JPS60110049A - Test method using test program - Google Patents

Test method using test program

Info

Publication number
JPS60110049A
JPS60110049A JP58219941A JP21994183A JPS60110049A JP S60110049 A JPS60110049 A JP S60110049A JP 58219941 A JP58219941 A JP 58219941A JP 21994183 A JP21994183 A JP 21994183A JP S60110049 A JPS60110049 A JP S60110049A
Authority
JP
Japan
Prior art keywords
item
test
processing
message
error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58219941A
Other languages
Japanese (ja)
Other versions
JPS6349248B2 (en
Inventor
Shiyuuko Asada
浅田 周子
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58219941A priority Critical patent/JPS60110049A/en
Publication of JPS60110049A publication Critical patent/JPS60110049A/en
Publication of JPS6349248B2 publication Critical patent/JPS6349248B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Abstract

PURPOSE:To decrease the number of steps of a test program and to reduce the capacity of a memory area by regarding similar messages and test items as the same processing respectively when working is tested for each function. CONSTITUTION:When a function unit 1-1 is tested, a procedure which produces an error at a prescribed area of the part 1-1 is stored in a procedure table 4-2 in the form of a variable. An item processing part 2 retrieves a test loop 4 to give processing to a common item 4-1. Then an item individual part 2-1 is actuated and performs the item processing according to the procedure variable of the part 1-1 within the table 4-2. In this case, it is detected whether an error is produed or not. If an error is detected, the next item of the table 4-2 is executed. This processing is continued until the test is through with respected all items. Then it is decided some problem arises in the relevant item when no error is detected. Thus the prescribed processing is caried out.

Description

【発明の詳細な説明】 (al 発明の技術分野 本発明は複数の機能単位部から構成されるデータ処理装
置が各機能単位部の動作をプログラムに依って試験する
際の試験方法を改善したテストプログラムによる試験方
法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a test method that improves a test method when a data processing device composed of a plurality of functional units tests the operation of each functional unit based on a program. It concerns a test method using a program.

(bl 従来技術と問題点 データ処理装置を含む電子計算機システムの各機能単位
部の動作を試験するのに試験用プログラム(以後テスト
プログラムと記す)を作成して機能単位部の動作を確認
している。然しながら、此のテストプログラムはデータ
処理装置単位は勿論、同一データ処理装置内の機能単位
部にそれぞれテストプログラムを準備して動作試験を4
テっでいる為に、テストプログラムの開発及び追加と修
正に多大の工数を要し能率が悪いばかりで無く、工期が
遅れると言9た欠点と作成したプログラムを格納する記
憶域の大きいものが必要となると言った欠点があった。
(bl) Prior art and problems In order to test the operation of each functional unit of a computer system including a data processing device, a test program (hereinafter referred to as a test program) is created and the operation of the functional unit is checked. However, this test program is not only for each data processing device, but also for each functional unit within the same data processing device, and the operation test is performed four times.
Because the test program is written in a large format, it takes a large amount of man-hours to develop, add, and modify the test program, which is not only inefficient but also delays the construction period. There was a drawback that I said it was necessary.

(C) 発明の目的 以上、従来の欠点に鑑み本発明は各機能単位の動作を試
験する際に、類似したメソセージと試験項目とを同一と
見なして処理を行い、プログラム作成と追加及び修正に
効率が良く、更に記fif域の容量の縮小の図れるプロ
グラムによる試験方法をJP(共することを目的とする
ものである。
(C) Beyond the purpose of the invention, in view of the conventional drawbacks, the present invention treats similar messages and test items as the same when testing the operation of each functional unit, and processes them in program creation, additions, and modifications. The purpose is to share with JP (JP) a test method using a program that is efficient and can further reduce the capacity of the fif area.

fdl 発明の構成 簡単に述べると本発明は、複数の機能単位部を有するデ
ータ処理装置からなる電子計算機システムに於いて、該
データ処理装置に類似したメソセージを同一形式のメソ
セージとして処理を行うメソセージ処理手段と類似した
試験項目を同一形式の試験項目として処理を行う項目処
理手段とを備えると共に、前記同一形式のメソセージの
内で前記機能単位部によって異なるメソセージ変数と前
記同一試験項目の内で試験する機能単位部によって異な
る試験手続き変数とを格納するテスト・テーブルを設け
、前記各機能単位部を試験する際に前記メツセージ処理
手段と項目処理手段とが前記テーブルを参照して試験を
行うようにしたことを特徴とするものである。
fdl Structure of the Invention Briefly stated, the present invention provides a message processing method for processing messages similar to the data processing device as messages of the same format in an electronic computer system comprising a data processing device having a plurality of functional units. and an item processing means for processing test items similar to the test items as test items of the same format, and testing different message variables depending on the functional unit within the message of the same format and the same test item. A test table is provided to store test procedure variables that differ depending on the functional unit, and the message processing means and item processing means refer to the table when testing each of the functional units. It is characterized by this.

tel 発明の実施例 以下、本発明の実施例を図によって詳<aに説明する。tel Embodiments of the invention Hereinafter, embodiments of the present invention will be explained in detail with reference to the drawings.

