JPS60207041A - Radiation tomography examination apparatus - Google Patents

Radiation tomography examination apparatus

Info

Publication number
JPS60207041A
JPS60207041A JP59063631A JP6363184A JPS60207041A JP S60207041 A JPS60207041 A JP S60207041A JP 59063631 A JP59063631 A JP 59063631A JP 6363184 A JP6363184 A JP 6363184A JP S60207041 A JPS60207041 A JP S60207041A
Authority
JP
Japan
Prior art keywords
image
value
picture element
pixel
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59063631A
Other languages
Japanese (ja)
Other versions
JPH0252306B2 (en
Inventor
Yoshitetsu Tanimoto
谷本 慶哲
Osamu Tsujii
修 辻井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59063631A priority Critical patent/JPS60207041A/en
Publication of JPS60207041A publication Critical patent/JPS60207041A/en
Publication of JPH0252306B2 publication Critical patent/JPH0252306B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph

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  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE:To remove the noise component in an image without a large amount of memories and without imparing image quality and processing time, by judging a picture element having the different value from the value of a picture element, which is adjacent to a picture element noted in a reconstructed image, as the noise. CONSTITUTION:Data from a memory 8 undergoes preprocessing by a preprocessor 15 of a high speed operating device 9 and then undergoes convolution by a convolver 16. Thereafter, the result is reversely projected on an image memory 18 by a reverse projector 17 and an image is reconstructed. The noise component is removed from the data of the recondtructed image by a noise remover 19. Its function is as follows: the value of the picture element at each picture element position in the reconstructed image is compared with the value of each picture element in a predetermined area around said picture element; the value of the picture element is intactly adopted when the different is smaller than the predetermined threshold value; and the average value of the values of the picture elements in the comparing areas is used as the value of said picture element when the picture element, whose value is smaller than the threshold value, is not present.

Description

【発明の詳細な説明】 (発明の挟挿j分野」 本発明は成用線をを利−して被検査体断面の像を1q(
これJ、り被検査イホの検査をf−j :)敢用線断層
検査装回に関りるらのC・ある。
DETAILED DESCRIPTION OF THE INVENTION (Field of Insertion of the Invention) The present invention utilizes construction lines to obtain an image of a cross section of an object to be inspected by 1q(
This is J, the inspection of the object to be inspected.

[発明の技ル目的苛【Fll 物体の内部欠陥ヤ) Ill成などを非破壊C1しかし
[The aim of the technique of invention is to create internal defects in objects, etc., in a non-destructive manner.

もち度良く測定できる装置として1丁」ンビコーク・1
〜′Eグラノイ・ス°1鬼Iノ (以−ト、C−1スキ
i・ニ1ど略称りる)と呼ばれCいる放用線断層検査装
防がある。
1 piece of equipment that can measure the durability well
There is an radial fault inspection device called C-1 (abbreviated as C-1).

この装置は例え(、口放銅線源として偏5Pな扇状に拡
がる)IンビーI、X線を暉則覆る敢剣線諒と、被検査
体を介してこの成用線源に2;1峙して配さ上し前記ノ
アンヒ−1、X線の拡がりノ)向(二複数の敢用線検出
累イを配しlこ検出■とを用い、被検査体を中心にこの
敢銅線源と検出器を同方向に例えば。
This device can be used as an analogy (as a direct emission copper ray source, which spreads out in a 5P fan shape), an X-ray beam that covers the X-rays, and a 2:1 beam to this commercial radiation source via the object to be inspected. Arrange the copper wires facing each other and place them facing each other in the direction of the spread of X-rays. For example, source and detector in the same direction.

1800〜3600に)υ−)で順次回転操作しながら
被検査(Alli面の多方向からのX線吸収データを収
集した(灸、〕ンビ1−りなどにより1画像「り招成処
1pを施し、lIi層像を用椙成づるようにしたもので
、断層面各荀頷に′)い(1組成に応じ200○段階C
JもDる階調C画像再構成Cさるσ)で、断層IIJi
の4人態を*r L <知ることが(・きる、。
X-ray absorption data from multiple directions of the surface to be inspected (Alli) was collected while rotating sequentially at 1800 to 3600). The image of the IIi layer is formed on each section of the tomographic plane.
J also D gradation C image reconstruction C monkey σ), tomographic IIJi
It is possible to know (・kiru,.

このような01ス−に1・すはいわfJる第31!1代
と呼ばれるもので、その他、ペンシル・ヒーLXX線を
曝射づるX線)原とこのX線源に体Jt+貞しく検出器
This is called the 31! vessel.

