JPS6018281B2 - Thin film creation device - Google Patents

Thin film creation device

Info

Publication number
JPS6018281B2
JPS6018281B2 JP52060607A JP6060777A JPS6018281B2 JP S6018281 B2 JPS6018281 B2 JP S6018281B2 JP 52060607 A JP52060607 A JP 52060607A JP 6060777 A JP6060777 A JP 6060777A JP S6018281 B2 JPS6018281 B2 JP S6018281B2
Authority
JP
Japan
Prior art keywords
substrate
thin film
film thickness
forming apparatus
thickness setting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52060607A
Other languages
Japanese (ja)
Other versions
JPS53144909A (en
Inventor
明紀 高畑
興一 佐藤
和明 内海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP52060607A priority Critical patent/JPS6018281B2/en
Publication of JPS53144909A publication Critical patent/JPS53144909A/en
Publication of JPS6018281B2 publication Critical patent/JPS6018281B2/en
Expired legal-status Critical Current

Links

Description

【発明の詳細な説明】 本発明は基体上に塗布法により薄膜を作成する装置に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for forming a thin film on a substrate by a coating method.

このような装置は、積層セラミックコンデンサやセラミ
ックフィル夕の製造過程の中でセラミックの薄膜を作成
する場合等に使用される。
Such devices are used, for example, when creating ceramic thin films during the manufacturing process of multilayer ceramic capacitors and ceramic filters.

従来、この種の薄膜作成装置としては、第1図に示すよ
うに、送りローラ31と支持ローラ32によってフィル
ム状基体のロール33から送り出された基体34の面上
に供孫台箱35からスラリ36を塗布し、マイクロメー
タヘツド37により調節された膜厚設定板38と支持板
39上の基体34とのすきまに対応した膜厚の薄膜40
を形成した後に、薄膜40を乾燥炉41中にあるシーズ
ヒータ42で乾燥し、巻き取りローラ43に基体34と
一緒に巻き取った後、薄膜40を基体34から剥離して
薄膜40のみを得る等の方法がある。
Conventionally, in this type of thin film forming apparatus, as shown in FIG. A thin film 40 having a thickness corresponding to the gap between the film thickness setting plate 38 and the substrate 34 on the support plate 39 adjusted by the micrometer head 37.
After forming the thin film 40, the thin film 40 is dried with a sheathed heater 42 in a drying oven 41, and after being wound up together with the base 34 on a winding roller 43, the thin film 40 is peeled off from the base 34 to obtain only the thin film 40. There are other methods.

しかし乍らこのような従来の方法では、フィルムと一緒
に巻きこまれた一部の徴量のスラリとフィルム面に閉じ
込められ、気泡状の空気となって残り、その状態でスラ
リが乾燥する時に気泡が熱膨張して薄膜に微小突起が形
成されたり、ピンホールを生じる場合があった。また、
1枚の膜厚設定板で膜厚設定を行うため薄膜の膜厚が不
均一になり、製品の特性が著しく覆われるとともに、製
品の生産性が悪い等の欠点があった。本発明の目的は、
上述の欠点を除去し、薄膜を高品質かつ能率的に生産す
る薄膜作成装置を提供することにある。
However, in this conventional method, some of the slurry that is rolled up with the film gets trapped in the film surface and remains as air bubbles, and when the slurry dries in that state, the air bubbles form. Thermal expansion may result in the formation of minute protrusions or pinholes in the thin film. Also,
Since the film thickness is set using a single film thickness setting plate, the film thickness of the thin film becomes non-uniform, which significantly obscures the characteristics of the product and has drawbacks such as poor product productivity. The purpose of the present invention is to
It is an object of the present invention to provide a thin film forming apparatus that eliminates the above-mentioned drawbacks and efficiently produces thin films with high quality.

すなわち本発明は、フィルム状基体を巻いたロールと、
作成した膜を基体とともに巻き取る巻き取り部と、これ
らの間にあって前記基体を繰り出す基体送り部と、前記
ロールと基体送り部との間で基体上にスラリを塗布する
スラリ供給部と、そこで塗布された薄膜を乾燥する乾燥
炉とを備えてなる装置において、前記基体に適当な張力
を与える機構と、前記ロールと前記スラリ供孫舎部との
間に基体表面に付着する気泡状の空気を除去する機構と
を有し、かつ前記スラリ供V給部には調節可能な2枚の
膜厚設定板を備えている薄膜作成装置である。
That is, the present invention includes a roll wound with a film-like substrate;
A winding section that winds up the prepared film together with the substrate; a substrate feeding section that is located between these and that feeds out the substrate; a slurry supply section that applies slurry onto the substrate between the roll and the substrate feeding section; A drying oven for drying the thin film produced by the slurry, a mechanism for applying appropriate tension to the substrate, and a mechanism for removing air bubbles adhering to the surface of the substrate between the roll and the slurry container. This thin film forming apparatus has a mechanism, and the slurry supply V supply section is equipped with two adjustable film thickness setting plates.

