JPS60155669A - Device for controlling vacuum atmosphere - Google Patents

Device for controlling vacuum atmosphere

Info

Publication number
JPS60155669A
JPS60155669A JP59012578A JP1257884A JPS60155669A JP S60155669 A JPS60155669 A JP S60155669A JP 59012578 A JP59012578 A JP 59012578A JP 1257884 A JP1257884 A JP 1257884A JP S60155669 A JPS60155669 A JP S60155669A
Authority
JP
Japan
Prior art keywords
flow rate
signal
pressure
deviation
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59012578A
Other languages
Japanese (ja)
Other versions
JPH0232352B2 (en
Inventor
Minoru Omoto
大本 稔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHINKU KIKAI KOGYO KK
Original Assignee
SHINKU KIKAI KOGYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHINKU KIKAI KOGYO KK filed Critical SHINKU KIKAI KOGYO KK
Priority to JP59012578A priority Critical patent/JPS60155669A/en
Publication of JPS60155669A publication Critical patent/JPS60155669A/en
Publication of JPH0232352B2 publication Critical patent/JPH0232352B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/52Controlling or regulating the coating process
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J3/00Processes of utilising sub-atmospheric or super-atmospheric pressure to effect chemical or physical change of matter; Apparatus therefor
    • B01J3/006Processes utilising sub-atmospheric pressure; Apparatus therefor
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process

Abstract

PURPOSE:To provide a titled device which adjusts easily a vacuum atmosphere and enables simplification of the device by the constitution in which the introducing amt. of a gas is selectively controlled by the deviation between the detected value of the flow rate of the gas to a vacuum vessel or the pressure of the vacuum vessel and respective set values. CONSTITUTION:The flow rate of the gas to be supplied via a flow rate control valve 13 to a vacuum vessel 11 to be evacuated by a vacuum pump (not shown) is detected by a flow rate sensor 21 and is outputted to the 1st comparator circuit 23 where the detected flow rate value and the set value signal from a flow rate setting circuit 25 are compared and the deviation is detected. On the other hand, the detection signal of the pressure in the vessel 11 detected by a vacuum gage 29 is outputted to the 2nd comparator circuit 31 where the pressure detection signal and the pressure set signal from a pressure setting circuit 35 are compared and the deviation is detected. The valve 13 is then operated via a valve actuating member 19 by a selecting switch 27 having contact points 27a, b, c in such a way that the deviation of the flow rate or the pressure is selectively made zero. The inflow rate of the gas to the vacuum vessel 11 is thus adjusted.

Description

【発明の詳細な説明】 この発明は、真空槽の真空雰囲気をガスの導入流量およ
び圧力のいずれを基準にしても制御することのできる真
空雰囲気制御装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a vacuum atmosphere control device that can control the vacuum atmosphere of a vacuum chamber based on both the flow rate and pressure of gas introduced.

真空槽内にAr、02.N2.SiH4,5iCQ4な
どのガスを導入して真空雰囲気を調整することは、スパ
ッタリング装置、イオンブレーティング装置、反応性真
空蒸着装置、プラズーマ発生装置など広く行なわれてい
る。このような装置においては、真空槽内の圧力を基準
として、あるいはガス流量を一定にして真空槽内にガス
が導入されており、自動圧力調整器(A P C)や自
動流量調整器<A F C)が用いられてきた。
Ar in the vacuum chamber, 02. N2. Adjusting a vacuum atmosphere by introducing a gas such as SiH4 or 5iCQ4 is widely used in sputtering equipment, ion blating equipment, reactive vacuum evaporation equipment, plasma generation equipment, and the like. In such devices, gas is introduced into the vacuum chamber based on the pressure within the vacuum chamber or with a constant gas flow rate, and an automatic pressure regulator (APC) or automatic flow rate regulator <A FC) has been used.