を設C−+ 、このX線源と検出器とを被検査体の断面
しこ沿って1〜ラハーススキ1ンさせ、11〜ツバ−ス
スキャン終γ1万に所定角嗅、回転さけc +Tjび1
〜ラバースス4−ヤンを?うういわゆる第1111代、
ペンシルヒ ムX線を幅狭のノア7ンヒーlXXわjl
とし、検jJ1.P子を数素了ト)たけた検出器を用い
(これらを十記ドラバ ススキャン及び回転繰1りさμ
るようにした第1111代の改良型とも云うぺさ、いわ
ゆる第21+、を代、被検合体の周囲全周に7p−)(
検出素子を西ピした検出器と幅広の)〆ンヒームを1り
川りるX線源とを用い、X線源のみ回転操作さけるいわ
ゆる第4世代なと種々の方式のCT 2 :、l(・)
がある。
Set C-+, move this X-ray source and detector along the cross-sectional edge of the object to be inspected from 1 to Lahasskin 1, and at the end of the 11-Tubers scan, rotate at a predetermined angle at γ10,000, rotate C+Tj and 1
~ Lovers 4- Yang? Uh, the so-called 1111th generation,
Pencil Him
and test jJ1. Using a detector with a large number of elements (P)
It is also called an improved version of the 1111th generation, so-called 21st+, which has 7p-)(
CT 2 :, l(・)
There is.

ところC一般に、得られノ二画像中に(,1,必ず雑音
成分が存在する。そして、これらの箱高lJ X線C丁
スキャブにと′ワて、得られた再構成画像にお(Jる欠
陥の像を見にククシ、あるいは、見落とし・たり、欠陥
部と見誤る可能矧があり、従ってこれら画像の雑音成分
の除去を行う必要がある。
However, in general, there is always a noise component in the obtained image (,1).And, by using these box height lJ X-ray scans, the obtained reconstructed image has (J When looking at the image of a defect, there is a possibility that it may be distorted, overlooked, or mistaken for a defect, so it is necessary to remove noise components from these images.

この画像中に含まれる雑音成分の除去についでは、従来
より種々の研究が成されてきた。イの代表的なものは、
高周波柑&除去のためのローパスフィルタや画像のΦわ
合けによる値18成分の平均化C−ある。これらのうり
、]]コーバスノイルによる方払は、実際にひ右りる画
像の空間周波数におりる急峻な変化をなまら夛ことにな
り、什確な断層像が得られない。また、Φね含けは複数
の画像が必要Cあり、CTスキャナのようなデジタルデ
ータを扱う装置Cは画像テ゛−夕を保存りるための膨大
な畢のメモリが必要となり、また、データ収集や重ね合
せ処理のために多くの時間を費やり。
Various studies have been conducted in the past regarding the removal of noise components contained in this image. The representative ones are:
Averaging of 18 components by a low-pass filter and image Φ combination for high-frequency filtering and removal. On the other hand, the correction using []] Corvus Noil results in the abrupt change in the spatial frequency of the image actually being distorted, making it impossible to obtain a reliable tomographic image. In addition, multiple images are required including Φ, and devices that handle digital data such as CT scanners require a huge amount of memory to store image data, and data collection is difficult. A lot of time is spent on overlay processing.

従って1画質や処理晴間を損うことなく、また。Therefore, without compromising image quality or processing time.

膨大なメモリも必要と1!ずに画像中に含まねる雑音成
分を除去できるにうにしたfj’i IA線pgI層検
査装置の出現が望まfk、 ”Cいた。
It also requires a huge amount of memory! It would be desirable to have a fj'i IA line pgI layer inspection device that can remove noise components included in images without any noise.

1発明の1」的1 本発明は1記の′、1j情に鑑み(成さ+il k乙の
C11画質処理晴間を損うことなく、また、j膨大なメ
モリも必要とせずに画像中に含まれる雑音成分を除去て
きるようにしたfj9.lIJ線断線断音検査装置供り
−ることを目的とする。
1 of the Invention 1 In view of the circumstances of 1 and 1j, the present invention has been devised to improve the image quality without impairing the C11 image quality processing and without requiring a huge amount of memory. It is an object of the present invention to provide an fj9.lIJ wire breakage sound inspection device capable of removing noise components contained therein.

[発明の概要] リーなわら本発明は」−配回的を達成りるため、被検査
体の特定断面に灼しくぞの各ノ)向からt¥7 /ご該
特定断面を透過した放射線量を成用線透過1 タとしで
収集し、この収集した放射線透過ノー゛−タに対して画
像再構成処理を施し、前記被検合体の特定断面の再構成
画像を得るようにした装置において、前記再構成画像の
各画素位置の画素についで小なるものがあるときは該画
素の伯をそのまま該画素の値とし、上記しきい値より小
なるしのが存在しない峙は該画素の比較領域の画素の伯
の平均稙を該画素の伯としく置換える手段を協えて構成
し、C’I画像はX線焦点リイズ、リン51ルビツブ。
[Summary of the Invention] In order to achieve the distribution method, the present invention is directed to a specific cross-section of an object to be inspected, in which the radiation transmitted through the specific cross-section is irradiated from each direction. In the apparatus, the amount of radiographic radiation is collected as one data, and the collected radiographic data is subjected to image reconstruction processing to obtain a reconstructed image of a specific cross section of the object to be examined. , if there is a smaller pixel at each pixel position in the reconstructed image, the number of the pixel is used as the value of the pixel, and if there is no smaller pixel than the threshold value, the pixel is compared. A means for replacing the average height of the pixels of the region with the ratio of the pixel is constructed together, and the C'I image is X-ray focused and phosphorus 51 rubits.

補間なとによって画像の空間周波数が制限され(おり、
ある周波vlLllの5のは出現C゛きないこと。
The spatial frequency of the image is limited by interpolation.
5 of a certain frequency vlLll cannot appear C゛.

