JPS6017304A - Method for measuring thickness of thin film of insoluble liquid - Google Patents
Method for measuring thickness of thin film of insoluble liquidInfo
- Publication number
- JPS6017304A JPS6017304A JP12441883A JP12441883A JPS6017304A JP S6017304 A JPS6017304 A JP S6017304A JP 12441883 A JP12441883 A JP 12441883A JP 12441883 A JP12441883 A JP 12441883A JP S6017304 A JPS6017304 A JP S6017304A
- Authority
- JP
- Japan
- Prior art keywords
- ink
- water
- base material
- signal
- wavelength band
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は不溶性液の薄膜厚測定法に係り、特に印刷機等
におけるインキと水との混合液等の薄膜厚測定法に適用
し得る不溶性液の薄膜厚測定法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for measuring the thickness of a thin film of an insoluble liquid, and more particularly to a method of measuring the thickness of a thin film of an insoluble liquid, which can be applied to a method of measuring the thickness of a thin film of a mixture of ink and water in a printing press, etc. .
一般に赤外線式水分計などの測定器は1例えば第1図に
示すものと類似した構成要素から製作されている。この
ような構成においては次のよ5外問題点があった。Measuring instruments such as infrared moisture meters are generally constructed from components similar to those shown in FIG. 1, for example. This configuration has the following problems.
■ 赤外検出の測定波長帯を1.0〜2.0μmの範囲
で使用している為母材の色票変化の影響を受けやすい。■ Since the measurement wavelength band of infrared detection is used in the range of 1.0 to 2.0 μm, it is susceptible to changes in the color chart of the base material.
■ 母材と水分量を含めた比率(M号で水分を評価して
いるので、母材が異なると検量線を作り変える必要があ
る。■ Ratio including base material and moisture content (moisture is evaluated using No. M, so if the base material is different, it is necessary to create a different calibration curve.
■ 母材に被着された水分及びインキが混在する混合液
を非接触で混在のまま、量全分別し。■ Separates the total amount of the mixed liquid containing moisture and ink adhering to the base material without contacting it.
はぼ同時に抽出することができなかった。could not be extracted at the same time.
本発明は上記の事情に鑑みて提茶されたもので、その目
的とするところは例えば水とインキとの混合液等からな
る不溶性液の薄膜厚全オンラインで定量的に計測し、且
つ水とインキ等を分離して測定し得る不溶性液の薄膜厚
測定法を提供するにある。The present invention was developed in view of the above circumstances, and its purpose is to quantitatively measure the entire thin film thickness of an insoluble liquid, such as a mixture of water and ink, online, and to An object of the present invention is to provide a method for measuring a thin film thickness of an insoluble liquid, which can be used to separate and measure ink and the like.
本発明による不溶性液の薄膜厚測定法は母材に被着され
た不溶性液の薄膜厚測定法において、上記不溶性液の吸
収波長帯に測定波長帯を設け。In the method for measuring the thickness of an insoluble liquid coated on a base material according to the present invention, a measurement wavelength band is provided in the absorption wavelength band of the insoluble liquid.
上記吸収波長帯外に参照波長帯を設け、これらの各波長
帯における上記母材からの各反射光を源定し、上記母材
および上記不溶性液からの各透過吸収光ないし反射光を
測定し、これらの各測定信号を相互比例補正することに
より上記母材の吸収特性を相殺することを特徴とし、測
定波長帯を例えば3.0〜4.5μmの範囲に設定する
ことにより母材の色票による影響を受け難くし、また各
測定信号を正規化信号として扱うことにより母材の信号
を相殺し得るようにして母材が変った場合でも同一検量
線を適用できるようにし、さらに例えばオフセット印刷
のように不溶性液の中味がインキと水とからなることが
既知の場合には%前記正規化信号からインキと水との単
独信号に分離できるよりにしたものである。A reference wavelength band is provided outside the absorption wavelength band, the source of each reflected light from the base material in each of these wavelength bands is determined, and each transmitted absorption light or reflected light from the base material and the insoluble liquid is measured. , is characterized in that the absorption characteristics of the base material are offset by mutually proportional correction of each of these measurement signals, and the color of the base material can be adjusted by setting the measurement wavelength band in the range of 3.0 to 4.5 μm, for example. In addition, by treating each measurement signal as a normalized signal, it is possible to cancel out the signal of the base material, so that the same calibration curve can be applied even if the base material changes. When it is known that the content of an insoluble liquid is composed of ink and water, such as in printing, it is possible to separate the normalized signal into individual signals of ink and water.
本発明の一実施例を添付図面を参照して詳細に説明する
。An embodiment of the present invention will be described in detail with reference to the accompanying drawings.
