JPS60181268A - Sputtering target - Google Patents

Sputtering target

Info

Publication number
JPS60181268A
JPS60181268A JP3607684A JP3607684A JPS60181268A JP S60181268 A JPS60181268 A JP S60181268A JP 3607684 A JP3607684 A JP 3607684A JP 3607684 A JP3607684 A JP 3607684A JP S60181268 A JPS60181268 A JP S60181268A
Authority
JP
Japan
Prior art keywords
target
sputtering
diameter
sputtering target
central part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3607684A
Other languages
Japanese (ja)
Inventor
Hisao Nozawa
野沢 悠夫
Hideki Nishida
西田 秀来
Takashi Obara
小原 尚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Ltd
Hitachi Microcomputer Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Microcomputer Engineering Ltd filed Critical Hitachi Ltd
Priority to JP3607684A priority Critical patent/JPS60181268A/en
Publication of JPS60181268A publication Critical patent/JPS60181268A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To extend the life of a disc-shaped sputtering target and to reduce the cost thereof by constituting the target of a central part and a toric peripheral part where consumption is heavy and making the peripheral part exchangeable. CONSTITUTION:A target 10 to be used for sputtering is constituted of the 1st target 10a consisting of a base body part having a large diameter D2 and the central part having a small diameter D1 and the toric 2nd target 10b fitted to the periphery of the central part. The 1st and 2nd targets 10a, 10b are of course made of the material having the same quality and both targets 10a, 10b are united to one body by means of screws or pins made of the material having the same quality. The diameter D1 in the central part of the 1st target 10a is made 0.4-0.8 times the diameter D2 of the 2nd target 10b. The 2nd target 10b of the circumferential part where consumption by the sputtering operation is heavy is exchangeable and therefore the life over the entire part of the target is extended and the cost is reduced.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はスパッタリングターゲットに係シ、特にターゲ
ットの構成に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a sputtering target, and particularly to the structure of the target.

〔発明の背景〕[Background of the invention]

従来、スパッタリングに用いるターゲットは所定の組成
で構成された一定の厚さを有する一体の円板が用いられ
ている。そして、スパッタリングは周知のようにイオン
をターゲットに衝突させターゲット表面の分子を放出さ
せることによシ行なわれる。
Conventionally, a target used for sputtering is an integral disk having a predetermined composition and a constant thickness. As is well known, sputtering is performed by colliding ions with a target and ejecting molecules on the target surface.

ところが、ターゲット表面からの分子の放出はターゲッ
ト表面全面から均一に行なわれず、ある特定の領域、す
なわち円板の周辺部分において著しく激しい。このため
、第1図に断面図で示すようにターゲット1の消耗は中
央部分1aに比較して周辺部分1bで著るしい。このよ
うにターゲット1が同図に点線で示す周辺部分1bが消
耗すると、被着した膜の膜厚および膜質の不均一が生じ
、実用上不都合となシ、シたがって同図に示すように表
面に平担部1Cを有するターゲット1に取替を余儀なく
される。このことは特に枚葉処理スパッタの場合には頻
繁となり、製造コスト上昇の原因となっている。
However, the release of molecules from the target surface is not performed uniformly over the entire surface of the target, but is extremely intense in a certain region, that is, in the periphery of the disk. Therefore, as shown in the cross-sectional view of FIG. 1, the wear of the target 1 is more significant in the peripheral portion 1b than in the central portion 1a. When the peripheral portion 1b of the target 1 shown by the dotted line in the figure is consumed in this way, the thickness and quality of the deposited film become uneven, which is a practical disadvantage. The target 1 has to be replaced with a flat portion 1C on the surface. This problem is particularly frequent in the case of single-wafer processing sputtering, and is a cause of increased manufacturing costs.

〔発明の目的〕[Purpose of the invention]

しだがって本発明は、前述した従来の問題に鑑みてなさ
れたものであり、その目的とするところは、製造コスト
を低減させるスパッタリングターゲットを提供すること
にある。
Therefore, the present invention has been made in view of the above-mentioned conventional problems, and its object is to provide a sputtering target that reduces manufacturing costs.

