JPS5971077A - Evaluation of light fatigue of photoreceptor for electronic photography - Google Patents
Evaluation of light fatigue of photoreceptor for electronic photographyInfo
- Publication number
- JPS5971077A JPS5971077A JP57182387A JP18238782A JPS5971077A JP S5971077 A JPS5971077 A JP S5971077A JP 57182387 A JP57182387 A JP 57182387A JP 18238782 A JP18238782 A JP 18238782A JP S5971077 A JPS5971077 A JP S5971077A
- Authority
- JP
- Japan
- Prior art keywords
- light
- potential
- fatigue
- photoreceptor
- irradiated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G21/00—Arrangements not provided for by groups G03G13/00 - G03G19/00, e.g. cleaning, elimination of residual charge
- G03G21/0094—Arrangements not provided for by groups G03G13/00 - G03G19/00, e.g. cleaning, elimination of residual charge fatigue treatment of the photoconductor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photoreceptors In Electrophotography (AREA)
- Control Or Security For Electrophotography (AREA)
- Discharging, Photosensitive Material Shape In Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は電子写真用感光体が電子写真プロセスの繰返し
を受けた際に生ずる光疲労の程度を定量的に評価する方
法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for quantitatively evaluating the degree of optical fatigue that occurs when an electrophotographic photoreceptor undergoes repeated electrophotographic processes.
複写機あるいはプリンタなどに用いられる電子写真用感
光体は、電子写真プロセスにおいて帯電器により表面に
電荷を帯び、次いで露光による光電効果により露光部の
表面電荷を形成させて画像潜像を付与する。その後現像
器により現像を行い、転写器により現像画像を紙面へ転
写する。最後に次回のプロセスのために感光体表面の残
留電位をおおむね零に近いレベルまで除電する。この種
の除電には光除電、交流コロナ除電および直流コロナ除
電がある。2. Description of the Related Art Electrophotographic photoreceptors used in copiers, printers, and the like have their surfaces charged by a charger in an electrophotographic process, and then a photoelectric effect caused by exposure forms surface charges in exposed areas to provide a latent image. Thereafter, a developing device performs development, and a transfer device transfers the developed image onto paper. Finally, the residual potential on the surface of the photoreceptor is neutralized to a level close to zero for the next process. This type of static elimination includes optical static elimination, AC corona static elimination, and DC corona static elimination.
以上のプロセスを繰り返すと、感光体には帯電後の表面
電位の低下および残留電位の上昇のような疲労現象を生
じる傾向がある。この疲労現象の要因の一つには、露光
および光除電等の感光体への光の照射に基づく光疲労が
ある。このような光疲労を定量的に評価することは、感
光体の信頼性を高めるための特性管理技術あるいは電子
写真プロセス制御技術にとって必要である。従来、感光
体の疲労特性は、例えば電子写真用複写機を用いて第1
図に示すような複写繰返し数に対する帯電電位(曲線1
1)、露光後電位(曲線12)、残留電位(曲線13)
を得ることにより評価してき′#、、。しかしこの場合
、帯電方式および除電方式の効果が合成された形で繰返
しの疲労が現われて来るため、光だけによる疲労成分の
抽出および解析が不可能であり、また測定精度および再
現性などに問題がある。If the above process is repeated, the photoreceptor tends to undergo fatigue phenomena such as a decrease in surface potential after charging and an increase in residual potential. One of the causes of this fatigue phenomenon is optical fatigue caused by light irradiation on the photoreceptor, such as exposure and photostatic discharge. Quantitative evaluation of such optical fatigue is necessary for property management technology or electrophotographic process control technology to improve the reliability of photoreceptors. Conventionally, the fatigue characteristics of a photoconductor have been determined by first measuring them using, for example, an electrophotographic copying machine.
Charging potential versus number of copying repetitions as shown in the figure (curve 1
1), Post-exposure potential (curve 12), residual potential (curve 13)
You can evaluate it by getting '#,,. However, in this case, repeated fatigue appears as a combination of the effects of the charging method and the static elimination method, so it is impossible to extract and analyze the fatigue component using only light, and there are also problems with measurement accuracy and reproducibility. There is.
本発明は、これに対し光だけの疲労成分を簡便に精度よ
く評価し、感光体の特性管理技術ならびに電子写真プロ
セスにおける疲労の減少に役立てることを目的とする。In contrast, it is an object of the present invention to easily and accurately evaluate the fatigue component caused by light alone, and to utilize this method in techniques for managing characteristics of photoreceptors and in reducing fatigue in electrophotographic processes.