しかしながら、形成すべき薄膜の種類、気相反応の種類
、放電条件などによって、あるいは繰返し使用による真
空槽内の排出ガス量の変化を考慮すると、所望の薄膜特
性などを得るためには、圧力を基準にしてガスを導入し
真空雰囲気を制御するのが適当である場合と、流量を基
準としてガスを導入して真空雰囲気を制御するのが好ま
しい場合とがあることが判ってきた。この要請を満足し
て双方の制御を可能にするには、自動圧力調整器と自動
流量調整器の2つの調整器を1つの真空槽に設けること
が必要となるが、それぞれの調整器に関してガス導入口
やガス流量制御バルブを要することから、装置が複雑、
高価となるばかりか、リークが発生する原因となる個所
も多くなり、保守管理も煩雑となるという問題が生じる
However, depending on the type of thin film to be formed, the type of gas phase reaction, discharge conditions, etc., or considering changes in the amount of exhaust gas in the vacuum chamber due to repeated use, it is difficult to increase the pressure in order to obtain the desired thin film characteristics. It has been found that there are cases where it is appropriate to introduce gas and control the vacuum atmosphere based on the flow rate, and there are cases where it is preferable to introduce the gas and control the vacuum atmosphere based on the flow rate. In order to satisfy this request and enable control of both, it is necessary to install two regulators, an automatic pressure regulator and an automatic flow regulator, in one vacuum chamber. The equipment is complicated because it requires an inlet and a gas flow control valve.
Problems arise in that not only is it expensive, there are many locations where leaks can occur, and maintenance management is also complicated.

この発明はこのような観点からなされたものであり、使
用目的によって、圧力あるいはガス流量のいずれを基準
としても簡便に真空雰囲気を調整することのできる真空
雰囲気制御装置を提供することを目的とする。
The present invention has been made from this point of view, and it is an object of the present invention to provide a vacuum atmosphere control device that can easily adjust the vacuum atmosphere based on either pressure or gas flow rate depending on the purpose of use. .

すなわち、この発明の真空雰囲気制御装置は、流量セン
サからの出力信号と設定流量信号とを比較し偏差を検知
して第1の動作信号を出力し、真空計からの出力信号と
設定圧力信号とを比較し偏差を検知して第2の動作信号
を出力する比較回路と、 真空槽へのガス流量を調整する流量調整バルブど。
That is, the vacuum atmosphere control device of the present invention compares the output signal from the flow rate sensor and the set flow rate signal, detects a deviation, outputs the first operation signal, and compares the output signal from the vacuum gauge with the set pressure signal. A comparison circuit that compares the values, detects deviations, and outputs a second operating signal, and a flow rate adjustment valve that adjusts the gas flow rate to the vacuum chamber.

前記第1または第2の動作信号を受けて偏差量が許容量
以下となるように前記流量制御バルブの開度を制御する
制御機構と、 前記第1または第2の動作信号を選択的に前記制御機構
に供給する信号切換機構とを有することを特徴とする。
a control mechanism that receives the first or second operating signal and controls the opening degree of the flow rate control valve so that the deviation amount is less than or equal to an allowable amount; It is characterized by having a signal switching mechanism that supplies signals to the control mechanism.

以下、添付図面に沿ってこの発明をさらに詳細に説明す
る。
The present invention will be described in more detail below with reference to the accompanying drawings.

第1図はこの発明の実施例を示す説明図であり、真空ポ
ンプにより排気される真空槽11には流量制御バルブ1
3が設けられ、このバルブ13の開度を制御することに
よりライン15からライン17を経て所望の流量で真空
槽11にガスを供給するようになっている。
FIG. 1 is an explanatory diagram showing an embodiment of the present invention, in which a flow control valve 1 is provided in a vacuum chamber 11 that is evacuated by a vacuum pump.
3 is provided, and by controlling the opening degree of this valve 13, gas is supplied to the vacuum chamber 11 from a line 15 through a line 17 at a desired flow rate.

流量センサ21、第1の比較回路23および流量設定回
路25は流量制御システムを構成する。
The flow rate sensor 21, the first comparison circuit 23, and the flow rate setting circuit 25 constitute a flow rate control system.

切換スイッチ27の接点27a、27bとが接続されて
流量モードとなると、流量設定回路25でポテンショメ
ータなどにより設定された電圧として、流量設定回路2
5から設定流量信号が第1の比較回路23に送られる。
When the contacts 27a and 27b of the changeover switch 27 are connected to enter the flow rate mode, the voltage set by the potentiometer or the like in the flow rate setting circuit 25 is set by the flow rate setting circuit 2
5, the set flow rate signal is sent to the first comparison circuit 23.