第1図は本発明方法を実施するのに用いられる一実施例
の構成を示す概略図。FIG. 1 is a schematic diagram showing the configuration of an embodiment used to carry out the method of the present invention.
第2図および第3図はそれぞれ第1図に示す一実施例の
動作全説明する信号波形図。2 and 3 are signal waveform diagrams each illustrating the entire operation of the embodiment shown in FIG. 1.
第4図は第1図に示す一実施例の動作を示すフローチャ
ート図。FIG. 4 is a flowchart showing the operation of the embodiment shown in FIG. 1.
第5図および第6図はそれぞれ第1図に示す一実施例に
よる実測例を示す図である。FIGS. 5 and 6 are diagrams each showing an example of actual measurement according to the embodiment shown in FIG. 1. FIG.
第1図〜第4図においてIは赤外発光体、2゜Zαま赤
外透過レンズ、3はチョッパホイール。In FIGS. 1 to 4, I is an infrared emitter, 2°Zα is an infrared transmitting lens, and 3 is a chopper wheel.
d、5.6は赤外用干渉フィルタ、2は赤外光導管。d, 5.6 is an infrared interference filter, and 2 is an infrared light pipe.
8は被測定対象物(母材)、9は測定対象物(インキ、
水)、ZZは赤外検出素子、12は増幅器、13.14
はパルス検出器、I5は同期装置、I6はい変換器、I
7は信号演算器、18は表示器、 Trはトリがパルス
V2Oはアナログ信号、tは時間、Hはサンプリング
周期、Wは水の吸収波長帯の信号、工はインキの吸収波
長帯の信号、Sは参照波長帯の信号、φは相互影響関数
、令はイ・キ又は水成分からなる測定信号ト・鴇、Dは
インキ又は水単独の信号値。8 is the object to be measured (base material), 9 is the object to be measured (ink,
water), ZZ is an infrared detection element, 12 is an amplifier, 13.14
is a pulse detector, I5 is a synchronizer, I6 is a converter, I
7 is a signal calculator, 18 is a display, Tr is a pulse, V2O is an analog signal, t is time, H is a sampling period, W is a signal in the absorption wavelength band of water, S is a signal in the reference wavelength band, φ is a mutual influence function, R is a measurement signal consisting of I, Q or water components, and D is a signal value of ink or water alone.
値(8o8oW I4マインキ又は混在の含水率である。Value (8o8oW This is the moisture content of I4 main ink or mixture.
第1図において赤外発光体2から放射される赤外全赤外
透過レンズ2で、赤外光導管2に集光する。この間にチ
ョッパホイール3上に赤外干渉フィルタ4.5.6f設
け、水の吸収波長帯のフィルタ4・インキの吸収波長帯
のフィルタ5.参照波長帯のフィルタ6を交互に、その
波長帯の光を透過させる。In FIG. 1, infrared light emitted from an infrared emitter 2 is focused into an infrared light conduit 2 by an infrared transmitting lens 2 . During this time, infrared interference filters 4, 5, and 6f are provided on the chopper wheel 3, including a filter 4 for the water absorption wavelength band and a filter 5 for the ink absorption wavelength band. The reference wavelength band filters 6 alternately transmit light in that wavelength band.
この赤外光を赤外先導管2で、測定対12 !p:49
及び被測定対象物8に導びき投光する。測定対象物9及
び被測定対象物8では赤外吸収や反射が生じ、赤外透過
レンズ10により反射光を集光し、赤外検出素子rrに
導びかれ、この赤外光の強さによって赤外検出素子lI
の抵抗が変化しそれを増幅器12で電圧増幅変換する、
この信号は第2図及び第3図のアナログ信号V8()で
あ乙。This infrared light is measured by the infrared leading tube 2 and the pair 12! p:49
The light is guided and projected onto the object to be measured 8. Infrared absorption and reflection occur in the measurement object 9 and the measurement object 8, and the reflected light is collected by the infrared transmission lens 10 and guided to the infrared detection element rr, and depending on the intensity of this infrared light, Infrared detection element II
The resistance changes and the voltage is amplified and converted by the amplifier 12.
This signal is the analog signal V8() shown in Figures 2 and 3.
一方、チョッパホイール3に設けている赤外用干渉フィ
ルタ4j5.6の回転位置を検出するパルス検出器14
と被測定対象物8の計測位置を検出するパルス検出部1
3から彦るパルス信号を同期させる同期装置I5の出力
信号は第2図及び第3図のトリガパルスTrである。こ
のトリガパルスTrとアナログ信号Vsaの各。On the other hand, a pulse detector 14 detects the rotational position of the infrared interference filter 4j5.6 provided on the chopper wheel 3.
and a pulse detection unit 1 that detects the measurement position of the object to be measured 8.
