JPS60137848A - Glass composition for sintered silicon carbide - Google Patents

Glass composition for sintered silicon carbide

Info

Publication number
JPS60137848A
JPS60137848A JP58244015A JP24401583A JPS60137848A JP S60137848 A JPS60137848 A JP S60137848A JP 58244015 A JP58244015 A JP 58244015A JP 24401583 A JP24401583 A JP 24401583A JP S60137848 A JPS60137848 A JP S60137848A
Authority
JP
Japan
Prior art keywords
sintered body
silicon carbide
glass
glass composition
composition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58244015A
Other languages
Japanese (ja)
Inventor
Hideo Suzuki
秀夫 鈴木
Shigeru Takahashi
茂 高橋
Tetsuo Kosugi
小杉 哲夫
Satoru Ogiwara
荻原 覚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58244015A priority Critical patent/JPS60137848A/en
Publication of JPS60137848A publication Critical patent/JPS60137848A/en
Pending legal-status Critical Current

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  • Glass Compositions (AREA)
  • Non-Adjustable Resistors (AREA)
  • Inorganic Insulating Materials (AREA)

Abstract

PURPOSE:To provide the titled composition composed of PbO, ZnO, B2O3, silica, alumina and P2O5 at specific ratios, and having high adhesivity to a sintered material composed mainly of SiC and having excellent hermetic sealing property. CONSTITUTION:A glass composition having a softening point of 500-570 deg.C and a thermal expansion coefficient of 40-60X10<-7>/ deg.C is prepared by mixing 10- 50(wt)% PbO, 20-50% ZnO, <=40% B2O3, <=30% silica, and if necessary, <=10% alumina and/or <=5% P2O5, heating and melting the mixture, and quenching and pulverizing the molten composition. The glass composition is mixed with an organic binder (e.g. a terpineol solution of nitrocellulose) in the form of paste, applied to a thick-film resistor formed on the surface of a sintered substrate composed mainly of SiC, and baked to obtain a coating film of the glass composition.

Description

【発明の詳細な説明】 〔発明の詳細な説明〕 本発明は、新規な炭化ケイ素焼結体用ガラス組成物に係
り、特に炭化ケイ素焼結体からなる基体表向に形成され
た厚膜抵抗体表面に被覆を有する混成集積回路装置及び
セラミックス封止された半ゴ11体末子を有するセラミ
ックスパッケージ半導体装置等の電気的装置に関する。
[Detailed Description of the Invention] [Detailed Description of the Invention] The present invention relates to a novel glass composition for a silicon carbide sintered body, and particularly to a thick film resistor formed on the surface of a substrate made of a silicon carbide sintered body. The present invention relates to electrical devices such as a hybrid integrated circuit device having a coating on its body surface and a ceramic package semiconductor device having an 11-piece semiconductor device sealed with ceramics.

〔発明の背景〕[Background of the invention]

1プ膜混成東積回路ンま、一般にセラミックス基板上に
スクリーン印刷および焼成技術によって形成された導体
や抵抗体などの素子に、半導体素子およびその他の電子
部品と接合することによって構成されている。そのセラ
ミックス基板には従来アルミナが主として使用されてき
た。それに対こでアルミナに比べ約10倍も大きな熱伝
導性を有し弔積回路用基板として優ると期待される電気
絶縁性の炭化ケイ素セラミックスが開発され、基板とし
ての検討が進められている。
A single film hybrid Toshiba circuit is generally constructed by bonding semiconductor elements and other electronic components to elements such as conductors and resistors formed on a ceramic substrate by screen printing and firing techniques. Conventionally, alumina has been mainly used for the ceramic substrate. In response, electrically insulating silicon carbide ceramics, which have thermal conductivity approximately 10 times greater than alumina and are expected to be superior as substrates for capacitive circuits, have been developed and are being studied as substrates.