次に本発明の薄膜作成装置の一実施例について図を参照
して説明する。
Next, an embodiment of the thin film forming apparatus of the present invention will be described with reference to the drawings.

第2図は本発明の薄膜作成装置の一実施例の構成を示す
斜視図、第3図は第2図における基体ガイドブロックの
断面図、第4図は第2図におけるスラリ供V給部の主要
断面図である。
2 is a perspective view showing the configuration of an embodiment of the thin film forming apparatus of the present invention, FIG. 3 is a sectional view of the base guide block in FIG. 2, and FIG. 4 is a sectional view of the slurry V supply section in FIG. It is a main sectional view.

1はフィルム状の基体でロール2から繰り出される。1 is a film-like substrate that is fed out from a roll 2;

3は張力制御部でロール2の巻径を検出部4で絶えず検
出し、この検出部の信号により基体1に一定の張力を与
える。
Reference numeral 3 denotes a tension control section that constantly detects the winding diameter of the roll 2 with a detection section 4, and applies a constant tension to the base 1 based on a signal from this detection section.

5は回転ローラで基体1の送り方向を変える。Reference numeral 5 indicates a rotating roller that changes the direction in which the substrate 1 is fed.

6はスラリ供V給部で、基体1の表面に付着する気泡状
の空気を除去する構造として、例えば基体1と一緒に巻
き込まれた徴量の空気に対して図示してない減圧ポンプ
等によりラビリンス構造7内を負圧とすることにより除
去するものであり、このラビリンス構造7を供給箱8の
基体ロール側前面に一体に設け、供給箱8内で上下摺動
し、粉末状の物体と溶剤とバィンダとで成るスラリ9の
薄膜10の膜厚を設定し、ス0ラリ9があふれるのを防
ぐ返し12とスラリ9をにがすにげ穴13とを有する第
1膜厚設定板11と、第1膜厚設定板11と同じく供給
箱8内で上下摺動して薄膜10の膜厚を設定している第
2膜厚設定板14と、第1膜厚設定板11および第25
膜厚設定板14の上下位置をおのおの調節するマイクロ
メータヘッド15と、基体1を介して供給箱8を保持し
ている支持台16とで構成されている。
Reference numeral 6 denotes a slurry supply V supply section, which has a structure for removing air bubbles adhering to the surface of the substrate 1, for example, by using a vacuum pump (not shown) or the like to remove a large amount of air drawn in together with the substrate 1. The labyrinth structure 7 is removed by creating a negative pressure inside the labyrinth structure 7. The labyrinth structure 7 is integrally provided on the front surface of the supply box 8 on the base roll side, and is slid up and down within the supply box 8 to remove powdery objects. A first film thickness setting plate 11 that sets the film thickness of the thin film 10 of the slurry 9 made of a solvent and a binder, and has a barb 12 to prevent the slurry 9 from overflowing and a pass hole 13 to drain the slurry 9. and a second film thickness setting plate 14 which, like the first film thickness setting plate 11, slides up and down in the supply box 8 to set the film thickness of the thin film 10;
It is comprised of a micrometer head 15 that adjusts the vertical position of the film thickness setting plate 14, and a support stand 16 that holds the supply box 8 via the base 1.

17は乾燥炉で薄膜10をヒータ18(例えば遠赤外線
ヒータを使用して効率よく乾燥する。
A drying oven 17 efficiently dries the thin film 10 using a heater 18 (for example, a far-infrared heater).

)で乾燥する。19は基体ガイドブロックで、薄膜10
が塗布された後の基体1の両端部(薄膜10が塗布され
ていない部分)をガイドして基体1の蛇行と薄膜10の
膜だれとを防ぐ。
) to dry. 19 is a base guide block, and the thin film 10
Both ends of the substrate 1 (portions to which the thin film 10 is not applied) after being coated are guided to prevent meandering of the substrate 1 and sagging of the thin film 10.