The output signal of the synchronizer I5 for synchronizing the pulse signals starting from 3 is the trigger pulse Tr shown in FIGS. 2 and 3. Each of this trigger pulse Tr and analog signal Vsa.
水の吸収波長帯の信号Wやインキの吸収波長帯の信号工
や参照波長帯の信号Sのピークに同期調整されており、
A/D変換器Z6はトリガパルスTrの信号を受け、ア
ナログ信号V8Gの各W、I 、8を取り込み、信号演
算器Z2に送られインキ膜厚とその含水率全演算して表
示器I8に表示されるようになっている。It is synchronously adjusted to the peak of the signal W in the water absorption wavelength band, the signal operator in the ink absorption wavelength band, and the signal S in the reference wavelength band.
The A/D converter Z6 receives the signal of the trigger pulse Tr, takes in each of W, I, and 8 of the analog signal V8G, is sent to the signal calculator Z2, calculates the ink film thickness and its moisture content, and displays it on the display I8. It is now displayed.
次に信号演算器12で信号処理される構成を第4図につ
いて説明するt、第3図の被測定対象物8のみのアナロ
グ信号VSGにおいて1周期Hで水の吸収波長帯の信号
W。とインキの吸収波長帯外。及び参照波長帯の信号S
o’1.取り込み記憶させて置き、第2図の被測定対象
物8及び測定対象物9の測定にセットし、アナログ信号
VSGの水の吸収波長帯の信号Wとインキの吸収波長帯
の信号了及び参照波長帯の信号s’6取り込んで、記憶
していたW、、I。−8ok、共に処理し、測定対象物
9のみの値公に変換する。Next, the configuration in which signals are processed by the signal calculator 12 will be explained with reference to FIG. 4. In the analog signal VSG of only the object to be measured 8 in FIG. 3, a signal W in the absorption wavelength band of water has one period H. and outside the absorption wavelength band of the ink. and reference wavelength band signal S
o'1. Import and store it in memory, set it for measurement of the object to be measured 8 and the object to be measured 9 in Fig. 2, and record the signal W in the water absorption wavelength band of the analog signal VSG, the signal W in the ink absorption wavelength band, and the reference wavelength. The band signal s'6 was captured and stored W,,I. -8ok, both are processed and the value of only the measurement object 9 is converted to the public value.
ここであらかじめ、インキと水膜厚によるアナログ信号
VEIGの各値I、W、Sと膜厚の関係を欄成し演算し
て、測定対象物9に混在しているインキ、水単独での値
Di算出する。Here, in advance, calculate the relationship between each value I, W, S of the analog signal VEIG due to the ink and water film thickness and the film thickness, and calculate the value of the ink and water alone mixed in the measurement object 9. Calculate Di.
単独での値りと相互影響関数φより、μ=φ1l(D)
からインキ・水膜厚μを算出し、含水率Gを得る。この
膜厚μと含水率Gを表示器I8で表示し、一連の流れを
終了する処理構成になっている。From the individual value and mutual influence function φ, μ=φ1l (D)
The ink/water film thickness μ is calculated from , and the water content G is obtained. The processing configuration is such that the film thickness μ and water content G are displayed on the display I8, and the series of steps is completed.
上記本発明の一莫施例の方法について説明する。The method according to one embodiment of the present invention will be explained.
■ 被測定対象物8のアナログ信号VSGのWo 、I
。、Soと被測定対象物8及び測定対象物9を含めたア
ナログ信号VSGのW、1.SL=豆
を基に、インキ成分からなる信号値、。Tと水成分から
なる信号値÷τ÷に変換すると、信号を正規化出来ると
共に測定対象物9のみ摘出さhl。例えば、インキ成分
からなる信号値についても同様に扱かえる。この単独信
号値りの摘出方法は次の作用で表示する、
つまり、6信号■。# I 、Wo、w、 So #S
を相互に比例信号化することにより、測定対象物9のみ
摘出される。■ Wo, I of the analog signal VSG of the object to be measured 8
. , So, W of the analog signal VSG including the object to be measured 8 and the object to be measured 9, 1. SL=signal value based on beans and composed of ink components. By converting the signal value consisting of T and the water component to ÷τ÷, the signal can be normalized and only the measurement object 9 can be extracted. For example, signal values consisting of ink components can be handled in the same way. This method of extracting the single signal value is displayed by the following effect, that is, 6 signals■. #I, Wo, w, So #S
By converting them into proportional signals, only the object 9 to be measured is extracted.