〔発明の概要〕[Summary of the invention]

このような目的を達成するために本発明は、スパッタリ
ングターゲットを、均一微小消耗領域と大量消耗領域と
に分割して同一組成材料で製作し、組合せて一体化させ
、大量消耗領域のみを交換可能に構成したものである。
In order to achieve this purpose, the present invention divides a sputtering target into a uniformly small consumption area and a large consumption area, which are made of the same composition material, and are combined and integrated, so that only the large consumption area can be replaced. It is composed of

〔発明の実施例〕[Embodiments of the invention]

次に図面を用いて本発明の実施例を詳細に説明する。 Next, embodiments of the present invention will be described in detail using the drawings.

第2図(a) 、 (b)は本発明によるスパッタリン
グターゲットの一例を示す断面構成図、その平面図であ
る。同図において、ターゲット10は、中央部分および
基体部分がそれぞh小、大の直径を有する円板状の第1
のターゲラ)10aと、この第1のターゲラ)lQaの
周辺部分に嵌合された円環状の第2のターゲット10b
とから構成されており、この第1のターゲット10aお
よび第2のターゲット10bは、ともに例えばNi−F
e合金材で形成され、両者は図示しない同一部材からな
るネジもしくはピン等により組合せ一体化されている。
FIGS. 2(a) and 2(b) are a cross-sectional configuration diagram and a plan view showing an example of a sputtering target according to the present invention. In the same figure, the target 10 has a disk-shaped first disk whose central portion and base portion have diameters of h small and large, respectively.
A second target 10b having an annular shape fitted to the peripheral portion of the first target (A) 10a.
The first target 10a and the second target 10b are both made of, for example, Ni-F.
They are made of an e-alloy material and are combined and integrated with screws, pins, etc. made of the same member (not shown).

すなわち均一微小消耗領域としての第1のターゲラZO
aと大量消耗領域としての第2のターゲット10bとに
2分割して形成され、第2のターゲット10bはネジも
しくはピンなどにより交換可能な状態で構成されている
In other words, the first target layer ZO as a uniform minute consumption area
A and a second target 10b as a mass consumption area are formed in two parts, and the second target 10b is configured to be replaceable with a screw or pin.

次に具体例を用いて詳細に説明する。Next, a detailed explanation will be given using a specific example.

まず、ターゲット10の第1のターゲット10Hの直径
Dlを100mm、全体の厚さTlを8mmとし、また
第2のターゲット10bの直径Ihを209mm。
First, the diameter Dl of the first target 10H of the target 10 is 100 mm, the total thickness Tl is 8 mm, and the diameter Ih of the second target 10b is 209 mm.

その厚さT2を5mmとし、両者の表面は均一な平面と
した。そして、このターゲット10を用いてRFスパッ
タにより厚さ約2.0μmの膜を連続して被着形成した
。この場合の被着回数と、膜厚ばらつきおよびターゲッ
ト10の消耗との関係を第3図に示した。同図から明ら
かなようにスパッタ回数が約300回程度から特性Iで
示すように膜厚のばらつきは大きくな)はしめ、約60
0回程3一 度で約2倍となる。一方、ターゲット10の消耗はスパ
ッタ回数約600回程度で、第1のターゲット(均一消
耗領域)10aでは特性1aに示すように約0.5 m
m 、第2のターゲット(大量消耗領域)10bでは特
性1bに示すように2〜2.5 mmとなシ、第1のタ
ーゲット(均一消耗領域)10aに比較して4〜5倍程
度に達する。
The thickness T2 was 5 mm, and both surfaces were made uniform and flat. Then, using this target 10, a film having a thickness of about 2.0 μm was continuously formed by RF sputtering. FIG. 3 shows the relationship between the number of depositions, film thickness variations, and wear of the target 10 in this case. As is clear from the figure, after the number of sputtering is about 300, the variation in film thickness becomes large as shown in characteristic I), and after about 60
Approximately 0 times and 3 times it will be approximately doubled. On the other hand, the wear of the target 10 is about 600 sputtering cycles, and the first target (uniform wear area) 10a has a wear of about 0.5 m as shown in characteristic 1a.
m is 2 to 2.5 mm in the second target (mass consumption area) 10b, as shown in characteristic 1b, and reaches about 4 to 5 times that of the first target (uniform consumption area) 10a. .

