JPS596039A - X-ray computer tomogram apparatus - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention provides an X-ray conbeater tomography apparatus (hereinafter simply referred to as (hereinafter referred to as OT device).

A slice tomographic image drawn by an X-ray CT apparatus includes object information of a region through which the X-ray beam has passed, and is a tomographic image averaged in the slice direction, corresponding to the width of the X-ray beam in the slice direction.

Normally, the X-ray beam of an X-ray CT device is
A width of ~10 mm is selected depending on the diagnostic purpose. When inspecting a wide range of a subject in a short period of time or in a region where the structure in the slice direction changes gradually, an X-ray beam having a wide width in the slice direction, such as 10 mm, is used. On the other hand, when the structure of the subject in the slice direction is to be inspected, an X-ray beam having a narrow width in the slice direction, such as between 1 and 3, is used.

Here, when the width of the X-ray beam in the slice direction is narrowed, the amount of X-rays incident on the detected X-ray quantity decreases, and the statistical fluctuation of the X-ray photons deteriorates the slice tomographic image.

Therefore, in order to keep the noise level of slice tomograms below a certain level, it is necessary to uniformize the amount of X-rays incident on the X-ray detector by appropriately changing the X-ray generation conditions according to the width of the X-ray beam in the slice direction. However, this has the problem of making the inspection using the X-ray CT apparatus extremely complicated.

An object of the present invention is to solve the problems of the prior art described above, and to provide an X-ray OT capable of efficiently inspecting and rendering good slice tomographic images.
The goal is to provide equipment.

The present invention is characterized by providing an X-ray generation condition selection circuit that uniquely determines the X-ray generation conditions for various widths in the X-ray beam slice direction that are assumed in advance. The goal is to automatically adjust X-ray generation conditions.

Hereinafter, the present invention will be described in detail along with examples.

FIG. 1 is a diagram showing a schematic configuration of an embodiment of the present invention. In the figure, 1 is a control panel device, 2 is a scanning device, and 6 is a high voltage generator, and the scanning device 2 is an X-ray generator 2A.

It includes a collimator device 2B, an X-ray detector 20, and the like.

The control panel device 1 inputs a slice width instruction command a to the collimator device 2B and the high voltage generator 3.

The collimator device 2B limits the width in the slice direction (direction perpendicular to the plane of the paper) of the X-ray beam X incident on the X-ray detector 2C in accordance with the slice width instruction command a.

The high voltage generator 3 selects an X-ray generation condition according to a slice width instruction command a, and supplies high voltage energy E to the two X-ray generators.

FIG. 2 is a diagram showing the internal configuration of the high voltage generator B shown in FIG. 1, where 6A is an X line generation condition selection circuit, and 3B is a high voltage generation circuit. The X-ray generation condition selection circuit is
A high voltage side signal uniquely determined according to the content of the slice width instruction command a is input to the high voltage generation circuit 6B. The high voltage control signal adjusts the X-ray tube voltage value and the or both.

Next, the operation of this embodiment will be explained with reference to FIGS. 1 and 2.

When the slice width instruction command a from the control panel device 1 is input to the collimator device 2B and the X-ray generation condition selection circuit 6A of the high voltage generator B, the contents of the slice width instruction command a are input from the X-ray generation condition selection circuit 3A. Generates a corresponding high voltage control signal. This high voltage control signal S is input to the high voltage generation circuit 6B, and is applied to the Set either or both of the tube voltage value and the X-ray tube current value. On the other hand, in the collimator device 2B, a collimator strip is set according to the slice width instruction command a.

In this state, the X-ray emission start switch of the X-ray generator 2A,
) is turned on, the high voltage generating circuit 3B
The high voltage energy E under the set conditions is applied to the X-ray generator 2A, and an X-ray beam X having a predetermined width in a suitable slice direction is emitted.

As described above, according to the present invention, a good slice tomographic image with a low noise level can be obtained regardless of the selection of the width of the X-ray beam in the slice direction.

[Brief explanation of the drawing]

FIG. 1 is a diagram showing a schematic configuration of an embodiment of the present invention, and FIG.
1 is a diagram showing the internal configuration of the high voltage generator shown in FIG. 1. FIG. 1 Control panel device 2 Scanning device 6 High voltage generation device 3A-X-ray generation condition selection circuit 6B High voltage generation circuit a Slice width instruction command b High voltage control signal E High voltage energy agent Patent attorney Aki 1) Haru Ki

Claims (1)

[Claims] In the X-ray conbeater tomography apparatus, means for changing the width of the X-ray beam in the slice direction, means for changing the X-ray generation conditions, and means for setting the X-ray generation conditions according to the width of the X-ray beam in the slice direction are provided. An X-ray combinator tomography device characterized by comprising: