JPS5935087A - Device for pulling semiconductor single crystal - Google Patents
Device for pulling semiconductor single crystalInfo
- Publication number
- JPS5935087A JPS5935087A JP14445382A JP14445382A JPS5935087A JP S5935087 A JPS5935087 A JP S5935087A JP 14445382 A JP14445382 A JP 14445382A JP 14445382 A JP14445382 A JP 14445382A JP S5935087 A JPS5935087 A JP S5935087A
- Authority
- JP
- Japan
- Prior art keywords
- pulling
- single crystal
- crystal
- chamber
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、たとえば単結晶シリコン等の単結晶半導体の
引上げ装置の改良に関す−る。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in an apparatus for pulling a single crystal semiconductor such as single crystal silicon.
従来、トランジスタ用基板、集積回路用基板の素材とし
ての単結晶半導体たとえば単結晶シリコンのH進法の一
つとしてグーヨコラルスキー法(CZ法)が知られてい
る◎
この方法&i第1図に示すように炉体a内に配置された
ルツボb内に多結晶シリコン原料とコントロール用活性
不純物とを入れて図示しないヒータで加熱することによ
りこれらを溶融させ、シリコン融液Cを得る。そして、
ルツボb内のシリコン融′e、cに種結晶dを浸し、仁
の種結晶di種結晶保持具eを介して連結されたワイヤ
、玉鎖り等の榮体からなる引上げ休fを捲上げて引上げ
るとともに回転させることにより単結晶シリコンg余得
る構成となっている。Conventionally, the Gouyo-Colarski method (CZ method) has been known as one of the H-adic methods for single-crystal semiconductors, such as single-crystal silicon, which are used as materials for transistor substrates and integrated circuit substrates. This method &iFigure 1 As shown in FIG. 2, a polycrystalline silicon raw material and a control active impurity are placed in a crucible b placed in a furnace body a, and heated by a heater (not shown) to melt them and obtain a silicon melt C. and,
Immerse the seed crystal d in the silicon melt e and c in the crucible b, and wind up the pulling material f, which is made of a wire, chain, etc., connected via the seed crystal holder e. The structure is such that an excess amount of single crystal silicon can be obtained by pulling it up and rotating it.
こうし/こ、単結晶シリコンgの引上げ時においては、
種結晶dの回転数を増加させることにより、単結晶シリ
コンgの断面内の比抵抗および酸素濃度の分布特性が改
善されることが一般に知らノ1ており、種結晶dの回転
数を上げることが望まilている。When pulling single crystal silicon g,
It is generally known that increasing the rotational speed of the seed crystal d improves the specific resistance and oxygen concentration distribution characteristics in the cross section of the single crystal silicon g. is desired.
しかしながら、従来においては、第2図(イ)〜に)で
示゛rように炉体aの上に扉体りを備えた剛性を有する
結晶取出しチャンバ(ゾルチャンバ)lを設け、この結
晶取出しチャンバiの上端側に設けた捲−ヒげ機構jに
よって条体からなる引上げ体ttm上げることにより単
結晶シリコンgを結晶取出しチャンバi内に吊上げるよ
うになっている。なお、@)はルツボb内のシリコン融
液Cに種結晶dfK:接触させたところ。(ロ)はli
t結晶7リコンgの引上げを終了したところ。(ハ)シ
\・7トオフバルブによリーヒ方に単結晶シリコンgt
吊上げシャットオフパルプkを閉じたところ。に)は単
結晶シリコンgt取出すために結晶取出しチャンバ1の
扉体hl開けたところをそれぞれ示す〇
このように、従来においては引上げた単結晶シリコンg
e機外へ取出すために、さらに単結晶シリコンgを吊−
にける部分が必要上なってワイヤ、玉鎖り等の条体から
なる引上げ体fの長さがその分だけ長くなり、1mの長
さのJlj結晶シリコンgを取出す′とするとリドにげ
体fの長さは約2.5m必要となる。一方、との挿引上
げ装置にあっては振子と同じで、条体からなる引上げ体
fの長さによる共振回転数で種結晶dの最大回転数はf
U!I限を受け、種結晶dの回転数を思うように上げる
ことができないのが現状である。However, in the past, as shown in FIG. The single crystal silicon g is lifted into the crystal extraction chamber i by raising a pulling body ttm consisting of a strip by a winding mechanism j provided on the upper end side of the single crystal silicon g. Note that @) shows the seed crystal dfK: brought into contact with the silicon melt C in the crucible b. (b) is li
Finished pulling t-crystal 7 recon g. (c) Monocrystalline silicon gt on the Leahy side using the 7-off valve.