第1図は本発明のテストプログラムによる試験方法を説
明する為の一実施例のブロック図、第2図は本発明のフ
ローチャート図である。
FIG. 1 is a block diagram of an embodiment for explaining a test method using a test program of the present invention, and FIG. 2 is a flowchart of the present invention.

図に於いて、1はデータ処理装置、2ば項目処理部、3
はメツセージ処理部、4はテストテーブル、]−1乃至
1−nば機能単位部、2−1乃至2−には項目個別部、
3−1乃至3−j はメソセージ個別部、4−1は共通
項目、4−2は手順テーブル、4−3はメツセージ・テ
ーブルをそれぞれ示す。
In the figure, 1 is a data processing device, 2 is an item processing unit, and 3 is a data processing device.
is a message processing section, 4 is a test table, ]-1 to 1-n are functional unit sections, 2-1 to 2- are item individual sections,
3-1 to 3-j are message individual parts, 4-1 is a common item, 4-2 is a procedure table, and 4-3 is a message table.

以下、第2図を参照しながら本実施例の説明をする。デ
ータ処理装置1は機能単位部1−1乃至1−nを有して
おり、此の装置に図に承ずよ・うにテストテーブル4が
付設され、此のテストテーブル4は共通項目4−1と手
順テーブル4−2とメツセージ・テーブル4−3とから
なり、共通する項目は共通項目4−1に格納され、類似
する試験項目別で然も機能単位細別に異なる試験手続き
変数は手順テーブル4−2に格納されており、又類似す
るメソセージは機能単位部に異なる部分のメソセージ変
数をメソセージ・テーブル4−3に格納されている。類
似する試験項目とメソセージとは、対応する項目個別部
とメソセージ個別部に入力され、同一処理が項目処理部
2とメソセージ処理部3にて行われる。例えば、機能単
位部1−1を試験する場合には、機能単位部1−1の所
定個所がエラーとなるような手順が変数として手順テー
ブル4−2に格納されることとなる。−同し類似の試験
も勿論各機能単位で試験されることが生じるのは言うま
でもない。例えば、機能単位部1−1を試験する場合に
はデータ処理装置にて機能単位部1−1を指定する。此
の指定に基づき項目処理部2はテストテーブル4を検索
して(第2図にしめず(1)の状態、以後第2図を省略
し括弧付き数字で示す)、共通する共通項目4−1 の
処理を行う(2)。次ぎに項目個別部2−1を作動せし
めて、手順テーブル4−2内の機能単位部l−1の手続
き変数に依って項目個別部2−1は項目処理を行う(3
)。項目処理部2は処理の際に、エラーが発生するや否
やを検知しく4)、エラーであれば、手順テーブルの次
の項目の実行を行い順次全項目が終了する迄処理を実行
する(7)。若しエラーで無ければ何等かの問題が此の
項目にて発生していることとなり、項目個別部2−1に
対応するメツセージ個別部3−1作動してエラーとなら
ない項目の手順テーブル4−2の変数例えば八に基づい
て、メソセージ・テーブル4−3を検索して(5)変数
Aのメソセージ変数に基づいて、メソセージ処理部3の
メソセージ個別部3−1はメソセージを作成して(6)
、次の項目を実行する。上記したように、項目個別部2
−1の処理が終了すると順次項目−個別部2−2の処理
が同様に行われてゆく。以上の説明は機能単位部単位で
項目チェックを行うように説明したが、項目単位で全機
能単位部のチェックを行っても同一処理で行えることは
言うまでもない。
The present embodiment will be explained below with reference to FIG. The data processing device 1 has functional unit units 1-1 to 1-n, and a test table 4 is attached to this device as shown in the figure. , a procedure table 4-2, and a message table 4-3. Common items are stored in the common item 4-1, and test procedure variables that are similar for each test item but differ for each functional unit are stored in the procedure table 4. -2, and for similar messages, the message variables of different parts in the functional units are stored in the message table 4-3. Similar test items and messages are input into the corresponding item individual section and message individual section, and the same processing is performed in the item processing section 2 and message processing section 3. For example, when testing the functional unit 1-1, a procedure that causes an error in a predetermined portion of the functional unit 1-1 is stored as a variable in the procedure table 4-2. - It goes without saying that the same and similar tests may also be tested for each functional unit. For example, when testing the functional unit 1-1, the data processing device specifies the functional unit 1-1. Based on this specification, the item processing unit 2 searches the test table 4 (state shown in Shimezu (1) in Fig. 2, hereinafter, Fig. 2 is omitted and indicated by numbers in parentheses), and finds the common common item 4- Perform the processing in step 1 (2). Next, the item individual unit 2-1 is activated, and the item individual unit 2-1 performs item processing according to the procedure variables of the functional unit unit l-1 in the procedure table 4-2.
). During processing, the item processing unit 2 detects as soon as an error occurs (4), and if it is an error, executes the next item in the procedure table and executes the process sequentially until all items are completed (7). ). If there is no error, it means that some kind of problem has occurred in this item, and the message individual section 3-1 corresponding to the item individual section 2-1 is activated and the procedure table 4- for items that does not cause an error. Based on the message variable of variable A, for example, 8, the message table 4-3 is searched (5) Based on the message variable of variable A, the message individual unit 3-1 of the message processing unit 3 creates a message (6 )
, do the following: As mentioned above, item individual part 2
When the processing of item -1 is completed, the processing of item-individual section 2-2 is performed in the same way. In the above explanation, the item check is performed on a functional unit basis, but it goes without saying that the same process can be used to check all functional units on an item-by-item basis.