20は薄膜10の状態を監視するための照明灯で、薄膜
10スラリ塗布部6で塗布された後および乾燥炉17で
乾燥された後に基体1の下部より照す。
Reference numeral 20 denotes a lighting lamp for monitoring the state of the thin film 10, which is illuminated from the bottom of the substrate 1 after the thin film 10 has been coated in the slurry coating section 6 and dried in the drying oven 17.

21は基体送り部で、ドライブローラ22とこれを駆動
するサーボモータ23と、一定の間隔を保って設置し、
基体了に送りを与えるピンチローラ24とで構成されて
いる。
Reference numeral 21 denotes a substrate feeding section, which is equipped with a drive roller 22 and a servo motor 23 that drives it, and is installed at a constant interval.
It consists of a pinch roller 24 that feeds the substrate.

25は巻き取り制御部で、巻き取りローラ26に巻き取
られた基体1と薄膜10との巻径を検出部27で検出し
、この検出部の信号により基体1と薄膜1川こ一定の張
力を与える。
Reference numeral 25 denotes a winding control section, in which a detection section 27 detects the winding diameter of the substrate 1 and thin film 10 wound around a winding roller 26, and a signal from this detection section is used to maintain a constant tension between the substrate 1 and the thin film 1. give.

次に本発明の動作について図を参照して説明する。Next, the operation of the present invention will be explained with reference to the drawings.

第2図および第3図、第4図に示すように、サーボモー
タ23により回転したドライブローラ22とピンチロー
ラ24とで基体1がロール2より送り出される。
As shown in FIGS. 2, 3, and 4, the base 1 is sent out from the roll 2 by a drive roller 22 rotated by a servo motor 23 and a pinch roller 24. As shown in FIGS.

このとき、基体1にはロール2の巻径を検出する検出部
4の信号を受けた張力制御部3により一定の張力が懸け
られている。ロール2より出された基体1は回転ローラ
5によって送り方向が変えられる。次に、支持台6上の
供給箱8のラビリンス構造7により基体1の表面上に付
着する気泡状の空気が除去され、続いてスラリ9が塗布
され薄膜10が形成される。このときスラリ9は、基体
ガイドブロック19にガイドされピンチローラ24が接
触する基体1の両端部には塗布されない。また、薄膜1
0の膜厚はマイクロメータヘッド15でおのおの調節さ
れた第1険厚設定板11、第2膜厚設定板14と平坦な
支持台16上の基体1とのすきまで設定されるが、あら
かじめ第1膜厚設定板11で設定した後第2膜厚設定板
14で最終的に設定される。それに第1膜厚設定板11
のすきまと第2膜厚設定板14のすきまとの差日が生じ
てスラリ9が余り第1膜厚設定板11と第2膜厚設定板
14との間にたまってきた場合は、第1膜厚設定板11
の返し12で供 v給箱8よりあふれるのを防いでにげ
穴13よりもとに戻す。次に基体1表面に塗布された薄
膜1川ま基体1の両端部をガイドしている基体ガイドブ
ロック19により導かれて乾燥炉17内のヒータ18で
乾燥される。それに塗布後と乾燥後との薄膜10の状態
は基体1の下部より照明灯20より照らして監視するこ
とができる。次に、乾燥した薄膜10はドライブロ川ラ
22とピンチローラ24を通って巻き取りローラ26に
基体1と一緒に巻き取られる。このとき、基体1と薄膜
10には基体と薄膜との巻径を検出する検出部27の信
号を受けた巻き取り制御部25により一定の張力が懸け
られている。巻き取り終了後、薄膜10を基体1から剥
離して薄膜のみを得ることができる。このように本発明
ではスラリの塗布時に基板とスラリの間に気泡状の空気
が残らないので、気泡状の空気に起因する薄膜中のピン
ホールが除かれる。また本発明では薄膜は2枚の膜厚設
定板により2段に設定されるので、膜厚が均一になる。
At this time, a constant tension is applied to the base body 1 by a tension control section 3 that receives a signal from a detection section 4 that detects the winding diameter of the roll 2. The feeding direction of the substrate 1 taken out from the roll 2 is changed by the rotating roller 5. Next, air bubbles adhering to the surface of the substrate 1 are removed by the labyrinth structure 7 of the supply box 8 on the support stand 6, and then the slurry 9 is applied to form the thin film 10. At this time, the slurry 9 is not applied to both ends of the base 1 that are guided by the base guide block 19 and come into contact with the pinch rollers 24. In addition, thin film 1
The film thickness of 0 is set up to the gap between the first thickness setting plate 11 and the second film thickness setting plate 14, which are respectively adjusted by the micrometer head 15, and the substrate 1 on the flat support stand 16. After setting with the first film thickness setting plate 11, the final setting is made with the second film thickness setting plate 14. In addition, the first film thickness setting plate 11
If there is a difference between the gap between the first film thickness setting plate 11 and the second film thickness setting plate 14, and the slurry 9 has accumulated between the first film thickness setting plate 11 and the second film thickness setting plate 14, Film thickness setting plate 11
The return 12 prevents it from overflowing from the supply box 8 and returns it to the hole 13. Next, the thin film coated on the surface of the substrate 1 is guided by substrate guide blocks 19 that guide both ends of the substrate 1 and dried by a heater 18 in a drying oven 17 . In addition, the state of the thin film 10 after coating and after drying can be monitored by illuminating it from the lower part of the substrate 1 with an illumination lamp 20. Next, the dried thin film 10 passes through a dry roller 22 and a pinch roller 24 and is wound up together with the substrate 1 onto a winding roller 26. At this time, a certain tension is applied to the base body 1 and the thin film 10 by the winding control unit 25 which receives a signal from the detection unit 27 that detects the winding diameters of the base body and the thin film. After winding is completed, the thin film 10 can be peeled off from the base 1 to obtain only the thin film. As described above, in the present invention, no air bubbles remain between the substrate and the slurry when the slurry is applied, so pinholes in the thin film caused by air bubbles are eliminated. Further, in the present invention, the thin film is set in two stages by two film thickness setting plates, so that the film thickness becomes uniform.

