JPS6011155A - Monitoring device for mass spectrometer - Google Patents

Abstract

PURPOSE:To enable easy optimization operation as well as maintenance and control of a device by subtracting the optimum value of parameters in a reference stage from the optimum value of the parameters at the present point of time and displaying a deviation value so that the change of conditioning owing to the contamination, trouble, etc. of a mass spectrometer can be monitored. CONSTITUTION:A signal for optimization is inputted to a CPU8 from an operation board 10 to monitor the condition of a present mass spectrometer 1 upon lapse of certain time from a reference stage, then the CPU8 reads the parameter values from the respective systems 2, 4, 6 of the spectrometer 1, calculates the optimum value of the parameters at the present point of time, stores the same in the 2nd storage part 16, reads out at the same time the optimum parameter value in the reference stage stored in the 1st storage part 14 and transmits the same together with the optimum value at the present point of time to a subtraction part 18. Both optimum values are subtracted for each of the parameters in the part 18 and a deviation is calculated. The deviation is displayed together with the optimum value of the present parameters sotred in the part 16 on the image screen of a display part 20.

Description

DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a monitoring device useful for optimizing mass spectrometer parameters.

(Prior art in general) This mass spectrometer is composed of an ion source system, an analysis system, and a detection system. There is an optimum value.In other words, each parameter, such as lens aberration and electrode accuracy in the above example, differs depending on the device, so the optimum value of the parameter is a value unique to each device. Even if a value is set, the condition/control value may change over time due to equipment contamination or malfunction.

By the way, in conventional mass spectrometers, the optimal values of each parameter are reset when overhauled.
Conventionally, even if the optimum value of φ is set once, there is no way to monitor any subsequent changes in the equipment's components, so cleaning or replacing parts must be done periodically.
Moreover, when a failure occurred, there was no choice but to repair that part. For this reason, there is a problem in that the maintenance of the equipment becomes insufficient because it is difficult to make repairs.

(c) Purpose The present invention has been made in view of the above-mentioned problem I, and it is possible to monitor changes in the condition of a mass spectrometer due to contamination or failure, thereby optimizing operation and maintenance of the device. The purpose is to make it easier to scrub.

2) Structure In order to achieve such an object, the present invention has a first storage section that stores the optimum values of parameters of each group such as the ion source system 1 analysis system and detection system of a mass spectrometer at the reference time, and a second storage section that stores the optimum values of the respective parameters to be set; A monitor device is composed of a subtraction section that calculates a deviation value by subtracting the optimum value of the parameter, and a display section that displays the deviation value calculated by this subtraction section, and the deviation value displayed on the above-mentioned display 1. The system is designed to monitor the status of each group in the mass spectrometer.

(E) Embodiments The present invention will be explained in detail based on embodiments and drawings.

FIG. 1 is a block diagram of a mass spectrometer and its monitoring device.

In the figure, 1 is a mass spectrometer, 2 is an ion source system for ionizing an analysis sample, and this ion source system 21 includes a lens for focusing an ion beam. 4 is an analysis system for mass-separating the ions introduced from the ion source system 2, and this analysis system 41
This includes 7 non-contact or quadrupole electrodes. 6 is analysis system 4
This detection system 6t includes a detector such as a secondary electron multiplier and an amplifier. 8 is the above-mentioned ion source system 2, analysis system 4. The arithmetic processing unit (hereinafter referred to as C1) manually inputs the values of the parameters of the detection system 6 and calculates from those values the optimum values of the parameters that indicate conditions for good resolution and excellent detection sensitivity in terms of the overall balance of the mass spectrometer 1. ) is called U).

It is also an operation panel that manually inputs signals to the arithmetic processing unit 8 of 10 cigarettes.

12V:i In the monitor device of the present invention, this monitor device 12
t, CI) U Store the optimum value of the Harameter of each base 2.4.6 calculated in 8 at the reference time (i.e., the reference time to be used as a guide for the equipment monitor such as when an overhaul is completed). A first storage unit 14, a second storage unit 16 that stores the optimum values of each parameter calculated by the CPU 8 at the current moment when time has passed since the reference time, and parameters at the current moment stored in the second storage unit 16. a subtraction unit 18 that calculates a deviation value by subtracting the optimum value of the parameter at the reference time stored in the first storage unit 14 from the optimum value of the parameter, and a deviation value calculated by the subtraction unit 18 and a second memory. The display section 20 simultaneously displays the optimum values of the parameters stored in the section 16 at the present time.

