JPS595905A - Device for detecting position of body - Google Patents

Abstract

PURPOSE:To measure the position of a body highly accurately without contact, by detecting the position of a body to be measured in a monitored region between a fixed infrared ray sensor and the surface of a monitored background based on the change in the amount of the infrared rays from the monitored region, which are detected by a sensor. CONSTITUTION:An infrared ray sensor 2, in which the upper surface of a lower plate 1b is made to be a surface S of a monitored background, is provided on the central part of an upper plate 1a of a ?-shaped casing 1. The sensor 2 is connected to an amplifier 6, an operating device 7, and a display device 8 by a connector 4 and a lead wire 5. A body to be measured 3 is brought to a reference position. The difference between the amount of radiated infrared rays from a monitored region V, which are inputted to the sensor 2, and the amount of the radiated infrared rays from the monitored region V, which are inputted to the sensor 2 when the body 3 is displaced from the reference position, is obtained. The position of the body 3 is detected based on said difference. Thus the position of the body 3 can be readily measured with good accuracy without contact and without receiving light.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an object position detection device having a completely new configuration using an infrared sensor.

For example, when detecting the edge position of a film in the manufacturing process of photographic film, etc., means that use normal light, such as phototransistors, cannot be used because of the interruption of exposure. The non-invention, which is also inappropriate since there is a risk of damaging the film due to the possibility of damaging the film, was made in view of the actual situation.
The purpose is to be able to easily and accurately measure the position of an object without contacting it without causing the problem of exposure to light, and to have an extremely simple configuration and low cost. The object of the present invention is to provide an object position detection device that can be manufactured in a number of ways.

In order to achieve the above object, an object position detection device according to the present invention is configured to be able to place a measured object within a monitoring area between a fixedly provided infrared sensor and its monitoring background surface, and an amount of infrared radiation from the monitoring area that enters the infrared sensor when the object is at a reference position; and an amount of infrared radiation from the monitoring area that enters the infrared sensor when the object to be measured is displaced from the reference position. The measuring object is characterized in that it is configured to detect the object to be measured based on the difference in position 11'.

According to the above configuration, when the object to be measured is located within the monitoring area of the infrared sensor, based on the change in the amount of infrared radiation from the monitoring area detected by the infrared sensor,
It is possible to easily and highly accurately measure the displacement of an object from its reference position, that is, its position, and it uses infrared rays instead of using phototransistor or contact sensor sound, which normally requires optical sound. Moreover, since it uses a non-contact infrared sensor, even if the object to be measured is photosensitive or soft, there is no risk of exposure or damage, so you can use it with confidence. can be used.

In addition, the special configuration of the device C is an extremely simple configuration that only requires an infrared sensor, its background, and a casing for fixing them, and the rest is only connected to a general-purpose amplifier and display. Therefore, it can be made very cheap.

In particular, the background surface for monitoring infrared rays is suitably combined with a plurality of areas having different infrared emissivity so that different amounts of infrared rays are radiated at the same point in time (same temperature condition ff = 1). With this configuration, accurate measurement can be reliably performed regardless of the infrared emissivity and temperature conditions of the object to be measured.

In other words, if the temperature and infrared emissivity of the monitoring background surface are sufficiently higher than those of the object to be measured, the amount of infrared rays radiated from the object to be measured can be ignored in the measurement, so the above configuration can be used to determine the position of the object to be measured. However, if the temperature and infrared emissivity of the monitoring background surface and the measured object are similar, the amount of radiated infrared rays per unit area of the monitoring background surface and the amount of radiated infrared rays per unit area of the measured object can be detected. Since the amounts are almost equal,
Even if the object to be measured is displaced from the reference position, the total amount of infrared rays incident on the infrared sensor does not substantially change. In this respect, the monitoring background surface is composed of a plurality of area parts with different infrared emissivity t' divided by boundary lines that intersect or overlap with the object to be measured, and the plural area parts are only on one side of the object to be measured. To locate or to go;
If the configuration is such that different areas are located on both sides of the object to be measured, the temperature of the object to be measured is equal to the temperature of the monitoring background surface, and the emissivity is the same as that of any one area. Even if there is, the emissivity will be different from other area parts. In other words, the amount of radiated infrared rays per unit area of the object to be measured is equal to the amount of radiated infrared rays per unit area of any one area part. However, the amount of radiated infrared rays per unit area differs depending on the other area, and furthermore, as the measured object is displaced from the reference position, the actual area of the other area, that is, the measured object Since the area of the unobstructed area changes depending on the object, the total amount of infrared rays incident on the infrared sensor changes by an amount corresponding to the amount of displacement of the object to be measured.

Therefore, the position of the object to be measured can be detected with high accuracy regardless of the infrared emissivity and temperature conditions of the object to be measured.

Hereinafter, an embodiment of the F1 invention will be explained based on all the drawings.