■ 測定対象物9つまり不溶液物質中のインキと水の単
独社を摘出する方法として、測定信添字I・・・インキ
、2・・・水
この方程式の中の一釣合関係式全収り出し、変形すると
、φ+t(−LLi>−φxscDx)=0 L
φ目(D2 )と表わされる。この関係においてインキ
中に水が蕪い場合、水がインキに影響を与えないからり
、=1でφ、2による膜厚は。■ As a method of extracting the independent components of ink and water in the measurement object 9, that is, the insoluble substance, the measurement subscript I...Ink, 2...Water One balance relational expression in this equation is fully satisfied. When extracted and transformed, it is expressed as φ+t (-LLi>-φxscDx)=0 L φth (D2). In this relationship, if water soaks into the ink, the water has no effect on the ink, so when =1, the film thickness is φ and 2.
インキ単独信号値D1となる。逆に水のみの場−L→−
」−
合、φ1 、(Di )=Oでφ1.(8゜了)=φ、
2(D2〕となって影響関数φ、2を介して、水単独信
号(i1¥Dat変換した膜厚は、水がインキに干渉し
た見かけのインキ膜厚を意味し、これを相殺する為に、
水がインキ伯母に干渉した信号−〇−4′を影響関数φ
1、を介して、水がインキ信s01
号に干渉した見かけのインキ膜厚で釣合せている。The ink-only signal value becomes D1. On the other hand, a place with only water -L→-
”-, φ1, (Di)=O and φ1. (8° completed)=φ,
2 (D2), and the water alone signal (i1\Dat converted film thickness means the apparent ink film thickness when water interferes with the ink, and in order to offset this, ,
The influence function φ
1, water interferes with the ink signal s01, which is balanced by the apparent ink film thickness.
この方程式全演算すると、インキと水の単独凰りか摘出
できる。If we calculate all of this equation, we can extract the ink and water separately.
次に上記本発明方法により実測した具体的実測例を示す
。Next, a specific example of actual measurement conducted using the above-described method of the present invention will be shown.
第5図は被測定対象物がCuとcrメッキの時の相互影
響関数φ、1を事例として1表示している。第5図の様
に被測定対象物か双わっても影響関数φ2□は反化無く
、安定した検1社線であることがわかる。FIG. 5 shows an example of the mutual influence function φ, 1 when the object to be measured is plated with Cu and Cr. As shown in FIG. 5, it can be seen that the influence function φ2□ does not reverse even if the object to be measured is different, and is a stable test line.
紀6図は印刷機上のインキローラが1−のあるローラを
計fiJした事例でインキと水が完全に分離して測定さ
れていることがわかる。Figure 6 shows an example in which the ink rollers on the printing press were measured using 1- rollers, and it can be seen that the ink and water were completely separated in the measurement.
以上により本発明方法によ八ば次の如A褒れた効果が奏
せられるものである。As described above, the method of the present invention provides the following advantages.
■ 従来は被測定対象物の変更に伴ないそのつど検量作
業を必要としていたが、不発明方法によれば、6信号工
。、I 、Wo 、W、Bo 。■ Conventionally, calibration work was required each time the object to be measured changed, but with the uninvented method, only 6 signal work is required. ,I,Wo,W,Bo.
Sを相互に比率信号化することにより、測定対象物のみ
摘出しているので、−回の検量作業でその値が被測定対
象物か変更になっても使用出来る。Since only the object to be measured is extracted by mutually converting S into a ratio signal, it can be used even if the value of the object to be measured is changed in the second calibration operation.
■ 不溶性液例えはインキと水の釣合関係と相互影響関
数により、測定対象物の測定信号離し、その単独信号値
り、、D、が得られる。(2) In the insoluble liquid analogy, the measurement signal of the object to be measured is separated by the balance relationship and mutual influence function of ink and water, and its single signal value, D, is obtained.
即ちインキと水の混在状態を分離し、インキと水の単独
膜厚を測定することができる。That is, it is possible to separate the mixed state of ink and water and measure the individual film thickness of ink and water.
■ 本発明方法を例えばオフセット印刷機に適用してイ
ンキ1立や水量をオンラ・fンで定量的に計測すること
により、高品質の印刷物が得られる。(2) High-quality printed matter can be obtained by applying the method of the present invention to, for example, an offset printing press and quantitatively measuring the amount of ink or water per drop online.