一般に酸化物系セラミックスに適用されているガラスと
して特開昭49−61216に知られている鉛硼珪酸塩
ガラスが用いられており、そのガラスが溶融しセラミッ
クスと反応することによって接着すると考えられている
。しかしこのガラス浴融体は小さい熱膨張係数(40X
 10−7/C) 41持ち、かつ酸化物同志の反応の
少ない炭化ケイ素焼結体のような物体とは、熱膨張の違
いによるクラックの発生、あるいはガラスに含有される
還元性酸化物(例えばPbO* BizOs、cao)
と炭化ケイ素焼結体の反応による反応ガス(CO又はC
Oz )の発生により、多数の気泡を生じて接合不良に
なるなどの欠点を有することを発明者らは見い出した。
Generally, lead borosilicate glass known from Japanese Patent Application Laid-open No. 49-61216 is used as a glass applied to oxide ceramics, and it is thought that the glass melts and reacts with ceramics to bond them. There is. However, this glass bath melt has a small coefficient of thermal expansion (40X
10-7/C) An object such as a silicon carbide sintered body that has 41 and has little reaction between oxides may cause cracks to occur due to differences in thermal expansion, or reduce oxides contained in glass (e.g. PbO* BizOs, cao)
A reaction gas (CO or C
The inventors have discovered that the generation of 0z) causes a number of bubbles, resulting in poor bonding.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、炭化ケイ素を主成分とする焼結体から
なる基体と接着性が良く、かつ耐気密性にすぐれたガラ
ス組成物を提供する。特に本発明の目的は室温で0.2
5m/Crr1・卸−C以上の熱伝導率及び室温で4 
X 10−’ /C以下の熱膨張率を有し、室温で10
’Ω・on以上の′電気絶縁性をゼする8iCセラミッ
クス焼結体から基体に対し接着性が良く、かつ耐気密性
にすぐれた電気的装置を提供するにある。
An object of the present invention is to provide a glass composition that has good adhesion to a substrate made of a sintered body containing silicon carbide as a main component and has excellent airtightness. In particular, the object of the present invention is to
Thermal conductivity of 5m/Crr1・Wholesale-C or higher and 4 at room temperature
It has a coefficient of thermal expansion of less than
An object of the present invention is to provide an electrical device made of an 8iC ceramic sintered body having an electrical insulation property of Ω·on or more, which has good adhesion to a substrate and has excellent airtightness.

〔発明の概要〕[Summary of the invention]

本発明は、炭化ケイ素を主成分とする焼結体からなる基
体表面に形成されるガラス組成物であって、該ガラス組
成物はその溶解前の組成が重量で酸化鉛(PbO)10
〜35%、酸化亜鉛(Z’n0)20〜50%と、酸化
ホウ素30%以下及びシリカ30%以下の1種以上とを
含むことを特徴とする。
The present invention relates to a glass composition formed on the surface of a substrate made of a sintered body mainly composed of silicon carbide, the glass composition having a composition before melting of 10 lead oxide (PbO) by weight.
~35%, zinc oxide (Z'n0) 20~50%, and one or more of boron oxide (30% or less) and silica (30% or less).

即ち、炭化ケイ素を主成分とする焼結体に対し、発泡が
無く、亀裂が発生せず、接着性の良いガラスには、炭化
ケイ素焼結体の熱膨張係数に近い熱膨張係数のガラスで
、かつ焼成時に炭化ケイ素焼結体の分解により発生する
ガス(例えばCO。
In other words, a glass with a thermal expansion coefficient close to that of the silicon carbide sintered body that does not foam, crack, and has good adhesion to the sintered body whose main component is silicon carbide is required. , and gases (e.g. CO) generated by decomposition of the silicon carbide sintered body during firing.