仔)発明の効果 以」二、詳細に説明したように本発明のナストプログラ
ムによる試験方法は、類似したメソセージと試験項目と
を同一と見なして処理を行い、従ってプログラム作成と
追加及び修正を行う場合に該当する変数のみを変更する
だけで良く、テストプログラムを作成する上で能率が良
いと共に、異なる変数格納のみで良く記↑、a域の容量
の縮小の図れるものとなり、電子計算機システムを試験
する上で利点の多いものとなる。
2) Effects of the Invention 2. As explained in detail, the test method using the Nast program of the present invention treats similar messages and test items as the same, and therefore creates, adds, and modifies the program. You only need to change the variables that apply to the case, which is efficient in creating test programs, and it is possible to write only by storing different variables, which reduces the capacity of area a, making it possible to test electronic computer systems. There are many advantages to doing so.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のテストプログラムによる試験方法を説
明する為の一実施例のブロック図、第2図は本発明のフ
ローチャート図である。 図に於いて、1はデータ処理装置、2は項目処理部、3
ばメソセージ処理部、4はテストテーブル、1−1乃至
]−nは機能単位部、2−1乃至2−には項目個別部、
3−1乃至3−j はメソセージ個別部、4−1 は共
通項目、4−2は手順テーブル、4−3はメツセージ・
テーブルをそれぞれ示す。 第1図 ム 第2図
FIG. 1 is a block diagram of an embodiment for explaining a test method using a test program of the present invention, and FIG. 2 is a flowchart of the present invention. In the figure, 1 is a data processing device, 2 is an item processing unit, and 3 is a data processing device.
4 is a test table, 1-1 to ]-n are functional unit parts, 2-1 to 2- are item individual parts,
3-1 to 3-j are individual message parts, 4-1 is a common item, 4-2 is a procedure table, and 4-3 is a message/message section.
Each table is shown below. Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 複数の機能単位部を有するデータ処理装置からなる電子
計算機システムに於いて、該データ処理装置に類似した
メソセージを同一形式のメツセージとして処理を行うメ
ソセージ処理手段と類似した試験項目を同一形式の試験
項目として処理を行う項目処理手段とを備えると共に、
前記同一形式のメソセージの内で前記機能単位部によっ
て異なるメツセージ変数と前記同一試験項目の内で試験
する機能単位部によって異なる試験手続き変数とを格納
するテスト・テーブルを設け、前記各機能単位部を試験
する際に前記メソセージ処理手段と項目処理手段とが前
記テーブルを参照して試験を行うようにしたことを特徴
とするテストプログラムによる試験方法。
In an electronic computer system consisting of a data processing device having a plurality of functional units, a test item similar to a message processing means that processes a message similar to the data processing device as a message of the same format is a test item of the same format. and item processing means for processing as
A test table is provided for storing message variables of the same format that differ depending on the functional unit and test procedure variables that differ depending on the functional unit to be tested within the same test item, and each of the functional units is A test method using a test program, characterized in that the message processing means and the item processing means refer to the table when testing.
JP58219941A 1983-11-21 1983-11-21 Test method using test program Granted JPS60110049A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58219941A JPS60110049A (en) 1983-11-21 1983-11-21 Test method using test program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58219941A JPS60110049A (en) 1983-11-21 1983-11-21 Test method using test program

Publications (2)

Publication Number Publication Date
JPS60110049A true JPS60110049A (en) 1985-06-15
JPS6349248B2 JPS6349248B2 (en) 1988-10-04

Family

ID=16743422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58219941A Granted JPS60110049A (en) 1983-11-21 1983-11-21 Test method using test program

Country Status (1)

Country Link
JP (1) JPS60110049A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6375845A (en) * 1986-09-18 1988-04-06 Fujitsu Ltd Testing system for ras circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6375845A (en) * 1986-09-18 1988-04-06 Fujitsu Ltd Testing system for ras circuit

Also Published As

Publication number Publication date
JPS6349248B2 (en) 1988-10-04

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