JPS5935144B2 - Color cathode ray tube equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a color cathode ray tube device suitable for use as a color image projection device.

Various types of color image projection devices have been proposed.

For example, red, green, and blue monochromatic cathode ray tubes are used, and the red, green, and positive monochromatic optical images obtained by these cathode ray tubes are combined on a screen to obtain a color projection image. There is something like this. Such a so-called three-tube type color image projection device obtains each color image using a monochromatic cathode ray tube. A color optical image in which the images are synthesized is obtained from a single ordinary color cathode ray tube,
That is, since there is no electrode for determining the landing position of the electron beam facing the fluorescent surface and determining the landing position on the fluorescent surface, such as a shadow mask, the electron beam The advantage is that the utilization rate of color is increased and a bright color projected image can be obtained.

However, in the case of such a three-tube system, not only is the overall size large, but also precision is required to set the mutual positional relationship of the three cathode ray tubes, which is disadvantageous in terms of manufacturing and handling. The present invention provides a color cathode ray tube which has a single-tube structure and is suitable for application to a color image projection apparatus, which eliminates the arrangement of electrodes for determining the electron beam arrival position, such as a shadow mask, which restricts the electron beam. There are some who are willing to provide the equipment.

That is, the present invention has a cathode ray tube configuration using an index method that eliminates the need for disposing a shadow mask or the like that has the effect of blocking part of the electron beam, and furthermore, the index signal can be easily extracted. This allows a bright color image to be obtained using a single beam in a single tube.

The present invention will be described in detail below with reference to the drawings. In the present invention, for example, as shown in FIG. 1, a tube body 1 having a neck portion 1n and a funnel portion 1f is provided, and the neck portion 1n
An electron gun 3 that emits, for example, a single beam 2 is disposed within the tube body 1, and a target 5 having a fluorescent surface 4 disposed on the side opposite to the electron gun 3 is disposed within the funnel portion 1f of the tube body 1. or,
A concave mirror, such as a spherical mirror 6, is disposed on the inner surface of the funnel portion 1f on the neck portion side, or at a position facing the inner surface so as to face the fluorescent surface 4 of the target 5.

Further, in front of the tube body 1, a correction lens 7 such as a Schmitt lens or a meniscus lens is disposed opposite to the panel section 1p disposed on the open end side of the funnel section 1f, or a correction lens 7 such as a Schmitt lens or a meniscus lens is disposed in front of the panel section 1p. itself is constituted by this correction lens 7, and thus, the concave mirror 6 and the correction lens 7 create a correction image on the path of the optical image generated by scanning the beam 2 from the electron gun 3 onto the fluorescent surface 4. It constitutes a lens system or a bower lens system.

Reference numeral 8 denotes horizontal and vertical deflection means for scanning the electron beam 2 on the fluorescent surface 4 in horizontal and vertical directions.

In the present invention, an index signal extraction means 9 is arranged on the opposite side of the fluorescent surface 2 of the target 5 from the electron gun 3.

An example of this index signal extraction means 9 and target 5 will be explained with reference to FIG.

In this case, the target 5 may be formed into a curved spherical shape that bulges toward the side facing the electron gun 3. Also, this target 5
has a substrate 10 made of, for example, metal and has a thickness T large enough to maintain its mechanical strength, and a thin metal plate 11 attached to the bulging side surface of the substrate 10. A fluorescent surface 4 is attached to the bulging curved surface side of the thin plate 11, that is, the side facing the electron gun 3. The phosphor surface 4 has red, green, and blue phosphor stripes R, G, and B extending vertically arranged in a predetermined order, as shown in FIGS. 3 and 4, for example. It has a structure in which, for example, a light-absorbing stripe called a guard band 12 is arranged between each phosphor stripe.

In the present invention, for example, the phosphor stripes are arranged in a predetermined positional relationship corresponding to a set (trifret) of adjacent phosphor stripes R, G, and B, or to a plurality of sets. A through hole 13 is bored.

In the illustrated example, a through hole 13 is bored at a position where a guard band 12 is to be placed between a blue stripe B and a red stripe R corresponding to each set of stripes R, G, and B. . This through hole 13 is made of stripes R and B, for example.
However, for a thick base 10, the width may be relatively large. That is, the substantial size of the through hole 13 is defined by the through hole in the thin plate 11. And, this thin plate 11 is
Since its thickness is thin, it can be formed with high precision and a delicate pattern by, for example, photo etching. The pattern on the side of the phosphor surface 4 of the through-hole 13 can also be formed as a slit extending vertically along the direction of extension of each phosphor stripe R, G, and B, as shown in FIG. 3, for example. However, in order to maintain sufficient mechanical strength of the thin plate 11 and therefore the fluorescent surface 4, the through holes 1 are formed as shown in FIG.
3 may extend in the direction of extension of each phosphor stripe or may be intermittent slits.