Lifting shut-off pulp k is closed. ) shows the opening of the door hl of the crystal extraction chamber 1 in order to take out the single crystal silicon gt. In this way, in the past, pulled single crystal silicon g
e To take it out of the machine, hang the monocrystalline silicon g.
As the length of the pulling body f made of strips such as wires and chains becomes longer, the length of the pulling body f consisting of strips such as wires and chains becomes longer. The length of f is required to be approximately 2.5 m. On the other hand, in the insertion and pulling device with , it is the same as a pendulum, and the maximum rotation speed of the seed crystal d is f
U! Currently, the number of rotations of the seed crystal d cannot be increased as desired due to the I limit.
すなわち、引上げ体fの回転数を増大させようとすると
、引−1−げ機構jがらの振動により、引−ヒげ中の単
結晶シリコンgの揺動およびシリコン融液Cの表面の摂
動が発生し2でt)1.結晶シリコンgの成長が困難と
なる。したが9で、引−ヒげ体fの回転数を一定限度以
上増加rることができず、中結晶シリコンgの断面内の
比抵抗およびv!素濃度の分布特性を改善することがで
きなくなるといった欠点があった。That is, when an attempt is made to increase the rotational speed of the pulling body f, the vibration of the pulling mechanism j causes the swing of the single crystal silicon g in the pulling member and the perturbation of the surface of the silicon melt C. Occurred at 2 t) 1. This makes it difficult to grow crystalline silicon g. However, in 9, the rotational speed of the drag body f cannot be increased beyond a certain limit, and the specific resistance in the cross section of the medium crystalline silicon g and v! There was a drawback that it became impossible to improve the distribution characteristics of elementary concentration.
本発明は、上記事情にもとづきなされ/こものて、その
目的とするところは、引−にげ中のtψ結晶千導体の揺
llll1.I、−よび溶融半導体表面の振動を発生さ
1力ることなく、種結晶の回転数を増加させノ)ことに
より、断面内の比抵抗および酸素(農度の分布”6j
t’l:が改善された庁結晶坐導体を製造し2川るt)
当結晶゛ト導体の引上げ装置を提供しようとするものC
ある。The present invention has been made based on the above circumstances, and its object is to shake a tψ crystal thousand conductor during removal. By increasing the rotational speed of the seed crystal without generating vibrations on the surface of the molten semiconductor and the resistivity in the cross section and the distribution of oxygen
t'l: Manufactured an improved crystalline conductor.
C which seeks to provide a pulling device for this crystal conductor.
be.