C02)の発生を出来るだけ抑えるために融点の低いガ
ラスで、しかもガラス自身によるガスの発生の無いガラ
スであること、の3点に着目して検討を重ねた。従来、
ガラスの融点を下げるに効果的な酸化物としてPbOが
あり、低融点ガラスの主成分として用いられている。し
かしPbO系ガラスは、融点を下げるけれど熱膨張係数
秀二犬へくし、かつ、溶融時に炭化ケイ素焼結体と反応
カスを発生する問題があった。そこで、熱膨張係数を小
さくシ、かつ反応ガスを抑制する働きを持った酸化亜鉛
の添加と、その組成の領域を見出すことにより上記問題
を解決したものである。
In order to suppress the generation of CO2) as much as possible, we focused on the following three points: the glass must have a low melting point, and the glass itself must not generate gas. Conventionally,
PbO is an oxide that is effective in lowering the melting point of glass, and is used as the main component of low-melting glass. However, PbO glass lowers the melting point but has a thermal expansion coefficient of only 100%, and also has the problem of generating reaction scum with the silicon carbide sintered body when melted. Therefore, the above problem was solved by adding zinc oxide, which has a small coefficient of thermal expansion and has the function of suppressing reactive gases, and by finding a range of its composition.

ガラス組成物の配合比としてPb010〜501q:5
6、Z n 020〜50重量%と、B 20 s≦3
0重量%及び5ift≦30咀1t’l:チの1種以上
とするもので、PbOの含有′;kを50係より多くす
ると炭化ケイ素焼結体の界面に発%mlや割れが発生し
て接着強度を低下させ、ZIIOを20チより少なくす
ると熱膨張係数が大きくなり、ガラスに割れが発生し接
着性が害される。PbOは特に10〜35チが好ましい
。また上記ガラス成分KA l、x OxやP2O5を
添加されても良く、これらの添加は炭化ケイ素・焼結体
罠対する接合性の点で有利であり、その添加量はA40
3≦10 、 P205≦5が良い。また活性な酸化物
や化合物の混入は炭化ケイ素に対する接着性を悪くする
。特にCab。
The blending ratio of the glass composition is Pb010-501q:5
6, Z n 020-50% by weight and B 20 s≦3
0% by weight and 5ift≦30〉1t'l: If the content of PbO is greater than 50%, %ml or cracks will occur at the interface of the silicon carbide sintered body. If ZIIO is less than 20 inches, the coefficient of thermal expansion will increase, causing cracks in the glass and impairing the adhesion. PbO is particularly preferably 10 to 35 inches. Further, the above-mentioned glass components KAl,xOx and P2O5 may be added, and these additions are advantageous in terms of bondability to silicon carbide/sintered body traps, and the amount of addition is greater than A40.
3≦10 and P205≦5 are good. Furthermore, the incorporation of active oxides and compounds deteriorates the adhesion to silicon carbide. Especially Cab.

T i O,Cu’Q、 Cu P、 BP、 Fe2
O3は悪い。
T i O, Cu'Q, Cu P, BP, Fe2
O3 is bad.

特に、PbO25〜35qり、Z n 025〜45 
%、8 r 0215〜25%及び820210〜20
%が好ましい。
In particular, PbO25~35q, Zn025~45
%, 8 r 0215-25% and 820210-20
% is preferred.

また本発明においては有機結合剤として、例えばエチル
セルローズやニトロセルローズ等の繊維素誘導体、メタ
クリル酸エステルやアクリル酸エステルの重合体のよう
な、焼成条件において容易に分解し完全に揮散する重合
体が使用される。さらに本発明においては、結合剤を溶
解して前記ガラス粉末をよく濡らし得る有機溶剤が用い
られ、例えばグリコールエーテル類やエステル、ケトン
、テレピネオールなどが挙げられる。前記の有機結合剤
と溶媒の配合量は、ペーストの印刷あるいは形成および
その後焼成までの工程において必要な作業性に応じて選
択され、例えばガラス粉末組成物100に対して、エチ
ルセルローズ1〜15重槍部、テレピネオール100重
量部はどで良い、配合方法は何ら限定されず慣用の装置
を利用して、ガラス粉末に有機結合溶液を加えて混練し
て均一な分散体とすることができる。
In addition, in the present invention, as the organic binder, polymers that easily decompose and completely volatilize under firing conditions, such as cellulose derivatives such as ethylcellulose and nitrocellulose, and polymers of methacrylic acid ester and acrylic acid ester, are used. used. Furthermore, in the present invention, an organic solvent is used that can dissolve the binder and wet the glass powder well, and examples thereof include glycol ethers, esters, ketones, and terpineol. The blending amount of the organic binder and solvent is selected depending on the workability required in the process of printing or forming the paste and the subsequent firing. The amount of 100 parts by weight of terpineol may be used.The blending method is not limited at all, and the organic binding solution can be added to the glass powder and kneaded to form a uniform dispersion using a conventional device.

