施例では流量計によるガス流の制御のみにより、ド
ーピングガスaの導入の停止のみならず、導入の開始も
極めて迅速におこなうことができる。
In this embodiment, only by controlling the gas flow using a flowmeter, it is possible to not only stop the introduction of the doping gas a but also start the introduction very quickly.

第7図+81は反応管8内へのドーピングガスaの導入
の(l止を行う場合のガス流を示したもので、この場合
は例えば排出用の流量a126を制御し°ζ排出呈を増
大させ、或いは流量ηI2を制御してキャリアガスbの
量を増大さ一部、或いは流量IiL 1を制御してドー
ピングガスaの量を減少する。これにより、キャリアガ
スbがガス導入管19の先端! 91)で分流してその
一部が排出用管23側に流れるので、ドーピングガスa
もその方向に流れる。
Figure 7+81 shows the gas flow when the doping gas a is stopped (l) introduced into the reaction tube 8. In this case, for example, the discharge flow rate a126 is controlled to increase the discharge rate. Alternatively, the amount of carrier gas b is increased by controlling the flow rate ηI2, or the amount of doping gas a is decreased by controlling the flow rate IiL1. ! 91) and a part of it flows to the discharge pipe 23 side, so the doping gas a
also flows in that direction.

よって、ドーピングガスaは一部のキャリアガスbと共
に排気管20から排気される。
Therefore, the doping gas a is exhausted from the exhaust pipe 20 together with a portion of the carrier gas b.

−力、第7図+81は反応管8内へのドーピングガスa
の導入の開始を行う場合のガス流をボしたもので、この
場合は上記停止の場合と逆に流量ri11.2或いは2
6を制御する。これにより、ガス導入管16から導入さ
れたドーピングガスaはそのカス導入管16の先端16
bで分流して、その−g(4がガス導入管19から導入
されたキャリアガスbによって希釈化され、i*連を与
えられて、出(12;うaから反応管8内に導入される
。なお、この上記先端16aで分流したドーピングガス
aの他の一部はガス導入管23から排気管20に1〕を
気される。
- force, Figure 7 +81 is the doping gas a into the reaction tube 8
In this case, the flow rate ri is 11.2 or 2
Control 6. Thereby, the doping gas a introduced from the gas introduction pipe 16 is transferred to the tip 16 of the waste introduction pipe 16.
The -g(4) is diluted by the carrier gas b introduced from the gas introduction tube 19, is given an i* stream, and is introduced into the reaction tube 8 from the output (12; ua). Note that another part of the doping gas a separated at the tip 16a is passed from the gas introduction pipe 23 to the exhaust pipe 20 (1).

従って、本実施例では、ドーピングガスaの導入開始や
停止に際しての切り換えG、1、F記先端16bから上
記用Ll 23 aまでの極めて短い間のガスの置換で
済み、しかもこの間には紺f等に見りれるガス溜りもな
く、極めて迅速な切り換えができる。
Therefore, in this embodiment, when starting or stopping the introduction of the doping gas a, it is sufficient to replace the gas in an extremely short period from the tip 16b indicated by G, 1, and F to the above-mentioned Ll 23a. There is no gas accumulation as seen in other systems, and switching is possible extremely quickly.

よって、ドーピングガスaの導入の開始及び停止を迅速
に行うことができ、気相成13+−内の不純物濃度変化
の極めて急峻なユピタキシャル成IQI關をf4)るこ
とか可能となる。
Therefore, it is possible to quickly start and stop the introduction of the doping gas a, and it is possible to achieve an extremely steep change in the impurity concentration in the vapor phase IQI (f4).

第8図はガス導入管19の先端191)の部分の3力に
おりる管内壁に、スペーサ27〜29を配置したもので
、これによりその部分の流速をルフ、逆流を防止するこ
とができ、カスの置換をより速めることかできる。また
、このスペーサ27〜29は管内の圧力を高め、流量バ
ランスの制御を容易にする効果も合せもつ。
In Fig. 8, spacers 27 to 29 are arranged on the inner wall of the gas introduction pipe 19 at the tip 191), which reduces the flow velocity in that part and prevents backflow. , the replacement of dregs can be made faster. The spacers 27 to 29 also have the effect of increasing the pressure inside the pipe and facilitating control of the flow balance.

