JPS5940273A - Electric field meter using polarization surface preserving optical fiber - Google Patents
Electric field meter using polarization surface preserving optical fiberInfo
- Publication number
- JPS5940273A JPS5940273A JP57151036A JP15103682A JPS5940273A JP S5940273 A JPS5940273 A JP S5940273A JP 57151036 A JP57151036 A JP 57151036A JP 15103682 A JP15103682 A JP 15103682A JP S5940273 A JPS5940273 A JP S5940273A
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical fiber
- electric field
- polarization
- beam splitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
- G01R29/0885—Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminiscent, glow discharge, or optical interferometers
Abstract
Description
【発明の詳細な説明】
本発明は偏波面保存光ファイバを用いた電界計に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an electric field meter using a polarization maintaining optical fiber.
従来の一般的な電界計は、端子間の電位差を求め、それ
から電界を求めるものがほとんどである。一般に端子は
金属であり、端子を測定電界の中に入れると電界の乱れ
を生じる。−!た非常な高電圧中においてはこの端子に
短絡することも考えられる。Most conventional electric field meters measure the potential difference between terminals and then calculate the electric field. Generally, the terminal is made of metal, and when the terminal is inserted into the measuring electric field, the electric field is disturbed. -! It is also possible that this terminal may be short-circuited under extremely high voltage conditions.
光を用いた電界計測においては、電気光学素子の両側を
crossする偏光板ではさみマルチモードファイバで
人力し、マルチモードファイバで出力をとシだす方式の
ものがある。ただしこの場合にはマルチモードファイバ
内の偏光面が完全にランダムな場合には安定となるが、
完全にランダムでないとき、また光源そのものが不安定
であるとき、マルチモードファイバに外乱があるときに
は出力が不安定となシ、誤差要因となる。In electric field measurement using light, there is a method in which both sides of an electro-optical element are sandwiched between crossed polarizing plates, manually operated with a multimode fiber, and output is outputted through the multimode fiber. However, in this case, it will be stable if the polarization plane in the multimode fiber is completely random, but
When the output is not completely random, when the light source itself is unstable, or when there is a disturbance in the multimode fiber, the output becomes unstable and causes errors.
しかも温度による偏光板の特性変化が大きいのでセンサ
一部の耐環境性が悪い。Moreover, since the characteristics of the polarizing plate vary greatly depending on temperature, the environmental resistance of a part of the sensor is poor.
本発明の目的は、前記した従来技術の欠点を解消し、高
精度の電界計を提供することにある。An object of the present invention is to eliminate the drawbacks of the prior art described above and provide a highly accurate electric field meter.
すなわち本発明の要旨は、光ファイバとして偏波面保存
光ファイバを用い位相変化量を測定することにある。That is, the gist of the present invention is to measure the amount of phase change using a polarization maintaining optical fiber as the optical fiber.
本発明の構成を実施例を示す図面を参照して具体重に説
明する。第1図において、光源1から出だ光は偏光板2
によって直線偏光となりλ/2板6により偏波面保存光
ファイバ4の光軸に結合される。出射光は出射直線偏光
が光軸と45°の傾きをなすように配置された電気光学
素子5をとおり、電気光学素子の光軸に光軸をあわせた
分波用偏光ビームスプリッタ6に入射される。従って電
界が印加されない場合には、直線偏光が分波用偏光ビー
ムスプリッタ乙に入射され、電界が光の進行方向に印加
されている場合には、電気光学素子の光軸間に印加電界
に比例した屈折率差が生じ、これによる2軸の光の間に
位相差が生じ、楕円偏光が分波用偏光ビームスプリッタ
乙に入射される。The structure of the present invention will be specifically explained with reference to drawings showing embodiments. In Fig. 1, the light emitted from the light source 1 is polarized by the polarizing plate 2.
The light becomes linearly polarized light, and is coupled to the optical axis of the polarization-maintaining optical fiber 4 by the λ/2 plate 6. The emitted light passes through an electro-optical element 5 arranged so that the emitted linearly polarized light forms an inclination of 45 degrees with the optical axis, and enters a polarizing beam splitter 6 whose optical axis is aligned with the optical axis of the electro-optical element. Ru. Therefore, when no electric field is applied, linearly polarized light is incident on the polarizing beam splitter B, and when an electric field is applied in the direction in which the light travels, it is proportional to the electric field applied between the optical axes of the electro-optical element. A refractive index difference occurs, which causes a phase difference between the two axes of light, and the elliptically polarized light is incident on the polarizing beam splitter B.