本発明のガラス組成物は、熱膨張係数が40〜60X1
0−’/Cであり、炭化ケイ素を主成分とする焼結体の
40X10−’/Cに近い値を示しており、したがって
焼成後ガラスに亀裂が入らない。
The glass composition of the present invention has a coefficient of thermal expansion of 40 to 60X1
0-'/C, which is close to 40X10-'/C of a sintered body containing silicon carbide as a main component, and therefore the glass does not crack after firing.

更にこのガラス組成物は、公知の技法によって炭化ケイ
素焼結体に適用され焼成される。このガラス組成物の軟
化温度が500〜570Cなので、焼成温度は溶融軟化
する570〜620Cで、圧縮空気中で行われることが
好ましい。はけ塗りスクリーン印刷法等により塗布する
ことができる。
Further, this glass composition is applied to a silicon carbide sintered body and fired by known techniques. Since the softening temperature of this glass composition is 500 to 570C, the firing temperature is preferably 570 to 620C, at which it melts and softens, and is preferably carried out in compressed air. It can be applied by a brushing screen printing method or the like.

本発明に係る炭化ケイ素を主成分とする焼結体は、特に
B e又は+38化合物をBeで0.1〜3.5重量%
含有し、理論密度の90チ以上、特に95チ以上の密度
を有し、室温で0.25 cal / cm−3eC1
・C以上、特に、0.4 cal / crn ・Be
Ce C以上の熱伝導率、107Ω’m以上、特に、1
0I0Ω” on以上の電気抵抗率を有するものが好ま
しい。
The sintered body containing silicon carbide as a main component according to the present invention particularly contains 0.1 to 3.5% by weight of Be or +38 compound.
Contains a theoretical density of 90 cm or higher, particularly 95 cm or higher, and has a density of 0.25 cal/cm-3eC1 at room temperature.
・C or higher, especially 0.4 cal/crn ・Be
Thermal conductivity of Ce C or higher, 107Ω'm or higher, especially 1
It is preferable to have an electrical resistivity of 0I0Ω”on or more.

本発明は、炭化ケイ素を主成分とする焼結体からなる基
体の表面に厚11q抵抗体が形成され、その低抗体の表
面がガラス膜で被われているものVこおいて、ガラス膜
はその溶解前の組成が重量で、Pb010〜5(1%、
Zn020〜50%と、820840%以下及び5iC
h30%以下の1種以上とを含むことを特徴とする混成
集積回路装置にある。本発明に係る厚膜抵抗体には従来
のP b 0−11203−8 i 02系ガラスが用
いられる。
In the present invention, a resistor with a thickness of 11q is formed on the surface of a substrate made of a sintered body mainly composed of silicon carbide, and the surface of the low antibody is covered with a glass film. The composition before dissolution is by weight, Pb010~5 (1%,
Zn020~50%, 820840% or less and 5iC
A hybrid integrated circuit device characterized by containing at least one type of h30% or less. Conventional P b 0-11203-8 i 02 glass is used for the thick film resistor according to the present invention.

本箪明rJ、炭化ケイ素を主成分とする基体に載V4L
された半纏体−に子がセラミックス焼結体からなる封止
体によって封止されているものにおいて、基体と封止体
とは溶解前の組成が重量でPb010〜’50 %、Z
 n 020〜50 %と、B20840qり以下及び
5i0230チ以下の1.1)11以上とを陰むガラス
によって接合されていることを特徴とするセラミックス
パッケージ半導体装置にある。
Honkenmei rJ, V4L mounted on a substrate whose main component is silicon carbide
In the case where the semi-enclosed body is sealed with a sealing body made of a ceramic sintered body, the composition of the base body and the sealing body before melting is Pb010~'50% by weight, Z
A ceramic package semiconductor device characterized in that the ceramic package semiconductor device is bonded by glass containing n 020 to 50% and 1.1) 11 or more of B20840q or less and 5i0230 or less.

