JPS5940871U - Integrated circuit automatic test equipment - Google Patents
Integrated circuit automatic test equipmentInfo
- Publication number
- JPS5940871U JPS5940871U JP13551982U JP13551982U JPS5940871U JP S5940871 U JPS5940871 U JP S5940871U JP 13551982 U JP13551982 U JP 13551982U JP 13551982 U JP13551982 U JP 13551982U JP S5940871 U JPS5940871 U JP S5940871U
- Authority
- JP
- Japan
- Prior art keywords
- identification number
- integrated circuit
- printing device
- integrated circuits
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来の集積回路自動試験装置を示すブロック図
、第2図はこの考案による集積回路自動試験装置を示す
ブロック図であり、1は被測定IC,2は自動送り装置
、3はテストヘッド、4は記憶装置、5は中央処理装置
、6は入出力インターフェース、7は信号源、8は計測
器、9は印−字装置、10はキーボード、11は識別番
号印字装置、12はカウンター、13は識別番号読み取
り装置である。尚、図中同一あるいは相当部分には同一
符号を付して示しである。FIG. 1 is a block diagram showing a conventional integrated circuit automatic testing device, and FIG. 2 is a block diagram showing an integrated circuit automatic testing device according to this invention, where 1 is an IC to be measured, 2 is an automatic feeder, and 3 is a tester. 4 is a storage device, 5 is a central processing unit, 6 is an input/output interface, 7 is a signal source, 8 is a measuring device, 9 is a printing device, 10 is a keyboard, 11 is an identification number printing device, 12 is a counter , 13 is an identification number reading device. In the drawings, the same or corresponding parts are designated by the same reference numerals.
Claims (1)
つ自動的に順次送り出してテストヘッドに装着する自動
送り装置と、上記集積回路の入力端子に信号を印加し、
更に出力端子からの信号を計測器に接続するためのテス
トヘッドと、上記集積回路の特性値を計測するたあに必
要なプログラムおよび計測結果等を記憶する記憶装置と
、上記記憶装置との間でデータの(受を行うと共に信号
源および計測器に制御信号を与える中央処理装置と、計
測結果等を印字する印字装置とから成る集積回路自動試
験装置において、被測定集積回路が収納ケースから送り
出されてテストヘッドに装着されるまでの過程に多数の
被測定集積回路を識別するためのコード、番号または記
号あるいはこれらの組み合せによる識別番号を上記集積
回路のボディまたは端子に印字する識別番号印字装置と
、上記印字装置により印字する識別番号が多数の被測定
集積回路に対して重複しないように識別番号を順次繰り
上げまたは繰り下げて印字する識別番号を識別番号印字
装置に指示するカウンターと、上記印字装置により印字
した識別番号を読み取る識別番号読み取り装置とを付加
したことを特徴とする集積回路自動試験装置。an automatic feeding device that automatically sequentially feeds a large number of integrated circuits to be measured stored in a storage case one by one and attaches them to a test head; and a signal is applied to an input terminal of the integrated circuit;
Furthermore, a test head for connecting the signal from the output terminal to a measuring instrument, a storage device for storing programs and measurement results necessary for measuring the characteristic values of the integrated circuit, and the storage device; In automatic integrated circuit testing equipment, which consists of a central processing unit that receives data and provides control signals to signal sources and measuring instruments, and a printer that prints measurement results, etc., the integrated circuit under test is sent out from the storage case. An identification number printing device that prints an identification number in the form of a code, number, symbol, or a combination thereof to identify a large number of integrated circuits under test on the body or terminals of the integrated circuits before they are mounted on a test head. a counter for instructing the identification number printing device to print an identification number by sequentially incrementing or decrementing the identification number so that the identification number printed by the printing device does not overlap with a large number of integrated circuits under test; and the printing device 1. An automatic integrated circuit testing device comprising: an identification number reading device for reading an identification number printed by an integrated circuit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13551982U JPS5940871U (en) | 1982-09-07 | 1982-09-07 | Integrated circuit automatic test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13551982U JPS5940871U (en) | 1982-09-07 | 1982-09-07 | Integrated circuit automatic test equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5940871U true JPS5940871U (en) | 1984-03-15 |
Family
ID=30305000
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13551982U Pending JPS5940871U (en) | 1982-09-07 | 1982-09-07 | Integrated circuit automatic test equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5940871U (en) |
-
1982
- 1982-09-07 JP JP13551982U patent/JPS5940871U/en active Pending
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