2本の偏波面保存光ファイバ4′、4“は各々光軸にあ
わされておシ、分波用偏光ビームスプリッタ乙に楕円偏
光が入射された場合には各軸の成分が各々伝送され、ふ
たたび合波用偏光ビームスプリッタ7により合成され楕
円偏光となり、受光部8に受光される。これを解析する
ことにより、位相変化量が求まり(例えばセナルモンの
方法により)それより印加電界が計測される。ここで電
気光学素子(例えばポッケルス素子)5の両側には偏光
板を設ける必要はない。The two polarization-maintaining optical fibers 4' and 4'' are aligned with their respective optical axes, and when elliptically polarized light is incident on the polarization beam splitter B, the components of each axis are transmitted, respectively. The light is combined again by the combining polarizing beam splitter 7 to become elliptically polarized light, which is received by the light receiving section 8.By analyzing this, the amount of phase change is determined (for example, by Senarmont's method), and from this the applied electric field is measured. Here, it is not necessary to provide polarizing plates on both sides of the electro-optical element (eg, Pockels element) 5.
偏波面保存光ファイバとしては、例えば特開昭57−3
7305号公報記載のものが適用できるが、特にこの構
造に限定するものではない。As a polarization maintaining optical fiber, for example, Japanese Patent Application Laid-Open No. 57-3
The structure described in Japanese Patent No. 7305 can be applied, but the structure is not particularly limited to this structure.
なお、第2図に示すように、位相変調器9によって位相
変調をかけ、電界印加による変調信号の変化量を測定し
てもよく、第6図に示すように、周波数変調器10を挿
入し、電界による周波数シフトを受光部でビート周波数
として測定してもよい。Note that, as shown in FIG. 2, the phase modulator 9 may be used to apply phase modulation and the amount of change in the modulated signal due to the application of an electric field may be measured, or as shown in FIG. 6, a frequency modulator 10 may be inserted. , the frequency shift caused by the electric field may be measured as a beat frequency by the light receiving section.
以上説明したような本発明の電界計であれば、次のよう
な顕著な効果を奏する。The electric field meter of the present invention as described above has the following remarkable effects.
(1)センサ一部に金属を用いていないので絶縁性に優
れている。(1) Since no metal is used in the sensor, it has excellent insulation properties.
(2)偏波面保存光ファイバを用いているので外乱によ
る偏波ゆらぎが小さく高精度で安定な特性を有する。(2) Since a polarization-maintaining optical fiber is used, polarization fluctuations due to external disturbances are small, and the device has highly accurate and stable characteristics.
(6)センサ一部に偏光板を用いていないので耐環境性
に優れている。(6) Since a polarizing plate is not used in a part of the sensor, it has excellent environmental resistance.
第1図、第2図及び第6図は本発明電界計のそれぞれ異
なる実施例を示す説明図である。
1:光源、2:偏光板、6:λ/2板、4:偏波面保存
光ファイバ、
5:電気光学素子、
6:分波用偏光ビームスプリッタ、
7:合波用偏光ビームスプリッタ、
8:受光部、9二位相変調器、
10:周波数変調器。
代理人 弁理士 佐 藤 不二雄
=5−
算 1 凹
見 Z 目
揶 3121IFIG. 1, FIG. 2, and FIG. 6 are explanatory diagrams showing different embodiments of the electric field meter of the present invention. 1: Light source, 2: Polarizing plate, 6: λ/2 plate, 4: Polarization maintaining optical fiber, 5: Electro-optical element, 6: Polarizing beam splitter for demultiplexing, 7: Polarizing beam splitter for multiplexing, 8: Light receiving section, 9 two-phase modulator, 10: frequency modulator. Agent Patent Attorney Fujio Sato = 5- Arithmetic 1 Kokumi Z Meki 3121I
Claims (1)
するだめの光源1と、直線偏光を光軸に45°の方位で
結合する電気光学素子5と、該電気光学素子5の出力光
を分波する分波用偏光ビームスプリッタ6と、該分波用
偏光ビームスプリッタ6によシ分波されたふたつの偏光
をそれぞれ偏波面保存光ファイバ4z4//により導い
て合波する合波用偏光ビームスプリッタ7と・両側光の
位相差を測定する受光部8とを有することを特徴とする
偏波面保存光ファイバを用いた電界計。1. A light source 1 that supplies linearly polarized light via a polarization-maintaining optical fiber 4, an electro-optical element 5 that couples the linearly polarized light at an orientation of 45° to the optical axis, and an electro-optical element 5 that couples the output light of the electro-optical element 5 to the optical axis. A polarization beam splitter 6 for demultiplexing, and polarized light for multiplexing that guides and combines the two polarized lights split by the polarization beam splitter 6 through polarization maintaining optical fibers 4z4//. An electric field meter using a polarization maintaining optical fiber, characterized by having a beam splitter 7 and a light receiving section 8 for measuring the phase difference between the beams on both sides.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57151036A JPS5940273A (en) | 1982-08-31 | 1982-08-31 | Electric field meter using polarization surface preserving optical fiber |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57151036A JPS5940273A (en) | 1982-08-31 | 1982-08-31 | Electric field meter using polarization surface preserving optical fiber |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5940273A true JPS5940273A (en) | 1984-03-05 |
Family
ID=15509893
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57151036A Pending JPS5940273A (en) | 1982-08-31 | 1982-08-31 | Electric field meter using polarization surface preserving optical fiber |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5940273A (en) |
-
1982
- 1982-08-31 JP JP57151036A patent/JPS5940273A/en active Pending
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