Monitoring of the mass spectrometer 1 by the monitor device 12 having the above configuration is performed as follows.

First, when the overhaul of mass spectrometer 1 is completed, etc.,
When a signal for optimization is input from 0, cpuB reads the values of parameters 2 and 4.6 for each group, and from those values it determines conditions that have good resolution and excellent detection sensitivity in terms of the overall balance of the mass spectrometer 1. Calculate the optimal value x1 of the parameter indicating . The calculated optimum value of each parameter x, L?
The data is sent to the first storage unit 14 and stored here. The optimal value x1 stored in the first storage unit 14 is then set as the optimal value at the reference time.

To monitor the current state of the mass spectrometer 1 after a certain period of time has elapsed from the reference time, when a signal for optimization is input from the operation panel 10, the CPU 13 controls each unit 2 of the mass spectrometer 1.
．． 4. Read the values of the parameters in 6 and calculate the optimum value X2 of the parameters at the present time in the same way as at the reference time. The calculated optimal value x2I-j of the parameter is sent to the second storage unit 16 and is stored here. Ha δreru. At the same time, CI) U 8 reads out the parameter optimum value x1 at the reference time stored in the first storage unit 14, and calculates a new [
These are sent to the subtraction unit 18 together with the calculated optimum value x2 at the current time. The optimal value x of each parameter at the reference time and at the present time sent from the subtraction unit IEI or Cl) U8
, , Based on X2, the optimum value X1 of the parameter at the reference time is subtracted for each parameter from the optimum value X2 of the parameter at the present time to calculate the deviation value (y=x2-x,). The deviation value γ calculated in one day by the subtraction unit and the second storage unit 16
The optimum value x2(d1) of the current parameter stored in
The signals are sent from the second storage section 16 and the subtraction section 18 to the display section 20, and displayed on the screen of the display section 20, for example, as shown in FIG. The numerical value in [ ] in the figure represents the deviation value y. Therefore, from this deviation value yi, it is possible to monitor the state of each parameter over time from the reference time of the mass spectrometer 1 to the present time, such as the degree of contamination and the timing of parts replacement. The three types of peaks shown in FIG. 2 are the ion peaks of the standard sample used for scouring. If both are displayed on the screen, it will be easier to judge the degree of optimization adjustment.

(f) Effects As described above, according to the present invention, the status of each group of the mass spectrometer can be monitored by looking at the deviation value displayed on the display.
You can easily adjust the optimization of each parameter. Furthermore, you can accurately determine when each unit should be cleaned, repaired, or replaced. In other words, the condition of the equipment can be known at all times, making it easier to maintain and manage the equipment.
Furthermore, an excellent effect of extending the life of the device can be obtained.

[Brief explanation of drawings]

The drawings show embodiments of the present invention, and FIG. 1 is a configuration diagram of a mass spectrometer and its monitoring device, and FIG. 2 (d) is an explanatory diagram showing display examples of each parameter. 1...Mass spectrometer, 2... Ion source system, 4... Analysis system, 6... Detection/detachment, 12... Monitor device, 14...
...first storage section, 16...second storage section, 18...subtraction section, 20...display section. Applicant Shimadzu Corporation Representative Patent Attorney Kazuhide Okada Figures 1 and 2

Claims (1)

[Scope of Claims] ([) A first storage unit that stores optimal values of parameters set at the reference time for each unit of the ion source system, analysis system, detection system, etc. of the mass spectrometer; a second storage section that stores the optimal values of the parameters of each group; and a second storage section that stores the optimal values of the parameters at the current time stored in the second storage section; A subtraction section that subtracts the value to calculate the deviation value, and a display section that displays the deviation value calculated by this W reduction section (if), the mass spectrometer is What is claimed is: 1. A mass spectrometry monitoring device, characterized in that it monitors the state of each group.