並びに再構成画像Cシステム周波数制限以]の急峻な変
化は再椙成哨の箱籟と考えられることにも用い とずいて適宜に設定したしきい稙を静嚇、再招成画像の
各画素位置の画素につい(その周囲の予め定めた11.
較領域の各画素の値と(れぞれ比較し。
Also, the sharp changes in the reconstructed image (below the system frequency limit) are considered to be a sign of re-creation. For the pixel at the position (predetermined 11.
Compare the values of each pixel in the comparison area.

その差分1的に1記しきい値より小なるものがあるとき
は誂画素の値をそのまま該画素の価とし、」記しさい1
偵より小なるものが存在しない肋は該画素の比較領域の
画素の稙の平均稙を該画素の値とじCβ換えることによ
り1画質や処理晴間を損うことなく、また膨大4jメモ
リも必要とけずに画像中に含まれる雑音成分を除去でき
るようにνる。
If the difference 1 is smaller than the 1st threshold value, the value of the selected pixel is used as the value of the pixel, and write 1.
For ribs that do not have anything smaller than the image, the average grain of the pixel in the comparison area of the pixel is changed to the value of the pixel by Cβ, without degrading the image quality or processing time, and without requiring a huge amount of 4J memory. The noise components included in the image can be removed without causing any damage.

[発明の実施例] 以−ト1本発明に一実施例について図面を参照しながら
説明する。
[Embodiments of the Invention] Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

第1図は木公直の構成を示リブ[コック図であり、ここ
Cは第2111代のC[スキ鵞・)を例にと−)(説明
覆る。図中、1は幅狭の)7ンヒ、−IXX線XRを曝
射するX線管、3はこのXta管1に対峙しく配される
放射線検出器eある。1この検出器3は7ノ7:ノビ−
1,X線XRの拡がり方向に8ヂ(Iンネル分の放胴線
検出素了を並設したしのCあり、X線管1と検出器3と
は々、いに対峙さn C11iil定しCある。2は撮
影領域C−あり、この撮影領域2には被検査体を保梢り
る図示しないデープルが設し」(あり、このデープルは
矢印4の方向に1〜ラバースさせるととしに矢印5の方
向に+−]−jイ1〜さけることがC゛きるようにしく
シである。従つ(、これによりドラバ−スス−1ヤンと
ロープ−ジョンをイうつ(、被検査体の所定断面につい
(種々のIl向からのX線吸収フ゛−タを収集C−きる
構成としCある。
Figure 1 shows the structure of Kimonao's ribs [This is a cock diagram, and here C is an example of the 2111th generation C [Sukigo・)] (Explanation is reversed. In the figure, 1 is narrow) 7, an X-ray tube for emitting -IXX-rays XR, and 3 a radiation detector e disposed opposite to the Xta tube 1. 1 This detector 3 is 7 no 7: nobby
1. In the direction of spread of X-rays 2 is an imaging area C, and this imaging area 2 is provided with a daple (not shown) that holds the object to be inspected. The direction of the arrow 5 is +-]-j i1~ so that it can be avoided. There is a configuration in which X-ray absorption filters from various directions can be collected for a predetermined cross section of the body.

この実施例(・は検出器3は8ヂトンネル′C−あり。In this embodiment, the detector 3 has an 8-tunnel 'C-.

ローテーションを6″′刻み′C−(ううbのとりれば
Rotate the rotation in 6''increments'C- (if you take uhb).

1スキ【シンr−240プロシIクション、1ノロシ1
クション当り480点のデータを収集r:きる。
1 Suki [Shinr-240 Prosiction, 1 Noroshi 1
480 points of data were collected per action.

要するにデータビ2ソチは05#C−ある。また、放射
線検出素子1素r当りの入用X線ビ 11リイズは3m
X3m’rある。
In short, Databi 2 Sochi is 05#C-. In addition, the required X-ray beam size per radiation detection element is 3m.
There is X3m'r.

6は検出器1から出力される入用成用線強度に応じた検
出電流をX線曝射毎に積分し、Δ/D(7]1コグーデ
ジタノ1.)変換lし、それが完γしたならば中央演算
装置7に割込みをかけるデータ収東装貿である。上記中
央演算装置7は1記デ タ収集装置6の割込み(:よっ
て、このテ゛−タ収集装謬6からのデータを読込み、こ
れをメモリ8に格納するとともにこのj′−夕を用い−
Cの゛〕ンボリ:I−ジョン(積和)演幹し、そし−(
、バックノロジエクション(逆投影)による再構成まで
のデータの流れをスフジー7 ル(管理)りる機能を右
する。
6 integrates the detection current corresponding to the required radiation intensity output from the detector 1 for each X-ray exposure, converts it to Δ/D (7] 1 Cogu Digitano 1.), and converts it to complete γ. If so, it is a data collection system that interrupts the central processing unit 7. The central processing unit 7 reads the data from the data collection device 6, stores it in the memory 8, and uses this j' data.
C part:
This function controls the flow of data up to reconstruction using back projection.