第1の比較回路23では流量計21からの流量出力信号
と設定流量信号とが比較されて偏差が検知され、第1の
比較回路23から偏差に応じて第1の動作信号が出力さ
れ、この動作信号によりサーボモータなどのバルブ作動
部材19が作動して、設定流量信号と流量出力信号との
偏差量が零以下となるように制御バルブ13の開度が調
節される。
The first comparison circuit 23 compares the flow rate output signal from the flowmeter 21 and the set flow rate signal to detect a deviation, and the first comparison circuit 23 outputs a first operation signal according to the deviation. A valve operating member 19 such as a servo motor is actuated by the operation signal, and the opening degree of the control valve 13 is adjusted so that the amount of deviation between the set flow rate signal and the flow rate output signal is equal to or less than zero.

一方、真空計29、第2の比較回路31および圧力設定
回路33は圧力制御システムを構成する。
On the other hand, the vacuum gauge 29, the second comparison circuit 31, and the pressure setting circuit 33 constitute a pressure control system.

切換えスイッチ27の接点27aと27cとが接続され
て圧力モードとなると、圧力設定回路33でポテンショ
メータなどにより設定され電圧として、圧力設定回路3
3から設定圧力信号が第2の比較回路31に送られる。
When the contacts 27a and 27c of the changeover switch 27 are connected to enter the pressure mode, the voltage is set by a potentiometer or the like in the pressure setting circuit 33.
3, the set pressure signal is sent to the second comparison circuit 31.

第2の比較回路31では真空計29からの圧力出力信号
と設定圧力信号とが比較されて、偏差が検知され第2の
比較回路31から偏差に応じて第2の動作信号が出力さ
れ、この動作信号によりバルブ作動部材19が作動して
、設定圧力信号と圧力出力信号との偏差量が零になるよ
うに流量制御バルブ13の開度が調整される。この圧力
制御システムでは流量制御バルブの開度をPID制御す
ることが好ましい。
The second comparison circuit 31 compares the pressure output signal from the vacuum gauge 29 with the set pressure signal, detects a deviation, and outputs a second operation signal from the second comparison circuit 31 in accordance with the deviation. The valve operating member 19 is actuated by the operation signal, and the opening degree of the flow control valve 13 is adjusted so that the amount of deviation between the set pressure signal and the pressure output signal becomes zero. In this pressure control system, it is preferable to PID control the opening degree of the flow rate control valve.

また、上記実施例では第1および第2の2つの比較回路
を用いて、それぞれ流量制御システムおよび圧力制御シ
ステムを作動せしめる場合について説明したが1つの比
較回路により流量出力信号と設定流量信号との比較およ
び圧力出力信号、設定圧力信号との比較の双方を行なう
ようにしてもよい。第2図はその実施例を示すブロック
図であり、第1図の第1および第2の比較回路の代りに
比較回路24を用いて切換えスイッチ28.30の接続
位置を変更した以外は第1図に示したものと同様である
。切換えスイッチ28.30においてそれぞれ接点28
aと接点28b、接点30aと接点30bとが接続され
ると流量設定回路25からの設定流量信号が比較回路2
4に送られ、この信号と流量センサ21からの出力信号
が比較されて偏差が検知され、比較回路24から第1の
動作信号が出力されてバルブ作動部材19により流量制
御バルブ13の開度が制御される。一方、切換えスイッ
チ28.30のそれぞれ接点28aと接点28c、接点
30aと接点30cとが接続されると、真空計29の出
力信号が比較回路24に入力され、この信号と圧力設定
回路33からの設定圧力信号とが比較されて第2の動作
信号が出力され、流量調整バルブ13の開度が制御され
る。
Further, in the above embodiment, the case where the first and second comparison circuits are used to operate the flow rate control system and the pressure control system, respectively, is explained, but one comparison circuit is used to compare the flow rate output signal and the set flow rate signal. Both the comparison and the comparison with the pressure output signal and the set pressure signal may be performed. FIG. 2 is a block diagram showing this embodiment, except that a comparator circuit 24 is used in place of the first and second comparator circuits in FIG. It is similar to that shown in the figure. Contacts 28 at changeover switches 28 and 30 respectively
When the contact a and the contact 28b are connected, and the contact 30a and the contact 30b are connected, the set flow rate signal from the flow rate setting circuit 25 is transmitted to the comparison circuit 2.
4, this signal is compared with the output signal from the flow rate sensor 21 to detect a deviation, and the comparison circuit 24 outputs a first operation signal, and the valve operating member 19 adjusts the opening degree of the flow rate control valve 13. controlled. On the other hand, when the contacts 28a and 28c and the contacts 30a and 30c of the changeover switches 28 and 30 are connected, the output signal of the vacuum gauge 29 is input to the comparison circuit 24, and this signal and the pressure setting circuit 33 are connected. The set pressure signal is compared with the second operating signal, and the opening degree of the flow rate adjustment valve 13 is controlled.