〔発明の概苅J
本発明ケよ、かかる目的を達成するために、師結晶に連
結゛さ71/ζワイヤ、玉鎖り等の条体からなる引14
げ体を」を上げる焼土げ機構をりう、結晶゛V・2、I
y体の引」二げ方向に沿って昇降自在とするととにべの
4巻上げ(幾(故によって引上げた単結晶半導体が収容
される結晶取出しブートン・2f従来の剛1生を41ノ
ー、乙ものからイ中縮自在なものに・紀ミえ、1曲も1
(:縮1..− r/と一状聾で引上げを行なうことに
より引上げ体の長さをケ(1くして、回転否9を高くで
きるよう(゛?二17だもので才)る〇
実施例
lR,’F、本発明の一実hiIt例6= lr 3
図オj ヒgE 4口金参照して説明する。図中1は上
部に開口部を有した炉体(チャンバ)であり、この炉体
1内にはルツボ2が配置され、かつ該ルツボ2は炉体1
内に挿入された支持棒3によって支持された状態になっ
ている。[Summary of the Invention] In order to achieve the above object, the present invention provides a method of connecting a crystal 71 to a master crystal;
Using the baked clay mechanism to raise the body, the crystal ゛V.2, I
If the y-body can be raised and lowered freely along the two-way direction, the crystal extraction bouton 2f, in which the pulled single crystal semiconductor is accommodated, will be 41 no. From something to something that can be reduced freely - Kimie, every single song is one
(:Reduction 1..- By pulling up with r/ and one-sided deafness, the length of the pulling body can be increased by 1 and the rotation angle 9 can be increased (゛?217)〇 Example 1R, 'F, Example 6 of the invention hiIt = lr 3
This will be explained with reference to Figure 4. In the figure, 1 is a furnace body (chamber) having an opening at the top, and a crucible 2 is disposed inside this furnace body 1.
It is supported by a support rod 3 inserted therein.
゛また、炉体1の上部にはこの上部に形成さhた開口部
に合致する結晶取出しチャンバ(プルチャンバ)4が塔
載されている。この結晶取出しチートンバ4は剛性部材
からなる下部チャンバ4aとベローズからなる伸縮自在
な上部チャン・s4bとから構成さiし、これらの境目
部分にシャットオフパルプ5が装着された状態となって
いるO
さらに、ヒ部チャンバ4aは上端側をガイ1゛シ八フト
6を案内とし−r #’l降FiJ能に取付けられた焼
土げ機構7と連結され、下端側はF部チャンノ々4aに
着脱自在かつ気密状態が保持できる構造となっている。Further, a crystal extracting chamber (pull chamber) 4 is mounted on the upper part of the furnace body 1 and fits into the opening formed in the upper part. This crystal extraction chamber 4 is composed of a lower chamber 4a made of a rigid member and an extensible upper chamber s4b made of a bellows, and a shut-off pulp 5 is attached to the boundary between them. Further, the upper end chamber 4a is connected to a baking mechanism 7 attached to the lower end with a guide 1 and an eighth shaft 6 guided, and the lower end side is connected to the F section channel 4a. It has a structure that allows it to be attached and detached freely and maintain an airtight state.
また、結晶取出]−チャンバ4内には上記焼土げ機構7
により捲取り自在なワイヤ、玉鎖り等の条体かもなる引
」二げ体8が垂下され、その下端にをま種結晶保持具9
を介して種結晶10が連結きれた状態となっている。In addition, the above-mentioned baking mechanism 7 is installed in the crystal extraction]-chamber 4.
A puller body 8, which can also be a strip of wire, chain, etc., that can be freely wound is hung down, and a seed crystal holder 9 is attached to the lower end of the puller body 8.
The seed crystal 10 is in a state of being completely connected via the .
L7かI−で、ルツ・げ2内に多結晶半導体と(−2で
の多結晶シリコン原料とコントロール用活性不純物とを
入れて図示しないヒータで加熱することにより、これら
を溶融させ、シリコン融液ツノを得る。At L7 or I-, a polycrystalline semiconductor, a polycrystalline silicon raw material at -2, and an active impurity for control are placed in Ruth Ge 2 and heated with a heater (not shown) to melt them, and the silicon melt is heated. Obtain liquid horns.
一方、捲上げ機構7を下部ポジション側に予′ め位
置をせて結晶取出17ヂヤンパ4の上部チャンバ4bを
圧縮させた状態とする。On the other hand, the winding mechanism 7 is previously placed in the lower position side to compress the upper chamber 4b of the jumper 4 for the crystal removal 17.