また、メモリ8はこの中央演算装置7のコントロールプ
ログラム及びデータ収集装置6にり得たX線投影による
X線吸収j゛−タの一時記憶場所としての主記憶の役割
を果/、: tl“。9はX線吸収デ りの前処理すな
わら、線嬰変動に勾りるレノルンス補1やビームハ ド
ニングに対づる処理などをtうって、補Wするととも(
′この前処L’l’ 演みのデータにQ;J L (]
ンボル シ」ン、バックノL1ジ【クション(jφ投影
)および@籟除去を行う高速演算装置C・ある。1oは
この高速演算装置9により再構成された画像及びX線吸
収デ タ等を多数枚保存するための固定ディスク装置、
11し、1前記高速演算装冒9により再構成された像等
を表示りる表示装置を含み、またシステムのコントロー
ルをfiう]ン1〜ロ 11部を含むシステL 、11
ンソ ルCある。12はシステム命令や装置の状態を検
知りるための低速パスラインて−あり、13は高速Cy
りを流層ための高速パスラインCある。。
In addition, the memory 8 plays the role of main memory as a temporary storage location for the control program of the central processing unit 7 and the X-ray absorption data obtained by the X-ray projection that can be transferred to the data acquisition device 6. .9 is pre-processing for X-ray absorption, in addition to pre-processing for linear radiation fluctuations, processing for beam hardening, etc., and performing correction W.
'This prequel L'l' Performance data Q; J L (]
There is a high-speed arithmetic unit C that performs symbol symbol, back no. 1o is a fixed disk device for storing a large number of images, X-ray absorption data, etc. reconstructed by this high-speed calculation device 9;
11, and 1 a system L including a display device for displaying an image etc. reconstructed by the high-speed calculation equipment 9 and also controlling the system;
There is a console C. 12 is a low-speed pass line for detecting system commands and device status, and 13 is a high-speed Cy
There is a high-speed pass line C for the flow layer. .

つぎに本発明におりるIl、 M除去機能を含む前記高
速演算装置9の詳細につい(第2図を参照しながら説明
(る。図において、1/lは、コン;・ロール部であり
、装謬内のデータの流れを制御りるとともに、後121
1iりる穎昌除去装謬に対してのパラメータ設定を行う
機能を有する。15は前処理装置であり、この前処理装
置15はコント[1−ル部14から送られて来るX線吸
収データを逐次、線量硬化補正し、またり、OG<対数
)変換等の処理を行う。16はコンボルバCあり、この
−]コンボルバ6は前処理装置15で処理されたデ タ
(投影ブタ)をセーフ”Lt、記憶しであるフィルタ関
数とコンボルルジョンしくその結果を逆投影装置17に
与えるしのである。この逆投影装置17はこのコンポル
ージョンされたダ タにf=J l−1られ(いる角度
情報をもとに1画像メモリ18にこのテ゛−タを該角度
方向に向41 (逆投影しく画像再構成俟りるらので・
ある。ま〕こ、19は![1スト側からの設定パラメー
タをもとに1画像メ王り18Fに得られた再構成画像中
の和音を除去りる柑音除去装冒C・ある。2Qは高速演
算装置9内の〕ント1」 ルハス、21はデータバスぐ
ある。
Next, details of the high-speed arithmetic unit 9 including the Il and M removal functions according to the present invention will be explained with reference to FIG. 2. In the figure, 1/l is a control section; In addition to controlling the flow of data within the system,
It has a function to set parameters for the 1i Riru Eichō removal equipment. 15 is a preprocessing device, and this preprocessing device 15 sequentially performs dose hardening correction on the X-ray absorption data sent from the control unit 14, and also performs processing such as OG<logarithm) conversion. conduct. 16 is a convolver C, and this convolver 6 saves the data (projection pig) processed by the preprocessing device 15 and stores the filter function and convolution result to the back projection device 17. The back projection device 17 directs this data in the 1-image memory 18 in the angular direction based on the angular information f=J l-1 (). (Since the image is reconstructed using back projection,
be. Ma] Hey, 19 is! [There is a sound removal function C that removes chords in the reconstructed image obtained in the 1st image menu 18F based on the setting parameters from the 1st stroke side. 2Q is the terminal 1 in the high-speed arithmetic unit 9, and 21 is the data bus.

つぎに1−記構成の本装置の作用につい(説明りる。Next, the operation of this device having the configuration described in 1- will be explained.

まず始めに1図示しないデープルに被検査体を載置し1
次にX線管Jユリフ7ンヒ−LXX線XRを発生さける
。すると、この)7ンビーL X線XRは被検査体を通
り、このX線管1に対峙しく配設された検出器3に大剣
りる。りると、この検出器2の各検出素子から入用教則
線強度に月応した電気低刈が出力される。この電気信舅
に1.データ収集装置6に人力され、ここC1検出累子
チ(・ンネル別にこの電気信舅を積分し、、、A/D変
換しく’>−シタルデータ化される。デシタルゲ゛−り
変換か終J′1するとデータ収集装誦6は中火演算装置
7M割込みをかlプ、これにより、中火演算装置7はこ
のガシタルテ゛−夕をメーEす8に格納りる。次に中火
演算装置7は、図示しないチーダル1駆動装置に指令を
与えてt−プルを所定ピッチだ1ブトラバ ススキ(l
ンづる。そして、肉び上述の如き動(11が(+われ。
First, place the object to be inspected on a table (not shown).
Next, generate X-ray XR from the X-ray tube. Then, the X-rays XR pass through the object to be inspected and reach a detector 3 arranged opposite to the X-ray tube 1. Then, each detection element of this detector 2 outputs an electric low mowing signal corresponding to the strength of the required teaching line. 1. To this electrician. The data collection device 6 manually integrates this electrical signal for each C1 detection channel, and converts it into digital data through A/D conversion. '1, the data collection device 6 interrupts the medium-heat calculation device 7M, and thereby the medium-fire calculation device 7 stores this gas data in the mail 8. Next, the medium-fire calculation device 7 gives a command to the Chidal 1 drive device (not shown) to move the t-pull at a predetermined pitch.
Nzuru. Then, the movement as mentioned above (11 is (+I).