第3図はマスフローコントローラ35を用いたこの発明
の他の実施例を示すブロック図である。
FIG. 3 is a block diagram showing another embodiment of the present invention using a mass flow controller 35.

マスフローコントローラ35は、流量制御バルブ13、
バルブ作動部材19、流量センサ21および第1の比較
回路23を備えている。スイッチ32の接点32aと接
点32bとが接続されると、流量設定回路25からの設
定流量信号が第1の比較回路23に入力し、流量センサ
21からの出力信号との偏差を検知して第1の動作信号
をバルブ作動部材に出力し、偏差量が零になるように流
量制御バルブ13の開度が調整される。一方、スイッチ
32の接点32aと接点32cとが接続されると、真空
計29からの出力信号と圧力設定回路33からの設定圧
力信号が第2の比較回路31で比較されて偏差が検知さ
れ、マスフローコントローラ35の第2比較回路23を
経て第2の動作信号がバルブ作動部材19に出力され、
偏差量が零になるように流量制御バルブ13の開度が調
整される。
The mass flow controller 35 includes the flow rate control valve 13,
It includes a valve actuation member 19, a flow rate sensor 21, and a first comparison circuit 23. When the contacts 32a and 32b of the switch 32 are connected, the set flow rate signal from the flow rate setting circuit 25 is input to the first comparator circuit 23, which detects the deviation from the output signal from the flow rate sensor 21 and compares the set flow rate signal with the output signal from the flow rate sensor 21. 1 is output to the valve operating member, and the opening degree of the flow rate control valve 13 is adjusted so that the amount of deviation becomes zero. On the other hand, when the contacts 32a and 32c of the switch 32 are connected, the output signal from the vacuum gauge 29 and the set pressure signal from the pressure setting circuit 33 are compared in the second comparison circuit 31, and a deviation is detected. A second operation signal is output to the valve actuation member 19 via the second comparison circuit 23 of the mass flow controller 35,
The opening degree of the flow rate control valve 13 is adjusted so that the amount of deviation becomes zero.