封止体にはアルミナ、炭化ケイ素、ムライト・焼結体等
が用いられる。炭化ケイ素は前述と同様の組成のものを
用いることができる。この半導体装置にはリードフレー
ムが設けられるが、このリードフレームには一般にファ
ーニコが用いられ、同様のガラスによって接合される。
Alumina, silicon carbide, mullite/sintered body, etc. are used for the sealing body. Silicon carbide having the same composition as described above can be used. This semiconductor device is provided with a lead frame, and this lead frame is generally made of Farnico and is bonded with a similar glass.

史に、基体には、金属製放熱フィンが設けられ、At製
が用いられる。
Historically, the base body is provided with metal radiation fins, and is made of At.

〔発明の実施例〕[Embodiments of the invention]

(実施例1) 第1表に示すガラス組成の原料鉛末を秤量し、V型ミキ
サーを用いて混合した。該混合鉛末をアルミナルツボに
入れ、゛電気加熱炉で1200tZ’に加熱、溶融し、
溶融物を水中に流1し込み4(1、速冷却させて4状の
ガラスを作製した。史に該ガラス全メノウ製ボールミル
で十分に粉砕して分末状にした。
(Example 1) Raw material lead powder having a glass composition shown in Table 1 was weighed and mixed using a V-type mixer. The mixed lead powder was placed in an aluminum crucible, heated to 1200 tZ' in an electric heating furnace, and melted.
The melt was poured into water and rapidly cooled to produce a four-shaped glass.The glass was thoroughly ground in a ball mill made entirely of agate to form a powder.

該ガラス粉末に、有機結合剤としてエチルセルローズを
濃度6係テレピネオール溶液を、ガラス粉末100重量
部に対し、18II1.線部の割合で添加し混練して、
スラリー状のペーストを調整し7た。
To the glass powder, a solution of terpineol with a concentration of 6 and ethyl cellulose as an organic binder was added to 100 parts by weight of the glass powder, and 18II1. Add and knead at the proportion of the line part,
A slurry paste was prepared.

次に予め脱脂洗條処理したベリリア(He O)2チ含
有の炭化ケイ素焼結体からなる基板の上に、1;亥ガラ
スペーストをスクリーン印刷したのち、大猟中で焼成し
た。焼成処理は加熱温度450C。
Next, on a substrate made of a silicon carbide sintered body containing beryllia (He O), which had been previously degreased and washed, a glass paste (1) was screen printed, and then fired in a large-scale oven. The firing temperature is 450C.

500C,570C,600G、620(1”、650
G、700C,750Cに15分保持して行った。
500C, 570C, 600G, 620 (1", 650
G, 700C, and 750C for 15 minutes.

こうして作・浸された試料についてガラスと基板との密
着状況1&:知るために下記によって試験した。
The sample prepared and immersed in this manner was tested as follows to determine the adhesion status between the glass and the substrate.

拡大顕微鏡による外観観察から泡の発生状況と亀裂の光
生状況全調べ、四罠接合強さを知るためにガラス部をピ
ンセットで引掻き評価した。
The appearance of the glass was observed using a magnifying microscope, and the appearance of bubbles and the photogenic state of cracks were all investigated.The glass part was scratched with tweezers to evaluate the strength of the four-trap bond.

本発明に係るSiC焼結体は理論密度の約100俤の密
7.1 f有し、都瀧で3.7X10−’/C,0,(
3”’ /CTn ” fil II Cの熱伝導率、
ロタび1013Ω”anの電気砥抗率を有していた。
The SiC sintered body according to the present invention has a theoretical density of 7.1 f, which is about 100 yen, and has a density of 3.7X10-'/C,0,(
3”' /CTn ” Thermal conductivity of fil II C,
It had an electric abrasive resistance of 1013 Ω"an.