本実施例では回転ローラ5を用いて基体の送り方向を変
えている。このように方向を変えることにより基体に掛
る張力の測定が容易になる。また本実施例では基体表面
に付着する気泡を除去する機構としてラビリンス構造7
をスラリ供給部と一体化して設けてある。気泡状の空気
を除去するために、このようにスラリ供繋溝部に一体化
して空気の入り込みを防止した構造が好ましい。さらに
本実施例では基体ガイドブロックを備えるとともに膜厚
設定板の幅を基体の幅よりも狭くし、基体の両端部には
薄膜が形成されないようにし、基体送り部ではピンチロ
ーラで薄膜の形成されていない基体両端部を押えるよう
にしている。このようにすることにより形成された薄膜
が第1図の支持ローラ32で押さえられる場合に比べて
ローラにより汚されることがなくなるので品質の優れた
薄膜が得られる。また基体ガイドブロックを備えること
により薄膜の膜だれがなく、薄膜が均一に保たれる効果
もあり、膜厚が厚い場合には特に有効である。さらに本
実施例では薄膜が塗布された後および乾燥された後に下
から照明灯により薄膜の状態を監視できる構成にしてあ
る。
In this embodiment, the rotating roller 5 is used to change the feeding direction of the substrate. By changing the direction in this way, it becomes easier to measure the tension applied to the substrate. In addition, in this embodiment, a labyrinth structure 7 is used as a mechanism for removing air bubbles adhering to the substrate surface.
is provided integrally with the slurry supply section. In order to remove air bubbles, it is preferable to have a structure in which the slurry is integrated with the slurry supply groove to prevent air from entering. Furthermore, in this embodiment, a substrate guide block is provided, and the width of the film thickness setting plate is made narrower than the width of the substrate, so that a thin film is not formed on both ends of the substrate, and a pinch roller is used in the substrate feeding section to form a thin film. This is done so that both ends of the base are held down. By doing so, the formed thin film is not stained by the rollers as compared to the case where the formed thin film is pressed by the support roller 32 shown in FIG. 1, so that a thin film of excellent quality can be obtained. Further, by providing the base guide block, there is no sagging of the thin film and the thin film is kept uniform, which is particularly effective when the film is thick. Further, in this embodiment, the condition of the thin film can be monitored from below using an illumination lamp after the thin film has been applied and dried.

これにより塗布状態の変化が容易に検知され、ただちに
所定の塗布条件に膜厚設定板が調節される。さらに本実
施例では2枚の膜厚設定坂間にスラリがたまってきた場
合に返しと逃げ穴とにより元に戻す構造にしたので、外
部に漏れることがないため作業性がよい。
As a result, changes in coating conditions are easily detected and the film thickness setting plate is immediately adjusted to predetermined coating conditions. Furthermore, in this embodiment, when slurry accumulates between the two film thickness setting slopes, it is constructed to be returned to its original state by means of a barb and escape hole, so there is no leakage to the outside, resulting in good workability.

以上説明したように、本発明によればピンホールがなく
、また膜厚が均一な薄膜を塗布法により達成することが
できる。
As explained above, according to the present invention, a thin film without pinholes and having a uniform thickness can be achieved by a coating method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の薄膜作成装置の概略図、第2図は本発明
装置の一実施例の構成を示す斜視図、第3図は第2図に
おける基体ガイドブロックの断面図、第4図は第2図に
おけるスラリ供給部の主要断面図である。 図において1,34は基体、2,33はロール、3は張
力制御部、4は検出部、5は回転ローラ、6はスラリ供
給部、7はラビリンス構造、8,25は供給箱〜 9,
36はスラリ、10,40は薄膜、11は第1膜厚設定
板、12は返し、13はにげ穴、14は第2膜厚設定板
、15,37はマイクロメータヘツド、16,39は支
持台、17,41は乾燥炉、18,42はヒータ、19
は基体ガイドブロック、2川ま照明灯、21は基体送り
部、22はドライブローフ、023はサーボモータ、2
4はピンチローラ、25は巻き取り制御部、26,43
は巻き取りローラ、27は検出部、31は送りローラ、
32は支持ローラ、38は濃厚設定板である。オー図 オ2図 汁3図 オ4図
Figure 1 is a schematic diagram of a conventional thin film forming apparatus, Figure 2 is a perspective view showing the configuration of an embodiment of the apparatus of the present invention, Figure 3 is a sectional view of the base guide block in Figure 2, and Figure 4 is 3 is a main sectional view of the slurry supply section in FIG. 2. FIG. In the figure, 1 and 34 are base bodies, 2 and 33 are rolls, 3 is a tension control unit, 4 is a detection unit, 5 is a rotating roller, 6 is a slurry supply unit, 7 is a labyrinth structure, 8 and 25 are supply boxes to 9,
36 is a slurry, 10 and 40 are thin films, 11 is a first film thickness setting plate, 12 is a return, 13 is a hollow hole, 14 is a second film thickness setting plate, 15 and 37 are micrometer heads, and 16 and 39 are Support stand, 17 and 41 are drying ovens, 18 and 42 are heaters, 19
2 is a base guide block, 2 is a lighting lamp, 21 is a base feeding section, 22 is a drive loaf, 023 is a servo motor, 2
4 is a pinch roller, 25 is a winding control section, 26, 43
is a take-up roller, 27 is a detection unit, 31 is a feed roller,
32 is a support roller, and 38 is a thickening setting plate. O diagram O 2 diagram Juice 3 diagram O 4 diagram

Claims (1)

【特許請求の範囲】 1 フイルム状基体を巻いたロールと、作成した膜を基
体とともに巻き取る巻き取り部と、これらの間にあつて
前記基体を繰り出す基体送り部と前記ロールと基体送り
部との間で基体上にスラリを塗布するスラリ供給部とそ
こで塗布された薄膜を乾燥する乾燥炉とを備えてなる装
置において、前記基体に適当な張力を与える機構と、前
記ロールと前記スラリ供給部との間に基体表面に付着す
る気泡状の空気を除去する機構とを有し、かつ前記スラ
リ供給部には調節可能な2枚の膜厚設備板を備えている
ことを特徴とする薄膜作成装置。 2 2枚の膜厚設定板はあらかじめ膜厚を設定する第1
膜厚設定板と、基体進行方向に対し第1膜厚設定板の前
方にあつて基体との隙間が前記第1の膜厚設定板よりも
小さい第2膜厚設定板とからなる特許請求の範囲第1項
記載の薄膜作成装置。 3 2枚の膜厚設定板間にはスラリの溢れを防ぐ返しを
設け第1の膜厚設定板ににげ穴を設けた特許請求の範囲
第2項記載の薄膜作成装置。 4 膜厚設定板の幅が基体の幅よりも狭い特許請求の範
囲第1項もしくは第2項記載の薄膜作成装置。 5 スラリ供給部と基体送り部との間の部分に基体ガイ
ドブロツクを備えた特許請求の範囲第1項もしくは第4
項記載の薄膜作成装置。 6 基体表面に付着する気泡状の空気を除去する機構は
ラビリンス構造である特許請求の範囲第1項記載の薄膜
作成装置。 7 基体表面に付着する気泡状の空気を除去する機構を
スラリ供給部と一体化し、スラリ供給部のロール側前面
に設けた特許請求の範囲第1項もしくは第6項記載の薄
膜作成装置。 8 基体の適当な張力を与える機構はロールの巻径を検
出する検出部とこの検出部の信号により基体の張力を制
御する張力制御部とからなる特許請求の範囲第1項記載
の薄膜作成装置。 9 基体進行方向に対しスラリ供給部の前方および乾燥
炉の前方の双方もしくは一方の基体下部に照明灯を備え
た特許請求の範囲第1項記載の薄膜作成装置。 10 ロールとスラリ供給部との間に回転ローラを設け
基体の方向を変更した特許請求の範囲第1項記載の薄膜
作成装置。 11 基体送り部の支持ローラは基体の両端のみを挾む
ピンチローラである特許請求の範囲第1項第4項もしく
は第5項記載の薄膜作成装置。
[Scope of Claims] 1. A roll around which a film-like substrate is wound, a winding section that winds up the prepared film together with the substrate, a substrate feeding section that is located between these and that feeds out the substrate, and the roll and substrate feeding section. An apparatus comprising: a slurry supply section for applying slurry onto a substrate between the two; and a drying oven for drying the thin film coated there; and a mechanism for removing air bubbles adhering to the surface of the substrate, and the slurry supply section is equipped with two adjustable film thickness equipment plates. Device. 2 The two film thickness setting plates are the first plate for setting the film thickness in advance.
A second film thickness setting plate comprising a film thickness setting plate and a second film thickness setting plate that is located in front of the first film thickness setting plate with respect to the substrate traveling direction and has a smaller gap with the substrate than the first film thickness setting plate. The thin film forming apparatus according to scope 1. 3. The thin film forming apparatus according to claim 2, wherein a bar is provided between the two film thickness setting plates to prevent slurry from overflowing, and a hollow hole is provided in the first film thickness setting plate. 4. The thin film forming apparatus according to claim 1 or 2, wherein the width of the film thickness setting plate is narrower than the width of the substrate. 5. Claim 1 or 4, which includes a substrate guide block in a portion between the slurry supply section and the substrate feeding section.
The thin film forming apparatus described in . 6. The thin film forming apparatus according to claim 1, wherein the mechanism for removing air bubbles adhering to the surface of the substrate has a labyrinth structure. 7. The thin film forming apparatus according to claim 1 or 6, wherein a mechanism for removing air bubbles adhering to the surface of the substrate is integrated with the slurry supply section and provided on the front surface of the slurry supply section on the roll side. 8. The thin film forming apparatus according to claim 1, wherein the mechanism for applying appropriate tension to the substrate comprises a detection section that detects the winding diameter of the roll, and a tension control section that controls the tension of the substrate based on a signal from this detection section. . 9. The thin film forming apparatus according to claim 1, further comprising an illumination lamp provided at the lower part of the substrate in front of the slurry supply section and/or in front of the drying oven with respect to the direction of movement of the substrate. 10. The thin film forming apparatus according to claim 1, wherein a rotating roller is provided between the roll and the slurry supply section to change the direction of the substrate. 11. The thin film forming apparatus according to claim 1, 4 or 5, wherein the support roller of the substrate feeding section is a pinch roller that pinches only both ends of the substrate.
JP52060607A 1977-05-24 1977-05-24 Thin film creation device Expired JPS6018281B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52060607A JPS6018281B2 (en) 1977-05-24 1977-05-24 Thin film creation device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52060607A JPS6018281B2 (en) 1977-05-24 1977-05-24 Thin film creation device

Publications (2)

Publication Number Publication Date
JPS53144909A JPS53144909A (en) 1978-12-16
JPS6018281B2 true JPS6018281B2 (en) 1985-05-09

Family

ID=13147100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52060607A Expired JPS6018281B2 (en) 1977-05-24 1977-05-24 Thin film creation device

Country Status (1)

Country Link
JP (1) JPS6018281B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010186982A (en) * 2009-01-13 2010-08-26 Shin Etsu Polymer Co Ltd Holding/removing jig and handling jig
JP2011142273A (en) * 2010-01-08 2011-07-21 Shin Etsu Polymer Co Ltd Holding/removing jig and handling jig

Also Published As

Publication number Publication date
JPS53144909A (en) 1978-12-16

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