以上のようにこの発明の真空雰囲気制御装置によれば、
真空槽へのガスの流量を制御することのできる流量制御
バルブを設け、切換えスイッチなどを用いて流量比較信
号および圧力比較信号の双方により択一的に上記流量バ
ルブを制御することにより1つの流量制御バルブで流量
を基準として、あるいは圧力を基準として真空雰囲気を
制御することができる。よって、真空槽へのガス導入に
用いる流量制御バルブやガス導入口を1つ設けるだけで
、圧力あるいはガス流入量のいずれを基準としても真空
雰囲気を調整することができ、装置の簡略化が可能であ
る。また、リークを起こす可能性のある箇所もそれだけ
減少し、真空装置の保守管理も容易となる。
As described above, according to the vacuum atmosphere control device of the present invention,
A flow rate control valve that can control the flow rate of gas to the vacuum chamber is provided, and a changeover switch or the like is used to selectively control the flow rate valve based on both a flow rate comparison signal and a pressure comparison signal, thereby achieving one flow rate. A control valve can control the vacuum atmosphere based on flow rate or pressure. Therefore, by simply providing one flow control valve or gas inlet for introducing gas into the vacuum chamber, the vacuum atmosphere can be adjusted based on either pressure or gas inflow rate, simplifying the equipment. It is. Furthermore, the number of locations where leaks may occur is reduced accordingly, and maintenance management of the vacuum equipment becomes easier.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図および第3図はこの発明の真空雰囲気制
御装置の実施例の構成を示すブロック図である。 図中、11は真空槽、13は流量制御バルブ、19はバ
ルブ作動部材、21は流量センサ、23は第1の比較回
路、24は比較回路、25は流量設定回路、27は切換
スイッチ、29は真空計、31は第2の比較回路、33
は圧力設定回路、35はマスフローコントローラである
。 特許出願人 真空器械工業株式会社 代理人 弁理士 大 原 拓 也 刑3図
FIGS. 1, 2, and 3 are block diagrams showing the configuration of an embodiment of the vacuum atmosphere control device of the present invention. In the figure, 11 is a vacuum chamber, 13 is a flow rate control valve, 19 is a valve operating member, 21 is a flow rate sensor, 23 is a first comparison circuit, 24 is a comparison circuit, 25 is a flow rate setting circuit, 27 is a changeover switch, 29 is a vacuum gauge, 31 is a second comparison circuit, 33
35 is a pressure setting circuit and a mass flow controller. Patent applicant: Shinku Kikai Kogyo Co., Ltd. Representative: Patent attorney: Takuya Ohara Figure 3

Claims (1)

【特許請求の範囲】 流量センサからの出力信号と設定流量信号とを比較し偏
差を検知して第1の動作信号を出力し、真空計からの出
力信号と設定圧力信号とを比較し偏差を検知して第2の
動作信号を出力する比較回路と。 真空槽へのガス流量を調整する流量調整バルブと、 前記第1または第2の動作信号を受けて偏差量が許容量
以下となるように前記流量制御バルブの開度を制御する
制御機構と、 前記第1または第2の動作信号を選択的に前記制御機構
に供給する信号切換機構とを有することを特徴とする真
空雰囲気制御装置。
[Claims] Compare the output signal from the flow rate sensor and the set flow rate signal to detect a deviation and output a first operation signal, and compare the output signal from the vacuum gauge and the set pressure signal to detect the deviation. and a comparison circuit that detects and outputs a second operation signal. a flow rate adjustment valve that adjusts the gas flow rate to the vacuum chamber; a control mechanism that receives the first or second operation signal and controls the opening degree of the flow rate control valve so that the deviation amount is equal to or less than an allowable amount; A vacuum atmosphere control device comprising: a signal switching mechanism that selectively supplies the first or second operation signal to the control mechanism.
JP59012578A 1984-01-26 1984-01-26 Device for controlling vacuum atmosphere Granted JPS60155669A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59012578A JPS60155669A (en) 1984-01-26 1984-01-26 Device for controlling vacuum atmosphere

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59012578A JPS60155669A (en) 1984-01-26 1984-01-26 Device for controlling vacuum atmosphere

Publications (2)

Publication Number Publication Date
JPS60155669A true JPS60155669A (en) 1985-08-15
JPH0232352B2 JPH0232352B2 (en) 1990-07-19

Family

ID=11809235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59012578A Granted JPS60155669A (en) 1984-01-26 1984-01-26 Device for controlling vacuum atmosphere

Country Status (1)

Country Link
JP (1) JPS60155669A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61259746A (en) * 1985-05-15 1986-11-18 Tokuda Seisakusho Ltd Apparatus for opening and closing vacuum container
JPS62152529A (en) * 1985-12-27 1987-07-07 Hitachi Ltd Treatment apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03126273U (en) * 1990-03-28 1991-12-19

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61259746A (en) * 1985-05-15 1986-11-18 Tokuda Seisakusho Ltd Apparatus for opening and closing vacuum container
JPS62152529A (en) * 1985-12-27 1987-07-07 Hitachi Ltd Treatment apparatus

Also Published As

Publication number Publication date
JPH0232352B2 (en) 1990-07-19

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