第2衣に評価結果を示す。表中〔泡〕は泡の発生状況を
示し、泡が発生しているものをX印、無いものを○印と
して表わした。〔割〕は亀裂の発生状況を示し、亀裂が
発生しているものをX印、無いものを○印として表わし
た。〔引〕はビンセットで引掻いた状況から?A着性の
きわめて悪いものを×印、や−や良好なものをΔ印、良
好なものを○印として表わした。表にントす如く、本発
明のガラス組成物であるA11〜13は、泡1割れの発
生がなく、殴れた密着性を有していた。
The evaluation results are shown on the second coat. [Bubble] in the table indicates the generation of bubbles, and those with bubbles are indicated by an X mark, and those without bubbles are indicated by an O mark. [Discount] indicates the occurrence of cracks, and those with cracks are indicated by an X mark, and those without cracks are indicated by an ○ mark. [Pull] is from the situation where it was scratched with a bottle set? Those with extremely poor A adhesion are marked with an x mark, those with rather good adhesion are marked with a Δ mark, and those with good adhesion properties are marked with an ○ mark. As shown in the table, the glass compositions A11 to A13 of the present invention did not have a single bubble and had excellent adhesion.

(実施例2) 第1図は実施例1で用いたSiC焼結体からなる基板に
厚膜抵抗体形成後の混成集積回路装置の断面図である。
(Example 2) FIG. 1 is a sectional view of a hybrid integrated circuit device after forming a thick film resistor on a substrate made of a SiC sintered body used in Example 1.

実施t+r+ iで用いた/K 11のガラス組成物を
用い、心気絶縁性炭化ケイ素焼結体の基板1の上にAg
−pd系導体ペーストを印刷し、大気中、700Cで焼
成して導体9を形成した後、次にこの導体と接続するよ
うに、同じ組成のガラスを用いシート抵抗5,5にΩ/
口のttuo□系の抵抗ペーストを印刷し、大気中、6
20t:’で焼成して厚膜抵抗体5を形成した。この上
に第1表に示す屋11の組成と特性を有するガラスペー
ストを印刷し、大気中、590Cの温度で焼成してガラ
ス被a10ff、//lljした。ガラスは半溶融状態
で形成され、気孔のないものが得られた。
Using the glass composition of /K 11 used in implementation t+r+i, Ag
-After printing a PD-based conductor paste and firing it in the atmosphere at 700C to form a conductor 9, glass of the same composition is used to connect it to the conductor, and the sheet resistance 5 is set to Ω/5.
Print the tuo□ type resistance paste and expose it to the atmosphere at 6
The thick film resistor 5 was formed by firing at 20 t:'. A glass paste having the composition and properties shown in Table 1 was printed thereon and fired in the atmosphere at a temperature of 590C to form a glass coating. The glass was formed in a semi-molten state and was free of pores.

低抗体のガラス被覆による抵抗値の変化率をめた結果+
0.01〜+0.02%と抵抗変化は小さい。また上記
厚膜回路形成体を150Cで1000hまで放置したと
きの抵抗値の経時変化を第2図に示した。抵抗値の変化
率は極めて小さい。
Results of calculating the rate of change in resistance due to low antibody glass coating +
The resistance change is small at 0.01 to +0.02%. Further, FIG. 2 shows the change in resistance value over time when the thick film circuit formed body was left at 150 C for 1000 hours. The rate of change in resistance value is extremely small.

(実施例3) 第3図は本発明の電気的装置の一例であるセラミックス
パンケージ半導体装置の断面図である。
(Embodiment 3) FIG. 3 is a sectional view of a ceramic span cage semiconductor device which is an example of the electrical device of the present invention.