FIG. 1 shows an object position detection device according to the present invention, in which an infrared sensor 2 is fixedly installed at the center of the upper plate 1a of a U-shaped casing l, with the upper surface of the F plate 1b serving as the monitoring background surface S.
The infrared sensor 2 is configured such that one edge of the object to be measured 3 can be placed within a monitoring area V formed between the infrared sensor 2 and its monitoring background surface S, and the infrared sensor 2 is connected to the infrared sensor 2 via a connector 4 and five lead wires. An amplifier 6, an arithmetic unit V17, and a display 8I are connected to each other. It is configured to detect the entire position of the object to be measured based on the difference between the amount of infrared radiation from the monitoring area V that enters the infrared sensor 2 when the object is displaced from its position.

That is, as shown in FIG. 2, if one edge of the object to be measured 3 is displaced from the reference position shown by the dotted line to the state shown by the dashed line with respect to the monitoring background surface S, the infrared rays The amount of infrared rays detected by sensor 2 changes. Therefore, by determining the relationship between the displacement of the object 3 and the output of the infrared sensor 2 in advance through calibration or the like and storing it in the arithmetic unit 7, the displacement of the object 3 (i.e.,
Based on the change in the amount of infrared rays detected by the infrared sensor 2 due to the change in the amount of intrusion into the monitoring area V, the displacement of the object 3 from the reference position, that is, the position can be measured.

As shown in FIG. 1, the monitoring background surface S is an independent member 9 in the form of a substantially square sheet or panel that is removably attached to the lower plate 1b of the casing l, for example, by a pull-out type. is formed on the top surface of. In addition, this is
Of course, it may be formed directly on the upper surface 1b of the lower plate 1b of the casing 1.

Moreover, as shown in FIG. 2, this monitoring background surface S is divided into two area portions S,...
It is divided into S2, and is coated with -10,000 area parts, so that the side area parts S, S2 have different emissivity ratios. It is configured to emit all infrared radiation. Incidentally, instead of changing the emissivity depending on the color applied to each area s, , Sz'e, it is also possible to appropriately combine materials having different emissivities even if they are of the same color.

Furthermore, the area is not limited to being divided into two area portions S, , S, by diagonal boundary lines as described above, but may be divided as shown in FIG. 3. In short, the object to be measured 3
When placing one edge within the monitoring area V, the monitoring background surface S
may be divided into a plurality of area portions S1 and S2 by a boundary line in a direction intersecting the object to be measured 3.

Furthermore, as shown in FIG. 4, when the object to be measured 3 is placed within the monitoring area V over its entire width direction, two boundaries are defined by the boundary line that overlaps the monitoring background surface St and the object to be measured 3. The measuring object 3 may be divided into area portions S, . In any of these embodiments, the amount of radiated infrared rays detected by the infrared sensor always changes with the displacement of the object 3 regardless of the emissivity or temperature conditions of the object 3 to be measured, so that measurement is impossible. It will never happen.

In addition, as shown in FIG.
If the change is made stepwise at a predetermined interval such as every m, the infrared sensor and noser 2
Since the detected amount of infrared rays changes in a peculiar manner, the displacement of the object 3 can be measured almost digitally by kneading, and in this case, the above-mentioned calibration can be made unnecessary, making the measurement even easier. It can be done.

Furthermore, the independent member 9 or the lower plate 1b forming the monitoring background surface S may be constantly immersed in a constant temperature bath or heated to a constant temperature with a thermostatic heater. If a device for maintaining the background surface Sk at a constant temperature is attached, there is no need to perform temperature calibration, and the measurement can be performed with higher accuracy than the background surface Sk without being affected by changes in ambient temperature.

Further, area portions S1 and S forming the monitoring background surface S
2i are made of the same material, and by cooling them with cooling water or the like, they can be maintained at different temperatures to form area portions S,, S, with different emissivities.

[Brief explanation of drawings]

The drawings are for illustrating embodiments of the present invention and for explaining the entire operation of the present invention. FIG. 1 is an overall configuration diagram, FIG. Each figure is a plan view of a main part showing different embodiments. 2... Infrared sensor, 3... Measured object, S...
Monitoring background surface, S2...area part, ■...monitoring area. No, N ←

Claims (1)

[Scope of Claims] ■ An object to be measured can be placed in a monitoring area between a fixedly provided infrared sensor and its monitoring background surface, and when the object to be measured is at a reference position, The object to be measured is determined based on the difference between the amount of infrared rays radiated from the specified monitoring area that enters the infrared sensor and the amount of infrared rays radiated from the monitoring area that enters the infrared sensor when the object to be measured is displaced from the reference position. An object position detection device characterized in that it is configured to detect the position of an object. (i) The monitoring background surface is composed of a plurality of area portions having different infrared emissivities divided by boundary lines that intersect or overlap with the object to be measured, and the plurality of area portions are located only on one side of the object to be measured. The object position detecting device according to claim 1, wherein the object position detecting device is configured such that different areas are arranged on both sides of the object to be measured.