第9図は変形例を示すもので、排気管として働くガス導
入管23′内にガス導入管16“、ガス導入管19″を
各々設けたものである。16b″、+9b″は各々ガス
導入管16″、19″の先端、233′は出1」である
。ガス導入管16“と19″は結合され、その出口が出
!’、j 23 a ′ となり、またガス導入管16
“は排出用管23′のより導入側でその排出用管23′
に結合されている。
FIG. 9 shows a modification in which a gas introduction pipe 16'' and a gas introduction pipe 19'' are provided inside the gas introduction pipe 23' which functions as an exhaust pipe. 16b'' and +9b'' are the tips of the gas introduction pipes 16'' and 19'', respectively, and 233' is the outlet 1''. Gas inlet pipes 16" and 19" are combined, and their outlets come out! ', j 23 a', and the gas introduction pipe 16
" is the inlet side of the discharge pipe 23', and the discharge pipe 23'
is combined with

なお、」−記実施例ではドーピングガスaを導入する例
について説明したが、第6図にボした実施例では、ガス
導入管12からもキャリアガスb′導入し、またガス導
入管16からは原ねガス(1を導入して、その原料によ
りl!N−に気相成長1−を形成さ−lることもできる
In the embodiment described in "-", an example was explained in which the doping gas a was introduced, but in the embodiment shown in FIG. It is also possible to introduce raw material gas (1) and form vapor phase growth (1-1) on l!N- using the raw material.

また、導入管16.19、排出用管23を1組として、
その複数組を1個の反応管8に対(7て設りて、その各
々の組により異なった原料ガスの7J。
In addition, the inlet pipe 16, 19 and the discharge pipe 23 are set as one set,
A plurality of sets are provided in pairs (7) in one reaction tube 8, and each set receives 7J of different raw material gas.

人の開始と停止をtiうようにすれば、ずべ”(のK]
料をガス状態で導入するOM−VPE (有機金属気相
成長法)の原料ガスの導入に利用することもできる。
If you try to start and stop people, you will be able to do it.
It can also be used to introduce raw material gas for OM-VPE (organic metal vapor phase epitaxy), which introduces materials in a gaseous state.

この場合は、その)夏材ガスの導入の開始及び停止を急
速に行うことができるので、成’Gtl’A内の組成の
変化を急峻なものにすることができる。よって、組成変
化の極めて急峻なペテロ接合の混晶化合物1こ導体の成
長が可能となり、ひいては精密へ超格子構造の実現も可
能となる。
In this case, it is possible to rapidly start and stop the introduction of the summer wood gas, thereby making it possible to make a sharp change in the composition within the adult Gtl'A. Therefore, it becomes possible to grow a mixed crystal compound conductor having a Peter junction with an extremely steep change in composition, and it is also possible to realize a precise superlattice structure.

(発明の効果) 以」二説明したように、本発明によれば、ガスの導入の
停止或いは停止と開始を急速に行うことができるので、
そのガスにより形成されイ)気相成IQ層の濃度変化を
急峻なものとすることができる。
(Effects of the Invention) As explained below, according to the present invention, gas introduction can be stopped or stopped and started rapidly.
A) The concentration change of the vapor-phase IQ layer formed by the gas can be made steep.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の気相成14ドーピンク装置
の説明図、第2図は3方バルブ金切り換えた状態の同装
置の説明図、第3図fa+、(blは第1図或いは第2
図におけるガス流の説明図、第4図は同装置の管内にス
ペーサを設けた改良例をボす図、第5図は管を二車構造
にした変形例を示す図、第6図は本発明の別の実、fi
t!i例の気相成長ドーピング装置の説明図、第7図f
a+、(blは第6図の装置におけるガス流の説明図、
第8図は同装置の管内にスペーサを設けた改良例を示す
図、第9図は同装置の管を条虫にした変形例をホずし1
、第10し1及び第11図は従来のドーピング装置の説
明図である。 1.2・・・流量n1.3・・・4方バルブ、4・・・
配管、5・・・継手、6・・・ガス導入管、7・・・1
〕1気管、8・・・反応管、9・・・基板、IO・・・
流■計、11・・・継手、12・・・ガス導入管、13
・・・3方バルブ、14・・・配管、15・・・紺;1
’、16・・・ガス導入管、17・・配管、!8・・・
継]−1」9・・・ガス導入管、20・・・υ[気管、
21.22・・・スペーサ、23・・・排出用管、24
・・・継手、25・・・配性、26・・・流量if、2
7〜29・・スペーサ。 特許出願人 新日本無線株式会社 代 理 人 弁理士 長Jv當明 第7図 第8図 第9図 ρ 第10図 寺#1lTff”艮 IjI月1M
Fig. 1 is an explanatory diagram of a vapor phase formation 14 doping device according to an embodiment of the present invention, Fig. 2 is an explanatory diagram of the same device in a state where the three-way valve gold is switched, Fig. 3 fa + (bl is the Or the second
An explanatory diagram of the gas flow in the figure, Fig. 4 is a diagram showing an improved example of the same device in which a spacer is provided inside the pipe, Fig. 5 is a diagram showing a modified example in which the pipe has a two-wheel structure, and Fig. 6 is a diagram showing the main part. Another fruit of invention, fi
T! Explanatory diagram of the vapor phase growth doping apparatus of example i, FIG. 7f
a+, (bl is an explanatory diagram of gas flow in the apparatus of FIG. 6,
Figure 8 shows an improved example of the same device in which a spacer is provided inside the tube, and Figure 9 shows a modified example of the same device in which a tapeworm is used as the tube.
, 10-1 and 11 are explanatory diagrams of conventional doping devices. 1.2...Flow rate n1.3...4-way valve, 4...
Piping, 5... Fitting, 6... Gas introduction pipe, 7... 1
]1 Trachea, 8...Reaction tube, 9...Substrate, IO...
Flowmeter, 11...Joint, 12...Gas introduction pipe, 13
... 3-way valve, 14... Piping, 15... Navy blue; 1
', 16...Gas introduction pipe, 17...Piping,! 8...
[Connection]-1" 9...Gas introduction pipe, 20...υ[Trachea,
21.22... Spacer, 23... Discharge pipe, 24
...Joint, 25...Distribution, 26...Flow rate if, 2
7-29...Spacer. Patent applicant New Japan Radio Co., Ltd. Agent Patent attorney Long JV Tomei Figure 7 Figure 8 Figure 9 Figure 10 Temple #1lTff”艮 IjI Month 1M