この目的は、一方向に移動する感光体表面に対向して移
動方向に光照射用光源、帯電器、電位測定プローブを順
次配置し、光照射開始時に光源と帯電器の間に位置して
光照射を受けない感光体表面と、光源の反帯電器側に位
置して光照射を受けた感光体表面との帯電電位の差をも
って光疲労を評価することによって達成される。The purpose of this is to sequentially arrange a light source for light irradiation, a charger, and a potential measurement probe in the direction of movement facing the surface of the photoreceptor that moves in one direction, and to position the probe between the light source and the charger at the beginning of light irradiation. This is achieved by evaluating optical fatigue based on the difference in charging potential between the surface of the photoreceptor that is not irradiated and the surface of the photoreceptor that is located on the side opposite the charger of the light source and is irradiated with light.
本発明は、光疲労現象は光の照射により自由になったキ
ャリアがトラップされることにより表面電位の低下ある
いは帯電電位の上昇が起きるとの認識に基づき、1回の
光照射により生ずるキャリアのトラップ数から光疲労を
評価するものである。The present invention is based on the recognition that the photo-fatigue phenomenon occurs when carriers freed by light irradiation are trapped, resulting in a decrease in surface potential or an increase in charged potential. It evaluates light fatigue based on the number.
以下図を引用して本発明の実施例について説明する。第
2図において円筒形感光体1は矢印方向方向2に回転可
能であり、その表面に対向してコロナ帯電器3が配置さ
れ、その感光体の回転方向の手前に図示しない光源によ
る光照射部4.先の方に電位測定プローブ5が位置して
いる。帯電器3とグローブ5の位置は固定で図では感光
体1の回転軸に対して30°の角をなしているが、光照
射部4の位置は可変である。この装置を用い、感光体1
を回転させ、帯電器3による帯電と光照射部4による光
照射を同時に開始するとプローブ5により第3図に示す
電位波形を得る。この波形のうち最初の電位の高い部分
31は、操作開始前に帯電器3と光放射部40間の位置
6にあった光来照射の感光体表面部分の電位であり、電
位の低い部分32は光放射部4より手前の位置7にあっ
た光に照射された感光体表面部分の電位である。この両
電位の差△Vをもって光疲労の評価とする。すなわち、
ΔVが前述のトラップ数を示し、△■が大きいほど光疲
労が太きいということになる。△Vの値は、光照射の強
度が一定の場合は、波長に、また感光体の周速が一定の
時ケよ光来照射部6の距離に依存し、一般に光来照射部
6の距離が小さい程、Δ■の値が太きい。このことは光
照射後帯電器3に達するまでにキャリアがトラップより
解放されることを意味する。従って光照射部4の位置を
順次移動させ、光照射後の経過時間を変えて第4図の示
す曲線を得ることにより、光疲労の回復特性を知ること
ができる。Embodiments of the present invention will be described below with reference to the drawings. In FIG. 2, a cylindrical photoreceptor 1 is rotatable in the direction of the arrow 2, a corona charger 3 is disposed opposite to the surface thereof, and a light irradiation section from a light source (not shown) is placed in front of the photoreceptor in the rotational direction. 4. A potential measuring probe 5 is located at the front. Although the positions of the charger 3 and the globe 5 are fixed and form an angle of 30° with respect to the rotation axis of the photoreceptor 1 in the figure, the position of the light irradiation section 4 is variable. Using this device, photoreceptor 1
When the probe 5 rotates and simultaneously starts charging by the charger 3 and irradiating light by the light irradiator 4, a potential waveform shown in FIG. 3 is obtained by the probe 5. The first high-potential portion 31 of this waveform is the potential of the photoconductor surface portion irradiated with light, which was located at position 6 between the charger 3 and the light emitting unit 40 before the start of operation, and the low-potential portion 32 is the potential of the surface portion of the photoreceptor that is irradiated with light at a position 7 in front of the light emitting section 4. The difference ΔV between these potentials is used to evaluate optical fatigue. That is,
ΔV indicates the number of traps mentioned above, and the larger Δ■, the greater the optical fatigue. The value of △V depends on the wavelength when the intensity of light irradiation is constant, and on the distance of the light irradiation part 6 when the circumferential speed of the photoreceptor is constant, and generally depends on the distance of the light irradiation part 6. The smaller the value, the larger the value of Δ■. This means that carriers are released from the traps before reaching the charger 3 after irradiation with light. Therefore, by sequentially moving the position of the light irradiation unit 4 and changing the elapsed time after light irradiation to obtain the curve shown in FIG. 4, the recovery characteristics of optical fatigue can be determined.
以上述べたように、本発明は電子写真プロセスの繰返し
の際の疲労の現象のうち光に基づく成分を、光の未照射
部と照射部との帯電電位の差だけにより簡単に抽出する
ものである。これにより光疲労の波長依存性、照射光強
度依存性および光疲労回復特性を簡便、かつ精度よく評
価できる。従ってSe系I Zn0j Cas、 op
c l アモルファスシリコン等の一般の電子写真用
感光体の光疲労を評価して、感光体の特性管理や開発、
rpc複写機、レーザプリンタ、インテリジェントコピ
ア等の電子写真プロセス制御技術の開発に対して大きく
寄与させることができる。As described above, the present invention allows the light-based component of the fatigue phenomenon during repeated electrophotographic processes to be easily extracted using only the difference in charging potential between the non-irradiated area and the irradiated area. be. This makes it possible to easily and accurately evaluate the wavelength dependence of photofatigue, the dependence of irradiation light intensity, and the photofatigue recovery characteristics. Therefore, Se-based I Zn0j Cas, op
c l Evaluate the optical fatigue of general electrophotographic photoreceptors such as amorphous silicon to manage and develop photoreceptor characteristics.