ここで、このターゲット10の周辺部側に配設されてい
る第2のターゲラ) 10bのみを新規に取り替えて上
面を均一に平面化した後に前述と同様のスパッタを繰シ
返し、スパッタ回数ど膜厚のばらつきおよびターゲット
の消耗との関係をめたところ、第3図と全く同一の結果
が得られた。
Here, only the second target (10b) disposed on the peripheral side of the target 10 is replaced with a new one to make the upper surface uniformly planar, and then the same sputtering as described above is repeated to increase the number of sputtering times. When we investigated the relationship between thickness variations and target wear, we obtained exactly the same results as in FIG. 3.

以上の構成から明らかなようにターゲット10を2分割
し、大量消耗領域のみを、消耗量に応じて取シ替えれば
従来の如き一体構成からなるターゲットに比較して4〜
5倍程度寿命が長くな多、コストの面で極めて効果的で
ある。
As is clear from the above configuration, if the target 10 is divided into two parts and only the large consumption area is replaced according to the amount of consumption, the target 10 will be 4 to
It has a lifespan about 5 times longer and is extremely cost effective.

なお、本発明は、ターゲットを2分割して消耗の著しい
周辺部分を交換することにあるが、重要4− な点は交換する部分の材料組成を常に同一とすることで
あり、ターゲットの製造において同一母材から製作する
。このとき、ターゲットの周辺部分を交換するので、大
きな母材が必要となる。これに対しては第4図に示すよ
うに第2図の第2のターゲット10bをさらに3分割し
て第3のターゲット10bl、第4のターゲット10b
2および第5のターゲラ)lQbsで構成しても第3図
の場合と全く同一の結果が得られた。なお、ここでは3
分割したが、2分割もしくは4分割以上でも全く同様の
効果が得られることは言うまでもない。
The present invention is to divide the target into two parts and replace the peripheral parts that are severely worn out, but the important point is to always make the material composition of the replaced parts the same, which is important in the manufacture of the target. Manufactured from the same base material. At this time, since the peripheral portion of the target is replaced, a large base material is required. For this purpose, as shown in FIG. 4, the second target 10b in FIG. 2 is further divided into three parts, a third target 10bl, a fourth target 10b
The same results as in the case of FIG. 3 were obtained even when the structure was composed of 1Qbs (2 and 5). In addition, here 3
Although it is divided into two parts, it goes without saying that the same effect can be obtained by dividing it into two or four parts or more.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明によれば、ターゲットを複数
分割して構成し、消耗の著しい部分のみを交換すること
ができるので、ターゲット自体のコストが安価となり、
したがって製造コストが大幅に低減できるという極めて
優れた効果が得られる。
As explained above, according to the present invention, the target can be divided into multiple parts and only the parts that are severely worn out can be replaced, so the cost of the target itself can be reduced.
Therefore, an extremely excellent effect can be obtained in that manufacturing costs can be significantly reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のスパッタリングターゲットの−例を示す
要部断面図、第2図(a)、Φ)は本発明によるスパッ
タリングターゲットの一実施例を示す要部断面構成図、
その平面図、第3図はスパッタ回数に対する膜厚のばら
つきおよびターゲットの消耗の厚さの関係を示す図、第
4図は本発明の他の実施例を示す平面図である。 10命・・・スパッタリングターゲット、10a・・・
・第1のターゲ゛ン)、10b・・・−第2のターゲッ
ト、10bl・・e・第3のターゲット、1Qb2 @
・・・第4のターゲット、10b8・・・・第5のター
ゲット。 7一
FIG. 1 is a sectional view of a main part showing an example of a conventional sputtering target, FIG. 2(a), Φ) is a sectional view of a main part showing an example of a sputtering target according to the present invention
FIG. 3 is a plan view of the same, and FIG. 3 is a diagram showing the relationship between film thickness variation and target wear thickness with respect to the number of sputtering operations. FIG. 4 is a plan view showing another embodiment of the present invention. 10 lives...sputtering target, 10a...
・First target), 10b...-Second target, 10bl...e Third target, 1Qb2 @
...Fourth target, 10b8...Fifth target. 71