そして、第4図0)で示すように・Iツボ2内のシリコ
ン融液11に種結晶10を浸し、支持棒3によりルツボ
2を回転させながら、引−ヒげ体8を撹−ヒげ機構7に
より回転させながら引き一部げることにより単結晶シリ
コン12を得る。Then, as shown in FIG. 4 (0), the seed crystal 10 is immersed in the silicon melt 11 in the I crucible 2, and while the crucible 2 is rotated by the support rod 3, the drag body 8 is stirred. Single crystal silicon 12 is obtained by pulling and pulling while rotating with mechanism 7.
ぞしで、第4図(ロ)で示すように単結晶シリコン12
の引上げが終了したのちは、第4図(ハ)で示すように
捲上げ機構7を上方に移動することに−Cより伸縮自在
な」二部チャンバ4b’i<伸ばしなから即結晶シリニ
1ン12をシャ1.トオフパルブ5の上方に吊上げ−C
シャノトメフパルズ5を閉じる@
つぎに、第4し1に)で示すように上部チャンバ4bの
下端を下部チャンバ4aから切り離し、て収縮させて単
結晶シリコン12を露出させ、この状態で単結晶シリコ
ン12を取出すことになる。Therefore, as shown in Figure 4 (b), single crystal silicon 12
After the pulling is completed, the winding mechanism 7 is moved upward as shown in FIG. 4(C). Turn 12 into Sha 1. Lift above to-off valve 5-C
Close the Shanotomefu Pulses 5@Next, as shown in 4th and 1), the lower end of the upper chamber 4b is cut off from the lower chamber 4a and contracted to expose the single crystal silicon 12, and in this state, the single crystal silicon 12 will be taken out.
しかして、本発明の」二記構成にあっては従来装置の結
晶取出(7チVンバ1をベローズの如き伸縮可能なもの
に替えることにより引上げ時の引上げ休8の長さを短か
くして種結晶lOの回転数を一部昇させるものであり、
従来装置で単結晶シリコン12の長さのものを取出す鳴
合、引上げ休8の長さが約2.5 m必要としたが、本
発明にちっては約βに短縮することが++J能となり、
共振回転数を40・ダ」二部できるようになった。However, in the second configuration of the present invention, the length of the pulling stop 8 during pulling can be shortened by replacing the seven chambers 1 of the conventional apparatus with extensible ones such as bellows. It partially increases the rotational speed of crystal lO,
Conventional equipment required a length of about 2.5 m to pull out a single crystal silicon 12 long piece, but with the present invention, it is possible to shorten it to about β. ,
It is now possible to increase the resonance rotation speed to 40.
なお、共振回転数N (r、p、m。)は重力加速度Q
(9,8m/s2) 、引上げ体の支点より重心まで
の距離A tnと17だとき、
N−:yrl¥で表わされる。Note that the resonance rotation speed N (r, p, m.) is the gravitational acceleration Q
(9,8m/s2), when the distance A from the fulcrum of the pulling body to the center of gravity is 17, it is expressed as N-:yrl\.
以上説明したように、本発明によれば、引上げ中の単結
晶シリコン等の半導体の揺動および溶融半導体表面の振
動を発生させることなく、種結晶の回転数を増加させる
ことにより、断面内の比抵抗および酸素濃度の分布特性
が改善された良好な単結晶半導体を製造することができ
るといった一効果を奏する。As explained above, according to the present invention, by increasing the rotational speed of the seed crystal without causing any vibration in the semiconductor such as single crystal silicon being pulled or vibration on the surface of the molten semiconductor, One effect is that a good single crystal semiconductor with improved resistivity and oxygen concentration distribution characteristics can be manufactured.
