JPS5989537U - Pattern inspected object - Google Patents

Pattern inspected object

Info

Publication number
JPS5989537U
JPS5989537U JP18492982U JP18492982U JPS5989537U JP S5989537 U JPS5989537 U JP S5989537U JP 18492982 U JP18492982 U JP 18492982U JP 18492982 U JP18492982 U JP 18492982U JP S5989537 U JPS5989537 U JP S5989537U
Authority
JP
Japan
Prior art keywords
inspected
fine pattern
inspected object
patterned object
ink film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18492982U
Other languages
Japanese (ja)
Inventor
光洋 岩崎
西本 豊司
Original Assignee
凸版印刷株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 凸版印刷株式会社 filed Critical 凸版印刷株式会社
Priority to JP18492982U priority Critical patent/JPS5989537U/en
Publication of JPS5989537U publication Critical patent/JPS5989537U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Processing (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本考案のパターン被検査体の一実施例を示す平面
図である。 1・・・基板、2・・・微細パターン、3・・・断裁線
、4・・・間隔、5・・・目印、6・・・欠陥。
The drawing is a plan view showing an embodiment of a patterned object to be inspected according to the present invention. DESCRIPTION OF SYMBOLS 1... Substrate, 2... Fine pattern, 3... Cutting line, 4... Spacing, 5... Mark, 6... Defect.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)基板上に検査対象の微細パターンが間隔をおいて
多数形成され、各微細ノ〈ターンを仕切る如く断裁線が
設けられてなるパターン被検査体において、各微細パタ
ーンの良否に対応して磁性インキ膜からなる目印が微細
パターンと前記断裁線との間隙に施されてなることを特
徴とするパターン被検査体。
(1) In a patterned object to be inspected, in which a large number of fine patterns to be inspected are formed at intervals on a substrate, and cutting lines are provided to separate each fine pattern (turns), the quality of each fine pattern is determined. A patterned object to be inspected, characterized in that a mark made of a magnetic ink film is placed in a gap between the fine pattern and the cutting line.
(2)目印の磁性インキ膜の仮想的直径が0.2〜1゜
0rrrrnである実用新案登録請求の範囲第1項記載
のパターン被検査体。
(2) The patterned object to be inspected according to claim 1, wherein the magnetic ink film of the mark has a virtual diameter of 0.2 to 1°0rrrrrn.
JP18492982U 1982-12-07 1982-12-07 Pattern inspected object Pending JPS5989537U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18492982U JPS5989537U (en) 1982-12-07 1982-12-07 Pattern inspected object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18492982U JPS5989537U (en) 1982-12-07 1982-12-07 Pattern inspected object

Publications (1)

Publication Number Publication Date
JPS5989537U true JPS5989537U (en) 1984-06-18

Family

ID=30399840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18492982U Pending JPS5989537U (en) 1982-12-07 1982-12-07 Pattern inspected object

Country Status (1)

Country Link
JP (1) JPS5989537U (en)

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