データ収集が4!され(ゆり、、イし+(、所定の範囲
の1〜ラバースス↓ヤンが終わると1次に所定角度(こ
こでは8瓜のピッチ)の[1−デージ・1ンがtうわれ
1両び1〜ラバースス−1:11ンが成されCデータの
収集がtうわれる。
Data collection is 4! (Yuri,, Ishi + (, 1 to Lovers in the predetermined range ↓ When the yang is finished, the [1-Dage 1-n of the predetermined angle (in this case, the pitch of 8 melons) is 1 to rubber sequence 1:11 is completed and C data is collected.

このようにしで、380’′の範囲に)ρ)(のi゛−
タ収集が終ると、次〆に中火演算装置7はこのメモリ8
に格納されたデータを読み出しC高速演算装置9に5え
、これを受(プた高速湯1粋装置9は勺えられたデ タ
に対し、前処理をf)う。
In this way, in the range of 380'')ρ)(i゛-
When the data collection is completed, the medium-heat calculation device 7 then uses this memory 8.
The data stored in the C is read out and sent to the high-speed arithmetic unit 9, which is then received by the high-speed processing unit 9, which performs preprocessing on the retrieved data.

そして、前処埋めみのデ〜りに荊し、−」ン11(ルシ
ョンをイラい、史に、このコン小ル シ・1ンしたデー
タを逆投影して画像再構成りるとともに画像中の和音成
分の除去をf:lう。このJ:うにしく再構成されlこ
画像は固定j゛イスク装10に格納されるとともにシス
′jlに1ンソール11に5えらね(その画像表示装置
(、二表示される12以上−が本装置の概略的な動作説
明Cある。
Then, after filling in the prefix, the image was reconstructed by back-projecting the data that had been created, and the image was reconstructed. The chord component of f:l is removed.This image is reconstructed in a fixed manner and is stored in the fixed image display unit 10, and also displayed on the system console 11 (its image display device). (12 or more displayed in 2) is a general operation explanation of this device.

つぎに1本発明装置の要部について説明する。Next, the main parts of the apparatus of the present invention will be explained.

)メられ−(きたデータは高速演算装置9の前処理装置
15にJ、り前処理され、つぎに]ンホルハ16Cコン
ボルージョンされた後、jg!投影装置17にJ、り画
像メモリ181に逆投影され(再構成される3、そしC
1この再構成された画像のデータに荊し、箱高除去装置
1C,)は和音成分の除去を?うう。
)Mere-(The incoming data is pre-processed by the pre-processing device 15 of the high-speed arithmetic unit 9, and then convolved with the image data by the image memory 181 by the projector 17.) projected (reconstituted 3, then C
1. Does the box height removal device 1C,) remove chord components from this reconstructed image data? UU.

この鮒音成分除人帆埋は、つぎのようにしC7うう。This carp sound component is removed as follows: C7 Uu.

ずなわら、本発明は (1)、CT像はX線焦点リイズ、検出器間ロリイズ、
リンノルピップ、補間なとにJ、−)で1周波数制限さ
れて、ある周波数取[のものは1京像を再現できない。
However, the present invention has (1) a CT image with X-ray focus rise, inter-detector roll rise,
Linnor pip, interpolation, J, -) is limited to one frequency, and a certain frequency cannot reproduce 1 quintillion images.

(2)、再構成画像ζ、シス″7j、周波数制限以上の
急峻な変化は再H6成地の和音と考えられる。
(2) Reconstructed image ζ, cis''7j, a sharp change exceeding the frequency limit is considered to be a chord of re-H6 formation.

樅 と云う欝念に基づいており、に+理的にに、L l記の
ことから、局所的周波数をめて、その制限により鉗昌を
除去りるものCあるが、実際には注目している画素に隣
接しでいる画素の値から著しくかり阿1れlた植を持て
ば雑音であると考えられるのでこれをもつで雑音である
と判定りる。そして1判定に用いる植はシスラーム及び
被検査体に応して決定りる。
It is based on the dream called "Mom", and theoretically, from the Book of L, there is a method that calculates the local frequency and eliminates the power by that restriction, but in reality, it is not worth paying attention to. If the value of a pixel is significantly different from the value of a pixel adjacent to the pixel, it is considered to be noise. The plant used for the first judgment is determined depending on the system and the subject to be examined.

以ト1作用について説明りる。The first effect will be explained below.