Claims (1)

【特許請求の範囲】 (11,2本のガス導入管を結合してその出I−1を気
相成長用の反応管内に臨よ一ロ、該2本のガス導入管の
一方にキャリアガスを、他力に反応用ガスを導入し、上
記キャリアガスを」−記他方のガス導入管に分流させる
ことにより上記反応用ガスの導入の停止が行われるよう
にしたことを特徴とする気相成長用ガス導入装置。 +21.J1記反応用ガスが、ドーピングガスであるこ
とを特徴とする特許請求の範囲第1項記載の気相成長用
ガス導入装置。 (:()、2本のガス導入管を結合してその出(」を気
相成長用の反応管内に臨ませ、該2本のガス導入管の一
力にキャリアガスを、他方に反応用ガスを導入し、目つ
」1記他方のガス導入管に排出用管る結合し、上記キャ
リアガスを上記排出用管に分流さゼることにより上記反
応用ガスの導入停止が行われ、上記キャリアガスの1−
記(11出川管への分IJ11をやめることにより上記
反応用ガスの導入が開始されるようにしたごとを特徴と
−4る気相酸1.:c川カス導入装置。 (4)、上記反応用ガスが、トーピ、ングガス或いは原
料ガスであることを特徴とする特許請求の範囲第3項記
載の気相成長用ガス導入装置。 (5)、上記2本のガス導入骨皮O・十記排出用管導I
組として、複数組が上記反応管に設(jられ゛(いるこ
とを特徴する特許請求の範囲第3伯記載の気相成長用ガ
ス導入装置。
[Claims] (11. Two gas introduction tubes are connected and the output I-1 is brought into the reaction tube for vapor phase growth. A gas phase characterized in that the introduction of the reaction gas is stopped by separately introducing the reaction gas and diverting the carrier gas to the other gas introduction pipe. Gas introduction device for growth. +21. Gas introduction device for vapor phase growth according to claim 1, characterized in that the reaction gas described in J1 is a doping gas. (: (), two gases Connect the inlet tubes so that their output faces into the reaction tube for vapor phase growth, and introduce the carrier gas into one of the two gas inlet tubes and the reaction gas into the other. The introduction of the reaction gas is stopped by connecting a discharge pipe to the other gas introduction pipe and branching the carrier gas to the discharge pipe.
(4) Gas-phase acid 1:c river waste introduction device characterized in that the introduction of the reaction gas is started by stopping the IJ11 to the Degawa pipe. The gas introduction device for vapor phase growth according to claim 3, characterized in that the reaction gas is a topi gas, an oxidation gas, or a raw material gas. Discharge pipe I
The gas introduction device for vapor phase growth according to claim 3, wherein a plurality of sets are installed in the reaction tube.
JP8913784A 1984-05-02 1984-05-02 Gas introduction device for gaseous phase growth Granted JPS60235794A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8913784A JPS60235794A (en) 1984-05-02 1984-05-02 Gas introduction device for gaseous phase growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8913784A JPS60235794A (en) 1984-05-02 1984-05-02 Gas introduction device for gaseous phase growth

Publications (2)

Publication Number Publication Date
JPS60235794A true JPS60235794A (en) 1985-11-22
JPH0456000B2 JPH0456000B2 (en) 1992-09-07

Family

ID=13962486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8913784A Granted JPS60235794A (en) 1984-05-02 1984-05-02 Gas introduction device for gaseous phase growth

Country Status (1)

Country Link
JP (1) JPS60235794A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4748135A (en) * 1986-05-27 1988-05-31 U.S. Philips Corp. Method of manufacturing a semiconductor device by vapor phase deposition using multiple inlet flow control

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4748135A (en) * 1986-05-27 1988-05-31 U.S. Philips Corp. Method of manufacturing a semiconductor device by vapor phase deposition using multiple inlet flow control

Also Published As

Publication number Publication date
JPH0456000B2 (en) 1992-09-07

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