JPS60164761U - 電子顕微鏡等の試料保持装置 - Google Patents

電子顕微鏡等の試料保持装置

Info

Publication number
JPS60164761U
JPS60164761U JP5270984U JP5270984U JPS60164761U JP S60164761 U JPS60164761 U JP S60164761U JP 5270984 U JP5270984 U JP 5270984U JP 5270984 U JP5270984 U JP 5270984U JP S60164761 U JPS60164761 U JP S60164761U
Authority
JP
Japan
Prior art keywords
sample
sample holding
main body
holding part
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5270984U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0243091Y2 (enrdf_load_stackoverflow
Inventor
亀割　健彦
榎本　進
繁 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Priority to JP5270984U priority Critical patent/JPS60164761U/ja
Publication of JPS60164761U publication Critical patent/JPS60164761U/ja
Application granted granted Critical
Publication of JPH0243091Y2 publication Critical patent/JPH0243091Y2/ja
Granted legal-status Critical Current

Links

JP5270984U 1984-04-12 1984-04-12 電子顕微鏡等の試料保持装置 Granted JPS60164761U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5270984U JPS60164761U (ja) 1984-04-12 1984-04-12 電子顕微鏡等の試料保持装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5270984U JPS60164761U (ja) 1984-04-12 1984-04-12 電子顕微鏡等の試料保持装置

Publications (2)

Publication Number Publication Date
JPS60164761U true JPS60164761U (ja) 1985-11-01
JPH0243091Y2 JPH0243091Y2 (enrdf_load_stackoverflow) 1990-11-16

Family

ID=30572903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5270984U Granted JPS60164761U (ja) 1984-04-12 1984-04-12 電子顕微鏡等の試料保持装置

Country Status (1)

Country Link
JP (1) JPS60164761U (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011514651A (ja) * 2008-03-17 2011-05-06 プロトチップス，インコーポレイテッド 電子顕微鏡にサンプルを装着するために用いられる標本ホルダ
EP2458616A3 (de) * 2010-11-29 2013-11-27 Leica Microsystems (Schweiz) AG Halterung für einen elektronenmikroskopischen Probenträger
JP2015056395A (ja) * 2013-09-13 2015-03-23 日立ハイテクノロジーズコリア株式会社 試料の断面観察に用いられる試料ホルダー及びその制御方法
US9312097B2 (en) 2007-05-09 2016-04-12 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9312097B2 (en) 2007-05-09 2016-04-12 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
JP2011514651A (ja) * 2008-03-17 2011-05-06 プロトチップス，インコーポレイテッド 電子顕微鏡にサンプルを装着するために用いられる標本ホルダ
US8853646B2 (en) 2008-03-17 2014-10-07 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
US8859991B2 (en) 2008-03-17 2014-10-14 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
USRE48201E1 (en) 2008-03-17 2020-09-08 Protochips, Inc. Specimen holder used for mounting samples in electron microscopes
EP2458616A3 (de) * 2010-11-29 2013-11-27 Leica Microsystems (Schweiz) AG Halterung für einen elektronenmikroskopischen Probenträger
JP2015056395A (ja) * 2013-09-13 2015-03-23 日立ハイテクノロジーズコリア株式会社 試料の断面観察に用いられる試料ホルダー及びその制御方法

Also Published As

Publication number Publication date
JPH0243091Y2 (enrdf_load_stackoverflow) 1990-11-16

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