本発明の装置は、実施例1で用いた炭化ケイ素焼結体か
らなる基板1に8i素子4が金で接合され、Si4と外
部端子であるリードフレーム13とをボンデングワイヤ
6 (Au、Ag、Pd、A/、線等)によって結合さ
れ、セラミックスキャップ12を用い、実施例1に示し
たAllの封止ガラス11によって封止されている。更
にSiC焼結体1にはAt製フィン16がシリコーンゴ
ム7によって接合されている。本発明の装置はきわめて
放熱性が高く、Si素子の高密度化が可能であることが
確認された。
In the device of the present invention, an 8i element 4 is bonded with gold to a substrate 1 made of the silicon carbide sintered body used in Example 1, and a bonding wire 6 (Au, Ag , Pd, A/, wire, etc.), and is sealed with the All-all sealing glass 11 shown in Example 1 using a ceramic cap 12. Furthermore, At fins 16 are bonded to the SiC sintered body 1 with silicone rubber 7. It was confirmed that the device of the present invention has extremely high heat dissipation properties, and that it is possible to increase the density of Si elements.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、炭化ケイ素を主成分とする焼結体から
なる基体に対し、泡及び割れの発生がなく、接着強度の
高い被覆及び接合ができ、混成集積回路装置及びセラミ
ックスパンケージ半導体装置として漬れた効果が発揮さ
れる。
According to the present invention, a substrate made of a sintered body mainly composed of silicon carbide can be coated and bonded with high adhesive strength without generation of bubbles or cracks, and a hybrid integrated circuit device and a ceramic span cage semiconductor device can be coated and bonded. A pickled effect is exhibited.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の電気的装置の一例である混成集積回路
装置の断面図、第2図は抵抗変化率と放置時間との関係
を示す線図及び第3図は本発明の吊、気的装置の一例で
あるセラミックスパッケージ半導体装置の断面図である
。 1・・・SiC焼結体基体、2.16・・・放熱フィン
、3・・・半田、4,7・・・Si素子、5・・・厚膜
抵抗体、6・・・ボンデングワイヤ、8・・・ヒートシ
ンク、9・・・厚膜導体、10・・・ガラス被覆、11
・・・封止ガラス、12・・・キャップ、13・・・リ
ードフレーム、14・・・AUl 15・・・シリコー
ンゴム。 代理人 弁理士 高橋明夫 第 1 図 (久う Cb)
FIG. 1 is a sectional view of a hybrid integrated circuit device which is an example of the electrical device of the present invention, FIG. 2 is a diagram showing the relationship between resistance change rate and standing time, and FIG. 1 is a cross-sectional view of a ceramic packaged semiconductor device, which is an example of a typical device. DESCRIPTION OF SYMBOLS 1... SiC sintered body base, 2.16... Heat radiation fin, 3... Solder, 4, 7... Si element, 5... Thick film resistor, 6... Bonding wire , 8... Heat sink, 9... Thick film conductor, 10... Glass coating, 11
...Sealing glass, 12...Cap, 13...Lead frame, 14...AUl 15...Silicone rubber. Agent Patent Attorney Akio Takahashi Figure 1 (Kuu Cb)

Claims (1)