Furthermore, in this case, by arranging the horizontally adjacent slits so that they are partially opposed to each other but alternately shifted in position, it is possible to avoid a decrease in mechanical strength due to the provision of the slits 13. can. Further, the index signal take-out device 9 disposed on the opposite side of the target 5 from the side facing the electron gun 3 may be configured, for example, by maintaining a required large distance d from the target 5 as shown in FIG. The electrode plate 14 may be constructed by arranging, for example, a spherically curved electrode plate 14.

In such a configuration, the electron beam 2 emitted from the electron gun 3 is horizontally and vertically scanned on the fluorescent surface 4. In this case, the electron beam is transmitted through the through hole 13 at a position above the through hole 13. 2 passes through the target 5 and heads towards the electrode plate 14, a current flows through the electrode plate 14 and the index signal can be taken out from its terminal t.

For example, in the case of the electron beam 2 having the pattern explained in FIG. 3, when the electron beam 2 scans along the dashed line a in FIG.
, and flows to the electrode 14, thereby causing the
As shown in the figure, index signals are taken out at positions corresponding to each through hole 13. Therefore, using this index signal as a reference, signals R, G, and B of each color are given to the electron gun as shown in FIGS. If the density is modulated according to the signal, a beam corresponding to the signal of each color will land on the phosphor of each color, and an optical image without color shift can be obtained. Also, in the configuration shown in FIG. 4, when the scanning line scans the position shown by the dashed line b in FIG. 4, an index signal having the same period (frequency) as in the case of FIG. The index signal shown in FIG. 5A is obtained, and when scanning the position shown by the chain line C, the index signal shown in FIG. 5B is obtained. In this case, each stripe R,
Even when scanning is performed obliquely to the direction of extension of G, B and the slit 13 as shown by the chain line d,
Since the index signal shown in is extracted, a color signal can be applied to the electron gun 3 using this as a reference, and an optical image without color shift can be reproduced. In the above example, the index signal extraction means 9 extracts the index signal using the current of the electron beam 2 itself, but various configurations can be used as the index signal extraction means. obtain.

For example, as shown in FIG. 6, on the opposite side of the target 5 to the side facing the electron gun 3, there is a phosphor 15 that emits radiation other than visible light, such as ultraviolet rays or infrared rays, due to the impact of the electron beam 2, and a phosphor 15 that emits rays other than visible rays, such as ultraviolet rays or infrared rays, is emitted from the phosphor 15. Ultraviolet light or ultraviolet light? It is also possible to arrange a detection element 16 to detect the index signal from which the detection element 16 is arranged. In addition, in Figure 6, the first
The same reference numerals are given to the parts corresponding to those in FIGS. 4 to 4, and redundant explanation will be omitted. Further, as another method for extracting the index signal, for example, as shown in FIG. 7, a secondary electron emitting material 17 having a secondary electron emission ratio δ greater than 1 is coated on the inner surface of the through hole 13 of the thin plate 11. Although not shown in FIG. 7, the secondary electrons generated by the impact of the electron beam on this are collected by the electrode plate 14 of the index take-out means 9 similar to that explained with reference to FIG. It is also possible to extract an index signal. In this case, 2
It is preferable that the secondary electron emitting material 17 is applied to the inner surface of the through hole 13, particularly the thin plate 11, by forming the through hole 13, particularly in the thin plate 11, into a V-shaped cross section that opens toward the side facing the electron gun. . Moreover, as this secondary electron emitting material, the secondary electron emission ratio δ
is sufficiently high, for example, MgO or MgO-Mg or Ni
-Be alloy, Ag-CS2O-CS alloy, etc. can be used. In addition, as described above, when this secondary electron emitting material 17 is applied to the inner surface of the through hole which has a V-shaped cross section and opens in the direction of arrival of the electron beam, the secondary electron emitting material 17 is Since the beam is incident obliquely, the secondary electrons can be emitted effectively. That is, general 2
Since the secondary electron emitting material exhibits a maximum value within a certain range for the energy of the electrons that excites it, the secondary electron emission ratio decreases when the maximum value is exceeded. This is because when the energy of electrons impacting the secondary electron emitting material layer is high,
This is thought to be due to the electron beam passing through the secondary electron material without exciting it, but when the electron beam is made to arrive obliquely to the secondary electron emitting material layer as described above, the electron beam The passage distance through the secondary electron emitting material layer can be increased, the transmission thereof can be effectively avoided, and the secondary electrons can be effectively generated. Further, as another example of the structure of the index signal extraction means and the target, for example, as shown in FIG. At a predetermined position of 4, there is a phosphor 1 capable of emitting light other than visible light, such as ultraviolet rays or infrared rays, by the impact of an electron beam.
5 is applied to the position where the through hole 13 explained in FIG. 3 and FIG. It is also possible to extract the index signal by detecting the index signal by the detection element 16 disposed on the opposite side.