Claims (1)

【特許請求の範囲】 1、同一組成材料からなシかつ均一微小消耗領域と大量
消耗領域とに分割され、両者を組合せて一体構成してな
ることを特徴としたスパッタリングターゲット。 2、前記微小消耗領域を円板状体とし、前記大量消耗領
域を円環状体としたことを特徴とする特許請求の範囲第
1項記載のスパッタリングターゲット。 3、前記円板状体の直径を前記円環状体の直径の04〜
0.8倍としたことを特徴とする特許請求の範囲第2項
記載のスパッタリングターゲット。
[Claims] 1. A sputtering target characterized by being made of the same composition material and divided into a uniform micro-consumed region and a large-scale consumable region, and integrally constructed by combining the two regions. 2. The sputtering target according to claim 1, wherein the minute consumption area is a disc-shaped body, and the massive consumption area is a toric body. 3. The diameter of the disk-shaped body is 04 to 04 of the diameter of the toric body.
The sputtering target according to claim 2, wherein the sputtering target is 0.8 times.
JP3607684A 1984-02-29 1984-02-29 Sputtering target Pending JPS60181268A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3607684A JPS60181268A (en) 1984-02-29 1984-02-29 Sputtering target

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3607684A JPS60181268A (en) 1984-02-29 1984-02-29 Sputtering target

Publications (1)

Publication Number Publication Date
JPS60181268A true JPS60181268A (en) 1985-09-14

Family

ID=12459646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3607684A Pending JPS60181268A (en) 1984-02-29 1984-02-29 Sputtering target

Country Status (1)

Country Link
JP (1) JPS60181268A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6165567A (en) * 1999-04-12 2000-12-26 Motorola, Inc. Process of forming a semiconductor device
WO2007108313A1 (en) * 2006-03-22 2007-09-27 Kabushiki Kaisha Kobe Seiko Sho Method of arc ion plating and target for use therein
WO2009157438A1 (en) * 2008-06-26 2009-12-30 株式会社アルバック Cathode unit and spattering device having same
CN111519144A (en) * 2020-05-19 2020-08-11 河南大学 Target holder applied to pulse laser codeposition and mounting method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6165567A (en) * 1999-04-12 2000-12-26 Motorola, Inc. Process of forming a semiconductor device
WO2007108313A1 (en) * 2006-03-22 2007-09-27 Kabushiki Kaisha Kobe Seiko Sho Method of arc ion plating and target for use therein
KR101027879B1 (en) 2006-03-22 2011-04-07 가부시키가이샤 고베 세이코쇼 Method of arc ion plating and target for use therein
US8133365B2 (en) 2006-03-22 2012-03-13 Kobe Steel, Ltd. Method of arc ion plating and target for use therein
WO2009157438A1 (en) * 2008-06-26 2009-12-30 株式会社アルバック Cathode unit and spattering device having same
US8470145B2 (en) 2008-06-26 2013-06-25 Ulvac, Inc. Cathode unit and sputtering apparatus provided with the same
JP5717444B2 (en) * 2008-06-26 2015-05-13 株式会社アルバック Cathode unit and sputtering apparatus provided with the cathode unit
CN111519144A (en) * 2020-05-19 2020-08-11 河南大学 Target holder applied to pulse laser codeposition and mounting method
CN111519144B (en) * 2020-05-19 2021-04-09 河南大学 Target holder applied to pulse laser codeposition and mounting method

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