JPS59970U - 半導体素子試験用恒温槽 - Google Patents

半導体素子試験用恒温槽

Info

Publication number
JPS59970U
JPS59970U JP9507982U JP9507982U JPS59970U JP S59970 U JPS59970 U JP S59970U JP 9507982 U JP9507982 U JP 9507982U JP 9507982 U JP9507982 U JP 9507982U JP S59970 U JPS59970 U JP S59970U
Authority
JP
Japan
Prior art keywords
constant temperature
semiconductor device
temperature chamber
device testing
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9507982U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6247095Y2 (enrdf_load_stackoverflow
Inventor
順一 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP9507982U priority Critical patent/JPS59970U/ja
Publication of JPS59970U publication Critical patent/JPS59970U/ja
Application granted granted Critical
Publication of JPS6247095Y2 publication Critical patent/JPS6247095Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP9507982U 1982-06-24 1982-06-24 半導体素子試験用恒温槽 Granted JPS59970U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9507982U JPS59970U (ja) 1982-06-24 1982-06-24 半導体素子試験用恒温槽

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9507982U JPS59970U (ja) 1982-06-24 1982-06-24 半導体素子試験用恒温槽

Publications (2)

Publication Number Publication Date
JPS59970U true JPS59970U (ja) 1984-01-06
JPS6247095Y2 JPS6247095Y2 (enrdf_load_stackoverflow) 1987-12-24

Family

ID=30227235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9507982U Granted JPS59970U (ja) 1982-06-24 1982-06-24 半導体素子試験用恒温槽

Country Status (1)

Country Link
JP (1) JPS59970U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6142478U (ja) * 1984-08-24 1986-03-19 沖電気工業株式会社 半導体装置のバ−ンイン装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6142478U (ja) * 1984-08-24 1986-03-19 沖電気工業株式会社 半導体装置のバ−ンイン装置

Also Published As

Publication number Publication date
JPS6247095Y2 (enrdf_load_stackoverflow) 1987-12-24

Similar Documents

Publication Publication Date Title
JPS59970U (ja) 半導体素子試験用恒温槽
JPS5851489U (ja) カプラ装置
JPS5963875U (ja) レコ−ド等の収納ケ−ス
JPS5830907U (ja) 分離するカセツトレコ−ダ−の扉
JPS58165703U (ja) テ−プレコ−ダ等の基板装置
JPS5957188U (ja) 洗面装置
JPS5971744U (ja) 手動式捺印装置の台上にすいつけた磁石つき枠
JPS5839515U (ja) 目盛板取付装置
JPS5832684U (ja) 部品の実装構造
JPS5828038U (ja) バイザ−保持機構
JPS58180674U (ja) 電子機器の透明窓
JPS6044244U (ja) カセットリッド開閉装置
JPS58139970U (ja) 額縁
JPS5977296U (ja) シ−ルド板のア−ス装置
JPS59138738U (ja) 計量用器付き洗剤箱
JPS60145375U (ja) 集積回路試験装置
JPS58144731U (ja) 受光体の取付装置
JPS5827990U (ja) 電子機器
JPS58172412U (ja) 排泄を表示するオムツカバ−
JPS58183692U (ja) テ−プカセツトの誤消去防止装置
JPS5928060U (ja) 計量器つき容器蓋
JPS58119738U (ja) 寒暖計窓設置用補助器具
JPS58123417U (ja) 濃度計付フイルム観察機
JPS5945704U (ja) テ−プレコ−ダ
JPS60102749U (ja) 開閉蓋の制動装置