第1図は従来装置の一部省略し1示ず概略的断面図、第
2図(イ)〜に)は従来装置にお&−Jる噴結晶仝l′
°i#);体の引上げから取出し直前までの各工程を示
す説明図、第3図および第4図(イ)〜に)は本発明の
一実施例を示すもので、@3図は−iB断面し−こ示ず
如、略的正面図、第4図(イ)〜に)は単結晶半ノ、+
ト(4・C/戸月−に〇から取出し直前までの各工程を
示・j説HIjll IQIであるOI・・・炉体(チ
ャンバ)、2・・・ルツrj!、4・・・結晶取11j
L f−ヤン・り(クルチャン・<)、4a・・・下
部チャンバ、4b・・・上部チーVン・り(ベローズハ
5・・・シャットオフパルプ、6・・・ガイドゾーヤフ
ト、7・・・催上げ機構、8・・・条体からなる引上は
体、9・・・種結晶保持具、lO・・・種結晶、1)
シリコン融液、12・・・単結晶シリコン。Fig. 1 is a schematic cross-sectional view of a conventional device with some parts omitted, and Fig. 2 (a) to 2) show the spout crystals included in the conventional device.
°i#); Explanatory drawings showing each process from lifting of the body to just before removal, Figures 3 and 4 (A) to 4) show one embodiment of the present invention, and Figure @3 shows - iB cross-section (not shown), schematic front view, Figures 4(a) to 4) are single-crystal half-sections, +
(4・C/Totsuki- shows each process from ○ to just before taking out・J theory HIjll IQI OI...Furnace body (chamber), 2...Rutsu rj!, 4...Crystal Tori 11j
L f-Yang Ri (Kulchan <), 4a...Lower chamber, 4b...Upper chain V-Chin Ri (Bellows ha 5...Shut-off pulp, 6...Guide Zo Yaft, 7... - Lifting mechanism, 8... Lifting body consisting of stripes, 9... Seed crystal holder, lO... Seed crystal, 1)
Silicon melt, 12...single crystal silicon.
Claims (1)
せ、この441結晶をこれに連結された条体からなる引
上げ体を捲上げて引上げることにより単結晶半導体を得
るようにした単結晶半導体の引上げ装置において、上記
引上げ体を捲上げる捲上げ機構を上記単結晶半導体の引
上げ方向に?Dって昇降自在とするとともにこの捲上げ
機構によって引上げた単結晶半導体が収容される結晶取
出し用チャンバを伸縮自在としたことを特徴とする単結
晶半導体の引上げ装置。 (2)結晶取出し用チャンバをベローズで構成した特許
請求の範囲第1項記載の単結晶半導体の引上げ装置。[Claims] A single crystal semiconductor is produced by bringing a seed crystal into contact with a semiconductor melt within (+1) 1ζ, and pulling up this 441 crystal by winding up a pulling body consisting of a strip connected to it. In the apparatus for pulling up a single crystal semiconductor, the winding mechanism for winding up the pulling body is directed in the direction of pulling the single crystal semiconductor. A single-crystal semiconductor pulling device characterized in that D is movable up and down, and a crystal extraction chamber in which the single-crystal semiconductor pulled by the hoisting mechanism is accommodated is extendable and retractable. (2) The apparatus for pulling a single crystal semiconductor according to claim 1, wherein the crystal extraction chamber is constructed of a bellows.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14445382A JPS5935087A (en) | 1982-08-20 | 1982-08-20 | Device for pulling semiconductor single crystal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14445382A JPS5935087A (en) | 1982-08-20 | 1982-08-20 | Device for pulling semiconductor single crystal |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5935087A true JPS5935087A (en) | 1984-02-25 |
Family
ID=15362592
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14445382A Pending JPS5935087A (en) | 1982-08-20 | 1982-08-20 | Device for pulling semiconductor single crystal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5935087A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102409398A (en) * | 2011-12-20 | 2012-04-11 | 北京京仪世纪电子股份有限公司 | Taking-out device of long monocrystalline silicon rods |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5319564B2 (en) * | 1973-12-11 | 1978-06-21 |
-
1982
- 1982-08-20 JP JP14445382A patent/JPS5935087A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5319564B2 (en) * | 1973-12-11 | 1978-06-21 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102409398A (en) * | 2011-12-20 | 2012-04-11 | 北京京仪世纪电子股份有限公司 | Taking-out device of long monocrystalline silicon rods |
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