今、第3図のように円+J状の物体に大小複数の孔をそ
の物体の軸線に沿ってあけた形状の被検査体を考えてみ
る。この被検査体の前記名札の中心を通る線での像のプ
ロフィールをとると実際には点線で承り如くであるはず
のプロフィールが第4図の実線の如上゛なまっている。
Now, let us consider an object to be inspected, which is a circular + J-shaped object with a plurality of large and small holes drilled along the axis of the object, as shown in Fig. 3. When the image profile is taken along a line passing through the center of the name tag of this object to be inspected, the profile, which should actually look like a dotted line, is distorted as shown by the solid line in FIG.

そして、径の小さい孔でLJ、 X線吸収係数に閣づく
再構成のデータC・あるC T’ (ifflの差が小
さくなるのがわかる。例えfば、レベルaで241IJ
化りれば5姻の穴しか見えないが、レベルをbからCへ
さげると0.5錨1の穴を認識出来る。しかし、実際は
第5図のようにノイズかのっ′Cいるからレベルを下げ
ると雑音も穴と認識されてしまう。この様に画像中の雑
音部はプロフィールを見れば明らかである場合がある。
Then, it can be seen that the difference in the reconstructed data C/C T' (iffl) that affects the LJ and X-ray absorption coefficient becomes smaller for a hole with a small diameter.For example, f is 241IJ at level A.
If you transform, you can only see the 5th hole, but if you lower the level from B to C, you can see the 0.5 Anchor 1 hole. However, in reality, as shown in Figure 5, there is noise, so if you lower the level, the noise will also be recognized as a hole. In this way, noise areas in an image may be obvious by looking at the profile.

また通常、雑音は高周波成分であるので、雑音部の方が
急激な変化を示している。従って、急激な変化の限度で
、頌&かiE規他信号を識別づることになるが、その限
度は、前述の条fj(t)によって決定されるものであ
る。実際の場合、隣接げる画素間では0丁値にして値M
分しか変化しないというのがわかる。、ノこIどし、C
丁イ偵は、そのシ、スJム内のtrl g一式に人さく
依存νるので、充分の知識が必HC−あると同時に経験
的にも決定出来る。第6図は、画素IM(3,3)に注
目した場合の比較領域を示したものである。この比較領
域は、ここCは?’JII両累の隣両車素8画素としく
、j5す、これを斜線(ホしくある。第7図は、惟音除
人9B理の一1列を示リフし−1−ブrr −l−”C
ある3、゛りむわ15.実際の再構成画像の画素数が例
えば240X240どりると、この画素の1番目の画素
J、り順にン11」画素を軸出し、この画素のデータと
この4目画素の周囲の比較領域にある画素の各々の画素
どの差をめると共にこの;(をビー11りの植イのらの
を結果(1〔1とし、該画素の植とし1Mより小なるも
のが(7rr シないとさは比較領域の画素の(iQの
平均(ii:jを該>iF目画素(1) Ki トシ(
ユ< ’b 17)である1、第7図の処理1にJ、っ
て、ローバスフィルりを選択的にかり!ご様な効果が1
′、1らねる。。
Further, since noise is usually a high frequency component, the noise part shows a more rapid change. Therefore, a limit of rapid changes will be used to identify the ode & iE standard signal, and that limit is determined by the above-mentioned clause fj(t). In actual case, the value M is set to 0 between adjacent pixels.
You can see that it only changes by a minute. , Noko I Doshi, C
The detection depends on the set of trl gs in the system, so sufficient knowledge is required and at the same time it can be determined empirically. FIG. 6 shows a comparison area when focusing on pixel IM (3, 3). This comparison area is here C? 'The pixels of both adjacent cars of JII Ryoju are 8 pixels, and j5 is a diagonal line (horizontal line). l-”C
Yes 3, Rimuwa 15. For example, if the number of pixels in the actual reconstructed image increases to 240x240, the first pixel (J) of this pixel, and the "N11" pixel are centered in order, and the data of this pixel and the data of this pixel are placed in the comparison area around this fourth pixel. Calculate the difference between each pixel of the pixels and use The average of (iQ) of the pixels in the comparison area (ii: j is > iF pixel (1) Ki Toshi (
1, which is 17), J is selectively applied to process 1 in Fig. 7, and low bass fill is applied! Various effects 1
', 1 line. .

これにより、C1画像の検出能や処理+1.’l聞を4
員うことなく、また、1jユ人なメ[りら必要とJ t
J″に画像中に倉まれる鉗?)成分を除去IC−さるJ
、うになう。
As a result, the detection ability and processing of the C1 image +1. 'l listen to 4
Without being a member, there is also a 1J Yu person's mail [Rira Necessary and J t
J” is a forceps held in the image?) component removed IC-Saru J
, Unanu.

なお、本発明は1−記し、かつ図面レニ示り実施例に限
定でることなくイの要旨を変史しbい範111内(・適
宜な形し7(実施し存ることしまららろんてあり。
The present invention is described in 1-1 and is not limited to the embodiments shown in the drawings, but may be modified within the scope 111 (and may be carried out in an appropriate form). There is.