In still another example, a target 5 having a through hole 13 is provided, and an E is provided on the opposite side of the target 5 from the side facing the electron gun 3.
BS(Elec-TrOnBOmbardedSemi
It is also possible to arrange a target consisting of cOnductOr) by means of which the index signal can be extracted. In the apparatus of the present invention described above, the electron beam 2 from the electron gun 3 is scanned onto the fluorescent surface 4 and a color optical image is taken out from the side facing the electron gun 3. 2 is transmitted through the target in accordance with the position of the phosphor, or the light rays or secondary electrons generated by being excited by this beam 2 are detected on the side opposite to the side from which the optical image is taken. Since the index signal is taken out, the arrangement is simplified and the index signal can be taken out reliably.

In addition, for example, the electrode 14 for extracting the index signal can be arranged with a large distance from the target 5, so that the capacitance generated between the two can be made sufficiently small, thereby improving the frequency characteristics. It can be measured. Further, when the above-mentioned device of the present invention is applied to a color image projection device, it can have a single-tube configuration, which has the advantage of making the device compact as a whole and making it easy to handle. Furthermore, the optical image has a beam index type configuration without installing conventional cathode ray tubes, shadow masks, or other means that reduce the use of electron beams, so a bright optical image can be obtained and a bright projected image can be obtained. be able to.

In addition, in the above-mentioned example, the phosphors of each color forming the phosphor surface 4 are arranged in a stripe pattern, or the phosphors of each color are composed of red, green, and blue. Other color combinations and phosphor pattern arrangements and configurations are possible, and through holes 13 for obtaining index signals are possible.
It is obvious that various changes may be made in the specific structure, such as not necessarily arranging the arranging element for each triflet, but arranging one arranging element for a plurality of trifrets.

[Brief explanation of the drawing]

Fig. 1 is a linear sectional view showing an example of the device of the present invention, Fig. 2 is a sectional view of its essential parts, Figs. 3 and 4 are front views showing examples of its fluorescent surface, and Fig. 5. 6 is a waveform diagram for explaining the operation of the apparatus of the present invention, and FIGS. 6 to 8 are line sectional views of main parts showing the target section and the means for extracting the index signal of other examples of the apparatus of the present invention. 1 is a tube body, 2 is a basket beam, 3 is an electron gun, 4 is a fluorescent surface,
5 is a target, 6 is a concave mirror, 7 is a correction lens, 8 is a horizontal/vertical deflection means, 9 is an index signal extraction means,
13 is a through hole.

Claims (1)

[Claims] 1. A fluorescent surface and an electron gun are disposed in the tube opposite to the fluorescent surface, and an optical image from the fluorescent surface is taken out from the side facing the electron gun, and an optical image is taken out from the opposite side. An index signal is obtained by extracting an electron beam from the electron gun that penetrates the fluorescent surface, or light generated by excitation of the electron beam, or secondary electrons. Cathode ray tube device. 2 A fluorescent surface and an electron gun are disposed in the tube, and an optical image from the fluorescent surface is taken out from the side facing the electron gun, and the optical image is taken out from the side facing the fluorescent surface. A reflecting mirror is provided, and a correction lens is disposed on the optical path of the optical image reflected by the reflecting mirror, and a correction lens is provided on the optical path of the optical image reflected by the reflecting mirror, and the correction lens is arranged to reflect the fluorescent light from the side opposite to the side facing the electron gun of the fluorescent surface. A color cathode ray tube characterized in that an index signal is obtained by extracting an electron beam from the electron gun that penetrates the light surface, or light generated by excitation of the electron beam, or secondary electrons. Device.