【特許請求の範囲】 1、炭化ケイ素を主成分とする焼結体よりなる基体表面
に形成されるガラス組成物であって、その俗解前の組成
が重量で、酸化鉛10〜50%、酸化徒鉛20〜50%
と、酸化ホウ素40%以下及びシリカ30チ以下の1種
以上とを含むことを特徴とする炭化ケイ素焼結体用ガラ
ス組成物。 2、前記ガラス組成物は有機結合剤を含むペーストであ
る特許請求の範囲第1項に□記載の炭化ケイ素焼結体用
ガラス組成物。 3、 前記炭化ケイ素焼結体はBe又はBe化合物をB
 eとして0.1〜3,5重量%含有する電気絶縁性焼
結体でるる特許請求の範囲第1項又は第2項に記載の炭
化ケイ素焼結体用ガラス組成物。 4、 炭化ケイ素を主成分とする焼結体よりなる基。 体表面に形成されるガラス組成物であって、その溶解前
の組成が重量で、酸化鉛10〜50チ、酸化亜鉛20〜
50%と、酸化ホウ素40チ以下及びシリカ30チは下
の1種以上と、アルミナ10チ以下及び五酸化リン5−
以下の1種以上とt含むことを特徴とする炭化ケイ素焼
結体用ガラス組成物。 5、炭化ケイ素を主成分とする焼結体からなる基体の表
面に厚゛膜抵抗体が形成され、該抵抗体の表面がガラス
膜で被われているものにおいて、前記ガラス膜はその溶
解前の組成が重数で、酸化鉛10〜50チ、酸化亜鉛2
0〜50%と、酸化ホウ素40%以下及びシリカ30%
以下の1種以上とを含むことを特徴とする電気的装置。 6、炭化ケイ素を主成分とする焼結体からなる基体に載
置された半導体素子、がセラミックス焼結体からなる封
止体によって封止されているものにおいて、前記基体と
封止体とは溶解前の組成が重量で酸化鉛10〜50%、
酸化亜鉛20〜50チと、酸化ホウ素40%以下及びシ
リカ30%以下の1種以上とを含むガラスによって接合
されていることを特徴とする毒気的装置。
[Scope of Claims] 1. A glass composition formed on the surface of a substrate made of a sintered body mainly composed of silicon carbide, whose composition before popularization is 10 to 50% by weight of lead oxide, 10% to 50% of lead oxide, Lead waste 20-50%
A glass composition for a silicon carbide sintered body, characterized in that it contains at least 40% of boron oxide and 30% or less of silica. 2. The glass composition for a silicon carbide sintered body according to claim 1, wherein the glass composition is a paste containing an organic binder. 3. The silicon carbide sintered body contains Be or a Be compound.
The glass composition for a silicon carbide sintered body according to claim 1 or 2, which is an electrically insulating sintered body containing 0.1 to 3.5% by weight of e. 4. A group consisting of a sintered body whose main component is silicon carbide. A glass composition formed on the body surface whose composition before melting is 10 to 50 inches of lead oxide and 20 to 20 inches of zinc oxide.
50%, less than 40% boron oxide, 30% silica, one or more of the following, less than 10% alumina, and 5% phosphorus pentoxide.
A glass composition for a silicon carbide sintered body, characterized by containing one or more of the following: 5. In the case where a thick film resistor is formed on the surface of a substrate made of a sintered body mainly composed of silicon carbide, and the surface of the resistor is covered with a glass film, the glass film is The composition is 10-50% lead oxide, 2% zinc oxide.
0-50%, boron oxide 40% or less and silica 30%
An electrical device comprising one or more of the following: 6. In a device in which a semiconductor element placed on a base made of a sintered body mainly composed of silicon carbide is sealed with a sealing body made of a ceramic sintered body, the base body and the sealing body are Composition before melting is 10-50% lead oxide by weight,
1. A toxic gas device, characterized in that it is joined by glass containing 20 to 50% zinc oxide and one or more of 40% or less boron oxide and 30% or less silica.
JP58244015A 1983-12-26 1983-12-26 Glass composition for sintered silicon carbide Pending JPS60137848A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58244015A JPS60137848A (en) 1983-12-26 1983-12-26 Glass composition for sintered silicon carbide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58244015A JPS60137848A (en) 1983-12-26 1983-12-26 Glass composition for sintered silicon carbide

Publications (1)

Publication Number Publication Date
JPS60137848A true JPS60137848A (en) 1985-07-22

Family

ID=17112437

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58244015A Pending JPS60137848A (en) 1983-12-26 1983-12-26 Glass composition for sintered silicon carbide

Country Status (1)

Country Link
JP (1) JPS60137848A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000073227A1 (en) * 1999-06-01 2000-12-07 Alliedsignal Inc. Low temperature burnout screen printing frit vehicules and pastes
US9793011B2 (en) 2012-11-21 2017-10-17 Hitachi, Ltd. Structure, electronic element module, heat exchanger, fuel rod, and fuel assembly

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000073227A1 (en) * 1999-06-01 2000-12-07 Alliedsignal Inc. Low temperature burnout screen printing frit vehicules and pastes
US6248680B1 (en) 1999-06-01 2001-06-19 Alliedsignal, Inc. Low temperature burnout screen printing frit vehicles and pastes
US6306208B2 (en) 1999-06-01 2001-10-23 Alliedsignal, Inc. Low temperature burnout screen printing frit vehicle
US9793011B2 (en) 2012-11-21 2017-10-17 Hitachi, Ltd. Structure, electronic element module, heat exchanger, fuel rod, and fuel assembly

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