It can greatly contribute to the development of electrophotographic process control technology such as RPC copiers, laser printers, and intelligent copiers.
第1図は電子写真複写機による複写フ゛ロセスp猶返し
における感光体疲労測定の例を示す電位の変化曲線図、
第2図は本発明の実施のための装置の一例を示す配置図
、第3図は第2図の装置によって得られた電位波形図、
第4図は第3図の△Vと光照射から帯電までの経過時間
との関係線図1である0、
1・・感光体、3・・・帯電器、4 ・光照射部、5電
位測定プローブ○FIG. 1 is a potential change curve diagram showing an example of photoconductor fatigue measurement during repetition of the copying process by an electrophotographic copying machine;
FIG. 2 is a layout diagram showing an example of an apparatus for carrying out the present invention, and FIG. 3 is a potential waveform diagram obtained by the apparatus shown in FIG.
Figure 4 is a relationship diagram 1 between △V in Figure 3 and the elapsed time from light irradiation to charging. Measurement probe○
Claims (1)
に光照射用光源、帯電器、i位測定プローブを順次配置
し、光照射開始時に光源と帯電器の間に位置して光照射
を受けない感光体表面と、光源の反帯電器側に位置して
光照射を受けた感光体表面との帯電電位の差をもって光
疲労を評価する:ことを特徴とする電子写真用感光体の
光疲労評価方法。1) A light source for light irradiation, a charger, and an i-position measurement probe are placed in sequence in the direction of movement facing the surface of a photoreceptor that moves in one direction, and when light irradiation starts, it is positioned between the light source and the charger to A photoreceptor for electrophotography, characterized in that optical fatigue is evaluated based on the difference in charging potential between the surface of the photoreceptor that is not irradiated and the surface of the photoreceptor that is located on the opposite side of the charger of the light source and is irradiated with light. photo fatigue evaluation method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57182387A JPS5971077A (en) | 1982-10-18 | 1982-10-18 | Evaluation of light fatigue of photoreceptor for electronic photography |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57182387A JPS5971077A (en) | 1982-10-18 | 1982-10-18 | Evaluation of light fatigue of photoreceptor for electronic photography |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5971077A true JPS5971077A (en) | 1984-04-21 |
JPH0447813B2 JPH0447813B2 (en) | 1992-08-05 |
Family
ID=16117419
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57182387A Granted JPS5971077A (en) | 1982-10-18 | 1982-10-18 | Evaluation of light fatigue of photoreceptor for electronic photography |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5971077A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7600385B2 (en) | 2005-03-30 | 2009-10-13 | Sumitomo Heavy Industries, Ltd. | Pulse tube cryogenic cooler |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5337025A (en) * | 1976-09-17 | 1978-04-05 | Canon Inc | Stabilizing method for electrostatic latent |
JPS5393030A (en) * | 1977-01-27 | 1978-08-15 | Ricoh Co Ltd | Copying process control method of electrophotographic copying machine |
JPS5532048A (en) * | 1978-08-28 | 1980-03-06 | Fuji Electric Co Ltd | Evaluating method for photosensitivity characteristic of photoreceptor for electrophotographic apparatus |
JPS5626751U (en) * | 1979-08-06 | 1981-03-12 | ||
JPS5719775A (en) * | 1980-07-09 | 1982-02-02 | Matsushita Electric Ind Co Ltd | Electrophotographic device |
-
1982
- 1982-10-18 JP JP57182387A patent/JPS5971077A/en active Granted
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5337025A (en) * | 1976-09-17 | 1978-04-05 | Canon Inc | Stabilizing method for electrostatic latent |
JPS5393030A (en) * | 1977-01-27 | 1978-08-15 | Ricoh Co Ltd | Copying process control method of electrophotographic copying machine |
JPS5532048A (en) * | 1978-08-28 | 1980-03-06 | Fuji Electric Co Ltd | Evaluating method for photosensitivity characteristic of photoreceptor for electrophotographic apparatus |
JPS5626751U (en) * | 1979-08-06 | 1981-03-12 | ||
JPS5719775A (en) * | 1980-07-09 | 1982-02-02 | Matsushita Electric Ind Co Ltd | Electrophotographic device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7600385B2 (en) | 2005-03-30 | 2009-10-13 | Sumitomo Heavy Industries, Ltd. | Pulse tube cryogenic cooler |
Also Published As
Publication number | Publication date |
---|---|
JPH0447813B2 (en) | 1992-08-05 |
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