例えば上記実施例Cは第2世代のX線01を例Lmと−
)(説明しIこが、その他の/j式やぞれを変形しlこ
))式の乙のに対しくら適用りることが出来、また、そ
の他一般的’eh I”’I像につい(の和尚除去(ご
つい(し、システ11、の知識から前記しきい110M
が決定rニーきれば利用111能Cあり、ま]こ、−1
−八己実施例の場合、比較領域L;L ンl 11画素
の隣接りる8点と1.たが第8図にiijすJ、うし二
d目両fF、1−)1<を中心にイのl1g接りる4点
を比較領域の画素RCとりるようにりることしひきる。
For example, in the above Example C, second generation X-ray 01 is used as Example Lm and -
) (I will explain this, but I can apply it to other /j expressions and transform each of them), and can also apply to other general 'eh I'''I images. (From the knowledge of the monk removal (gotsui), system 11, the threshold 110M
If you decide r knee, there is use 111 function C, ma]ko, -1
- In the case of the eight-point embodiment, the comparison area L is 8 adjacent points of 11 pixels and 1. However, as shown in FIG. 8, four points touching 11g of A centering on J, ox 2d, both fF, 1-)1< are drawn so as to take the pixel RC of the comparison area.

また1本発明におい(は、比較点の画素とイの比較領域
の画素との差におい(、シきい稙Mより小さいものが存
在し41いときは比較領域の8点の画素の410の平均
(i+:+をそのね二目点の画素(1θとしたが第9図
に承りように3111点の画素1)[シを中心とりる1
)8個(例えば、 2 /lOX 2401iji+ 
素) (7)ψ均110を用いるJ、うにしても良い。
In addition, in the present invention, if there is a difference between the pixel at the comparison point and the pixel in the comparison area A, and there is a difference smaller than the threshold M, the average of 410 of the 8 pixels in the comparison area. (i+: + is the pixel of the second point (1θ, but as shown in Figure 9, 3111 pixel 1) [centered at 1
) 8 pieces (for example, 2 /lOX 2401iji+
(7) J using ψ average 110 may also be used.

]発明の効果] 以1訂述したように本発明は、被検合体の特定断面にλ
・jしくその各イ装置および各/j自から40 /こ該
特定前面を透過しIこ成用線罹を放QA線透過データと
し【収集し、この収集しlこ放射線透過データに苅しく
画像再構成処理を施し、前記被検合体の特定断面の再構
成画像を得るようにした装:1・°1においC1前記角
椙成画像の各画素(11ii@の画、+、1つい2くの
局間のγめ定めlこ比較領1或の各画、+3の11−と
ぞれぞれ比較し、その各々の差のうら、4jiが吊め定
め!こしきい植より小なるしのがあるときは該画素の(
C6をそのまま該画素の稙とし、1.記しきい(IQよ
り小なるしのが’fF IjL/ /、’tい助し、1
該画、+□の′比較領域の画素の1ifjの平均1的を
該画素の11C」としC置換える手段を備え、C1画像
はX線焦点リイズ、リンノルビッヂ、保管などによっ【
画(象の空間周波数が制限されでおり、ある周波数取1
の乙のは内規できないこと、並びに山構成画像eシスj
ム周波数制限以上の急峻な変化は掬構成時の41音と考
えられることに基づい(適宜に設定したしさい稙を用い
、再構成画像の各画素位四の画素についCぞの爵皿の予
め定めた比較領域の各画素の値とそれぞれ比較し、ぞの
lIl′jレニ1記しぎい値より小なるものがあるとき
は該画素の稙をそのまま該画素の110とし、−[記し
ぎい植J、り小むるものが存在しないI+=’1は該画
素の比較ダ11岐の画素の値の平均始を該画素の(偵と
しく置換えるようにしたことにより、画質や処l!l]
時間を損うことむく、まIこ、膨大なメモリし必要とけ
ずに画像中に含まれる雄鳥成分が除去Cきるようになる
4jどの特徴を子i t+’る放IP1線断層検査装防
を提供りることがて・きる。
[Effect of the invention] As described above, the present invention has the advantage that λ
・Collect the 40 rays that pass through the specific front surface from each of the devices and each of them as radiation QA ray transmission data, and add the radiation transmission data to this collected The device performs image reconstruction processing to obtain a reconstructed image of a specific cross section of the object combination: At 1°1, each pixel of the C1 corner image (11ii@ image, +, 1 and 2 Compare each stroke in the comparison area 1 with 11- of +3, and the difference between each of them is 4ji, which is smaller than Koshikii-e. If there is, the corresponding pixel's (
Set C6 as the base of the pixel; 1. The threshold (less than IQ is 'fF IjL/ /, 't aid, 1
This image is equipped with a means for replacing C with the average value of 1ifj of the pixels in the comparison area of +□ as 11C of the pixel, and the C1 image is
(The spatial frequency of the elephant is limited, and at a certain frequency
The fact that the internal regulations cannot be established, and the mountain composition image e system j
Based on the fact that a sharp change exceeding the frequency limit is considered to be 41 tones at the time of composing the image (using an appropriately set shisai tone, it is possible to Compare the value of each pixel in the defined comparison area, and if there is a value smaller than the threshold value, set the edge of the pixel as it is to 110, and - , I+='1, where there is no smaller value, means that the average value of the pixel values of the 11 branches of the comparison of the pixel is replaced with
In order to eliminate the rooster component contained in the image without wasting time or requiring a large amount of memory, we have developed an IP 1-ray tomography inspection system that takes into account the features of the image. There are things you can offer.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明装置の概略的な構成を承りIロワ9図、
第2図は本発明の要部構成を示4ノロツク図、第3図は
被検合体の一例を承り断面図、第4図はその画像のプロ
ツイールの一例を示1図、第5図は画像信号と和音信号
の一例を承り図、第6図は4目画素とぞの比較領域を示
ν閏、第7図は本発明に用いる画像tJj高除去のため
のアルニ「リズムを承りノローチ鵞・−1〜、第8間、
第9図は注目点の画素と比較領域の他の例を承り図であ
る。 1・・XvA!管、3・・・放射線検出器、6・・・デ
ータ収集装置、7・・・中央演仲装置 8・・・メモリ
、9・・・高速i宙酔装置、10・・・人容屋記1意・
装置、11・・・]ンソ ル、12・・・人出力ハス、
14・・・高速演斡装置′二コントローラ、15・・・
前処理装置、16・・・積和装置(二lンホルハ)、1
7・・・逆投影装置、18・・・イメーシヌしり(曲目
色メし1.1 ) 、1≦)・・・!fl ?O1i除
去装置。 出願人代理人 37埋[鈴ン1八直す 第1図 第2図 第3図 第4図 第6図 第5図
FIG. 1 shows the schematic configuration of the device of the present invention, and FIG.
Fig. 2 is a four-dimensional diagram showing the main structure of the present invention, Fig. 3 is a sectional view of an example of a test object, Fig. 4 is an example of a protease of the image, Fig. 1, and Fig. 5 are images. An example of a signal and a chord signal is shown in FIG. -1~, 8th period,
FIG. 9 is a diagram showing another example of the pixel of interest and the comparison area. 1...XvA! Tube, 3...Radiation detector, 6...Data collection device, 7...Central communication device 8...Memory, 9...High-speed i-hanging device, 10...Human store record 1 meaning・
equipment, 11...] system, 12...manpower output,
14...High-speed display device'2 controller, 15...
Pre-processing device, 16... product-sum device (two-litter), 1
7...Back projection device, 18...Imeshinushiri (music color scheme 1.1), 1≦)...! Fl? O1i removal device. Applicant's agent