第1図は本発明方法を実施するのに用いられる一実施例
の購成を示す概略2図。
第2図およびwJ3図はそれぞれ第1図に示す一実施例
の動作を説明する信号波形図、d54図は第1図に示す
一実施例の動作を示すフローチャート図。
第5図および第6図はそれぞれ第1図に示す一実施例に
よる実測例を示す図である。
I・・・赤外発光体、2.10・・・赤外透過レンズ、
3・・・チョッパホイール%4.5.6・・・赤外用干
渉フィルタ、?・・・赤外先導管、8・・・被測定対象
物(母材]、9・・・測定対象物(インキ、水)。
ZZ・・・亦外検出紫子、12・・・増幅器、Z 3
、I4・・・パルス検出器、I5・・・同期装置、I6
・・・A/D変換器、I2・・・信号演算器、1B・・
・表示器。
出願人復代理人 弁理士 鈴 江 武 彦第1日
第20
第3図
4?oイ件Q
ωト(Q Lnぐのへ一〇
χ・−噛寥唆ミFIG. 1 is a schematic diagram illustrating an embodiment used to carry out the method of the present invention. 2 and wJ3 are signal waveform diagrams each explaining the operation of the embodiment shown in FIG. 1, and FIG. d54 is a flow chart diagram showing the operation of the embodiment shown in FIG. 1. FIGS. 5 and 6 are diagrams each showing an example of actual measurement according to the embodiment shown in FIG. 1. FIG. I... Infrared light emitter, 2.10... Infrared transmitting lens,
3... Chopper wheel %4.5.6... Infrared interference filter, ? ... Infrared leading tube, 8... Object to be measured (base material), 9... Object to be measured (ink, water). ZZ... Extra detection purple, 12... Amplifier, Z 3
, I4...Pulse detector, I5...Synchronizer, I6
...A/D converter, I2...Signal calculator, 1B...
·display. Applicant Sub-Agent Patent Attorney Takehiko Suzue Day 1 Day 20 Figure 3 4? oi caseQ
Claims (1)
記不溶性液の吸収波長帯に測定波長帯を設け、上記吸収
波長帯外に参照波長帯を設け、これらの各波長帯におけ
る上記母材からの各反射光を測定し、上記母材および上
記不溶性液からの各透過吸収光ないし反射光を測定し。 これらの各測定信号を相互比例補正することにより上記
母材の吸収特性を相殺することを特徴とする不溶性液の
薄膜厚測定法。[Claims] In a method for measuring the thickness of an insoluble liquid deposited on a base material, a measurement wavelength band is provided in the absorption wavelength band of the insoluble liquid, a reference wavelength band is provided outside the absorption wavelength band, and these wavelength bands are provided. Each reflected light from the base material in each wavelength band was measured, and each transmitted absorption light or reflected light from the base material and the insoluble liquid was measured. A method for measuring a thin film thickness of an insoluble liquid, characterized in that the absorption characteristics of the base material are offset by mutually proportional correction of each of these measurement signals.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12441883A JPS6017304A (en) | 1983-07-08 | 1983-07-08 | Method for measuring thickness of thin film of insoluble liquid |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12441883A JPS6017304A (en) | 1983-07-08 | 1983-07-08 | Method for measuring thickness of thin film of insoluble liquid |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6017304A true JPS6017304A (en) | 1985-01-29 |
Family
ID=14884983
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12441883A Pending JPS6017304A (en) | 1983-07-08 | 1983-07-08 | Method for measuring thickness of thin film of insoluble liquid |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6017304A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0536080A2 (en) * | 1991-10-04 | 1993-04-07 | S.C.R. Engineers Ltd. | Method for measuring liquid flow |
WO2001092820A1 (en) * | 2000-05-26 | 2001-12-06 | Infralytic Gmbh | Method and device for determining the thickness of transparent organic layers |
JPWO2007004466A1 (en) * | 2005-07-01 | 2009-01-29 | シスメックス株式会社 | Analysis equipment |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5830605A (en) * | 1981-08-18 | 1983-02-23 | Kawasaki Steel Corp | Method for measuring thickness of surface film |
-
1983
- 1983-07-08 JP JP12441883A patent/JPS6017304A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5830605A (en) * | 1981-08-18 | 1983-02-23 | Kawasaki Steel Corp | Method for measuring thickness of surface film |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0536080A2 (en) * | 1991-10-04 | 1993-04-07 | S.C.R. Engineers Ltd. | Method for measuring liquid flow |
EP0536080A3 (en) * | 1991-10-04 | 1994-10-12 | Scr Eng Ltd | Method for measuring liquid flow. |
WO2001092820A1 (en) * | 2000-05-26 | 2001-12-06 | Infralytic Gmbh | Method and device for determining the thickness of transparent organic layers |
JPWO2007004466A1 (en) * | 2005-07-01 | 2009-01-29 | シスメックス株式会社 | Analysis equipment |
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