JPS595974A - 干渉雑音試験装置 - Google Patents

干渉雑音試験装置

Info

Publication number
JPS595974A
JPS595974A JP57114635A JP11463582A JPS595974A JP S595974 A JPS595974 A JP S595974A JP 57114635 A JP57114635 A JP 57114635A JP 11463582 A JP11463582 A JP 11463582A JP S595974 A JPS595974 A JP S595974A
Authority
JP
Japan
Prior art keywords
interference noise
measured
intensity
band
receiver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57114635A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0143913B2 (cs
Inventor
Koitaro Kasai
笠井　鯉太郎
Toshio Abe
俊雄 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP57114635A priority Critical patent/JPS595974A/ja
Publication of JPS595974A publication Critical patent/JPS595974A/ja
Publication of JPH0143913B2 publication Critical patent/JPH0143913B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G01R31/3161—Marginal testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57114635A 1982-07-01 1982-07-01 干渉雑音試験装置 Granted JPS595974A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57114635A JPS595974A (ja) 1982-07-01 1982-07-01 干渉雑音試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57114635A JPS595974A (ja) 1982-07-01 1982-07-01 干渉雑音試験装置

Publications (2)

Publication Number Publication Date
JPS595974A true JPS595974A (ja) 1984-01-12
JPH0143913B2 JPH0143913B2 (cs) 1989-09-25

Family

ID=14642752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57114635A Granted JPS595974A (ja) 1982-07-01 1982-07-01 干渉雑音試験装置

Country Status (1)

Country Link
JP (1) JPS595974A (cs)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60233570A (ja) * 1984-05-07 1985-11-20 Tohoku Metal Ind Ltd 妨害波測定方法
JPS6465465A (en) * 1987-09-05 1989-03-10 Tokin Corp Radiation noise measuring instrument

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60233570A (ja) * 1984-05-07 1985-11-20 Tohoku Metal Ind Ltd 妨害波測定方法
JPS6465465A (en) * 1987-09-05 1989-03-10 Tokin Corp Radiation noise measuring instrument

Also Published As

Publication number Publication date
JPH0143913B2 (cs) 1989-09-25

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