Claims (1)

【特許請求の範囲】 被検杏イ小の1セJ定断面各荀置【、:勾し2(ぞの各
1)向から1旧こ該44’+定回向を透過しまた放OJ
線h3を成用線透過データとして収集し、この収集した
放(ト)線透過i′−タに苅し7(画像↓1構成処理を
施し゛(、透過放射線h4に塁づく前記被検査体の1、
′11断面の両構成画像を得るようにした装置におい(
、ijj百1c山輪成画像の名画??、 (3’/置の
両車につい(ぞの周囲の予るときは該画素の狛をぞのま
ま該画、!′8の植とし、。 1記り、きい(iG J、り小なる乙のが存71シない
11.鴇31該画素の比較領域の画素の植の甲均イ11
“1を該画素の植とし、(置イ条える手段を備えたこと
を1、′西攻どりる/1(QiJ線断層検f1装置。
[Claims] One section of the apricot to be tested is placed in a fixed cross section of each section.
The line h3 is collected as the transmitted radiation data, and the collected radiation data is subjected to the image ↓1 composition processing. 1,
In the apparatus designed to obtain both constituent images of the '11 cross section (
, ijj 101c mountain ring formation masterpiece? ? , (For both cars at 3' / position (when the surroundings are planned, the pixel of the pixel is left as it is, and the image is set at !'8. 11. 31 The pixel in the comparison area of the pixel is 11
``1'' is the setting for the pixel, (1 is equipped with a means for placing the pixel, 1, 'west attack/1 (QiJ line tomographic detection f1 device.
JP59063631A 1984-03-31 1984-03-31 Radiation tomography examination apparatus Granted JPS60207041A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59063631A JPS60207041A (en) 1984-03-31 1984-03-31 Radiation tomography examination apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59063631A JPS60207041A (en) 1984-03-31 1984-03-31 Radiation tomography examination apparatus

Publications (2)

Publication Number Publication Date
JPS60207041A true JPS60207041A (en) 1985-10-18
JPH0252306B2 JPH0252306B2 (en) 1990-11-13

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP59063631A Granted JPS60207041A (en) 1984-03-31 1984-03-31 Radiation tomography examination apparatus

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JP (1) JPS60207041A (en)

Cited By (1)

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JP2007054527A (en) * 2005-08-26 2007-03-08 Shimadzu Corp Digital radiography apparatus

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JP4211702B2 (en) * 2004-05-12 2009-01-21 トヨタ自動車株式会社 Cast hole measurement method
JP4211704B2 (en) * 2004-07-27 2009-01-21 トヨタ自動車株式会社 Cast hole measurement method
JP4769089B2 (en) * 2006-01-31 2011-09-07 株式会社東芝 X-ray equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007054527A (en) * 2005-08-26 2007-03-08 Shimadzu Corp Digital radiography apparatus
JP4609238B2 (en) * 2005-08-26 2011-01-12 株式会社島津製作所 Digital radiography equipment

Also Published As

Publication number Publication date
JPH0252306B2 (en) 1990-11-13

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